with multiple changes of direction

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CPC
H01J49/408

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/408with multiple changes of direction

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Time of flight mass analyser with spatial focussing
- Patent number 12,131,895
- Issue date Oct 29, 2024
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion entry/exit device
- Patent number 12,051,583
- Issue date Jul 30, 2024
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 12,027,360
- Issue date Jul 2, 2024
- Shimadzu Corporation
- Hiroyuki Miura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,990,328
- Issue date May 21, 2024
- Shimadzu Corporation
- Hiroyuki Miura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyzer with 3D electrostatic field
- Patent number 11,942,318
- Issue date Mar 26, 2024
- Shimadzu Corporation
- Vyacheslav Shchepunov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detection systems
- Patent number 11,587,776
- Issue date Feb 21, 2023
- EL-MUL TECHNOLOGIES LTD.
- Semyon Shofman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,587,780
- Issue date Feb 21, 2023
- Shimadzu Corporation
- Yusuke Tateishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion entry/exit device
- Patent number 11,527,395
- Issue date Dec 13, 2022
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atmospheric pressure ion source interface
- Patent number 11,430,646
- Issue date Aug 30, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Aivaras Venckus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-resolved chemical studies via time-of-flight secondary ion mas...
- Patent number 11,355,336
- Issue date Jun 7, 2022
- UT-Battelle, LLC
- Anton V. Ievlev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass analyser with spatial focussing
- Patent number 11,328,920
- Issue date May 10, 2022
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characterization of crude oil by time of flight mass spectrometry
- Patent number 11,320,413
- Issue date May 3, 2022
- Saudi Arabian Oil Company
- Omer Refa Koseoglu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time-of-flight mass spectrometers
- Patent number 11,309,175
- Issue date Apr 19, 2022
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual mode mass spectrometer
- Patent number 11,094,521
- Issue date Aug 17, 2021
- Micromass UK Limited
- Jeffery Mark Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiturn time-of-flight mass spectrometer and method for producing...
- Patent number 11,094,522
- Issue date Aug 17, 2021
- Shimadzu Corporation
- Hiroyuki Miura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide within pulsed converters
- Patent number 11,081,332
- Issue date Aug 3, 2021
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyser having extended flight path
- Patent number 10,950,425
- Issue date Mar 16, 2021
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion entry/exit device
- Patent number 10,903,062
- Issue date Jan 26, 2021
- Micromass UK Limited
- Kevin Giles
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer
- Patent number 10,739,320
- Issue date Aug 11, 2020
- Shimadzu Corporation
- Hideki Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Ion analyzer
- Patent number 10,541,125
- Issue date Jan 21, 2020
- Shimadzu Corporation
- Hiroyuki Miura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion entry/exit device
- Patent number 10,446,381
- Issue date Oct 15, 2019
- Micromass UK Limited
- Kevin Giles
- G01 - MEASURING TESTING
Information Patent Grant
System and methodology for expressing ion path in a time-of-flight...
- Patent number 10,438,788
- Issue date Oct 8, 2019
- NOAA Technology Partnerships Office
- Daniel Murphy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Counterflow sample introduction and devices, systems and methods us...
- Patent number 10,327,319
- Issue date Jun 18, 2019
- PerkinElmer Health Sciences, Inc.
- Peter Morrisroe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mirror, an ion mirror assembly and an ion trap
- Patent number 10,147,591
- Issue date Dec 4, 2018
- Auckland UniServices Limited
- Peter Derrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and methodology for expressing ion path in a time-of-flight...
- Patent number 10,128,098
- Issue date Nov 13, 2018
- NOAA Technology Partnerships Office
- Daniel Murphy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyser and method of mass analysis
- Patent number 9,997,343
- Issue date Jun 12, 2018
- Shimadzu Corporation
- Li Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal acceleration coaxial cylinder time of flight mass analyser
- Patent number 9,978,577
- Issue date May 22, 2018
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for separating ions according to a physicochemical property
- Patent number 9,881,782
- Issue date Jan 30, 2018
- Micromass UK Limited
- Jason Lee Wildgoose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and methodology for expressing ion path in a time-of-flight...
- Patent number 9,761,431
- Issue date Sep 12, 2017
- NOAA Technology Partnerships Office
- Daniel Murphy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal acceleration coaxial cylinder time of flight mass analyser
- Patent number 9,728,391
- Issue date Aug 8, 2017
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ION ENTRY/EXIT DEVICE
- Publication number 20240355606
- Publication date Oct 24, 2024
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT LASER ION SOURCE APPARATUS AND METHOD
- Publication number 20240079226
- Publication date Mar 7, 2024
- ATOMIC ENERGY OF CANADA LIMITED / ÉNERGIE ATOMIQUE DU CANADA LIMITÉE
- Ankur Chaudhuri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN E...
- Publication number 20230402272
- Publication date Dec 14, 2023
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Entry/Exit Device
- Publication number 20230170203
- Publication date Jun 1, 2023
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20220406588
- Publication date Dec 22, 2022
- Shimadzu Corporation
- Hiroyuki MIURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME OF FLIGHT MASS ANALYSER WITH SPATIAL FOCUSSING
- Publication number 20220238320
- Publication date Jul 28, 2022
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20220189758
- Publication date Jun 16, 2022
- Shimadzu Corporation
- Yusuke TATEISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF SELECTING IONS BY ION MOBILITY SEPARATION AND ISOLATION O...
- Publication number 20220163480
- Publication date May 26, 2022
- Micromass UK Limited
- Martin Palmer
- G01 - MEASURING TESTING
Information Patent Application
TIME-RESOLVED CHEMICAL STUDIES VIA TIME-OF-FLIGHT SECONDARY ION MAS...
- Publication number 20210257205
- Publication date Aug 19, 2021
- UT-Battelle, LLC
- Anton V. Ievlev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATMOSPHERIC PRESSURE ION SOURCE INTERFACE
- Publication number 20210142997
- Publication date May 13, 2021
- Thermo Fisher Scientific (Bremen) GmbH
- Aivaras VENCKUS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Entry/Exit Device
- Publication number 20210125818
- Publication date Apr 29, 2021
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTITURN TIME-OF-FLIGHT MASS SPECTROMETER AND METHOD FOR PRODUCIN...
- Publication number 20210111015
- Publication date Apr 15, 2021
- Shimadzu Corporation
- Hiroyuki MIURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSER
- Publication number 20210020421
- Publication date Jan 21, 2021
- Shimadzu Corporation
- Vyacheslav SHCHEPUNOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDE WITHIN PULSED CONVERTERS
- Publication number 20200168447
- Publication date May 28, 2020
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME OF FLIGHT MASS ANALYSER WITH SPATIAL FOCUSSING
- Publication number 20200152440
- Publication date May 14, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-REFLECTING TIME-OF-FLIGHT MASS SPECTROMETERS
- Publication number 20200083034
- Publication date Mar 12, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Entry/Exit Device
- Publication number 20200075302
- Publication date Mar 5, 2020
- Micromass UK Limited
- Kevin Giles
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER
- Publication number 20200003739
- Publication date Jan 2, 2020
- SHIMADZU CORPORATION
- Hideki YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
DUAL MODE MASS SPECTROMETER
- Publication number 20190237318
- Publication date Aug 1, 2019
- Micromass UK Limited
- Jeffery Mark Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSER HAVING EXTENDED FLIGHT PATH
- Publication number 20190206669
- Publication date Jul 4, 2019
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ANALYZER
- Publication number 20190189418
- Publication date Jun 20, 2019
- Shimadzu Corporation
- Hiroyuki MIURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHODOLOGY FOR EXPRESSING ION PATH IN A TIME-OF-FLIGHT...
- Publication number 20190096653
- Publication date Mar 28, 2019
- NOAA Technology Partnerships Office
- Daniel Murphy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Entry/Exit Device
- Publication number 20180337030
- Publication date Nov 22, 2018
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHODOLOGY FOR EXPRESSING ION PATH IN A TIME-OF-FLIGHT...
- Publication number 20180061624
- Publication date Mar 1, 2018
- NOAA Technology Partnerships Office
- Daniel Murphy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Orthogonal Acceleration Coaxial Cylinder Time of Flight Mass Analyser
- Publication number 20180047556
- Publication date Feb 15, 2018
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN ION MIRROR, AN ION MIRROR ASSEMBLY AND AN ION TRAP
- Publication number 20180040465
- Publication date Feb 8, 2018
- Aukland UniServices Ltd.
- Peter Derrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSER AND METHOD OF MASS ANALYSIS
- Publication number 20170278689
- Publication date Sep 28, 2017
- Shimadzu Corporation
- Li Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Separating Ions According to a Physicochemical Property
- Publication number 20170213716
- Publication date Jul 27, 2017
- Micromass UK Limited
- Jason Lee Wildgoose
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODOLOGY FOR EXPRESSING ION PATH IN A TIME-OF-FLIGHT...
- Publication number 20170084446
- Publication date Mar 23, 2017
- NOAA Technology Partnerships Office
- Daniel Murphy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSER, MASS SPECTROMETER AND ASSOCIATED METHODS
- Publication number 20140291503
- Publication date Oct 2, 2014
- SHIMADZU CORPORATION
- Vyacheslav Shchepunov
- H01 - BASIC ELECTRIC ELEMENTS

with multiple changes of direction

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Time of flight mass analyser with spatial focussing

Ion entry/exit device

Mass spectrometer

Mass spectrometer

Mass analyzer with 3D electrostatic field

Ion detection systems

Time-of-flight mass spectrometer

Ion entry/exit device

Atmospheric pressure ion source interface

Time-resolved chemical studies via time-of-flight secondary ion mas...

Time of flight mass analyser with spatial focussing

Characterization of crude oil by time of flight mass spectrometry

Multi-reflecting time-of-flight mass spectrometers

Dual mode mass spectrometer

Multiturn time-of-flight mass spectrometer and method for producing...

Ion guide within pulsed converters

Mass analyser having extended flight path

Ion entry/exit device

Mass spectrometer

Ion analyzer

Ion entry/exit device

System and methodology for expressing ion path in a time-of-flight...

Counterflow sample introduction and devices, systems and methods us...

Ion mirror, an ion mirror assembly and an ion trap

System and methodology for expressing ion path in a time-of-flight...

Mass analyser and method of mass analysis

Orthogonal acceleration coaxial cylinder time of flight mass analyser

Method for separating ions according to a physicochemical property

System and methodology for expressing ion path in a time-of-flight...

Orthogonal acceleration coaxial cylinder time of flight mass analyser

Patents Applicationslast 30 patents

ION ENTRY/EXIT DEVICE

COMPACT LASER ION SOURCE APPARATUS AND METHOD

SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN E...

Ion Entry/Exit Device

MASS SPECTROMETER

TIME OF FLIGHT MASS ANALYSER WITH SPATIAL FOCUSSING

TIME-OF-FLIGHT MASS SPECTROMETER

METHOD OF SELECTING IONS BY ION MOBILITY SEPARATION AND ISOLATION O...

TIME-RESOLVED CHEMICAL STUDIES VIA TIME-OF-FLIGHT SECONDARY ION MAS...

ATMOSPHERIC PRESSURE ION SOURCE INTERFACE

Ion Entry/Exit Device

MULTITURN TIME-OF-FLIGHT MASS SPECTROMETER AND METHOD FOR PRODUCIN...

MASS ANALYSER

ION GUIDE WITHIN PULSED CONVERTERS

TIME OF FLIGHT MASS ANALYSER WITH SPATIAL FOCUSSING

MULTI-REFLECTING TIME-OF-FLIGHT MASS SPECTROMETERS

Ion Entry/Exit Device

MASS SPECTROMETER

DUAL MODE MASS SPECTROMETER

MASS ANALYSER HAVING EXTENDED FLIGHT PATH

ION ANALYZER

SYSTEM AND METHODOLOGY FOR EXPRESSING ION PATH IN A TIME-OF-FLIGHT...

Ion Entry/Exit Device

SYSTEM AND METHODOLOGY FOR EXPRESSING ION PATH IN A TIME-OF-FLIGHT...

Orthogonal Acceleration Coaxial Cylinder Time of Flight Mass Analyser

AN ION MIRROR, AN ION MIRROR ASSEMBLY AND AN ION TRAP

MASS ANALYSER AND METHOD OF MASS ANALYSIS

Method for Separating Ions According to a Physicochemical Property

SYSTEM AND METHODOLOGY FOR EXPRESSING ION PATH IN A TIME-OF-FLIGHT...

MASS ANALYSER, MASS SPECTROMETER AND ASSOCIATED METHODS