with multiple reflections

Industry

CPC
H01J49/406

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/406with multiple reflections

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Time-of-flight mass spectrometer with multiple reflection
- Patent number 12,205,814
- Issue date Jan 21, 2025
- Claus Köster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap array for high throughput charge detection mass spectrometry
- Patent number 12,159,780
- Issue date Dec 3, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Decoding multiplexed mass spectral data
- Patent number 12,159,775
- Issue date Dec 3, 2024
- Micromass UK Limited
- Richard Denny
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass analyser with spatial focussing
- Patent number 12,131,895
- Issue date Oct 29, 2024
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mirror for multi-reflecting mass spectrometers
- Patent number 12,125,694
- Issue date Oct 22, 2024
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for pulsed mode charge detection mass spectrom...
- Patent number 12,112,936
- Issue date Oct 8, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for multi-pass encoded frequency pushing
- Patent number 12,100,584
- Issue date Sep 24, 2024
- Leco Corporation
- Peter Markel Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-calibration of high resolution mass spectrum
- Patent number 12,020,918
- Issue date Jun 25, 2024
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of gain calibration
- Patent number 11,996,277
- Issue date May 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TOF MS detection system with improved dynamic range
- Patent number 11,881,387
- Issue date Jan 23, 2024
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accelerator for multi-pass mass spectrometers
- Patent number 11,817,303
- Issue date Nov 14, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for accurate, stable voltage supply
- Patent number 11,791,145
- Issue date Oct 17, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Philipp Cochems
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mirror for multi-reflecting mass spectrometers
- Patent number 11,756,782
- Issue date Sep 12, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic trap mass spectrometer with improved ion injection
- Patent number 11,742,192
- Issue date Aug 29, 2023
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplexing method for separators
- Patent number 11,733,206
- Issue date Aug 22, 2023
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-pass mass spectrometer
- Patent number 11,705,320
- Issue date Jul 18, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time of flight mass analyser
- Patent number 11,621,156
- Issue date Apr 4, 2023
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,587,780
- Issue date Feb 21, 2023
- Shimadzu Corporation
- Yusuke Tateishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass spectrometer and method of mass spectrometry
- Patent number 11,387,094
- Issue date Jul 12, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gridless ion mirrors with smooth fields
- Patent number 11,367,608
- Issue date Jun 21, 2022
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time of flight mass analyser
- Patent number 11,342,175
- Issue date May 24, 2022
- Micromass UK Limited
- Jeffery Mark Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass analyser with spatial focussing
- Patent number 11,328,920
- Issue date May 10, 2022
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time-of-flight mass spectrometers
- Patent number 11,309,175
- Issue date Apr 19, 2022
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Printed circuit ion mirror with compensation
- Patent number 11,295,944
- Issue date Apr 5, 2022
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer and method for improving mass and...
- Patent number 11,264,229
- Issue date Mar 1, 2022
- Guennadi Lebedev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mirror for multi-reflecting mass spectrometers
- Patent number 11,239,067
- Issue date Feb 1, 2022
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic linear ion trap design for charge detection mass spec...
- Patent number 11,232,941
- Issue date Jan 25, 2022
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap array for high throughput charge detection mass spectrometry
- Patent number 11,227,759
- Issue date Jan 18, 2022
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for capturing ions in an electrostatic linear...
- Patent number 11,227,758
- Issue date Jan 18, 2022
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-pass mass spectrometer
- Patent number 11,211,238
- Issue date Dec 28, 2021
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MULTI-REFLECTION MASS SPECTROMETER
- Publication number 20250062111
- Publication date Feb 20, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR PULSED MODE CHARGE DETECTION MASS SPECTROM...
- Publication number 20240412967
- Publication date Dec 12, 2024
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC GAIN CONTROL
- Publication number 20240404808
- Publication date Dec 5, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-REFLECTION MASS SPECTROMETER
- Publication number 20240395531
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VOLTAGE SUPPLY FOR MASS SPECTROMETER
- Publication number 20240395532
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Philipp Cochems
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYTICAL INSTRUMENT CALIBRATION
- Publication number 20240371618
- Publication date Nov 7, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Daniel Marc Mourad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER HAVING HIGH SAMPLING DUTY CYCLE
- Publication number 20240339314
- Publication date Oct 10, 2024
- Micromass UK Limited
- Jason Lee Wildgoose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME OF FLIGHT MASS ANALYSIS SYSTEM
- Publication number 20240331994
- Publication date Oct 3, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER
- Publication number 20240312775
- Publication date Sep 19, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-CALIBRATION OF HIGH RESOLUTION MASS SPECTRUM
- Publication number 20240297029
- Publication date Sep 5, 2024
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic Ion Trap Configuration
- Publication number 20240071741
- Publication date Feb 29, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS
- Publication number 20240030018
- Publication date Jan 25, 2024
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESSING ION PEAK AREAS IN MASS SPECTROMETRY
- Publication number 20240014021
- Publication date Jan 11, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Bernd Hagedorn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETRIC ANALYSIS OF LABELLED ANALYTE IONS
- Publication number 20230411138
- Publication date Dec 21, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-PASS MASS SPECTROMETER
- Publication number 20230386818
- Publication date Nov 30, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR FOURIER TRANSFORM ELECTROSTATIC ION TRAP WI...
- Publication number 20230377866
- Publication date Nov 23, 2023
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High resolution multi-reflection time-of-flight mass analyser
- Publication number 20230290629
- Publication date Sep 14, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS
- Publication number 20230170204
- Publication date Jun 1, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Correcting Mass Spectral Data
- Publication number 20230131302
- Publication date Apr 27, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER WITH MULTIPLE REFLECTION
- Publication number 20230096197
- Publication date Mar 30, 2023
- Bruker Daltonics GmbH & Co. KG
- Claus KÖSTER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS ANALYSERS
- Publication number 20220415640
- Publication date Dec 29, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Christian Hock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF GAIN CALIBRATION
- Publication number 20220367165
- Publication date Nov 17, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR PULSED MODE CHARGE DETECTION MASS SPECTROM...
- Publication number 20220344145
- Publication date Oct 27, 2022
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DECODING MULTIPLEXED MASS SPECTRAL DATA
- Publication number 20220277943
- Publication date Sep 1, 2022
- Micromass UK Limited
- Richard Denny
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Multi-Pass Encoded Frequency Pushing
- Publication number 20220262616
- Publication date Aug 18, 2022
- Leco Corporation
- Peter Markel Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME OF FLIGHT MASS ANALYSER WITH SPATIAL FOCUSSING
- Publication number 20220238320
- Publication date Jul 28, 2022
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20220189758
- Publication date Jun 16, 2022
- Shimadzu Corporation
- Yusuke TATEISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-CALIBRATION OF HIGH RESOLUTION MASS SPECTRUM
- Publication number 20220148867
- Publication date May 12, 2022
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS
- Publication number 20220148872
- Publication date May 12, 2022
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRAP ARRAY FOR HIGH THROUGHPUT CHARGE DETECTION MASS SPECTROMETRY
- Publication number 20220122831
- Publication date Apr 21, 2022
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS

with multiple reflections

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Time-of-flight mass spectrometer with multiple reflection

Ion trap array for high throughput charge detection mass spectrometry

Decoding multiplexed mass spectral data

Time of flight mass analyser with spatial focussing

Ion mirror for multi-reflecting mass spectrometers

Apparatus and method for pulsed mode charge detection mass spectrom...

Methods and systems for multi-pass encoded frequency pushing

Self-calibration of high resolution mass spectrum

Method of gain calibration

TOF MS detection system with improved dynamic range

Accelerator for multi-pass mass spectrometers

Systems and methods for accurate, stable voltage supply

Ion mirror for multi-reflecting mass spectrometers

Electrostatic trap mass spectrometer with improved ion injection

Multiplexing method for separators

Multi-pass mass spectrometer

Multi-reflecting time of flight mass analyser

Time-of-flight mass spectrometer

Time of flight mass spectrometer and method of mass spectrometry

Gridless ion mirrors with smooth fields

Multi-reflecting time of flight mass analyser

Time of flight mass analyser with spatial focussing

Multi-reflecting time-of-flight mass spectrometers

Printed circuit ion mirror with compensation

Time-of-flight mass spectrometer and method for improving mass and...

Ion mirror for multi-reflecting mass spectrometers

Electrostatic linear ion trap design for charge detection mass spec...

Ion trap array for high throughput charge detection mass spectrometry

Apparatus and method for capturing ions in an electrostatic linear...

Multi-pass mass spectrometer

Patents Applicationslast 30 patents

MULTI-REFLECTION MASS SPECTROMETER

APPARATUS AND METHOD FOR PULSED MODE CHARGE DETECTION MASS SPECTROM...

AUTOMATIC GAIN CONTROL

MULTI-REFLECTION MASS SPECTROMETER

VOLTAGE SUPPLY FOR MASS SPECTROMETER

ANALYTICAL INSTRUMENT CALIBRATION

MASS SPECTROMETER HAVING HIGH SAMPLING DUTY CYCLE

TIME OF FLIGHT MASS ANALYSIS SYSTEM

COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER

SELF-CALIBRATION OF HIGH RESOLUTION MASS SPECTRUM

Electrostatic Ion Trap Configuration

ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS

PROCESSING ION PEAK AREAS IN MASS SPECTROMETRY

TIME-OF-FLIGHT MASS SPECTROMETRIC ANALYSIS OF LABELLED ANALYTE IONS

MULTI-PASS MASS SPECTROMETER

SYSTEMS AND METHODS FOR FOURIER TRANSFORM ELECTROSTATIC ION TRAP WI...

High resolution multi-reflection time-of-flight mass analyser

ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS

Method for Correcting Mass Spectral Data

TIME-OF-FLIGHT MASS SPECTROMETER WITH MULTIPLE REFLECTION

TIME-OF-FLIGHT MASS ANALYSERS

METHOD OF GAIN CALIBRATION

APPARATUS AND METHOD FOR PULSED MODE CHARGE DETECTION MASS SPECTROM...

DECODING MULTIPLEXED MASS SPECTRAL DATA

Methods and Systems for Multi-Pass Encoded Frequency Pushing

TIME OF FLIGHT MASS ANALYSER WITH SPATIAL FOCUSSING

TIME-OF-FLIGHT MASS SPECTROMETER

SELF-CALIBRATION OF HIGH RESOLUTION MASS SPECTRUM

ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS

ION TRAP ARRAY FOR HIGH THROUGHPUT CHARGE DETECTION MASS SPECTROMETRY