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Industry

CPC
Y10S977/875

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

Current Industry

Y10S977/875with tip detail

Industries

Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope for cleaning nanostructures
- Patent number 11,130,159
- Issue date Sep 28, 2021
- International Business Machines Corporation
- Pio Peter Niraj Nirmalraj
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Cleaning of nanostructures
- Patent number 10,543,515
- Issue date Jan 28, 2020
- International Business Machines Corporation
- Pio Peter Niraj Nirmalraj
- B08 - CLEANING
Information Patent Grant
Nanometer scale instrument for biochemically, chemically, or cataly...
- Patent number 8,046,843
- Issue date Oct 25, 2011
- General Nanotechnology L.L.C.
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tapered probe structures and fabrication
- Patent number 8,020,216
- Issue date Sep 13, 2011
- The Regents of the University of California
- Sungho Jin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Near-field optical probe based on SOI substrate and fabrication met...
- Patent number 7,871,530
- Issue date Jan 18, 2011
- Electronics and Telecommunications Research Institute
- Eunkyoung Kim
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tip array structure and fabricating method of tip structure
- Patent number 7,814,566
- Issue date Oct 12, 2010
- Industrial Technology Research Institute
- Wei-Su Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe used for surface enhanced vibrational spectroscopic analysis...
- Patent number 7,707,647
- Issue date Apr 27, 2010
- Canon Kabushiki Kaisha
- Kaoru Konakahara
- G01 - MEASURING TESTING
Information Patent Grant
Near-field optical probe based on SOI substrate and fabrication met...
- Patent number 7,550,311
- Issue date Jun 23, 2009
- Electronics and Telecommunications Research Institute
- Eunkyoung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Carbon thin line probe
- Patent number 7,543,482
- Issue date Jun 9, 2009
- Olympus Corporation
- Masashi Kitazawa
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Nanometer scale data storage device and associated positioning system
- Patent number 7,535,817
- Issue date May 19, 2009
- General Nanotechnology, L.L.C.
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Microcoaxial probes made from strained semiconductor bilayers
- Patent number 7,485,857
- Issue date Feb 3, 2009
- Wisconsin Alumni Research Foundation
- Robert H. Blick
- G01 - MEASURING TESTING
Information Patent Grant
Sensors for electrochemical, electrical or topographical analysis
- Patent number 7,444,856
- Issue date Nov 4, 2008
- The Board of Trustees of the Leland Stanford Junior University
- Friedrich B. Prinz
- G01 - MEASURING TESTING
Information Patent Grant
Telegraph signal microscopy device and method
- Patent number 7,427,754
- Issue date Sep 23, 2008
- The Regents of the University of California
- Kang L. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for scanning probe contact printing
- Patent number 7,344,756
- Issue date Mar 18, 2008
- Northwestern University
- Chad Mirkin
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor probe with resistive tip and method of fabricating th...
- Patent number 7,319,224
- Issue date Jan 15, 2008
- Samsung Electronics Co., Ltd.
- Hong-sik Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 7,312,619
- Issue date Dec 25, 2007
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Multi-dimensional force sensing for scanning probe microscopy using...
- Patent number 7,137,291
- Issue date Nov 21, 2006
- Xidex Corporation
- Vladimir Mancevski
- G01 - MEASURING TESTING
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 7,098,678
- Issue date Aug 29, 2006
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Sensing mode atomic force microscope
- Patent number 7,095,020
- Issue date Aug 22, 2006
- Brookhaven Science Associates
- Paul V. C. Hough
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscopy probes and methods
- Patent number 7,081,624
- Issue date Jul 25, 2006
- The Board of Trustees of the University of Illinois
- Chang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Nanometer scale data storage device and associated positioning system
- Patent number 7,042,828
- Issue date May 9, 2006
- General Nanotechnology L.L.C.
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Active probe for an atomic force microscope and method for use thereof
- Patent number 7,017,398
- Issue date Mar 28, 2006
- Veeco Instruments Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 6,943,574
- Issue date Sep 13, 2005
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maximilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Catheter and guide wire exchange system with improved proximal shaf...
- Patent number 6,893,417
- Issue date May 17, 2005
- Medtronic Vascular, Inc.
- Richard Gribbons
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Probe for scanning probe microscope
- Patent number 6,864,481
- Issue date Mar 8, 2005
- SII NanoTechnology Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Sensing mode atomic force microscope
- Patent number 6,818,891
- Issue date Nov 16, 2004
- Brookhaven Science Associates
- Paul V. C. Hough
- G01 - MEASURING TESTING
Information Patent Grant
Active probe for an atomic force microscope and method of use thereof
- Patent number 6,810,720
- Issue date Nov 2, 2004
- Veeco Instruments Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Nanotweezers and nanomanipulator
- Patent number 6,805,390
- Issue date Oct 19, 2004
- Yoshikazu Nakayama
- Yoshikazu Nakayama
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Nanotweezers and nanomanipulator
- Patent number 6,802,549
- Issue date Oct 12, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 6,798,226
- Issue date Sep 28, 2004
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephen Maximilian Altmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CLEANING OF NANOSTRUCTURES
- Publication number 20200094295
- Publication date Mar 26, 2020
- International Business Machines Corporation
- Pio Peter Niraj Nirmalraj
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Nanometer Scale Instrument for Biochemically, Chemically, or Cataly...
- Publication number 20120147722
- Publication date Jun 14, 2012
- General Nanotechnology, LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
Nanometer Scale Instrument for Biochemically, Chemically, or Cataly...
- Publication number 20090324450
- Publication date Dec 31, 2009
- General Nanotechnology, LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
NEAR-FIELD OPTICAL PROBE BASED ON SOI SUBSTRATE AND FABRICATION MET...
- Publication number 20090218648
- Publication date Sep 3, 2009
- Eunkyoung KIM
- G01 - MEASURING TESTING
Information Patent Application
Tapered probe structures and fabrication
- Publication number 20090133171
- Publication date May 21, 2009
- The Regents of the University of California
- Sungho Jin
- G01 - MEASURING TESTING
Information Patent Application
PROBE USED FOR SURFACE ENHANCED VIBRATIONAL SPECTROSCOPIC ANALYSIS...
- Publication number 20080286563
- Publication date Nov 20, 2008
- Canon Kabushiki Kaisha
- Kaoru Konakahara
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE HAVING NANO-HOLE AND FABRICATING METHOD THEREOF, TIP ARRA...
- Publication number 20080160285
- Publication date Jul 3, 2008
- Industrial Technology Research Institute
- Wei-Su Chen
- B82 - NANO-TECHNOLOGY
Information Patent Application
Microcoaxial probes made from strained semiconductor bilayers
- Publication number 20080061798
- Publication date Mar 13, 2008
- Robert H. Blick
- G01 - MEASURING TESTING
Information Patent Application
Carbon thin line probe
- Publication number 20070204681
- Publication date Sep 6, 2007
- OLYMPUS CORPORATION
- Masashi Kitazawa
- G01 - MEASURING TESTING
Information Patent Application
Near-field optical probe based on SOI substrate and fabrication met...
- Publication number 20070128854
- Publication date Jun 7, 2007
- Eunkyoung Kim
- G01 - MEASURING TESTING
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20060255818
- Publication date Nov 16, 2006
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Application
Nanometer scale data storage device and associated positioning system
- Publication number 20060239129
- Publication date Oct 26, 2006
- General Nanotechnology LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
TELEGRAPH SIGNAL MICROSCOPY DEVICE AND METHOD
- Publication number 20060231754
- Publication date Oct 19, 2006
- Kang L. Wang
- G01 - MEASURING TESTING
Information Patent Application
Sensors for electrochemical, electrical or topographical analysis
- Publication number 20060213259
- Publication date Sep 28, 2006
- Friedrich B. Prinz
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor probe with resistive tip and method of fabricating th...
- Publication number 20060060779
- Publication date Mar 23, 2006
- SAMSUNG ELECTRONICS CO., LTD.
- Hong-sik Park
- G01 - MEASURING TESTING
Information Patent Application
Nanometer scale data storage device and associated positioning system
- Publication number 20050190684
- Publication date Sep 1, 2005
- General Nanotechnology LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20050184746
- Publication date Aug 25, 2005
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Application
Active probe for an atomic force microscope and method for use thereof
- Publication number 20050066714
- Publication date Mar 31, 2005
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20050040836
- Publication date Feb 24, 2005
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maximilian Altmann
- G01 - MEASURING TESTING
Information Patent Application
Sensing mode atomic force microscope
- Publication number 20050029450
- Publication date Feb 10, 2005
- Paul V.C. Hough
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscopy probe and method for scanning probe conta...
- Publication number 20040228962
- Publication date Nov 18, 2004
- Chang Liu
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscopy probe and method for scanning probe conta...
- Publication number 20040227075
- Publication date Nov 18, 2004
- Chang Liu
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscopy probe and method for scanning probe conta...
- Publication number 20040226464
- Publication date Nov 18, 2004
- Chad Mirkin
- G01 - MEASURING TESTING
Information Patent Application
Multi-dimensional force sensing for scanning probe microscopy using...
- Publication number 20040134265
- Publication date Jul 15, 2004
- Vladimir Mancevski
- G01 - MEASURING TESTING
Information Patent Application
Catheter and guide wire exchange system with improved proximal shaf...
- Publication number 20040122363
- Publication date Jun 24, 2004
- Richard Gribbons
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Nanotweezers and nanomanipulator
- Publication number 20030189350
- Publication date Oct 9, 2003
- YOSHIKAZU NAKAYAMA
- Yoshikazu Nakayama
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Nanotweezers and nanomanipulator
- Publication number 20030189351
- Publication date Oct 9, 2003
- YOSHIKAZU NAKAYAMA
- Yoshikazu Nakayama
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Sensing mode atomic force microscope
- Publication number 20030146380
- Publication date Aug 7, 2003
- Paul V.C. Hough
- G01 - MEASURING TESTING
Information Patent Application
Probe for scanning probe microscope
- Publication number 20030122072
- Publication date Jul 3, 2003
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Application
Active probe for an atomic force microscope and method of use thereof
- Publication number 20030094036
- Publication date May 22, 2003
- Dennis M. Adderton
- G01 - MEASURING TESTING

with tip detail

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Scanning probe microscope for cleaning nanostructures

Cleaning of nanostructures

Nanometer scale instrument for biochemically, chemically, or cataly...

Tapered probe structures and fabrication

Near-field optical probe based on SOI substrate and fabrication met...

Tip array structure and fabricating method of tip structure

Probe used for surface enhanced vibrational spectroscopic analysis...

Near-field optical probe based on SOI substrate and fabrication met...

Carbon thin line probe

Nanometer scale data storage device and associated positioning system

Microcoaxial probes made from strained semiconductor bilayers

Sensors for electrochemical, electrical or topographical analysis

Telegraph signal microscopy device and method

Method for scanning probe contact printing

Semiconductor probe with resistive tip and method of fabricating th...

Multiple local probe measuring device and method

Multi-dimensional force sensing for scanning probe microscopy using...

Multiple local probe measuring device and method

Sensing mode atomic force microscope

Scanning probe microscopy probes and methods

Nanometer scale data storage device and associated positioning system

Active probe for an atomic force microscope and method for use thereof

Multiple local probe measuring device and method

Catheter and guide wire exchange system with improved proximal shaf...

Probe for scanning probe microscope

Sensing mode atomic force microscope

Active probe for an atomic force microscope and method of use thereof

Nanotweezers and nanomanipulator

Nanotweezers and nanomanipulator

Multiple local probe measuring device and method

Patents Applicationslast 30 patents

CLEANING OF NANOSTRUCTURES

Nanometer Scale Instrument for Biochemically, Chemically, or Cataly...

Nanometer Scale Instrument for Biochemically, Chemically, or Cataly...

NEAR-FIELD OPTICAL PROBE BASED ON SOI SUBSTRATE AND FABRICATION MET...

Tapered probe structures and fabrication

PROBE USED FOR SURFACE ENHANCED VIBRATIONAL SPECTROSCOPIC ANALYSIS...

STRUCTURE HAVING NANO-HOLE AND FABRICATING METHOD THEREOF, TIP ARRA...

Microcoaxial probes made from strained semiconductor bilayers

Carbon thin line probe

Near-field optical probe based on SOI substrate and fabrication met...

Multiple local probe measuring device and method

Nanometer scale data storage device and associated positioning system

TELEGRAPH SIGNAL MICROSCOPY DEVICE AND METHOD

Sensors for electrochemical, electrical or topographical analysis

Semiconductor probe with resistive tip and method of fabricating th...

Nanometer scale data storage device and associated positioning system

Multiple local probe measuring device and method

Active probe for an atomic force microscope and method for use thereof

Multiple local probe measuring device and method

Sensing mode atomic force microscope

Scanning probe microscopy probe and method for scanning probe conta...

Scanning probe microscopy probe and method for scanning probe conta...

Scanning probe microscopy probe and method for scanning probe conta...

Multi-dimensional force sensing for scanning probe microscopy using...

Catheter and guide wire exchange system with improved proximal shaf...

Nanotweezers and nanomanipulator

Nanotweezers and nanomanipulator

Sensing mode atomic force microscope

Probe for scanning probe microscope

Active probe for an atomic force microscope and method of use thereof