X-ray fluorescence

Industry

CPC
G01N2223/076

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/076X-ray fluorescence

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Identification of mycotoxin absorption materials in clay deposits
- Patent number 12,158,461
- Issue date Dec 3, 2024
- Halliburton Energy Services, Inc.
- Marina Carbo
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for determining the mineralogy of drill solids
- Patent number 12,111,273
- Issue date Oct 8, 2024
- Schlumberger Technology Corporation
- Jonathan Mitchell
- E21 - EARTH DRILLING MINING
Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of metal or alloy coating
- Patent number 12,092,594
- Issue date Sep 17, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Petro-steering methodologies during under balanced coiled tubing (U...
- Patent number 12,065,929
- Issue date Aug 20, 2024
- Saudi Arabian Oil Company
- Ferney Geovany Moreno Sierra
- G01 - MEASURING TESTING
Information Patent Grant
Method of using a dissolvable deployment device for the transfer of...
- Patent number 12,025,001
- Issue date Jul 2, 2024
- Talgat Shokanov
- E21 - EARTH DRILLING MINING
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Portable assessment kit and method for measuring metal content of a...
- Patent number 11,965,838
- Issue date Apr 23, 2024
- 3AWater Oy
- Tuomo Nissinen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for acquiring elastic modulus of rock containing...
- Patent number 11,965,839
- Issue date Apr 23, 2024
- INST. OF GEOL. & GEOPHYS., CN ACAD. OF SCIENCES
- Beixiu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Ore component analysis device and method
- Patent number 11,953,455
- Issue date Apr 9, 2024
- SHANDONG UNIVERSITY
- Chen Liu
- G01 - MEASURING TESTING
Information Patent Grant
Biological imaging method using X-ray fluorescence
- Patent number 11,946,884
- Issue date Apr 2, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detection device, recording medium, and positioning method
- Patent number 11,940,397
- Issue date Mar 26, 2024
- Horiba, Ltd.
- Tomoki Aoyama
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,394
- Issue date Mar 26, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Sample mounting system for an X-ray analysis apparatus
- Patent number 11,927,550
- Issue date Mar 12, 2024
- Malvern Panalytical B.V.
- Jaap Boksem
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,554
- Issue date Mar 12, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,921,059
- Issue date Mar 5, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
XFR analyzer instrument
- Patent number 11,898,973
- Issue date Feb 13, 2024
- Hitachi High-Tech Analytical Science Finland Oy
- Oleg Shirokobrod
- G01 - MEASURING TESTING
Information Patent Grant
X-ray sequential array wavelength dispersive spectrometer
- Patent number 11,885,755
- Issue date Jan 30, 2024
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Advanced X-ray emission spectrometers
- Patent number 11,874,239
- Issue date Jan 16, 2024
- UChicago Argonne, LLC
- Chengjun Sun
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detection and identification of foreign eleme...
- Patent number 11,867,645
- Issue date Jan 9, 2024
- Security Matters LTD.
- Yair Grof
- G01 - MEASURING TESTING
Information Patent Grant
Deposition system and method
- Patent number 11,823,964
- Issue date Nov 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Hao Cheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Data-driven solutions for inverse elemental modeling
- Patent number 11,821,857
- Issue date Nov 21, 2023
- Baker Hughes Oilfield Operations LLC
- Robert Krumm
- E21 - EARTH DRILLING MINING
Information Patent Grant
X-ray fluorescence analyzer and a method for performing an x-ray fl...
- Patent number 11,815,480
- Issue date Nov 14, 2023
- Outotec (Finland) Oy
- Tommi Koskinen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Integrated, portable sample analysis system and method
- Patent number 11,796,486
- Issue date Oct 24, 2023
- Spectro Scientific, Inc.
- Patrick F. Henning
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectroscopic analysis apparatus and elemental analysis method
- Patent number 11,796,491
- Issue date Oct 24, 2023
- Shimadzu Corporation
- Shinji Miyauchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240418661
- Publication date Dec 19, 2024
- Rigaku Corporation
- Yoshiyuki KATAOKA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240402101
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Tetsuya YONEDA
- G01 - MEASURING TESTING
Information Patent Application
AN X-RAY FLUORESCENCE SYSTEM
- Publication number 20240385129
- Publication date Nov 21, 2024
- Commonwealth Scientific and Industrial Research Organisation
- Brianna Ganly
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240361261
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240361263
- Publication date Oct 31, 2024
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...
- Publication number 20240310308
- Publication date Sep 19, 2024
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Martin Leibfritz
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
- Publication number 20240309759
- Publication date Sep 19, 2024
- Talgat Shokanov
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...
- Publication number 20240295512
- Publication date Sep 5, 2024
- AKTSIONERNOE OBSHCHESTVO "CHEPETSKIJ MEKHANICHESKIJ ZAVOD
- Olga Alekseevna KARAVAEVA
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20240286541
- Publication date Aug 29, 2024
- Veracio Ltd
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM
- Publication number 20240264098
- Publication date Aug 8, 2024
- Rigaku Corporation
- Tsutomu TADA
- G01 - MEASURING TESTING
Information Patent Application
LUBRICATING OIL ANALYSIS
- Publication number 20240133859
- Publication date Apr 25, 2024
- ExxonMobil Technology and Engineering Company
- Andrew SATTERFIELD
- G01 - MEASURING TESTING
Information Patent Application
ELECTROSTATIC IMAGE DEVELOPER, PROCESS CARTRIDGE, IMAGE FORMING APP...
- Publication number 20240103391
- Publication date Mar 28, 2024
- FUJIFILM Business Innovation Corp.
- Yosuke TSURUMI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
- Publication number 20240093603
- Publication date Mar 21, 2024
- Talgat Shokanov
- E21 - EARTH DRILLING MINING
Information Patent Application
Steerable X-Ray Fluorescence Inspection Device
- Publication number 20240085354
- Publication date Mar 14, 2024
- Viken Detection Corporation
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
Monitoring properties of X-ray beam during X-ray analysis
- Publication number 20240077437
- Publication date Mar 7, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED SOURCE ROCK NET THICKNESS PREDICTION SYSTEM AND METHOD
- Publication number 20240053319
- Publication date Feb 15, 2024
- Saudi Arabian Oil Company
- Fatai A. Anifowose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSIN...
- Publication number 20240035989
- Publication date Feb 1, 2024
- Security Matters Ltd.
- Haggai ALON
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR SMART BATTERY COLLECTION, SORTING, AND PACK...
- Publication number 20240027376
- Publication date Jan 25, 2024
- Li Industries, Inc.
- David YOUNG
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
X-RAY FLUORESCENCE WITH HEAVY ELEMENT TARGET AND METHODS OF USE THE...
- Publication number 20240019386
- Publication date Jan 18, 2024
- Bruce Kaiser
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PREDICTING THE PRESENCE OF RARE EARTH ELEMENTS
- Publication number 20240003836
- Publication date Jan 4, 2024
- MICROBEAM TECHNOLOGIES, INC.
- Matthew Fuka
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MAPPING CHEMICAL ELEMENTS IN A SAMPLE
- Publication number 20240003837
- Publication date Jan 4, 2024
- Bar Ilan University
- Sharon SHWARTZ
- G01 - MEASURING TESTING
Information Patent Application
XRF-IDENTIFIABLE BLACK POLYMERS
- Publication number 20240002630
- Publication date Jan 4, 2024
- Security Matters Ltd.
- Haggai ALON
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
SAMPLE CELL FOR FLUID SAMPLE AND X-RAY FLUORESCENCE ANALYZER AND AN...
- Publication number 20230417691
- Publication date Dec 28, 2023
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yuki KANAZAWA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER
- Publication number 20230408428
- Publication date Dec 21, 2023
- Shimadzu Corporation
- Yasuyuki OKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
DEPOSITION SYSTEM AND METHOD
- Publication number 20230386942
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wen-Hao CHENG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING MASS FRACTIONS IN A TEST SAMPLE W...
- Publication number 20230366840
- Publication date Nov 16, 2023
- Bruker AXS GmbH
- Dominique Porta
- G01 - MEASURING TESTING
Information Patent Application
TRACKING HIDE AND LEATHER IN A SUPPLY CHAIN PROCESS
- Publication number 20230358723
- Publication date Nov 9, 2023
- Security Matters Ltd.
- Yifat BAREKET
- C14 - SKINS HIDES PELTS LEATHER
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230349841
- Publication date Nov 2, 2023
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G01 - MEASURING TESTING

X-ray fluorescence

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Identification of mycotoxin absorption materials in clay deposits

X-ray fluorescence analyzer

Systems and methods for determining the mineralogy of drill solids

X-ray spectrometer and pulse height prediction program

Measurement of metal or alloy coating

Monitoring properties of X-ray beam during X-ray analysis

Petro-steering methodologies during under balanced coiled tubing (U...

Method of using a dissolvable deployment device for the transfer of...

Apparatus and method for x-ray fluorescence analysis

Patterned x-ray emitting target

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Portable assessment kit and method for measuring metal content of a...

Method and system for acquiring elastic modulus of rock containing...

Ore component analysis device and method

Biological imaging method using X-ray fluorescence

Radiation detection device, recording medium, and positioning method

Inspection apparatus and inspection method

Sample mounting system for an X-ray analysis apparatus

Inspection apparatus and inspection method

Inspection apparatus and inspection method

XFR analyzer instrument

X-ray sequential array wavelength dispersive spectrometer

Advanced X-ray emission spectrometers

System and method for detection and identification of foreign eleme...

Deposition system and method

Data-driven solutions for inverse elemental modeling

X-ray fluorescence analyzer and a method for performing an x-ray fl...

Integrated, portable sample analysis system and method

X-ray spectroscopic analysis apparatus and elemental analysis method

Patents Applicationslast 30 patents

X-RAY FLUORESCENCE SPECTROMETER

X-RAY ANALYZER

AN X-RAY FLUORESCENCE SYSTEM

INSPECTION APPARATUS AND INSPECTION METHOD

X-RAY ANALYZER

X-RAY FLUORESCENCE SPECTROMETER

MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...

METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...

METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM

LUBRICATING OIL ANALYSIS

ELECTROSTATIC IMAGE DEVELOPER, PROCESS CARTRIDGE, IMAGE FORMING APP...

METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...

Steerable X-Ray Fluorescence Inspection Device

Monitoring properties of X-ray beam during X-ray analysis

AUTOMATED SOURCE ROCK NET THICKNESS PREDICTION SYSTEM AND METHOD

XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSIN...

METHODS AND SYSTEMS FOR SMART BATTERY COLLECTION, SORTING, AND PACK...

X-RAY FLUORESCENCE WITH HEAVY ELEMENT TARGET AND METHODS OF USE THE...

SYSTEM AND METHOD FOR PREDICTING THE PRESENCE OF RARE EARTH ELEMENTS

SYSTEM AND METHOD FOR MAPPING CHEMICAL ELEMENTS IN A SAMPLE

XRF-IDENTIFIABLE BLACK POLYMERS

SAMPLE CELL FOR FLUID SAMPLE AND X-RAY FLUORESCENCE ANALYZER AND AN...

X-RAY FLUORESCENCE ANALYZER

DEPOSITION SYSTEM AND METHOD

SYSTEM AND METHOD FOR DETERMINING MASS FRACTIONS IN A TEST SAMPLE W...

TRACKING HIDE AND LEATHER IN A SUPPLY CHAIN PROCESS

INSPECTION APPARATUS AND INSPECTION METHOD