X-ray fluorescence

Industry

CPC
G01N2223/076

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/076X-ray fluorescence

Industries

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Patents Grantslast 30 patents

Information Patent Grant
System and method for soil characterization
- Patent number 12,360,099
- Issue date Jul 15, 2025
- X-Centric Sciences Inc.
- Roozbeh Ravansari
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence system and x-ray source with electrically insula...
- Patent number 12,360,067
- Issue date Jul 15, 2025
- Sigray, Inc.
- Wenbing Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray fluorescence spectroscopy analysis
- Patent number 12,345,667
- Issue date Jul 1, 2025
- Schlumberger Technology Corporation
- Sergey Mikhailovich Makarychev-Mikhailov
- G01 - MEASURING TESTING
Information Patent Grant
Method for detection of soil heavy metal pollution using unmanned a...
- Patent number 12,339,240
- Issue date Jun 24, 2025
- University of Electronic Science and Technology of China
- Fang Huang
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Systems and methods for analyzing core using x-ray fluorescence
- Patent number 12,325,345
- Issue date Jun 10, 2025
- Veracio Ltd.
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method for quantitatively characterizing dendrite segregation and d...
- Patent number 12,326,434
- Issue date Jun 10, 2025
- NCS TESTING TECHNOLOGY CO., LTD
- Dongling Li
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for analyzing prostate biopsy
- Patent number 12,306,172
- Issue date May 20, 2025
- ProSight Ltd.
- Meir Weksler
- G01 - MEASURING TESTING
Information Patent Grant
Device for closing the input opening in the sample chamber in an x-...
- Patent number 12,298,262
- Issue date May 13, 2025
- Wolfgang Gehrlein
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis system and method with multi-source design
- Patent number 12,292,396
- Issue date May 6, 2025
- SHENZHEN ANGSTROM EXCELLENCE TECHNOLOGY CO. LTD
- Xuena Zhang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,265,042
- Issue date Apr 1, 2025
- Shimadzu Corporation
- Yasuyuki Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 12,247,935
- Issue date Mar 11, 2025
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Spectrometer
- Patent number 12,235,228
- Issue date Feb 25, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 12,235,229
- Issue date Feb 25, 2025
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Deposition system and method
- Patent number 12,211,756
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Hao Cheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus to operate a quality control in industrial production lin...
- Patent number 12,181,429
- Issue date Dec 31, 2024
- DE.TEC.TOR S.r.l.
- Giuseppe Pitta'
- G01 - MEASURING TESTING
Information Patent Grant
Identification of mycotoxin absorption materials in clay deposits
- Patent number 12,158,461
- Issue date Dec 3, 2024
- Halliburton Energy Services, Inc.
- Marina Carbo
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for determining the mineralogy of drill solids
- Patent number 12,111,273
- Issue date Oct 8, 2024
- Schlumberger Technology Corporation
- Jonathan Mitchell
- E21 - EARTH DRILLING MINING
Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of metal or alloy coating
- Patent number 12,092,594
- Issue date Sep 17, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Petro-steering methodologies during under balanced coiled tubing (U...
- Patent number 12,065,929
- Issue date Aug 20, 2024
- Saudi Arabian Oil Company
- Ferney Geovany Moreno Sierra
- G01 - MEASURING TESTING
Information Patent Grant
Method of using a dissolvable deployment device for the transfer of...
- Patent number 12,025,001
- Issue date Jul 2, 2024
- Talgat Shokanov
- E21 - EARTH DRILLING MINING
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Portable assessment kit and method for measuring metal content of a...
- Patent number 11,965,838
- Issue date Apr 23, 2024
- 3AWater Oy
- Tuomo Nissinen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR OPERATING AN X-RAY DEVICE, X-RAY DEVICE, COMPUTER PROGRA...
- Publication number 20250231123
- Publication date Jul 17, 2025
- Siemens Healthineers AG
- Markus Kowarschik
- G01 - MEASURING TESTING
Information Patent Application
CHANGING THE ORIENTATION OF THE X-RAY EMITTER IN ORDER TO VARY THE...
- Publication number 20250203744
- Publication date Jun 19, 2025
- Siemens Healthineers AG
- Joerg FREUDENBERGER
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTING UNIT FOR AN X-RAY OPTICAL ELEMENT IN AN X-RAY FLUORESCENC...
- Publication number 20250198955
- Publication date Jun 19, 2025
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Bruno Schroth
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20250162487
- Publication date May 22, 2025
- Veracio Ltd
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Application
SPECTROMETER
- Publication number 20250164421
- Publication date May 22, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Application
MONITORING NANOPARTICLE ADDITIVES IN WELLBORE TREATMENT FLUID USING...
- Publication number 20250146918
- Publication date May 8, 2025
- Halliburton Energy Services, Inc.
- Preston Andrew May
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...
- Publication number 20250146960
- Publication date May 8, 2025
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD
- Publication number 20250067690
- Publication date Feb 27, 2025
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND POWER SUPPLY DEVICE
- Publication number 20250031293
- Publication date Jan 23, 2025
- Shimadzu Corporation
- Yohei UKAI
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240418661
- Publication date Dec 19, 2024
- Rigaku Corporation
- Yoshiyuki KATAOKA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240402101
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Tetsuya YONEDA
- G01 - MEASURING TESTING
Information Patent Application
AN X-RAY FLUORESCENCE SYSTEM
- Publication number 20240385129
- Publication date Nov 21, 2024
- Commonwealth Scientific and Industrial Research Organisation
- Brianna Ganly
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240361261
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240361263
- Publication date Oct 31, 2024
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...
- Publication number 20240310308
- Publication date Sep 19, 2024
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Martin Leibfritz
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
- Publication number 20240309759
- Publication date Sep 19, 2024
- Talgat Shokanov
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...
- Publication number 20240295512
- Publication date Sep 5, 2024
- AKTSIONERNOE OBSHCHESTVO "CHEPETSKIJ MEKHANICHESKIJ ZAVOD
- Olga Alekseevna KARAVAEVA
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20240286541
- Publication date Aug 29, 2024
- Veracio Ltd
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM
- Publication number 20240264098
- Publication date Aug 8, 2024
- Rigaku Corporation
- Tsutomu TADA
- G01 - MEASURING TESTING
Information Patent Application
LUBRICATING OIL ANALYSIS
- Publication number 20240133859
- Publication date Apr 25, 2024
- ExxonMobil Technology and Engineering Company
- Andrew SATTERFIELD
- G01 - MEASURING TESTING
Information Patent Application
ELECTROSTATIC IMAGE DEVELOPER, PROCESS CARTRIDGE, IMAGE FORMING APP...
- Publication number 20240103391
- Publication date Mar 28, 2024
- FUJIFILM Business Innovation Corp.
- Yosuke TSURUMI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
- Publication number 20240093603
- Publication date Mar 21, 2024
- Talgat Shokanov
- E21 - EARTH DRILLING MINING
Information Patent Application
Steerable X-Ray Fluorescence Inspection Device
- Publication number 20240085354
- Publication date Mar 14, 2024
- Viken Detection Corporation
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
Monitoring properties of X-ray beam during X-ray analysis
- Publication number 20240077437
- Publication date Mar 7, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED SOURCE ROCK NET THICKNESS PREDICTION SYSTEM AND METHOD
- Publication number 20240053319
- Publication date Feb 15, 2024
- Saudi Arabian Oil Company
- Fatai A. Anifowose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSIN...
- Publication number 20240035989
- Publication date Feb 1, 2024
- Security Matters Ltd.
- Haggai ALON
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR SMART BATTERY COLLECTION, SORTING, AND PACK...
- Publication number 20240027376
- Publication date Jan 25, 2024
- Li Industries, Inc.
- David YOUNG
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING

X-ray fluorescence

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for soil characterization

X-ray fluorescence system and x-ray source with electrically insula...

X-ray fluorescence spectroscopy analysis

Method for detection of soil heavy metal pollution using unmanned a...

Systems and methods for analyzing core using x-ray fluorescence

Method for quantitatively characterizing dendrite segregation and d...

Method and system for analyzing prostate biopsy

Device for closing the input opening in the sample chamber in an x-...

X-ray analysis system and method with multi-source design

X-ray fluorescence analyzer

X-ray fluorescence spectrometer

Inspection apparatus and inspection method

Spectrometer

X-ray fluorescence spectrometer

X-ray detector system with at least two stacked flat Bragg diffractors

Deposition system and method

Apparatus to operate a quality control in industrial production lin...

Identification of mycotoxin absorption materials in clay deposits

X-ray fluorescence analyzer

Systems and methods for determining the mineralogy of drill solids

X-ray spectrometer and pulse height prediction program

Measurement of metal or alloy coating

Monitoring properties of X-ray beam during X-ray analysis

Petro-steering methodologies during under balanced coiled tubing (U...

Method of using a dissolvable deployment device for the transfer of...

Apparatus and method for x-ray fluorescence analysis

Patterned x-ray emitting target

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Portable assessment kit and method for measuring metal content of a...

Patents Applicationslast 30 patents

METHOD FOR OPERATING AN X-RAY DEVICE, X-RAY DEVICE, COMPUTER PROGRA...

CHANGING THE ORIENTATION OF THE X-RAY EMITTER IN ORDER TO VARY THE...

ADJUSTING UNIT FOR AN X-RAY OPTICAL ELEMENT IN AN X-RAY FLUORESCENC...

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

SPECTROMETER

MONITORING NANOPARTICLE ADDITIVES IN WELLBORE TREATMENT FLUID USING...

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...

ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD

X-RAY FLUORESCENCE ANALYZER AND POWER SUPPLY DEVICE

PATTERNED X-RAY EMITTING TARGET

X-RAY FLUORESCENCE SPECTROMETER

X-RAY ANALYZER

AN X-RAY FLUORESCENCE SYSTEM

INSPECTION APPARATUS AND INSPECTION METHOD

X-RAY ANALYZER

X-RAY FLUORESCENCE SPECTROMETER

MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...

METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...

METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM

LUBRICATING OIL ANALYSIS

ELECTROSTATIC IMAGE DEVELOPER, PROCESS CARTRIDGE, IMAGE FORMING APP...

METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...

Steerable X-Ray Fluorescence Inspection Device

Monitoring properties of X-ray beam during X-ray analysis

AUTOMATED SOURCE ROCK NET THICKNESS PREDICTION SYSTEM AND METHOD

XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSIN...

METHODS AND SYSTEMS FOR SMART BATTERY COLLECTION, SORTING, AND PACK...