by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Industry

CPC
G01N23/223

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/223by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Stop and go pig
- Patent number 12,320,461
- Issue date Jun 3, 2025
- Rosen IP AG
- Matthias Grote
- B08 - CLEANING
Information Patent Grant
Coincidence technique-based x-ray detection device and composition...
- Patent number 12,313,574
- Issue date May 27, 2025
- SHANDONG UNIVERSITY
- Chen Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for analyzing prostate biopsy
- Patent number 12,306,172
- Issue date May 20, 2025
- ProSight Ltd.
- Meir Weksler
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for biological analyte studying using x-ray fl...
- Patent number 12,306,120
- Issue date May 20, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Device for closing the input opening in the sample chamber in an x-...
- Patent number 12,298,262
- Issue date May 13, 2025
- Wolfgang Gehrlein
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,292,397
- Issue date May 6, 2025
- Shimadzu Corporation
- Yuji Morihisa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis system and method with multi-source design
- Patent number 12,292,396
- Issue date May 6, 2025
- SHENZHEN ANGSTROM EXCELLENCE TECHNOLOGY CO. LTD
- Xuena Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for interpreting high energy interactions
- Patent number 12,292,398
- Issue date May 6, 2025
- Veracio Ltd.
- Brandon Lee Goodchild Drake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and measuring device for measuring objects by means of x-ray...
- Patent number 12,287,302
- Issue date Apr 29, 2025
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Martin Leibfritz
- G01 - MEASURING TESTING
Information Patent Grant
X ray fluorescence analyzer
- Patent number 12,270,773
- Issue date Apr 8, 2025
- Shimadzu Corporation
- Yuji Morihisa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,265,042
- Issue date Apr 1, 2025
- Shimadzu Corporation
- Yasuyuki Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Polarized, energy dispersive x-ray fluorescence system and method
- Patent number 12,247,934
- Issue date Mar 11, 2025
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 12,247,935
- Issue date Mar 11, 2025
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Spectrometer
- Patent number 12,235,228
- Issue date Feb 25, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 12,235,229
- Issue date Feb 25, 2025
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Detecting downhole fluid composition utilizing photon emission
- Patent number 12,221,884
- Issue date Feb 11, 2025
- Halliburton Energy Services, Inc.
- Christopher Michael Jones
- G01 - MEASURING TESTING
Information Patent Grant
Deposition system and method
- Patent number 12,211,756
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Hao Cheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus to operate a quality control in industrial production lin...
- Patent number 12,181,429
- Issue date Dec 31, 2024
- DE.TEC.TOR S.r.l.
- Giuseppe Pitta'
- G01 - MEASURING TESTING
Information Patent Grant
Seal element for a pipeline pig
- Patent number 12,163,591
- Issue date Dec 10, 2024
- Rosen Swiss AG
- Patrik Rosen
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Identification of mycotoxin absorption materials in clay deposits
- Patent number 12,158,461
- Issue date Dec 3, 2024
- Halliburton Energy Services, Inc.
- Marina Carbo
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
Method for handling melt samples in a steelworks laboratory, and st...
- Patent number 12,123,862
- Issue date Oct 22, 2024
- thyssenkrupp Polysius GmbH
- Reinhard Teutenberg
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for determining the mineralogy of drill solids
- Patent number 12,111,273
- Issue date Oct 8, 2024
- Schlumberger Technology Corporation
- Jonathan Mitchell
- E21 - EARTH DRILLING MINING
Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of metal or alloy coating
- Patent number 12,092,594
- Issue date Sep 17, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Small-angle X-ray scatterometry
- Patent number 12,085,521
- Issue date Sep 10, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Petro-steering methodologies during under balanced coiled tubing (U...
- Patent number 12,065,929
- Issue date Aug 20, 2024
- Saudi Arabian Oil Company
- Ferney Geovany Moreno Sierra
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-Ray Fluorescence Spectrometer and Power Supply Apparatus
- Publication number 20250172514
- Publication date May 29, 2025
- Shimadzu Corporation
- Yohei UKAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Handheld X-ray fluorescence, XRF, analyzer and a method for element...
- Publication number 20250172513
- Publication date May 29, 2025
- BRUKER NANO GMBH
- Tim Heek
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-Ray Fluorescence Spectrometer and Power Supply Apparatus
- Publication number 20250172515
- Publication date May 29, 2025
- Shimadzu Corporation
- Yohei UKAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALCULATING FILM THICKNESS OF GRAIN BOUNDARY OXIDE LAYER...
- Publication number 20250164422
- Publication date May 22, 2025
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Koji SASAKI
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20250162487
- Publication date May 22, 2025
- Veracio Ltd
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Application
SPECTROMETER
- Publication number 20250164421
- Publication date May 22, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Application
MONITORING NANOPARTICLE ADDITIVES IN WELLBORE TREATMENT FLUID USING...
- Publication number 20250146918
- Publication date May 8, 2025
- Halliburton Energy Services, Inc.
- Preston Andrew May
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...
- Publication number 20250146960
- Publication date May 8, 2025
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
FAST NONDESTRUCTIVE METHOD TO EVALUATE THE CURATIVE SYSTEM OF RUBBE...
- Publication number 20250137949
- Publication date May 1, 2025
- CNPC USA Corp.
- Scott MENG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20250137947
- Publication date May 1, 2025
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ken GOTO
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETEC...
- Publication number 20250130184
- Publication date Apr 24, 2025
- HORIBA, LTD.
- Shunsuke MURATA
- G01 - MEASURING TESTING
Information Patent Application
XRF MEASUREMENTS OF MULTIPHASE OILFIELD FLUIDS
- Publication number 20250076228
- Publication date Mar 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Reda Karoum
- G01 - MEASURING TESTING
Information Patent Application
XRF AND CALCIMETRY EVALUATION OF MULTIPHASE OILFIELD FLUIDS
- Publication number 20250076229
- Publication date Mar 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Reda Karoum
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20250081534
- Publication date Mar 6, 2025
- SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Junichi KOEZUKA
- G01 - MEASURING TESTING
Information Patent Application
PRODUCTION SOLUTIONS FOR HIGH-THROUGHPUT/PRECISION XPS METROLOGY US...
- Publication number 20250067691
- Publication date Feb 27, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...
- Publication number 20250062048
- Publication date Feb 20, 2025
- UNIVERSITAET HAMBURG
- Jonas BAUMANN
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION
- Publication number 20250060324
- Publication date Feb 20, 2025
- TOKYO ELECTRON LIMITED
- Francisco Machuca
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20250052704
- Publication date Feb 13, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Wei Ti LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND POWER SUPPLY DEVICE
- Publication number 20250031293
- Publication date Jan 23, 2025
- Shimadzu Corporation
- Yohei UKAI
- G01 - MEASURING TESTING
Information Patent Application
Adaptable X-Ray Analysis Apparatus
- Publication number 20250020601
- Publication date Jan 16, 2025
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240418661
- Publication date Dec 19, 2024
- Rigaku Corporation
- Yoshiyuki KATAOKA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240402101
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Tetsuya YONEDA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER
- Publication number 20240393268
- Publication date Nov 28, 2024
- Shimadzu Corporation
- Yuji MORIHISA
- G01 - MEASURING TESTING
Information Patent Application
AN X-RAY FLUORESCENCE SYSTEM
- Publication number 20240385129
- Publication date Nov 21, 2024
- Commonwealth Scientific and Industrial Research Organisation
- Brianna Ganly
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND X-RAY APERTURE MEMBER
- Publication number 20240385130
- Publication date Nov 21, 2024
- Shimadzu Corporation
- Goshi AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
Small-Angle X-Ray Scatterometry
- Publication number 20240377342
- Publication date Nov 14, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240361261
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240361263
- Publication date Oct 31, 2024
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING

by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Stop and go pig

Coincidence technique-based x-ray detection device and composition...

Method and system for analyzing prostate biopsy

Apparatus and method for biological analyte studying using x-ray fl...

Device for closing the input opening in the sample chamber in an x-...

X-ray fluorescence analyzer

X-ray analysis system and method with multi-source design

Systems and methods for interpreting high energy interactions

Method and measuring device for measuring objects by means of x-ray...

X ray fluorescence analyzer

X-ray fluorescence analyzer

Polarized, energy dispersive x-ray fluorescence system and method

X-ray fluorescence spectrometer

Inspection apparatus and inspection method

Spectrometer

X-ray fluorescence spectrometer

Detecting downhole fluid composition utilizing photon emission

Deposition system and method

Method for measuring distribution of pores in electrode for seconda...

Apparatus to operate a quality control in industrial production lin...

Seal element for a pipeline pig

Identification of mycotoxin absorption materials in clay deposits

X-ray fluorescence analyzer

Method for handling melt samples in a steelworks laboratory, and st...

Systems and methods for determining the mineralogy of drill solids

X-ray spectrometer and pulse height prediction program

Measurement of metal or alloy coating

Small-angle X-ray scatterometry

Monitoring properties of X-ray beam during X-ray analysis

Petro-steering methodologies during under balanced coiled tubing (U...

Patents Applicationslast 30 patents

X-Ray Fluorescence Spectrometer and Power Supply Apparatus

Handheld X-ray fluorescence, XRF, analyzer and a method for element...

X-Ray Fluorescence Spectrometer and Power Supply Apparatus

METHOD FOR CALCULATING FILM THICKNESS OF GRAIN BOUNDARY OXIDE LAYER...

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

SPECTROMETER

MONITORING NANOPARTICLE ADDITIVES IN WELLBORE TREATMENT FLUID USING...

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...

FAST NONDESTRUCTIVE METHOD TO EVALUATE THE CURATIVE SYSTEM OF RUBBE...

X-RAY ANALYSIS APPARATUS

SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETEC...

XRF MEASUREMENTS OF MULTIPHASE OILFIELD FLUIDS

XRF AND CALCIMETRY EVALUATION OF MULTIPHASE OILFIELD FLUIDS

SEMICONDUCTOR DEVICE

PRODUCTION SOLUTIONS FOR HIGH-THROUGHPUT/PRECISION XPS METROLOGY US...

X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...

HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

X-RAY FLUORESCENCE ANALYZER AND POWER SUPPLY DEVICE

Adaptable X-Ray Analysis Apparatus

PATTERNED X-RAY EMITTING TARGET

X-RAY FLUORESCENCE SPECTROMETER

X-RAY ANALYZER

X-RAY FLUORESCENCE ANALYZER

AN X-RAY FLUORESCENCE SYSTEM

X-RAY FLUORESCENCE ANALYZER AND X-RAY APERTURE MEMBER

Small-Angle X-Ray Scatterometry

INSPECTION APPARATUS AND INSPECTION METHOD

X-RAY ANALYZER

X-RAY FLUORESCENCE SPECTROMETER