by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Industry

CPC
G01N23/223

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/223by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
System and method for soil characterization
- Patent number 12,360,099
- Issue date Jul 15, 2025
- X-Centric Sciences Inc.
- Roozbeh Ravansari
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a semiconductor device
- Patent number 12,363,955
- Issue date Jul 15, 2025
- Semiconductor Energy Laboratory Co., Ltd.
- Junichi Koezuka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence system and x-ray source with electrically insula...
- Patent number 12,360,067
- Issue date Jul 15, 2025
- Sigray, Inc.
- Wenbing Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for K-edge-based X-ray imaging having improved...
- Patent number 12,360,060
- Issue date Jul 15, 2025
- Redlen Technologies, Inc.
- Krzysztof Iniewski
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing device for x-ray analysis
- Patent number 12,352,710
- Issue date Jul 8, 2025
- Shimadzu Corporation
- Yuta Saito
- G01 - MEASURING TESTING
Information Patent Grant
Multi-physical field measurement device for metal solidification pr...
- Patent number 12,345,666
- Issue date Jul 1, 2025
- Shanghai Jiaotong University
- Jiao Zhang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectroscopy analysis
- Patent number 12,345,667
- Issue date Jul 1, 2025
- Schlumberger Technology Corporation
- Sergey Mikhailovich Makarychev-Mikhailov
- G01 - MEASURING TESTING
Information Patent Grant
Methods for inspection of press-hardening steel surfaces prior to s...
- Patent number 12,345,696
- Issue date Jul 1, 2025
- GM Global Technology Operations LLC
- Hassan Ghassemi-Armaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement system and measurement method
- Patent number 12,345,159
- Issue date Jul 1, 2025
- Komatsu Ltd.
- Yuichi Kodama
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method for detection of soil heavy metal pollution using unmanned a...
- Patent number 12,339,240
- Issue date Jun 24, 2025
- University of Electronic Science and Technology of China
- Fang Huang
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Health-level measuring method, health-level determining apparatus,...
- Patent number 12,326,438
- Issue date Jun 10, 2025
- ORGANTECH, INC.
- Takashi Tsuji
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence (XRF) mapping for anode inspection
- Patent number 12,327,861
- Issue date Jun 10, 2025
- GM Global Technology Operations LLC
- Shaomao Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for quantitatively characterizing dendrite segregation and d...
- Patent number 12,326,434
- Issue date Jun 10, 2025
- NCS TESTING TECHNOLOGY CO., LTD
- Dongling Li
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for analyzing core using x-ray fluorescence
- Patent number 12,325,345
- Issue date Jun 10, 2025
- Veracio Ltd.
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Stop and go pig
- Patent number 12,320,461
- Issue date Jun 3, 2025
- Rosen IP AG
- Matthias Grote
- B08 - CLEANING
Information Patent Grant
Coincidence technique-based x-ray detection device and composition...
- Patent number 12,313,574
- Issue date May 27, 2025
- SHANDONG UNIVERSITY
- Chen Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for analyzing prostate biopsy
- Patent number 12,306,172
- Issue date May 20, 2025
- ProSight Ltd.
- Meir Weksler
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for biological analyte studying using x-ray fl...
- Patent number 12,306,120
- Issue date May 20, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Device for closing the input opening in the sample chamber in an x-...
- Patent number 12,298,262
- Issue date May 13, 2025
- Wolfgang Gehrlein
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,292,397
- Issue date May 6, 2025
- Shimadzu Corporation
- Yuji Morihisa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis system and method with multi-source design
- Patent number 12,292,396
- Issue date May 6, 2025
- SHENZHEN ANGSTROM EXCELLENCE TECHNOLOGY CO. LTD
- Xuena Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for interpreting high energy interactions
- Patent number 12,292,398
- Issue date May 6, 2025
- Veracio Ltd.
- Brandon Lee Goodchild Drake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and measuring device for measuring objects by means of x-ray...
- Patent number 12,287,302
- Issue date Apr 29, 2025
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Martin Leibfritz
- G01 - MEASURING TESTING
Information Patent Grant
X ray fluorescence analyzer
- Patent number 12,270,773
- Issue date Apr 8, 2025
- Shimadzu Corporation
- Yuji Morihisa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,265,042
- Issue date Apr 1, 2025
- Shimadzu Corporation
- Yasuyuki Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Polarized, energy dispersive x-ray fluorescence system and method
- Patent number 12,247,934
- Issue date Mar 11, 2025
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 12,247,935
- Issue date Mar 11, 2025
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Spectrometer
- Patent number 12,235,228
- Issue date Feb 25, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 12,235,229
- Issue date Feb 25, 2025
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION SYSTEM AND METHOD
- Publication number 20250237620
- Publication date Jul 24, 2025
- Purdue Research Foundation
- Aaron James Specht
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MAPPING IRREGULAR SURFACES
- Publication number 20250231128
- Publication date Jul 17, 2025
- IXRF, Inc.
- Robert Tisdale
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
RADIATION DETECTION ELEMENT, RADIATION DETECTOR, RADIATION DETECTIO...
- Publication number 20250224526
- Publication date Jul 10, 2025
- HORIBA, LTD.
- Koji ISHIKURA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTION DEVICE AND RADIATION DETECTOR
- Publication number 20250224351
- Publication date Jul 10, 2025
- HORIBA, LTD.
- Daisuke MATSUNAGA
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...
- Publication number 20250216347
- Publication date Jul 3, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Uri Hadar
- G01 - MEASURING TESTING
Information Patent Application
RECORDING APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20250208071
- Publication date Jun 26, 2025
- Rigaku Corporation
- Yuji HATAYAMA
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTING UNIT FOR AN X-RAY OPTICAL ELEMENT IN AN X-RAY FLUORESCENC...
- Publication number 20250198955
- Publication date Jun 19, 2025
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Bruno Schroth
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SEPARATOR FOR SORTING METALS FROM RECYCLED MATERIAL
- Publication number 20250196191
- Publication date Jun 19, 2025
- SGM MAGNETICS S.P.A.
- Stefano DANESI
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
SYSTEMS AND METHODS FOR MOBILE ELEMENTAL ANALYSIS
- Publication number 20250189467
- Publication date Jun 12, 2025
- IXRF, Inc.
- Robert Clayton Tisdale
- G01 - MEASURING TESTING
Information Patent Application
SILICA IN ROCK SAMPLES
- Publication number 20250189508
- Publication date Jun 12, 2025
- Chevron U.S.A. Inc.
- Eliza MATHIA
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Fluorescence Spectrometer and Power Supply Apparatus
- Publication number 20250172514
- Publication date May 29, 2025
- Shimadzu Corporation
- Yohei UKAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Handheld X-ray fluorescence, XRF, analyzer and a method for element...
- Publication number 20250172513
- Publication date May 29, 2025
- BRUKER NANO GMBH
- Tim Heek
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-Ray Fluorescence Spectrometer and Power Supply Apparatus
- Publication number 20250172515
- Publication date May 29, 2025
- Shimadzu Corporation
- Yohei UKAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALCULATING FILM THICKNESS OF GRAIN BOUNDARY OXIDE LAYER...
- Publication number 20250164422
- Publication date May 22, 2025
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Koji SASAKI
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20250162487
- Publication date May 22, 2025
- Veracio Ltd
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Application
SPECTROMETER
- Publication number 20250164421
- Publication date May 22, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Application
MONITORING NANOPARTICLE ADDITIVES IN WELLBORE TREATMENT FLUID USING...
- Publication number 20250146918
- Publication date May 8, 2025
- Halliburton Energy Services, Inc.
- Preston Andrew May
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...
- Publication number 20250146960
- Publication date May 8, 2025
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
FAST NONDESTRUCTIVE METHOD TO EVALUATE THE CURATIVE SYSTEM OF RUBBE...
- Publication number 20250137949
- Publication date May 1, 2025
- CNPC USA Corp.
- Scott MENG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20250137947
- Publication date May 1, 2025
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ken GOTO
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETEC...
- Publication number 20250130184
- Publication date Apr 24, 2025
- HORIBA, LTD.
- Shunsuke MURATA
- G01 - MEASURING TESTING
Information Patent Application
XRF MEASUREMENTS OF MULTIPHASE OILFIELD FLUIDS
- Publication number 20250076228
- Publication date Mar 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Reda Karoum
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20250081534
- Publication date Mar 6, 2025
- SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Junichi KOEZUKA
- G01 - MEASURING TESTING
Information Patent Application
XRF AND CALCIMETRY EVALUATION OF MULTIPHASE OILFIELD FLUIDS
- Publication number 20250076229
- Publication date Mar 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Reda Karoum
- G01 - MEASURING TESTING
Information Patent Application
PRODUCTION SOLUTIONS FOR HIGH-THROUGHPUT/PRECISION XPS METROLOGY US...
- Publication number 20250067691
- Publication date Feb 27, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...
- Publication number 20250062048
- Publication date Feb 20, 2025
- UNIVERSITAET HAMBURG
- Jonas BAUMANN
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION
- Publication number 20250060324
- Publication date Feb 20, 2025
- TOKYO ELECTRON LIMITED
- Francisco Machuca
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20250052704
- Publication date Feb 13, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Wei Ti LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND POWER SUPPLY DEVICE
- Publication number 20250031293
- Publication date Jan 23, 2025
- Shimadzu Corporation
- Yohei UKAI
- G01 - MEASURING TESTING
Information Patent Application
Adaptable X-Ray Analysis Apparatus
- Publication number 20250020601
- Publication date Jan 16, 2025
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING

by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for soil characterization

Method for manufacturing a semiconductor device

X-ray fluorescence system and x-ray source with electrically insula...

Systems and methods for K-edge-based X-ray imaging having improved...

Signal processing device for x-ray analysis

Multi-physical field measurement device for metal solidification pr...

X-ray fluorescence spectroscopy analysis

Methods for inspection of press-hardening steel surfaces prior to s...

Measurement system and measurement method

Method for detection of soil heavy metal pollution using unmanned a...

Health-level measuring method, health-level determining apparatus,...

X-ray fluorescence (XRF) mapping for anode inspection

Method for quantitatively characterizing dendrite segregation and d...

Systems and methods for analyzing core using x-ray fluorescence

Stop and go pig

Coincidence technique-based x-ray detection device and composition...

Method and system for analyzing prostate biopsy

Apparatus and method for biological analyte studying using x-ray fl...

Device for closing the input opening in the sample chamber in an x-...

X-ray fluorescence analyzer

X-ray analysis system and method with multi-source design

Systems and methods for interpreting high energy interactions

Method and measuring device for measuring objects by means of x-ray...

X ray fluorescence analyzer

X-ray fluorescence analyzer

Polarized, energy dispersive x-ray fluorescence system and method

X-ray fluorescence spectrometer

Inspection apparatus and inspection method

Spectrometer

X-ray fluorescence spectrometer

Patents Applicationslast 30 patents

DETECTION SYSTEM AND METHOD

SYSTEMS AND METHODS FOR MAPPING IRREGULAR SURFACES

RADIATION DETECTION ELEMENT, RADIATION DETECTOR, RADIATION DETECTIO...

RADIATION DETECTION DEVICE AND RADIATION DETECTOR

NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...

RECORDING APPARATUS, SYSTEM, METHOD, AND PROGRAM

ADJUSTING UNIT FOR AN X-RAY OPTICAL ELEMENT IN AN X-RAY FLUORESCENC...

X-RAY SEPARATOR FOR SORTING METALS FROM RECYCLED MATERIAL

SYSTEMS AND METHODS FOR MOBILE ELEMENTAL ANALYSIS

SILICA IN ROCK SAMPLES

X-Ray Fluorescence Spectrometer and Power Supply Apparatus

Handheld X-ray fluorescence, XRF, analyzer and a method for element...

X-Ray Fluorescence Spectrometer and Power Supply Apparatus

METHOD FOR CALCULATING FILM THICKNESS OF GRAIN BOUNDARY OXIDE LAYER...

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

SPECTROMETER

MONITORING NANOPARTICLE ADDITIVES IN WELLBORE TREATMENT FLUID USING...

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...

FAST NONDESTRUCTIVE METHOD TO EVALUATE THE CURATIVE SYSTEM OF RUBBE...

X-RAY ANALYSIS APPARATUS

SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETEC...

XRF MEASUREMENTS OF MULTIPHASE OILFIELD FLUIDS

SEMICONDUCTOR DEVICE

XRF AND CALCIMETRY EVALUATION OF MULTIPHASE OILFIELD FLUIDS

PRODUCTION SOLUTIONS FOR HIGH-THROUGHPUT/PRECISION XPS METROLOGY US...

X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...

HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

X-RAY FLUORESCENCE ANALYZER AND POWER SUPPLY DEVICE

Adaptable X-Ray Analysis Apparatus