by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Industry

CPC
G01N23/223

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/223by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Detecting downhole fluid composition utilizing photon emission
- Patent number 12,221,884
- Issue date Feb 11, 2025
- Halliburton Energy Services, Inc.
- Christopher Michael Jones
- G01 - MEASURING TESTING
Information Patent Grant
Deposition system and method
- Patent number 12,211,756
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Hao Cheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus to operate a quality control in industrial production lin...
- Patent number 12,181,429
- Issue date Dec 31, 2024
- DE.TEC.TOR S.r.l.
- Giuseppe Pitta'
- G01 - MEASURING TESTING
Information Patent Grant
Seal element for a pipeline pig
- Patent number 12,163,591
- Issue date Dec 10, 2024
- Rosen Swiss AG
- Patrik Rosen
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Identification of mycotoxin absorption materials in clay deposits
- Patent number 12,158,461
- Issue date Dec 3, 2024
- Halliburton Energy Services, Inc.
- Marina Carbo
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
Method for handling melt samples in a steelworks laboratory, and st...
- Patent number 12,123,862
- Issue date Oct 22, 2024
- thyssenkrupp Polysius GmbH
- Reinhard Teutenberg
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for determining the mineralogy of drill solids
- Patent number 12,111,273
- Issue date Oct 8, 2024
- Schlumberger Technology Corporation
- Jonathan Mitchell
- E21 - EARTH DRILLING MINING
Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of metal or alloy coating
- Patent number 12,092,594
- Issue date Sep 17, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Small-angle X-ray scatterometry
- Patent number 12,085,521
- Issue date Sep 10, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Petro-steering methodologies during under balanced coiled tubing (U...
- Patent number 12,065,929
- Issue date Aug 20, 2024
- Saudi Arabian Oil Company
- Ferney Geovany Moreno Sierra
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation detector and radiation detection apparatus
- Patent number 12,044,816
- Issue date Jul 23, 2024
- Horiba, Ltd.
- Daisuke Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
Adaptable X-ray analysis apparatus
- Patent number 12,031,925
- Issue date Jul 9, 2024
- Malvern Panalytical B.V.
- Detlef Beckers
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Scanning mode application of neutron-induced gamma analysis for soi...
- Patent number 12,031,928
- Issue date Jul 9, 2024
- Auburn University
- Bryan A. Chin
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Mammography imaging system using X-ray fluorescence
- Patent number 12,029,599
- Issue date Jul 9, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for sorting of diamonds
- Patent number 12,030,086
- Issue date Jul 9, 2024
- BOTSWANA INTERNATIONAL UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Adamu Murtala Zungeru
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method of using a dissolvable deployment device for the transfer of...
- Patent number 12,025,001
- Issue date Jul 2, 2024
- Talgat Shokanov
- E21 - EARTH DRILLING MINING
Information Patent Grant
Signal processing method, learning model generation method, signal...
- Patent number 12,019,037
- Issue date Jun 25, 2024
- Horiba, Ltd.
- Shunsuke Murata
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Enhanced security threat detection
- Patent number 11,966,004
- Issue date Apr 23, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Portable assessment kit and method for measuring metal content of a...
- Patent number 11,965,838
- Issue date Apr 23, 2024
- 3AWater Oy
- Tuomo Nissinen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for acquiring elastic modulus of rock containing...
- Patent number 11,965,839
- Issue date Apr 23, 2024
- INST. OF GEOL. & GEOPHYS., CN ACAD. OF SCIENCES
- Beixiu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Surface analyzer
- Patent number 11,965,841
- Issue date Apr 23, 2024
- Shimadzu Corporation
- Akira Ogoshi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...
- Publication number 20250062048
- Publication date Feb 20, 2025
- UNIVERSITAET HAMBURG
- Jonas BAUMANN
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION
- Publication number 20250060324
- Publication date Feb 20, 2025
- TOKYO ELECTRON LIMITED
- Francisco Machuca
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20250052704
- Publication date Feb 13, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Wei Ti LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND POWER SUPPLY DEVICE
- Publication number 20250031293
- Publication date Jan 23, 2025
- Shimadzu Corporation
- Yohei UKAI
- G01 - MEASURING TESTING
Information Patent Application
Adaptable X-Ray Analysis Apparatus
- Publication number 20250020601
- Publication date Jan 16, 2025
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240418661
- Publication date Dec 19, 2024
- Rigaku Corporation
- Yoshiyuki KATAOKA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240402101
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Tetsuya YONEDA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER
- Publication number 20240393268
- Publication date Nov 28, 2024
- Shimadzu Corporation
- Yuji MORIHISA
- G01 - MEASURING TESTING
Information Patent Application
AN X-RAY FLUORESCENCE SYSTEM
- Publication number 20240385129
- Publication date Nov 21, 2024
- Commonwealth Scientific and Industrial Research Organisation
- Brianna Ganly
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND X-RAY APERTURE MEMBER
- Publication number 20240385130
- Publication date Nov 21, 2024
- Shimadzu Corporation
- Goshi AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
Small-Angle X-Ray Scatterometry
- Publication number 20240377342
- Publication date Nov 14, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240361261
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240361263
- Publication date Oct 31, 2024
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR OPTIMIZED SAMPLE IRRADIATION IN A CABINET IRR...
- Publication number 20240353356
- Publication date Oct 24, 2024
- KUB TECHNOLOGIES, INC. DBA KUBTEC
- Vikram Butani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PEAK IDENTIFICATION ANALYSIS PROGRAM, AND X-RAY FLUORESCENT SPECTRO...
- Publication number 20240337612
- Publication date Oct 10, 2024
- Rigaku Corporation
- Wataru MATSUDA
- G01 - MEASURING TESTING
Information Patent Application
SILICON DRIFT DETECTION ELEMENT, SILICON DRIFT DETECTOR, AND RADIAT...
- Publication number 20240337765
- Publication date Oct 10, 2024
- HORIBA, Ltd.
- Daisuke MATSUNAGA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEM-EDS HOLDER DEVICE FOR THIN FILTER-TYPE SAMPLE
- Publication number 20240328968
- Publication date Oct 3, 2024
- Korea Institute of Science and Technology
- Hye Jung Chang
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER
- Publication number 20240328971
- Publication date Oct 3, 2024
- Shimadzu Corporation
- Yuji MORIHISA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...
- Publication number 20240310308
- Publication date Sep 19, 2024
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Martin Leibfritz
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
- Publication number 20240309759
- Publication date Sep 19, 2024
- Talgat Shokanov
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...
- Publication number 20240295512
- Publication date Sep 5, 2024
- AKTSIONERNOE OBSHCHESTVO "CHEPETSKIJ MEKHANICHESKIJ ZAVOD
- Olga Alekseevna KARAVAEVA
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20240286541
- Publication date Aug 29, 2024
- Veracio Ltd
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Application
ANALYSIS METHOD OF PHOTOSENSITIVE COMPOSITION, PRODUCTION METHOD OF...
- Publication number 20240280518
- Publication date Aug 22, 2024
- FUJIFILM CORPORATION
- Hideo NAGASAKI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR X-RAY FLUORESCENCE IMAGING
- Publication number 20240280519
- Publication date Aug 22, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Yurun LIU
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM
- Publication number 20240264098
- Publication date Aug 8, 2024
- Rigaku Corporation
- Tsutomu TADA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING A LAYER OF A SEMICONDUCTOR DEVIC...
- Publication number 20240241067
- Publication date Jul 18, 2024
- Samsung Electronics Co., Ltd.
- Seungchul Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CORRECTION TECHNIQUES FOR MATERIAL CLASSIFICATION
- Publication number 20240228181
- Publication date Jul 11, 2024
- Sortera Technologies Inc.
- Lakshmi Chellappan
- G01 - MEASURING TESTING
Information Patent Application
SEAL ELEMENT FOR A PIPELINE PIG
- Publication number 20240200664
- Publication date Jun 20, 2024
- ROSEN SWISS AG
- Patrik Rosen
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...

by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Detecting downhole fluid composition utilizing photon emission

Deposition system and method

Method for measuring distribution of pores in electrode for seconda...

Apparatus to operate a quality control in industrial production lin...

Seal element for a pipeline pig

Identification of mycotoxin absorption materials in clay deposits

X-ray fluorescence analyzer

Method for handling melt samples in a steelworks laboratory, and st...

Systems and methods for determining the mineralogy of drill solids

X-ray spectrometer and pulse height prediction program

Measurement of metal or alloy coating

Small-angle X-ray scatterometry

Monitoring properties of X-ray beam during X-ray analysis

Petro-steering methodologies during under balanced coiled tubing (U...

Method and system for non-destructive metrology of thin layers

Radiation detector and radiation detection apparatus

Adaptable X-ray analysis apparatus

Scanning mode application of neutron-induced gamma analysis for soi...

Mammography imaging system using X-ray fluorescence

Method and system for sorting of diamonds

Method of using a dissolvable deployment device for the transfer of...

Signal processing method, learning model generation method, signal...

Apparatus and method for x-ray fluorescence analysis

Patterned x-ray emitting target

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Enhanced security threat detection

Portable assessment kit and method for measuring metal content of a...

Method and system for acquiring elastic modulus of rock containing...

Surface analyzer

Patents Applicationslast 30 patents

X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...

HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

X-RAY FLUORESCENCE ANALYZER AND POWER SUPPLY DEVICE

Adaptable X-Ray Analysis Apparatus

PATTERNED X-RAY EMITTING TARGET

X-RAY FLUORESCENCE SPECTROMETER

X-RAY ANALYZER

X-RAY FLUORESCENCE ANALYZER

AN X-RAY FLUORESCENCE SYSTEM

X-RAY FLUORESCENCE ANALYZER AND X-RAY APERTURE MEMBER

Small-Angle X-Ray Scatterometry

INSPECTION APPARATUS AND INSPECTION METHOD

X-RAY ANALYZER

X-RAY FLUORESCENCE SPECTROMETER

SYSTEM AND METHOD FOR OPTIMIZED SAMPLE IRRADIATION IN A CABINET IRR...

PEAK IDENTIFICATION ANALYSIS PROGRAM, AND X-RAY FLUORESCENT SPECTRO...

SILICON DRIFT DETECTION ELEMENT, SILICON DRIFT DETECTOR, AND RADIAT...

SEM-EDS HOLDER DEVICE FOR THIN FILTER-TYPE SAMPLE

X-RAY FLUORESCENCE ANALYZER

MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...

METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...

METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

ANALYSIS METHOD OF PHOTOSENSITIVE COMPOSITION, PRODUCTION METHOD OF...

APPARATUS AND METHOD FOR X-RAY FLUORESCENCE IMAGING

X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM

APPARATUS AND METHOD FOR MEASURING A LAYER OF A SEMICONDUCTOR DEVIC...

CORRECTION TECHNIQUES FOR MATERIAL CLASSIFICATION

SEAL ELEMENT FOR A PIPELINE PIG