BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a simplified plan view, partly schematic, of an apparatus in accordance with an embodiment of the invention.
FIG. 2 is a vertical cross-sectional view, partly schematic, of the apparatus 10 of FIG. 1 taken along line 2-2 in FIG. 1.
FIG. 3 is an enlarged view of the cross-sectional view of FIG. 2 with respect to a load lock chamber unit of the apparatus of FIG. 1.
FIG. 4 is a vertical cross-sectional view, partly schematic, of the load lock chamber unit taken along line 4-4 in FIG. 1.
FIG. 5 is an enlarged, top plan view of a robotic transfer mechanism included in the apparatus in accordance with an embodiment of the invention.
FIG. 6 is a rear view of the robotic transfer mechanism taken along line 6-6 in FIG. 5.
FIG. 7 is a simplified, partially schematized, cross-sectional view of a vacuum process chamber unit configured for a plasma enhanced chemical vapor deposition process in accordance with an embodiment of the invention.
FIG. 8 is a top plan view, partially schematized, of an apparatus in accordance with an alternative embodiment of the invention.
FIG. 9 is a top plan view, partially schematized, of an apparatus in accordance with another alternative embodiment of the invention.
FIG. 10 is a top plan view, partially schematized, of an apparatus in accordance with another alternative embodiment of the invention.
FIG. 11 is a process flow diagram of a method for processing substrates in accordance with an embodiment of the invention.
FIG. 12 is a process flow diagram of a method for processing substrates in accordance with another embodiment of the invention.