Claims
- 1. An apparatus for releasing at least a portion of a carrier film from at least one semiconductor die adhered thereto, comprising:
a base member including an upwardly extending periphery configured to receive and engage a peripheral frame supporting the carrier film with the at least one semiconductor die already adhered thereto; and a plurality supports protruding from said base member and located within said upwardly extending periphery, said plurality of supports being sufficiently laterally spaced apart from one another to permit deflection of portions of the carrier film therebetween responsive to a pressure differential across the carrier film.
- 2. The apparatus of claim 1, wherein said base member includes a vacuum port therethrough.
- 3. The apparatus of claim 1, wherein said plurality of supports comprises a plurality of raised members extending upwardly from said plate member, each raised member of said plurality of raised members extending approximately the same distance from said plate member.
- 4. The apparatus of claim 1, comprising a perforated screen.
- 5. The apparatus of claim 4, wherein said perforated screen includes a plurality of peaks and a plurality of valleys.
- 6. The apparatus of claim 5, wherein said plurality of peaks form said plurality of supports.
- 7. The apparatus according to claim 4, wherein said plurality of supports extend through said perforated screen.
- 8. The apparatus of claim 1, wherein said base member includes a plurality of fenestrations.
- 9. The apparatus of claim 8, wherein each of said plurality of supports is positioned between at least two of said plurality of fenestrations.
- 10. The apparatus of claim 1, further comprising a die removal component for removing a semiconductor die adhered to the carrier film.
- 11. The apparatus of claim 10, wherein said die removal component is configured to apply positive pressure to a back side of said semiconductor die adhered to the carrier film.
- 12. The apparatus of claim 10, wherein said die removal component is configured to pick said semiconductor die from the carrier film.
- 13. An apparatus for at least partially releasing a carrier film from a semiconductor die, the apparatus comprising:
a base member including a raised periphery and a plurality of raised members, said plurality of raised members being laterally spaced apart from one another, each raised member of said plurality having substantially the same height; a vacuum source communicating with an area below a top of said raised members so as to reduce adherence of the carrier film from a back side of the semiconductor die; and a die removal component for removing a single die from the carrier film.
- 14. The apparatus of claim 13, wherein said die removal component is positioned above the base member and is configured to pick said single die from the carrier film.
- 15. The apparatus of claim 14, wherein said die removal component comprises a vacuum collett.
- 16. The apparatus of claim 13, wherein said die removal component is positioned below a carrier film positioned on the base member and is configured to apply positive pressure to the back side of the single die.
- 17. The apparatus of claim 16, wherein said die removal component comprises an upwardly extendible piston.
- 18. The apparatus of claim 13, wherein said plurality of raised members are formed by a perforated screen.
- 19. A system for releasing at least a portion of a carrier film from at least one selected semiconductor die, comprising:
a base member configured to at least partially support a the carrier film having a semiconductor wafer already adhered thereto, said base member including a plurality of supports located within said periphery and extending substantially to a location at which the carrier film is located when the carrier film is at least partially supported by said base member, said plurality of supports being sufficiently laterally spaced apart from one another to permit deflection of portions of the carrier film therebetween responsive to a pressure differential across the carrier film; a negative pressure source in communication with said base to draw the carrier film away from portions of a back side of the semiconductor wafer into locations between said plurality of supports; and a die removal component laterally positionable in a plurality of locations relative to the semiconductor wafer.
- 20. The system of claim 19, wherein said die removal component is located over said base and is configured to pick the at least one selected semiconductor die from the carrier film.
- 21. The system of claim 20, wherein said die removal component comprises a vacuum collet.
- 22. The system of claim 19, wherein said die removal component is:
located beneath said location at which the carrier film is located when the carrier film is at least partially supported by said base member; and configured to apply a positive pressure to a back side of the at least one selected semiconductor die.
- 23. The system of claim 22, wherein said die removal component includes an extendible piston.
- 24. The system of claim 19, wherein said base member includes a perforated screen.
- 25. The system of claim 24, wherein said perforated screen forms said plurality of supports.
- 26. The system of claim 24, wherein said plurality of supports extend through said perforated screen.
- 27. The system of claim 19, further comprising a base positioning mechanism for moving said base beneath a desired location of the wafer.
- 28. The system of claim 27, wherein said base positioning mechanism moves said base to a location beneath the at least one selected semiconductor die.
CROSS-REFERENCE TO RELATED APPLICATION
[0001] This application is a continuation of application Ser. No. 09/140,920, filed Aug. 26, 1998, pending.
Continuations (1)
|
Number |
Date |
Country |
Parent |
09140920 |
Aug 1998 |
US |
Child |
09772792 |
Jan 2001 |
US |