1. Field of Art
The disclosure relates to forming a layer of material on a substrate using atomic layer deposition (ALD).
2. Description of the Related Art
Atomic layer deposition (ALD) is one way of depositing material on a substrate. ALD uses the bonding force of a chemisorbed molecule that is different from the bonding force of a physisorbed molecule. In ALD, source precursor is adsorbed onto the surface of a substrate and then purged with an inert gas. As a result, physisorbed molecules of the source precursor (bonded by the Van der Waals force) are desorbed from the substrate. However, chemisorbed molecules of the source precursor are covalently bonded, and hence these molecules are strongly adsorbed on the substrate and not desorbed from the substrate during purging or evacuating. The chemisorbed molecules of the source precursor (adsorbed on the substrate) react with and/or are replaced by molecules of reactant precursor. Then, the excessive precursor or physisorbed molecules are removed by injecting the purge gas and/or pumping the chamber, producing a final atomic layer.
Embodiments relate to performing atomic layer deposition (ALD) on a substrate using an array of injector modules having injection portions facing the substrate and placed in a plane parallel to the surface of the substrate onto which an ALD layer is deposited. The plurality of injector modules that form the array are, in some embodiments, configured in a regular array such as in a matrix of columns and/or rows of injector modules. Each injector module of the array is configured so that a corresponding precursor output portion of each module confronts a substrate and is separated from the substrate by a predetermined distance.
Each of the injector modules of the array injects both source precursor and reactant precursor onto the substrate. Injecting both source precursor and reactant precursor using the same injector module reduces the displacement of a substrate needed to deposit a layer of material. In order to deposit the layer on a portion of the substrate, the portion is exposed to both the source precursor and the reactant precursor. Because each injector module of the array provides both reactant and source precursors simultaneously, the relative displacement between the substrate and the injector modules can be small.
Embodiments are described herein with reference to the accompanying drawings. Principles disclosed herein may, however, be embodied in many different forms and should not be construed as being limited to the embodiments set forth herein. In the description, details of well-known features and techniques may be omitted to avoid unnecessarily obscuring the features of the embodiments.
In the drawings, like reference numerals in the drawings denote like elements. The shape, size and regions, and the like, of the drawing may be exaggerated for clarity.
Embodiments relate to performing atomic layer deposition (ALD) on a substrate using an array of injector modules having injection portions facing the substrate placed in a plane parallel to the surface of the substrate onto which an ALD layer is deposited. The plurality of injector modules that form the array are, in some embodiments, configured in a regular array such as in a matrix of columns and/or rows of injector modules. In other embodiments of the array, the injector modules are configured in a periodic pattern. Each injector module of the array is configured so that a corresponding precursor output portion of each module is disposed in a plane facing and parallel to a surface of a substrate and is separated from the substrate by a predetermined distance.
Each of the injector modules of the array injects both source precursor and reactant precursor onto the substrate. Injecting both source precursor and reactant precursor using the same injector modules reduces the displacement of a substrate needed to deposit a layer of material. To deposit the layer on a portion of the substrate, the portion is exposed to both the source precursor and the reactant precursor. Because each injector module of the array provides both reactant and source precursors simultaneously, the relative displacement between the substrate and the injector modules used to deposit a layer of material can be small. That is, to deposit a layer of material the relative displacement distance in a width direction of the substrate may be shorter than the width Ω of the substrate and the relative displacement distance in a length direction of the substrate may be shorter than the length of the substrate.
The process chamber enclosed by the walls may be maintained in a vacuum state to prevent contaminants from affecting the deposition process. The process chamber 110 contains a susceptor 128 which receives a substrate 120. The susceptor 128 is placed on a support plate 124 for a sliding movement.
The susceptor 128 may be secured to brackets 111 that move across an extended bar 138 with screws formed thereon. The brackets 111 have corresponding screws formed in their holes receiving the extended bar 138. The extended bar 138 is secured to a spindle of a motor 114, and hence, the extended bar 138 rotates as the spindle of the motor 114 rotates. The rotation of the extended bar 138 causes the brackets 111 (and therefore the susceptor 128) to make a linear movement on the support plate 124. By controlling the speed and rotation direction of the motor 114, the speed and the direction of the linear movement of the susceptor 128 can be controlled. The use of a motor 114 and the extended bar 138 is merely an example of a mechanism for moving the susceptor 128.
When using such linear deposition device 100, a minimum stroke distance for performing the ALD on the entire susceptor 128 is 3L where L represents the length of the substrate 120 as illustrated in
As shown by arrows in
As described above, an array of injection modules 204, whether arranged as shown in
One embodiment of using an injection module array 200 and non-linear motion profiles is schematically illustrated in
The array deposition device 300 of
For array deposition devices, such as device 300, it is possible to use a combination of a first motion profile and a second motion profile so that portions of the substrate 312 pass below more injection modules of the array 304, thereby increasing a deposition rate of a corresponding layer. Conventionally, the moving mechanism 316 would translate the susceptor and attached substrate linearly to correspond to the single row of linearly arranged injection modules. However, for injection modules configured as an array, as disclosed herein, the moving mechanism 316 is not limited to linear translation because the injection modules are arranged in a two-dimensional array, and not a single “one dimensional” row. As such, the example moving mechanism 316 is configured for double planetary movement and includes shafts 318, 320, a cam plate 324 connected to the shafts 314, 320, and two motors 328, 332 for rotating the shafts 318, 320.
In one embodiment, the moving mechanism 316 causes the susceptor 308 (and the substrate 312) to move in directions indicated by circles 336, 340. The circle 336 shown by a solid line represents a primary motion profile of shaft 320 and the circles 340 shown by dashed lines represent a secondary motion profile of shaft 318. Each complete rotational movement of the shaft 318 corresponds to ⅙ of the entire circular movement of shaft 320. Each of the circles 340 corresponds to an additional ⅙ of the entire circular movement of the shaft 318. In this way, the susceptor 308 makes repeated “rotations,” each having a first radius, during the performance of a single “revolution,” which has a second radius.
In other embodiments, different movement motions such as repeated straight linear movement, elliptic movement or irregular movement of the susceptor 308 may be used.
In other embodiments, the susceptor may move along a different motion profile. For example, the susceptor may move along only the primary motion profile without movement along the secondary motion profile. Further, the susceptor may move along in a reciprocal linear motion profile instead of circular or elliptic motion profile.
Each injector array, regardless of the specific two-dimensional array configuration, includes a plurality of injection modules that provide both source precursor and reactant precursor to a substrate.
The conduit 404 is connected to sources of various gases via valves 408, 412. The valves 408, 412 can be switched on or off to selectively connect the conduit 404 to the sources of the gases.
The channel 512 is formed in the outer periphery of the body 560 at a first distance from a center of the body, as measured from O-O′. In one embodiment, the channel 512 carries reactant precursor gas received via the conduit 404. The reactant precursor travels via perforations or slit 530 to an injection chamber 536 having a width of WE1. The substrate 120 is injected with the reactant precursor below the injection chamber 536. As a result, the source precursor may react or replace source precursor adsorbed on the substrate 120 and form a layer of material on the substrate 120.
The reactant precursor moves through a constriction zone 552 and is discharged via an exhaust 542. The exhaust 542 is at a third distance from the center of the body that is less than the first distance but greater than the distances from the center corresponding to separation gas channel 518, exhaust 544, and the channel 514, as described below. The constriction zone 552 has a height HE1 that is smaller than the width WE1 of the injection chamber 536. In one embodiment, the height HE1 is from 1 mm to 4 mm. Due to the reduced size of passage in the constriction zone 552, the speed of the reactant precursor in the constriction zone 552 is increased while the pressure of the reactant precursor is decreased in the constriction zone 552 compared to the reactant precursor in the injection chamber 536. Thus, the reactant precursor facilitates the removal of excess reactant precursor (e.g., reactant precursor molecules physisorbed on the substrate 120) while leaving the deposited material intact on the substrate 120.
To cause sufficient Bernoulli effect in the constriction zone 552, the height HE1 of the constriction zone 552 is smaller than ⅔ of the width WE1, and more preferably smaller than ⅓ of the diameter WE1. The constriction zone 552 also enables the reactant precursor to form self-sustaining laminar flow to cause the reactant precursor to react or replace the source precursor in a uniform manner. The constriction zone 552 reduces leaking or diffusion of reactant precursor beyond outer wall 537 of the injection module 204 by facilitating discharge of the reactant precursor through the exhaust 542 due to pressure at the constriction zone 552 that is lower than the pressure gap (with height of h) between the outer wall 537 and the substrate 120. Whenever the injection module 204 is moving relative to the substrate 120, the molecules of the reactant precursor are adsorbed on the substrate 120 across an area having an outer diameter of DR.
The channel 514 is formed at a second distance less than the first distance that is near center axis O-O′ of the injection module 204. In one embodiment, the channel 514 carries source precursor. The source precursor in the channel 514 is injected into an injection chamber 538 via a perforation 532. The injection chamber 538 has a diameter of WE2. The portion of the substrate 120 below the injection chamber 538 is injected with the source precursor. Part of the injected source precursor is adsorbed on the substrate 120 while remaining excess source precursor is discharged via the constriction zone 554 to an exhaust 544. The constriction zone 554 has a height HE2 that is smaller than the diameter WE2 of the injection chamber 538. The exhaust 544 is at a fourth distance that is between the fifth distance (corresponding to the separation gas channel 518 described below) and the second distance (corresponding to channel 514).
As a result, the pressure of the source precursor drops and the speed of the source precursor increases as the source precursor passes through the constriction zone 554, facilitating removal of excess source precursor (e.g., source precursor molecules physisorbed on the substrate 120) while leaving source precursor molecules chemisorbed on the substrate 120 intact.
To cause sufficient Bernoulli effect in the constriction zone 554, the height HE2 of the constriction zone 554 is smaller than ⅔ of the diameter WE2, and more preferably smaller than ⅓ of the diameter WE2. The constriction zone 554 also enables the source precursor to form self-sustaining laminar flow to adsorb the source precursor in a uniform manner. When the injection module 204 moves relative to the substrate 120, an area with diameter Ds is exposed to the source precursor.
The channel 518 carries separation gas (e.g., inert gas such as Argon). The separation gas forms an air curtain between the portion of the injection module 204 injecting the source precursor and the portion of the injection module 204 injecting the reactant precursor. In this way, the mixing of the source precursor and the reactant precursor is prevented from occurring at places other than on the substrate 120. Hence, formation of particles due to the reaction between source precursor and the reactant precursor can be prevented. The channel 518 is disposed at a fifth distance from the center of the body between the third distance (corresponding to exhaust 542) and the fourth distance (corresponding to exhaust 544).
As the injection module 204 moves over the substrate 120, the portion of the substrate 120 previously exposed to the source precursor is subsequently exposed to the reactant precursor. That is, the area represented by diameter Ds is exposed to the source precursor and then the reactant precursor. As a result of the reaction between the source precursor and the reactant precursor, a layer of material is deposited on the substrate 120 that is an intersection of areas defined by diameters DR and DS as the substrate and injection modules of the array move relative to one another.
In one embodiment, the distance h is either a function of diameter Ds or may be set to a fixed value, for example, in the range of 0.1 mm to 3 mm. For example, the distance h is set to a value less than one tenth of DS to minimize the precursor leak through this gap.
The body 560 of the injection module 204 is also formed with exhausts 542, 544 for discharging the excess reactant precursor and the excess source precursor, respectively. The exhausts 542, 544 are connected to the injection chambers 536, 538 via constriction zones 552 and 554.
Although the injection module 204 of
This application claims priority to and the benefit of U.S. Provisional Application No. 61/971,427, filed Mar. 27, 2014, which is incorporated by reference in its entirety.
Number | Date | Country | |
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61971427 | Mar 2014 | US |