1. Field of the Invention
The present invention relates to a technique of signal transmission between devices such as multiple processors and memories (for example, between digital circuits constructed by CMOSs or between their functional blocks) in an information processing apparatus, and in particular to a technique for speeding up bus transmission which a plurality of elements are connected to a same transmission line for transferring data. In particular, the present invention relates to a bus to which a plurality of memory modules and a memory controller are connected and to a system using that bus.
2. Description of Related Art
As a bus system that is connected with many nodes and intended for high-speed data transfer, is mentioned a non-contact bus line of Japanese Unexamined Patent Laid-Open No. 7-141079 (U.S. Pat. No. 5,638,402).
However, in the conventional technique of 7-141079 (U.S. Pat. No. 5,638,402), the line length occupied by a directional coupler decides module intervals. Accordingly, in order to shorten the module intervals, it is necessary to shorten the line length of the directional coupler. However, shorter line length becomes a cause of reducing the transmission efficiency, i.e., degree of coupling, and thus, it is impossible to make each interval less than certain length. Thus, a first problem is to realize high-density mounting of memories by making intervals between memory modules smaller.
A second problem is that, as transmission speed becomes higher in high-speed data transmission, waveform distortion increases owing to frequency-dependent effects such as the skin effect. This appears as a phenomenon that pulse waveform becomes dull at its rising and falling shoulders, and owing to this influence, appears as an increase of skew when a receiver takes in the pulse waveform. Namely, since the shoulders of the pulse waveform inputted into the receiver become dull, time when a signal exceeds or falls short of the receiver's reference voltage (Vref) increases. As a result, receiver's take-in time increases, causing the increase of the skew.
The reason why the skin effect makes the shoulders of the pulse dull is described as follows.
A high-speed pulse has a high-frequency component depending on the reciprocal of its transition (rise or fall) time. For example, the frequency bank (fknee) of a pulse having the transition time Tr can be written by the following equation:
fknee=0.35/Tr (1)
Accordingly, when it is assumed that a pulse of 1 Gbps is transmitted and 30% of it is the transition time, then, fknee=0.35/(0.3 [ns])˜1 GHz. In this case, resistance increase owing to the skin effect is calculated as follows.
The volume resistivity ρ of copper at 20 [° C.] is 1.72*10^−8 [Ω·m]. In the case of a standard line (linewidth 0.1 [mm] and line thickness 0.030 [mm]) in a board, DC resistance becomes 5.7 [mΩ/mm]. Here, “^” expresses the power. Further, resistance per unit length owing to the skin effect is:
r=2.6×10^−6√{square root over (f)}[Ω/mm] (2)
and, at 1 GHz, it becomes:
r=82[mΩ/mm].
Thus, in comparison with the DC resistance 6 [mΩ/mm], the resistance in the transmission time increases 13 times. Namely, the high resistance appears only at the transition time, and this leads to the dull wave waveform. This is because a resistance component becomes larger as the frequency becomes higher, thus having larger effects at rising and falling times. As a technique for overcoming this, a driver can be used to make the pulse waveform steeper at the transition (rise and fall) times. For example, an article, “Limits of Electrical Signaling (Transmitter Equalization)”; IEEE HOT interconnect V (1997, 9/21–23), pp. 48 describes an equalizer system using DAC (Digital Analog Converter) of a driver (transmitter). This is realized in the driver by changing transition waveform steeply all the more when the quantity of dullness is larger. In the case of using this technique, the driver becomes complex and it is difficult to mount many devices on LSI.
As a third problem, a plurality of memories have different line lengths depending on their distances from a memory controller. This causes time differences in read and write data. Data arrival times are different depending on chip locations, and its correction makes system design very difficult. Thus, removal of these time differences is a problem.
As a means for solving the first problem, a line (main line) from a memory controller is folded, and directional couplers are formed both with respect to a line part before the fold and with respect to a line part after the fold. As a result, pitch of modules can be shortened, while wiring length of each coupler is maintained, and high-density mounting can be realized.
As a means for solving the second problem, a directional coupler that can generate forward crosstalk is formed in a T-shape. As a result, the backward crosstalk component and the forward crosstalk component are superposed into an NRZ signal in a transition time. By this operation, waveform can be sharpened, and dulling of waveform owing to, for example, the skin effect can be equalized. As a result, it is not necessary to specially control a driver, and LSI is simplified.
As a means for solving the third problem, a main line is folded, and a switch is provided for connecting to one of both ends of the main line. This switch is turned to switch the connection in a read cycle and in a write cycle. By this, differential delay that depends on positions can be eliminated, and system design becomes easy. Further, this becomes possible by utilizing the characteristic that, by using the T-shaped directional coupler of the means for solving the second problem for connecting a memory chip, signals are generate in both directions.
A first embodiment will be described referring to
A reference numeral 10-1 refers to an LSI chip (hereinafter referred to as MC: Memory Controller) having a control function as a memory controller, and 2-2–2-9 to memory modules each mounted with a plurality of memory chips 10-2–10-9. A printed circuit board 1 is a mother board that is mounted with MC 10-1 and the memory modules 2-2–2-9 and has lines permitting data transfer between MC 10-1 and the memory chips 10-2–10-9 within the memory modules 2-2–2-9. The memory modules 2-2–2-9 are connected to the mother board via connectors.
MC 10-1 carries out operations of data read and write into the memory chips 10-2–10-9. Reference numerals 1-1–1-9 refer to lines for data transfer carried out for those read and write operations. Among these lines, the line 1-1 connected to MC 10-1 is particularly called a main line.
Broken lines m1, c1, m2 and c2 within the mother board refer to signal layers within the board, respectively. One end of each line 1-1–1-9 is connected to MC 10-1 or a memory chip 10-2–10-9, and the other end is connected to a terminating voltage Vtt via a terminating resistance Rtt. This terminating resistance Rtt connected to the terminating voltage Vtt is expressed by a black rectangle (▪). This terminating resistance has an almost same value as a line characteristic impedance of each line 1-1–1-9. Accordingly, those terminations operate to absorb signals from the lines 1-1–1-9, preventing generation of reflection.
Data transfers between MC 10-1 and the memory chips 10-2–10-9 are carried out through directional couplers C2–C9 each shown as a reversed letter “C”. These directional couplers are equivalent to ones of 7-141079 (U.S. Pat. No. 5,638,402). Namely, data transfer between two nodes is carried out utilizing crosstalk (in a directional coupler) as coupling between two parallel lines. Thus, transfer between MC (bus master) 10-1 and a memory chip (bus slave) 10-2–10-9 is carried out utilizing crosstalk between two lines, i.e., the main line 1-1 and a line 1-2–1-9. This crosstalk signal is generated with regard to an edge of a drive pulse, and after a certain time, returns to the terminating voltage. Accordingly, when the drive signal is a rectangular wave of an NRZ signal, then, a signal generated by a directional coupler can be regarded as an RTZ (Return To Zero) signal. In this sense, the directional coupler is a converter from an NRZ signal to an RTZ signal.
In 7-141079 (U.S. Pat. No. 5,638,402), there is a problem that an interval (pitch) between the memory modules 2-2–2-9 mounted on the mother board 1 can not be less than the length of each coupler, since the directional couplers are serially arranged (
On the other hand, in the present embodiment, wiring of the main line 1-1 is arranged on the layer m1 from MC 10-1 toward the right in the figure, moves onto the layer m2 at the right end of the mother board 1, being folded toward the left in the figure, and thereafter is terminated. On the layer m1, the main line 1-1 constitutes the couplers C2, C4, C6 and C8 with the lines 1-2, 1-4, 1-6 and 1-8 on the layer c1. Further, on the layer m2, the main line 1-1 constitutes the couplers C9, C7, C5 and C3 with the lines 1-9, 1-7, 1-5 and 1-3 on the layer c2. Here, the couplers C2, C4, C6 and C8 are formed (in an upper layer) between the m1 layer and the c1 layer of the mother board 1, and the couplers C3, C5, C7 and C9 are formed (in a lower layer) between the m2 layer and the c2 layer of the mother board 1.
The couplers C2–C9 are serially arranged with respect to the main line 1-1 such that the characteristic impedance of the lines becomes constant. Further, they are arranged and wired such that data transfer between MC 10-1 and the memory chips 1-2–1-9 is carried out utilizing backward crosstalk in any coupler. Namely, although the couplers C2, C4, C6 and C8 in the upper layer of the main line 1-1 and the couplers C9, C7, C5 and C3 in the lower layer are wired in the opposite directions, they are wired in the same direction in relation to the main line 1-1. Thus, they are arranged such that backward crosstalk is generated in any transfer.
As shown in
In other words, the conventional technique has a problem that, the interval (pitch) between the memory modules 2-2–2-4 mounted on the mother board 1 as shown in
Parallel lines 1-1 and 1-2, which are arranged in parallel in the layers above and below the layers m1 and c1, constitute the directional coupler C2 of
Between those couplers on the m1–c1 layers and m2–c2 layers, a ground layer or a power supply layer is placed and functions to prevent noise between signals, i.e., coupling between the directional couplers C2–C3. By the structure of
Those couplers are formed as coupling in vertical direction in the cross section. Of course, the couplers may be formed as coupling by lateral arrangement, as in
Further, it can be easily understood that, by providing two or more folds in
In the present embodiment, the number of memory modules is eight of 2-2–2-9. However, the number can be more or less, depending on the system structure. Further, terminating resistance Rtt may be placed on either an upper surface or lower surface of the mother board 1, since its function is not changed on either surface.
Further, the directional coupler of the present embodiment utilizes backward crosstalk. However, forward crosstalk may be utilized. In the latter case, the direction of signal propagation in the main line 1-1 is opposite to the lines 1-2–1-9. In that case too, by folding the main line, the memory modules can be mounted at pitch smaller than the length of the coupling line.
A second embodiment is shown in
In
Between the connectors 3 and 4, the line 1-2 of the coupler C2 is placed on one side of the main line 1-1, and on the other side, the line 1-3 for the coupler C3 is placed at the same wiring pitch so as to maintain the same degree of coupling. The reason of the same wiring pitch in the arrangement is that degree of coupling should be same for generating signal voltages with the same amplitude both in the couplers C2 and C3, so that modules having the same function can be connected to the connectors 3 and 4. Conversely, by arranging the lines at the same pitch, the main line 1-1 and the lines 1-2 and 1-3 can have each the same crosstalk coefficient, and data from the memory modules mounted on the connectors 3 and 4 can be read and written with the same signal amplitude.
Thus, each pair of the directional couplers C2 and C3, C3 and C4, C4 and C5, and C5 and C6 are formed on both sides of the main line 1-1, with similar wiring arrangement with respect to the other signals, too. As a result, the pitch of the connectors 2-6 can be narrowed to about half in comparison with the wiring length required for each coupler C2–C6. Thus, similar result as
Here, between the connectors 2 and 3, on only one side of the main line 1-1 has a line 1-2 arranged. In order to prevent mismatch of impedance owing to difference between coupling of two lines between the connectors 2 and 3 and coupling of three lines other than between the connectors 2 and 3, a terminated dummy line may be provided opposite to the side of the line 1-2 from the main line 1-1 between the connectors 2 and 3. As a result, impedance of the main line 1-1 becomes flat, and accordingly, impedance mismatch becomes smaller and signal distortion becomes smaller. Thus, data transfer can be realized at a much higher speed.
A third embodiment is shown in
With respect to this main line 1-1, lines 1-2–1-6 from the connectors 2-6 are formed such that couplers C2–C6 correspond to every other connectors arranged successively, being coupled to the main line 1-1 before folding and the main line 1-1 after folding. Of course, the connectors 2-6 and the main line 1-1 are terminated, and there is no reflection distortion at their terminations. Further, the data line (main line) from MC 10-1 is drawn as many lines such as 4 bytes, 8 bytes and 16 bytes depending of the number of data bits. When wiring of the data lines can not be implemented in only one layer in the mother board 1 owing to too high wiring density, the main lines 1-1 may be wired in respective different layers, depending on a plurality of signals. For example, when it is assumed that the main line 1-1 of
Further, as another effect, by wiring the main line 1-1 in a same wiring layer, it is not necessary to use VIA at a fold, in contrast with
Next, referring to
The present embodiment relates to a memory module that can be applied to the first embodiment or both the second and third embodiments.
a) shows a signal connection diagram within a memory module 2-2. In the memory module 2-2 shown in FIG. 9(a), two memory chips 10-2a and 10-2b are connected to one signal line 1-2, so that memory capacity per module can be increased twice.
Next, a fifth embodiment will be described referring to
In the present embodiment, a transceiver of a directional coupler is provided as a separate part, so that capacity of a mounted memory module can be increased further.
Transceivers 3-1–3-9 each comprise a driver 6-2 and a receiver 5-1, and have a directional control function for output control of the driver 6-2 and the receiver 5-1. In
The module 2-1 comprises a memory controller 10-1 and a transceiver 3-1. Each of the memory modules 2-2–2-9 is mounted with a plurality of memory chips, and these memory modules 2-1–2-9 are arranged on a mother board 1 through connectors.
A main line 1-1 is terminated at the other end, for impedance matching, being connected to a terminating voltage Vtt. In the directional couplers C2–C9, lines drawn from the transceivers 3-2–3-9 within the memory modules 2-2–2-9 and the main line 1-1 constitute the couplers. Similarly to the main line 1-1, these lines are terminated for impedance matching, being connected to the terminating voltage Vtt. The main line 1-1 may be folded as shown in
MC 10-1 sends the transceivers 3-1–3-9 a read/write (R/W) signal 4 for controlling the signal transfer direction, depending on a state of memory read or memory write. The signal 4 may also serve as a read/write signal for the memory chips. In
Next, write operation, in which data is written from MC 10-1 of
First, MC 10-1 sets the R/W signal into a write mode, enables the buffer 6-2 within the transceiver 3-1, and disables the buffer 5-1. Conversely, MC 10-1 disables the buffers 6-2 built in the transceivers 3-2–3-9 within the memory modules 2-2–2-9, and enables the buffers 5-1. This prepares for writing from MC 10-1 to each memory.
After bank RAS (Row Address Strobe)/CAS (Column Address Strobe) address is sent to prepare for the writing, MC 10-1 sends digital (NRZ) data. The sent NRZ signal is converted to an RTZ signal in the couplers C2–C9, and transmitted to the transceivers 3-2–3-9 within the memory modules 2-2–2-9. The transmitted RTZ signal is demodulated from the RTZ signal to the NTZ signal in the respective buffers 5-1 within the transceivers 3-2–3-9, and the data is transferred to the memory chip through the buses 20-2–20-9. This data is written into the memory, to complete the write operation.
Next, read operation, in which data is read into MC 10-1, will be described.
First, MC 10-1 sets the R/W signal into a read mode, enables the buffer 5-1 within the transceiver 3-1, and disables the buffer 6-2. Conversely, MC 10-1 disables the buffers 5-1 built in the transceivers 3-2–3-9 within the memory modules 2-2–2-9, and enables the buffer 6-2. This operation prepares for reading from each memory to MC 10-1.
After sending bank RAS/CAS address to prepare for the reading, the addressed memory sends digital (NRZ) data. The transmitted NRZ signal is sent as the NRZ signal itself through the buffer 6-2 within the transceiver 3-2–3-9 respectively, converted into an RTZ signal in the coupler C2–C9, and propagated to the main line 1-1. The transmitted RTZ signal is demodulated from the RTZ signal to the NRZ signal in the buffer 5-1 within the transceiver 3-1, and the data is transmitted to MC 10-1. When MC 10-1 reads this data, the read operation is completed. Here, of course, the address and the read/write state are determined previous to the time of the read/write operation.
Thus, since the transceiver 3-1 provided within the memory controller module is combined with the directional couplers C2–C9, data can be transferred with low distortion and at a high speed. Accordingly, MC 10-1 can send and receive all the signals in the NRZ form at a high speed. As a result, it is not necessary to provide the receiver with a special circuit for demodulating an RTZ signal, and it is possible to connect a memory controller that has only a driver receiver for transfer of an NRZ signal. Further, since the memory controller is provided in the form of a module, it is also possible to connect a memory controller provided with an RTZ receiver that can be directly connected to the main line 1-1. As a result, the system structure becomes flexible.
Thus, by combining the transceivers 3-2–3-9 provided within the memory modules with the directional couplers C2–C9, data transfer to and from MC 10-1 can be realized with low distortion and at a high speed. such structure has the effect that a memory chip can have an interface only for a conventional NRZ signal, and cheap chips can be connected. Further, the data bus inside the memory module 2-2 is generally shorter in comparison with the main line 1-1, so that high-speed operation can be realized similarly to the bus using the directional couplers for memory modules. As a result, from the viewpoint of the system, many memory chips can be mounted in a memory modules, and accordingly, the high-density memory system can be realized.
Referring to
The transceiver 3-1 has two signal pins for data input and output, being referred to as DA and DY, respectively. Buffers 5-1, 5-2, 6-1 and 6-2 are provided within the transceiver 3-1, and connected in parallel, to constitute a transceiver circuit. The buffers 5-1 and 6-1 have a function of demodulating an RTZ signal to an NRZ signal. The buffers 5-2 and 6-2 within the transceiver receives an NRZ signal as an input and outputs an NRZ signal.
All the buffers 5-1, 5-2, 6-1, and 6-2 operate exclusively, and only one of them is selected in order to select a transmission direction and a signal conversion type.
For example, in order to transfer data from data DY to DA, a directional control signal, i.e., AtoY signal is set H, and the buffer 5-1 or 5-2 is enabled. For selection of the buffer 5-1 or 5-2, an RTZ signal is used. In order to transfer data from data DA to DY, AtoY signal is set L and the buffer 6-1 or 6-2 is enabled. For selection of the buffer 6-1 or 6-2, an RTZ signal is used.
Further, Vref is a reference voltage for input signals into the buffers 5-1, 5-2, 6-1 and 6-2, and each reference voltage is connected to a terminal shown by an arrow. Using this reference voltage, an input signal is judged.
According to the structure of
As described above, there is a problem that in high-speed data transfer, as the transfer speed increases, waveform distortion increases owing to the frequency-dependent effects such as the skin effect. As a technique for overcoming this problem, there is a technique in which pulse waveform is sharpened at the transition (rise and fall) times. However, this technique is complex in the structure and control of the driver. Thus, an object of the present embodiment is to perform such shaping of the pulse waveform using not a driver but a coupler.
In
Empty boxes shown in
In the present embodiment, a part comprising the two couplers C1 and C2, and the transmission line L7 as a leader line for those couplers is referred to as T-shaped coupler T1 shown in a dotted line.
Each terminal of the coupler T1 is connected to the terminating voltage Vtt through a terminating resistance Rtt, in order to clarify the naked (true) electric characteristics of the coupler. By this, there is no reflection at each point in the transmission path.
In write operation shown in
Circuit simulation was carried out in order to clarify the characteristics of this T-shaped coupler.
Waveforms for various points are shown in
The circuit simulation was carried out using SPICE (Simulation Program for Integrated Circuit Emphasis). However, SPICE employed can not deal with the skin effect, and accordingly, a waveform without the skin effects, namely, a state without dull waveform was simulated. In fact, the skin effect is superimposed on this simulation effect. As a result, generally, shoulders of the waveform become attenuated or dull.
In
The parameters have the values shown in the following.
The model parameters of the couplers (coupler 1 and coupler 2) are shown in the following.
Here, r11 and r22 are line resistances per unit length, L11 and L22 self-inductances per unit length of the lines, CR1 and CR2 self-capacitances per unit length of the lines, and L12 and C12 respectively mutual inductance and mutual capacitance per unit length of the lines.
In
Similarly,
Next, the reason that waveform can be sharpened will be described referring to
FIG. 18(1) shows write data waveform, i.e., an NRZ signal waveform from vpulse of
Further, the NRZ signal on the main line 1-1 propagates without reflection on the transmission line L3 toward the termination. This propagation pulse generates backward crosstalk (BWXT) in the coupler C2. This crosstalk waveform is shown in FIG. 18(3). This crosstalk waveform of FIG. 18(3) endures for duration of round-trip propagation in the line length of the coupler C2.
For example, in the case that the coupler is formed in a glass epoxy type printed circuit board, its relative dielectric constant is about εr=4.6. Thus, in the case that the coupling length is 30 [mm], multiplication by the propagation velocity 7.15 [ps/mm] (=√{square root over ((relative dielectric cons tan t=4.6))}/velocity of light) of the pulse leads to a round-trip propagation delay 429 [ps].
In the coupler T1 shown in
The skin effect is a phenomenon that shoulders of waveform become dull, and by causing overshoot of the rise of the pulse, this dulling of waveform can be eliminated. The waveform of FIG. 18(4) is just like that.
FIG. 19(1) shows an NRZ signal from the chip 10-2. After this signal arrives at the branch point in the line 1-2, it proceeds both toward the coupler C1 (L5) and toward the coupler C2 (L6). Thereafter, the waveform generation process shown in
As described above, when the T-shaped coupler is used, although an edge rises sharply (overshoot) only at a transition time, the pulse width is the same as the case in which only the coupler C2 is used, without increasing the pulse width. In other words, also the T-shaped coupler can be used to equalize dull waveform owing to the skin effect, and at the same time, can maintain the same pulse width as in the case of using the coupler C2 only, so that the high-speed operation is not retarded.
The overshoot part is generated by FWXT, and accordingly, micro strip line should be selected for the coupler. Further, even in FWXT, its forward crosstalk coefficient may be positive or negative depending on the structure of the board. Thus, it is important to select the wiring structure in the board such that the forward crosstalk coefficient becomes positive.
Owing to thus-described operation, in the memory system of
Next, a memory system using this T-shaped coupler line will be described referring to
A memory controller (MC) shown as 10-1 sends and receives a read signal, a write signal, and a clock signal to and from memory chips 10-2–10-7. The reference numeral 7-1 refers to a main line for the clock signal, and 7-2–7-7 to T-shaped couplers coupled with the main line 7-1. Those couplers are connected to the memory chips 10-2–10-7, respectively.
The clock signal CLKout is outputted from MC 10-1 synchronously with a clock phase φ within the MC 10-1, passes through the main line 7-1, and is inputted again to a clock input signal CLKin. The main line 7-1 is terminated at both ends in the neighborhood of MC 10-1, and there hardly exist any reflection at those ends.
Read and write signal terminals of a switch 9 are connected to a main line 8-1 for data. The switch 9 is connected to Write direction at the time of write operation and to Read direction at the time of read operation, with low impedance. The main line 8-1 for data and the couplers 8-2–8-7 are wired in the same wiring positions (in the same shape) as the line 7-1 for the clock and the couplers 7-2–7-7. Propagation delay of the switch 9 has a finite value, and a line having the same propagation delay as that value is added to the line 7-1 for the clock signal CLKout so as to realize the wiring of the same shape seen from MC 10-1.
Here,
Referring to
First, MC 10-1 controls the switch 9 to switch it to Write side, previously to writing to the memory. After sending bank RAS/CAS address to prepare for writing, MC 10-1 sends NRZ write data synchronously with the clock CLKout.
For example, when write operation for the memory 10-2 is carried out, the sent clock signal (CLKout) and the NRZ signal of the write data are converted to RTZ signals in respective T-shaped couplers 7-2 and 8-2.
The clock signal CLKout arrives at the memory 10-2 through a path R1 in which the signal propagates through the lines 7-1 and 7-2. The write data arrives at the memory 10-2 through a path R2 in which the signal propagates through the lines 8-1 and 8-2. The paths R1 and R2 are equal-length lines when the switch 9 is included. As a result, the clock signal and the data signal arrive in phase at the memory 10-2. Here, “phases” means a phase of signal waveform for the clock signal and the data signal, and “in phase” means that a phase difference is so small that it can be neglected in the read/write operation.
Similarly, with respect to the other memories 10-3–10-7, phase differences between the clock signal and the write data signal are same owing to the same-shape wiring, although there are differences in propagation delays from MC 10-1. In other words, since a phase difference between the clock signal and the write data signal is same for every memory chip 10-2–10-7, the memories 10-2–10-7 can take in (latch) data using the clock signal CLKout. Thus, with respect to each memory, the clock signal CLKout and the write data having the same phase difference can be transmitted.
Next, referring to
First, MC 10-1 sets the R/W signal to a read mode. After sending bank RAS/CAS address to prepare for reading, read data as an NRZ signal is sent from the addressed memory synchronously with the clock signal CLKout.
For example, it is assumed that data is read from the memory 10-2. Similarly to
Accordingly, in MC 10-1, by using the returned clock signal CLKin, read data from a memory chip at any position can be latched in phase, so that design relating to data timing becomes remarkably easy.
With respect to both write data and read data, the same phase difference can be realized as described above, since there is no disturbance in impedance owing to the directional couplers 7-2–7-7 or 8-2–8-7, and since the same pulse can be sent both forward and backward from the T-shaped coupler. Further, in this case too, by using the T-shaped couplers, a transition time pulse can be sharpened, so that high-speed operation can be realized by effectively coping with waveform distortion such as the skin effect.
Next, further application of this embodiment will be described, referring to
Next, another embodiment using T-shaped couplers will be described, referring to
The present embodiment is different from the embodiment of
The DQS signal is sent synchronously with the internal clock signal φ of MC 10-1, at the time of data writing. Memory chips 10-2–10-7 use this DQS signal for latching write data (DQ signal) generated in a T-shaped coupler 8-2–8-7 coupled to a main line 8-1. Similarly to the previous embodiment (
With respect to read data, the read data (DQ) from each chip is inputted to MC 10-1 through the coupler and the main line 8-1. At the same time with this, also the strobe signal (DQS) is sent from the memory chip that sends the read data. As a result, although the memory chips 10-2–10-7 are arranged such that their delays for MC 10-1 are different, a phase difference between the read data (DQ) and the strobe signal (DQS) is same for any memory chip. Accordingly, MC 10-1 can latch the read data DQ using the DQS signal. In other words, even in the case that wiring is not folded, read data can be synchronously taken in. Further, by using a coupler coupled to the main line toward left and right as shown in
Next, an embodiment in which high-density mounting is realized will be described referring to
In
By making the main line 1-1 branch in this way, and by forming the couplers C2–C9 with respect to the branched main line 1-1, it is possible to mount memory modules at the pitch shorter than the wiring length of each coupler C2–C9.
Further, high-density mounting can be realized in such structure as shown in
A main line 1-1 drawn from MC 10-1 branches in a wiring layer m1 in the neighborhood of MC 10-1. The branch lines are each folded into a wiring layer m2, and memory modules 2-2–2-9 are arranged so as to form couplers C2–C9 with respect to the folded main lines 1-1. In comparison with
The above-described coupler may be constructed as another part, i.e., as a coupling element. This embodiment will be described, referring to
a) shows a chip (element) 60 mounted with many directional couplers. The chip of
As material for this coupler 60, not only lines formed on epoxy type resin, but also lines formed on polyimide resin, ceramic such as alumina or mullite, or silicon have the same function.
According to such structure as shown
Further, as shown in
The terminating resistances within the element 61 or 62 of
Referring to
Further, a line 1-2 on the mother board is drawn from a terminal EYi of the coupling element 61-2, is connected to a second coupling element 61-3. The wiring is repeated simlarly in the following stages, and a line 1-5 from a coupling element 61-5 is terminated.
According to the arrangement and wiring shown in
Further, by constructing the coupling elements 61-2–61-5 as separate chips, degree of freedom is given to design of the mother board. Namely, it is possible to mount memory modules such that wiring length of each coupler becomes less than the limitation, to realize high-density mounting. Further, it is not necessary to provide couplers in the layer structure of the mother board 1, and thus, the number of the layers can be reduced, and the board can be cheaper. Further, by providing the coupling elements as separate parts, it is possible to suppress dispersion in parts production, in comparison with the case that couplers are provided within the whole board of the mother board 1.
Here, of course, the coupling elements 61-2–61-5 can be mounted on the mother board 1, not only on the side of the memory modules 2-2 but also on the back side.
Next,
A reference numeral 10 refers to a dotted line block indicating the controls of the MC controller. Access to a memory is carried out by means of an address converter 17, a read data signal 15, and write data signal 16. Namely, in write access, a logical address is converted to a physical address by address calculation in the address converter 17, and the data signal 16 is sent to the memory corresponding to the physical address. Within MC 10, to this end, a sequencer 19 controls various blocks at appropriate times suitable for memories connected to MC 10, satisfying also other requirements. For example, the sequencer 19 carries out management of sequence timing with respect to switching between RAS and CAS, and sending of a base address BA and a chip select CS. In addition, if necessary, ECC (error correct code) for data is generated in a generator ECCg, and the data added with ECC is transmitted.
Similarly, read access is carried out by sending read request to a memory, switching an address between RAS and CAS, and sending a base address BA and a chip select CS. In addition, in some cases, a read/write switching signal and a data mask signal may be included, of course. When it is discerned that the memory sends the read data, the data is received through a receiver 5, data errors are detected and corrected in an ECC part. Thereafter, MC controller 10 functions to return the data in response to the read request. Here, the receiver 5 has also a function of demodulating an RTZ signal to an NRZ signal. In addition, the sequencer 19, of course, performs enable control of the driver 6, refresh control of DRAM, power-on control, and the like.
Since MC has such functions, it can perform storing (write) and reference (read) of data into and from a memory, in response to a memory access request from another part of the system, such as a DMA transfer request from an I/O side or a memory access request from a processor.
Next,
In
These buses 201–204 are connected to the chip set 300. The chip set 300 controls data sending and receiving between those buses 201–204.
Here, in the memory bus 202, data transfer is carried out using the directional couplers of the present invention. By this, high-speed operation of memory access is possible, throughput is improved, and latency becomes shorter, so that system performance is improved.
Further, as shown in
By folding a main line, and forming directional couplers with respect to this folded main line, it is possible to make the interval between memory module about half the wiring length of each directional coupler.
By using a T-shaped coupler, the waveform become steeper to have an effect of equalizing the skin effect. This makes high-speed operation possible.
In the case of a plurality of memories, by folding lines of a clock signal and a data signal from a memory controller, and by inputting the clock signal again, it is possible to eliminate a time difference for the read data and write data. This makes system design remarkably easy.
Number | Date | Country | Kind |
---|---|---|---|
11-130957 | May 1999 | JP | national |
2000-126234 | Apr 2000 | JP | national |
Number | Name | Date | Kind |
---|---|---|---|
3516065 | Bolt et al. | Jun 1970 | A |
3619504 | De Veer | Nov 1971 | A |
3764941 | Nick | Oct 1973 | A |
3786418 | Nick | Jan 1974 | A |
4380080 | Rattlingourd | Apr 1983 | A |
5119398 | Webber, Jr. | Jun 1992 | A |
5126910 | Windsor et al. | Jun 1992 | A |
5229398 | Malen et al. | Jul 1993 | A |
5241643 | Durkin et al. | Aug 1993 | A |
5365205 | Wong | Nov 1994 | A |
5376904 | Wong | Dec 1994 | A |
5449112 | Heitman et al. | Sep 1995 | A |
5515195 | McAdams | May 1996 | A |
5638402 | Osaka | Jun 1997 | A |
5811972 | Thompson et al. | Sep 1998 | A |
5945886 | Millar | Aug 1999 | A |
6137709 | Boaz et al. | Oct 2000 | A |
6172895 | Brown et al. | Jan 2001 | B1 |
6366520 | Huber | Apr 2002 | B1 |
6438012 | Osaka et al. | Aug 2002 | B1 |
6654270 | Osaka et al. | Nov 2003 | B2 |
Number | Date | Country |
---|---|---|
7141079 | Jun 1995 | JP |
8188366 | Jul 1996 | JP |