The present invention relates generally to grazing-incidence collectors (GICs), and in particular to a cooled spider and cooled spider methods for GICs.
EUV lithography is anticipated to be the lithographic process of choice for producing future generations of semiconductor devices having linewidths on the order of 32 nm and smaller. The wavelength of the EUV radiation is nominally 13.5 nm, which calls for the use of specialized optics to collect and image the EUV radiation.
One type of EUV optical system used to collect the radiation from the light source is a grazing-incidence collector (GIC). A GIC typically comprises one or more concentrically arranged GIC shell mirrors (“GIC shells”). The GIC shells are configured to receive light from the EUV source at grazing incidence and reflect the light to form a focused illumination beam that first forms an intermediate focus and then creates an illumination region in the far field that is preferably uniform to within a specification set by the overall system optical design.
GICs typically require a “spider” that maintains the GIC shells in a fixed position relative to one another. Prior art GIC spiders are typically designed for laboratory and non-production EUV lithography systems and so have relatively simple designs that lack active thermal management. This is problematic for a commercially viable GIC since the spider will receive prolonged exposure to EUV radiation and other radiation by-products (e.g., energetic particles, infrared radiation, etc.) that will heat the spider and potentially induce deformation to the mirrors and cause performance problems.
An aspect of the invention is a cooled spider for a grazing-incident collector (GIC) that includes one or more GIC shells. The cooled spider includes an outer ring that includes a plurality of cooling channel sections, and an inner ring that includes a plurality of cooling channels loops each covering a portion of the inner ring. The cooled spider also includes a plurality of spokes that mechanically connect the inner and outer rings, with each spoke including a pair of cooling channels that fluidly connect to different cooling channel sections in the outer ring and to a cooling channel loop in the inner ring to form a cooling-fluid flow path through the spider, with each spoke configured to mechanically support an edge portion of the one or more GIC shells.
Another aspect of the invention is a method of cooling a spider that operably supports one or more shells of a GIC mirror. The method includes providing a spider having an outer ring and an inner ring mechanically and fluidly connected by a plurality of spokes and defining a cooling-fluid flow path through the spider. The method also includes flowing a cooling fluid over the cooling-fluid flow path to cool the spider.
Additional features and advantages of the invention will be set forth in the detailed description which follows, and in part will be readily apparent to those skilled in the art from that description or recognized by practicing the invention as described herein, including the detailed description which follows, the claims, as well as the appended drawings.
It is to be understood that both the foregoing general description and the following detailed description present embodiments of the invention, and are intended to provide an overview or framework for understanding the nature and character of the invention as it is claimed. The accompanying drawings are included to provide a further understanding of the invention, and are incorporated into and constitute a part of this specification. The drawings illustrate various embodiments of the invention and together with the description serve to explain the principles and operations of the invention.
The various elements depicted in the drawing are merely representational and are not necessarily drawn to scale. Certain sections thereof may be exaggerated, while others may be minimized. For ease of illustration, not all like elements are necessarily labeled. The drawing is intended to illustrate an example embodiment of the invention that can be understood and appropriately carried out by those of ordinary skill in the art.
The present invention relates generally to GICs, and in particular to a cooled spider, and methods for supporting one or more GIC shells using a cooled spider. The general configuration of the cooled spider is first described, followed by details of the different components and the cooling channels of and the flow path through the spider. An EUV lithography system that employs the cooled spider is then described.
Cooled spider 10 also includes input and output cooling-fluid manifolds 110A and 110B fluidly connected to outer ring 20 via respective input and output pipes 112A and 112B at input and output positions PIN and POUT, respectively. Input and output cooling-fluid manifolds 110A and 110B are used to circulate a cooling fluid 120 over a general cooling-fluid flow path FP through spider 10. An example cooling fluid 120 is water, which may be de-ionized water. An example material for forming spider 10 is stainless steel. Other materials include Inconel, Aluminum, Nickel or Nickel alloy for thermal compatibility with electroformed GIC shells.
Outer ring 20 includes a body portion 21 having an inner surface 22 and an outer surface 24. Body portion 21 includes a number of generally rectangular indentations 30 in outer surface 24 that reduce the weight of outer ring 20 while maintaining its structural rigidity. Outer ring 20 also includes a number of cooling channel sections 36, as described below. In an example embodiment, outer ring body portion 21 is formed from two concentrically joined inside and outside ring members 21A and 21B that in an example embodiment form an inside lip 23 (see
A main function of spider 10 is to provide precise, sturdy mounting and mechanical rigidity to the assembly of one or more GIC shells. Since the spider serves as the mechanical interface of the GIC mirror to an external support that is part of a larger system (e.g., an EUV illuminator), GIC mirror alignment often comes down to spider alignment.
Because spider 10 receives thermal flux during operation of a GIC mirror that employs the spider, failure to actively control its temperature leads to a temperature drift, and therefore, dimensional changes due to a finite coefficient of thermal expansion. This is clearly undesirable as this adversely affects the optical performance of the GIC mirror.
In an example, each spoke 80 is formed from first and second pieces that when mated (e.g., e-beam welded) form upper and lower channels 96A and 96B.
In forming spider 10, spokes 80 are connected to inner ring 50 with spoke ends 92 fitting within inner ring slots 66 so that spoke cooling channel inner ends 97A and 97B of upper and lower cooling channels 96A and 96B connect with inner ring cooling channel ends 63A and 63B of U-shaped cooling channel 62 of inner ring 50.
Cooling fluid 120 flows through spider 10 over a general flow path FP that in an example has multiple branches. General flow path FP starts at input cooling-fluid manifold 110A and enters outer ring 20 via an input pipe 112A at input point PIN. At this point, flow path FP diverges in opposite directions to form respective branch flow paths FP1 and FP2 that traverse different spokes 80 and inner ring portions 53, and that meet up and exit outer ring 20 at output pipe 112B at output point POUT. In an example embodiment, input point PIN and output point POUT are preferably located 180° apart (see also
Branch flow path FP1 is defined in part by outer ring cooling channel sections 36 that follows a zig-zag pattern all the way to from input pipe 112A to the upper channel end 98A of spoke 80-4. Branch flow path FP1 is also defined by other cooling channel sections 36 that connect a) input pipe 112A to the lower channel outer end 98B of spoke 80-2; b) upper channel outer end 98A of spoke 80-2 to the upper channel outer end 98A of spoke 80-3; and c) lower channel outer end 98B of spoke 80-3 to output pipe 112B located at spoke 80-4. Thus, cooling channels 36 divide branch flow path FP1 into two flow sub-paths FP1A and FP2B.
Likewise, branch flow path FP2 is defined in part by corresponding outer ring cooling channel sections 36 that also follow a zig-zag pattern all the way to from upper channel outer end 98A of spoke 80-1 to upper channel outer end 98A of spoke 80-4. Branch flow path FP2 is also defined by additional outer ring cooling channel sections 36 that connect a) input pipe 112A to the lower channel outer end 98B of spoke 80-6; b) upper channel outer end 98A of spoke 80-6 to the upper channel outer end 98A of spoke 80-5; and c) lower channel outer end 96B of spoke 80-5 to output pipe 112B located at spoke 80-4. Thus, the additional cooling channels 36 also divide branch flow path FP2 into two flow sub-paths FP2A and FP2B.
Looking at the branch flow paths FP1 and FP2 now in more detail, with reference to
Sub-path FP1B follows an outer ring cooling channel section 36 from input pipe 112A to lower channel outer end 98B of spoke 80-2. With reference to
Sub-path FP2A enters lower channel outer end 98B of spoke 80-6 and then proceeds in the counterclockwise direction (
Flow path FP2B is essentially symmetrical with flow path FP1 B and is connected to spokes 80-6 and 80-5 via respective cooling channel sections 36, so that the flow path traverse spokes 80-6 and 80-5 and the respective inner ring portions 53 in reverse order, i.e., clockwise in spoke 80-6 (
Spider with GIC Shells
A light source LS is also shown relative to GIC mirror 240 for reference. Spider 10 is configured to operably support one or more GIC shells 20 in a spaced-apart and concentric configuration while not substantially blocking EUV radiation from being relayed from an EUV light source to a GIC mirror intermediate focus.
In one example, GIC shell edges 202 are supported by spokes 80 at steps 86. Also in an example, clips 89 are also attached (clipped) to spokes 80 at edge 82 and are secured the GIC shells 200 and to the spokes. An example clip 89 includes a mounting base 91 from which extends a forked section 92 having two pads 93. In forming the GIC mirror 240, the innermost GIC shell 200 is arranged on spider 10 with the GIC shell edge 202 placed on the corresponding inner steps 86 of spokes 80. Steps 86 support GIC shell 200 at respective portions of the GIC shell edge 202. Clips 89 are then arranged on spokes 80 adjacent GIC shell outer surface 204, with the clip mounting bases 91 attached to corresponding steps 86 so that pads 93 rest against the GIC shell outer surface. The GIC shell 200 is then optically aligned and a laser is used to irradiate pads 93 and mounting bases 91 to secure (i.e., laser weld) the GIC to spider 10 in a fixed position. This process is repeated for the remaining GIC shells 200 to form the completed GIC mirror 240 shown in
EUV Lithography System with Cooled Spider
System 300 includes a system axis AS and EUV light source LS, such as a hot plasma source, that emits working EUV radiation 302 at λ=13.5 nm. EUV radiation 302 is generated, for example, by an electrical discharge source (e.g., a discharged produced plasma, or DPP source), or by a laser beam (laser-produced plasma, or LPP source) on a target of Lithium, Xenon or Tin. EUV radiation 302 emitted from such a LPP source may be roughly isotropic and, in current DPP sources, is limited by the discharge electrodes to a source emission angle of about θ=60° or more from optical axis AS. It is noted that the isotropy of the LPP source will depend on the mass of the target pellet. For relatively high mass targets, the emission is anisotropic, with most of the emerging radiation headed back toward the laser beam due to absorption in the forward direction by the target mass. For a low mass LPP target, which is almost entirely ionized by the laser, the emission is much closer to isotropic.
System 300 includes a EUV GIC mirror 240 that includes cooled spider 10. EUV GIC mirror 240 is arranged adjacent and downstream of EUV light source LS, with collector axis AC lying along system axis AS. EUV GIC mirror 240 collects EUV working radiation 302 (i.e., light rays LR) from EUV light source LS located at source focus SF and the collected radiation forms intermediate source image IS at intermediate focus IF. An illumination system 316 with an input end 317 and an output end 318 is arranged along system axis AS and adjacent and downstream of EUV GIC mirror 240 with the input end adjacent the EUV GIC mirror. Illumination system 316 receives at input end 217 EUV radiation 302 from source image IS and outputs at output end 318 a substantially uniform EUV radiation beam 320 (i.e., condensed EUV radiation). Where system 300 is a scanning type system, EUV radiation beam 320 is typically formed as a substantially uniform line of EUV radiation at reflective reticle 336 that scans over the reticle.
A projection optical system 326 is arranged along (folded) system axis AS downstream of illumination system 316. Projection optical system 326 has an input end 327 facing illumination system output end 318, and an opposite output end 328. A reflective reticle 336 is arranged adjacent the projection optical system input end 327 and a semiconductor wafer 340 is arranged adjacent projection optical system output end 328. Reticle 336 includes a pattern (not shown) to be transferred to wafer 340, which includes a photosensitive coating (e.g., photoresist layer) 342. In operation, the uniformized EUV radiation beam 320 irradiates reticle 336 and reflects therefrom, and the pattern thereon is imaged onto photosensitive surface 342 of wafer 340 by projection optical system 326. In a scanning system 300, the reticle image scans over the photosensitive surface to form the pattern over the exposure field. Scanning is typically achieved by moving reticle 336 and wafer 240 in synchrony.
Once the reticle pattern is imaged and recorded on wafer 240, the patterned wafer 340 is then processed using standard photolithographic and semiconductor processing techniques to form integrated circuit (IC) chips.
Note that in general the components of system 300 are shown lying along a common folded axis AS in
It will be apparent to those skilled in the art that various modifications and variations can be made to the present invention without departing from the spirit and scope of the invention. Thus it is intended that the present invention cover the modifications and variations of this invention provided they come within the scope of the appended claims and their equivalents.