Claims
- 1. An inventory label generating method comprising:
generating a plurality of candidate labels; and selecting a plurality of acceptably distinguishable labels from among the candidate labels by determining spectra emitted by the candidate labels when the candidate labels are energized, and by comparing the spectra of the candidate labels.
- 2. The method of claim 1, wherein the labels comprise semiconductor nanocrystals.
- 3. The method of claim 1, wherein the candidate labels are generated by combining a plurality of markers, each marker emitting a marker signal at an associated signal wavelength in response to excitation energy.
- 4. The method of claim 1, further comprising directing an excitation energy toward the markers and measuring the wavelength/intensity spectra emitted by the labels.
- 5. The method of claim 1, wherein the wavelength/intensity spectra of the candidate labels are determined by modeling a combination of a plurality of marker signals.
- 6. The method of claim 5, further comprising calculating at least one of the signals by modeling emissions from a manufacturable marker.
- 7. The method of claim 6, further comprising adjusting the calculated signals from the manufacturable marker in response to measured marker signal variations.
- 8. The method of claim 5, further comprising measuring at least one of the signals by energizing a marker so that the marker emits the signal.
- 9. The method of claim 1, further comprising comparing at least some of the candidate labels with a library of distinguishable labels to determine if the candidate labels are acceptable, and adding acceptable candidate labels to the library.
- 10. A method for identifying a plurality of identifiable elements, the method comprising:
energizing a plurality of labels so that a first marker of each label generates a first signal with a first wavelength peak, at least some of the labels comprising multiple-signal labels, each multiple-signal label having a second marker generating a second signal with a second wavelength peak; measuring the first wavelength peaks; for each multiple-signal label, measuring the second wavelength peak at least a predetermined minimum wavelength separation from the associated first peak; and identifying the labels in response to the measured peaks.
- 11. The method of claim 10, wherein each predetermined minimum wavelength separation is at least as large as a full width half maximum (FWHM) of at least one of the associated first peak and the associated second peak.
CROSS-REFERENCES TO RELATED APPLICATIONS
[0001] The present patent application is a continuation of U.S. patent application Ser. No. 09/827,013 filed on Apr. 5, 2001, which claims the benefit of priority from co-pending U.S. Provisional Patent Application No. 60/195,520, entitled “Method for Encoding Materials with Semiconductor Nanocrystals, Compositions Made Thereby, and Devices for Detection and Decoding Thereof,” filed Apr. 6, 2000, the full disclosures of which are incorporated herein by reference.
[0002] The subject matter of the present application is related to the following co-pending patent applications, the disclosures of which are also incorporated herein by reference: U.S. patent application Ser. No. 09/160,458 filed Sep. 24, 1998 and entitled, “Inventory Control”; U.S. patent application Ser. No. 09/397,432 filed Sep. 17, 1999, and also entitled “Inventory Control”; PCT Patent Application No. WO 99/50916 as published on Apr. 1, 1999, entitled “Quantum Dot White and Colored Light Emitting Diodes”; and U.S. patent application Ser. No. 09/259,982 filed Mar. 1, 1999, and entitled “Semiconductor Nanocrystal Probes for Biological Applications and Process for Making and Using Such Probes”.
Provisional Applications (1)
|
Number |
Date |
Country |
|
60195520 |
Apr 2000 |
US |
Continuations (1)
|
Number |
Date |
Country |
Parent |
09827013 |
Apr 2001 |
US |
Child |
10807616 |
Mar 2004 |
US |