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4424583 | Uchida | Jan 1984 | |
4600934 | Aine et al. | Jul 1986 | |
4668865 | Gimzewski et al. | May 1987 | |
4670092 | Motamedi | Jun 1987 | |
4724318 | Binnig | Feb 1988 | |
4783237 | Aine et al. | Nov 1988 | |
4800274 | Hansma et al. | Jan 1989 | |
4806755 | Duerig et al. | Feb 1989 | |
4851080 | Howe et al. | Jul 1989 | |
4851671 | Pohl | Jul 1989 | |
4883959 | Hosoki et al. | Nov 1989 | |
4906840 | Zdeblick et al. | Mar 1990 | |
4916002 | Carver | Apr 1990 | |
4941753 | Wickramasinghe | Jul 1990 | |
4943719 | Akamine et al. | Jul 1990 | |
4945235 | Nishioka et al. | Jul 1990 | |
4968585 | Albrecht et al. | Nov 1990 | |
4992659 | Abraham et al. | Feb 1991 | |
5003815 | Martin et al. | Apr 1991 | |
5020376 | Wall et al. | Jun 1991 | |
5021364 | Akamine et al. | Jun 1991 | |
5041783 | Ohta et al. | Aug 1991 | |
5047633 | Finlan et al. | Sep 1991 | |
5047637 | Toda | Sep 1991 | |
5047649 | Hodgson et al. | Sep 1991 | |
5065103 | Slinkman et al. | Nov 1991 | |
5085070 | Miller et al. | Feb 1992 | |
5164791 | Kubo et al. | Nov 1992 |
Number | Date | Country |
---|---|---|
0047601 | Feb 1988 | JPX |
Entry |
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"Kelvin probe force microscopy", M. Nonnenmacher et al., Appl. Phys. Lett. Jun. 24, 1991, pp. 2921-2923. |
"Lateral Dopant Profiling In Semiconductors By Force Microscopy Using Capacitive Detection", by D. W. Abraham et al, 12 pages. |