Number | Date | Country | Kind |
---|---|---|---|
7-236955 | Sep 1995 | JPX | |
7-236970 | Sep 1995 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
3814356 | Coleman et al. | Jun 1974 | |
3835320 | Helong | Sep 1974 | |
3873831 | Ruska et al. | Mar 1975 | |
4044256 | Krisch et al. | Aug 1977 | |
4523094 | Rossow et al. | Jun 1985 | |
5350921 | Aoyama et al. | Sep 1994 |
Number | Date | Country |
---|---|---|
56-3962 | Nov 1981 | JPX |
Entry |
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P.A. Stoyanov et al, "EMV-100L electron microscope", Instrumentation and Experimental Techniques, No. 1, Jan. 1970, pp. 245-247. |
"Jeol Electron Optics and Analytical Instrumentation", Jeol Co., Ltd., Tokyo, Japan. has no dated. |
Hitachi Electron Microscope H-7000 Catalog. |