Claims
- 1. A negative electron affinity photocathode comprising:
- a light-transmissive substrate;
- a negative electron affinity active layer disposed on said substrate; and
- a patterned mask associated with said active layer, said mask having one or more openings that define areas of said active layer for emission of electrons by negative electron affinity when said active layer is stimulated by a light beam directed through said substrate.
- 2. A negative electron affinity photocathode as defined in claim 1 wherein said mask comprises a blocking layer on an emission surface of said active layer.
- 3. A negative electron affinity photocathode as defined in claim 2 wherein said blocking layer comprises a metal layer.
- 4. A negative electron affinity photocathode as defined in claim 2 wherein said blocking layer comprises a semiconductor layer.
- 5. A negative electron affinity photocathode as defined in claim 2 wherein said blocking layer comprises a dielectric layer.
- 6. A negative electron affinity photocathode as defined in claim 1 wherein said mask comprises a buried blocking layer located within said active layer.
- 7. A negative electron affinity photocathode as defined in claim 1 wherein said mask comprises a blocking layer disposed between said active layer and said substrate.
- 8. A negative electron affinity photocathode as defined in claim 1 wherein said mask comprises an electron blocking layer for blocking electrons emitted by said active layer.
- 9. A negative electron affinity photocathode as defined in claim 1 wherein said mask comprises a light blocking layer for blocking the light beam directed through said substrate.
- 10. A negative electron affinity photocathode as defined in claim 9 further comprising a material having a high index of refraction located in said one or more openings.
- 11. A negative electron affinity photocathode as defined in claim 10 wherein said high index material is shaped as a lens adjacent to said one or more openings.
- 12. A negative electron affinity photocathode as defined in claim 1 wherein said active layer includes a bandgap ramp through the thickness thereof for producing an electric field for directing electrons emitted within said active layer toward an emission surface of said active layer.
- 13. A negative electron affinity photocathode as defined in claim 1 wherein said one or more openings have dimensions less than about 2 micrometers.
- 14. A negative electron affinity photocathode as defined in claim 1 wherein said mask comprises an electrically inactive region of said active layer.
- 15. A negative electron affinity photocathode as defined in claim 1 wherein said mask comprises a metal blocking layer disposed on or within said active layer.
- 16. An electron source comprising:
- a light-transmissive substrate;
- a negative electron affinity active layer disposed on said substrate, said active layer having a conduction band;
- a patterned mask associated with said active layer, said mask having one or more openings that define areas of said active layer for emission of electrons;
- a light beam generator for directing a light beam through said light-transmissive substrate at said active layer for exciting electrons into the conduction band of said active layer;
- electron optics for forming the electrons emitted from the emission areas of said active layer into an electron beam; and
- a vacuum enclosure for maintaining said active layer at high vacuum such that electrons in the conduction band of said active layer have higher energies than electrons in the vacuum enclosure adjacent to said active layer and have a high probability of emission into the vacuum enclosure from the emission areas of said active layer.
- 17. An electron source as defined in claim 16 wherein said mask comprises a blocking layer on an emission surface of said active layer.
- 18. An electron source as defined in claim 16 wherein said mask comprises a buried blocking layer disposed within said active layer.
- 19. An electron source as defined in claim 16 wherein said mask comprises a blocking layer disposed between said active layer and said substrate.
- 20. An electron source as defined in claim 16 wherein said mask comprises an electron blocking layer for blocking electrons emitted by said active layer.
- 21. An electron source as defined in claim 16 wherein said mask comprises a light blocking layer for blocking the light beam directed through said light-transmissive substrate at said active layer.
- 22. An electron source as defined in claim 16 wherein said mask comprises an electrically inactive region of said active layer.
- 23. An electron beam system comprising:
- an electron source comprising:
- a light-transmissive substrate;
- a negative electron affinity active layer disposed on said substrate, said active layer having a conduction band;
- a patterned mask associated with said active layer, said mask having one or more openings that define areas of said active layer for emission of electrons;
- a light beam generator for directing a light beam through said light-transmissive substrate at said active layer for exciting electrons into the conduction band of said active layer;
- source electron optics for forming the electrons emitted from the emission areas of said active layer into an electron beam; and
- a source vacuum enclosure for maintaining said active layer at high vacuum such that electrons in the conduction band of said active layer have higher energies than electrons in the source vacuum enclosure adjacent to said active layer and have a high probability of emission into the source vacuum enclosure from the emission areas of said active layer;
- a main vacuum enclosure for receiving said electron beam from said electron source and for holding a workpiece for processing by said electron beam; and
- main electron optics located within said main vacuum enclosure for directing said electron beam to said workpiece.
- 24. A negative electron affinity photocathode comprising:
- a light-transmissive substrate; and
- a negative electron affinity active layer disposed on said substrate, said active layer having an emission surface and being laterally graded with respect to bandgap in a direction parallel to said emission surface, said laterally graded active layer defining low bandgap regions for emission of electrons by negative electron affinity when said active layer is stimulated by a light beam directed through said substrate, said laterally graded active layer further defining high bandgap regions surrounding said low bandgap regions.
- 25. A negative electron affinity photocathode comprising:
- a light-transmissive substrate;
- an inactive layer disposed on said substrate; and
- one or more pillars of negative electron affinity active material extending through said inactive layer from said substrate to a surface of said inactive layer, said pillars defining areas for emission of electrons by negative electron affinity when said pillars are stimulated by a light beam directed through said substrate.
- 26. A negative electron affinity photocathode as defined in claim 25 further comprising a layer of negative electron affinity active material covering said inactive layer and said pillars.
CROSS REFERENCE TO RELATED APPLICATIONS
This application is a continuation-in-part of pending application Ser. No. 08/863,493 filed May 27, 1997, which in turn is a continuation-in-part of application Ser. No. 08/499,945 filed Jul. 10, 1995, now U.S. Pat. No. 5,684,360.
Government Interests
This invention was made with Government support under DARPA N00014-92-J-1996. The Government has certain rights in the invention.
US Referenced Citations (7)
Non-Patent Literature Citations (5)
Entry |
A. Herrera-Gomez et al. SPIE vol. 2022. Photodetectors and Power Meters. Jul. 1993. p. 51. |
C. Sanford, Doctoral Thesis, Cornell Univ. Dept. of Electrical Engineering. 1990. |
J. Schneider et al. "Semiconductor on Glass Photocathodes as High Performance Sources for Parallel Electron Beam Lithography", J. Vac.Sci.Technol., Part B, vol. 14, No.6, Nov.-Dec. 1996 pp. 3782-3786. |
E. Santos et al, "Selective Emission of Electrons from Patterned Negative Electron Affinity Cathodes", IEEE Trans. on Electron Devices. vol. 41, No. 3, Mar. 1994, pp. 607-611. |
A. Baum et al. "Semiconductor on Glass Photocathodes for High Throughput Maskless Electron Beam Lithography", 41st Electron Ion & Photon Beam & Nanolithography Conference, 1997. |
Continuation in Parts (2)
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Number |
Date |
Country |
Parent |
863493 |
May 1997 |
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Parent |
499945 |
Jul 1995 |
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