Patent Application
20060049430
This application is based on Japanese patent application NO. 2004-240752, the content of which is incorporated hereinto by reference.
1. Field of the Invention
This invention relates to a field-effect transistor, a complementary field-effect transistor, and a method of manufacturing the field-effect transistor.
2. Description of the Related Art
As the prior art, Japanese Patent Laid-open No. 2004-87640 has disclosed a technique for improving an operation speed of a transistor formed on a single-crystal silicon substrate having a (100) crystal plane as a principal surface. The publication has described that a channel direction of a field-effect transistor can be a <100> axis direction of silicon, allowing the transistor to be operated at a higher speed than that with a conventional <110> axis direction. It has also described that a stress controlling film can be formed on a field-effect transistor to improve drain current properties.
There has been need for reducing a minimum processing dimension required for a gate as need for size reduction of a device has been increased in a field-effect transistor. Thus, improving an ON-state current has been also need in an transistor. There is, therefore, still room for improving an ON-state in a semiconductor device having a configuration as described in Japanese Patent Laid-open No. 2004-87640.
We have studied the configuration described in the above publication, and has focused attention to that in the configuration described in the above publication, an upper surface of a channel region is parallel to a principal surface of a silicon substrate. We have considered that since an ON-state current per a unit channel width is constant, that is, unchanged, it is difficult to improve an ON-state current as a channel width is reduced. Furthermore, focusing attention to a channel width and a channel mobility per a unit channel width as new factors contributing to change in an ON-state current in a field-effect transistor, we have conducted intense investigation and finally achieved this invention.
The term, a “channel length” as used in this specification refers to a length of a channel region in a direction connecting source-drain regions. The term, a“channel width” refers to a length of a channel region in a direction perpendicular to the direction connecting source-drain regions, in other words, an extension direction of a gate electrode. The term, a “channel region” refers to a region directly below a gate electrode which separates source/drain regions formed on a substrate.
According to the present invention, there is provided a field-effect transistor comprising a substrate made of single-crystal silicon having a {100} plane as a principal surface; a gate electrode on the substrate, which extends substantially in a direction of the <010> crystal axis of the single-crystal silicon or of an axis equivalent to the <010> crystal axis direction; and source/drain regions on the surface of the substrate in both sides of the gate electrode, wherein the surface of the substrate directly below the gate electrode has the principal surface and an inclined surface oblique to the principal surface along an extension direction of the gate electrode.
A crystal plane represents the three-dimensional position thereof and generally corresponds to three vertical directions of x-axis, y-axis and z-axis. The (001) plane, the (010) plane, the (100) plane, the (00-1) plane, the (0-10) plane and the (−100) plane correspond to each surface of a cube. These planes have similar properties, so they are called as the {001} plane as a whole.
According to the present invention, there is provided a substrate made of single-crystal silicon having a {100} plane as a principal surface; the element isolation region on the substrate; an element region on the substrate which is defined by the element isolation region; a gate electrode on the substrate which extends from the element region to the element isolation region such that it divides the element region and extends substantially in a direction of the <010> crystal axis of the single-crystal silicon or of an axis equivalent to the <010> crystal axis direction; and source/drain regions on the surface of the substrate in both sides divided by the gate electrode, wherein the surface of the substrate directly below the gate electrode has the principal surface and an inclined surface oblique to the principal surface along an extension direction of the gate electrode.
In the present invention, a gate electrode in a substrate made of single-crystal silicon having a {100} plane as a principal surface extends substantially in a <010> crystal axis direction or an axis direction equivalent to the <010> crystal axis direction, and a region directly below the gate electrode in the substrate has an inclined surface oblique to the principal surface along the extension direction of the gate electrode. Thus, a channel region can be formed in a crystal plane in single-crystal silicon with higher channel mobility. By forming an inclined surface, a channel width can be increased in comparison with the case where a substrate surface in a region directly below a gate electrode is substantially a principal surface. Thus, this invention can increase an ON-state current in a field-effect transistor.
Here, in this specification, single crystal silicon having a {100} plane as a principal surface may be inclined from the {100} plane within a given offset angle. As used in this specification, the phrase, “substantially extending in a given crystal-axis direction” allows a deviation within ±5° from the crystal-axis direction. As used in this specification, the phrase, “having a substantially given surface orientation” allows a deviation within ±5° from the surface orientation.
In a field-effect transistor of the present invention, the inclined surface may be formed near the element isolation region. Thus, an ON-state current in the field-effect transistor can be reliably increased.
In a field-effect transistor of the present invention, the inclined surface may be formed by one crystal plane of the above single-crystal silicon. Thus, a crystal plane with higher channel mobility can be selectively used as an inclined surface, and a configuration with a predetermined ON-state current can be provided with good reproductivity.
In a field-effect transistor of the present invention, the inclined surface may be comprised of a plurality of crystal planes of the above single-crystal silicon. Such a configuration can prevent electric field concentration to a given region in a substrate surface and allow a plane with higher channel mobility to be used as an inclined surface.
In a field-effect transistor of the present invention, the inclined surface may comprise a (301) plane of the single-crystal silicon, a plane equivalent to the (301) plane, or a plane oblique to the (301) plane or to the plane equivalent to the (301) plane within 5°. Thus, channel mobility may be reliably increased and a channel width can be adequately increased, resulting in further reliable increase of an ON-state current.
In a field-effect transistor of the present invention, the inclined surface may be curved such that along the <010> crystal axis direction of the single-crystal silicon or the axis direction equivalent to the <010> crystal axis direction, a surface orientation of the inclined surface continuously varies from the <100> crystal axis direction of the single-crystal silicon to an <ab0> crystal axis direction where “a” and “b” are independently an integer or to a direction equivalent to the <ab0> crystal axis direction. Thus, electric field concentration on a substrate surface can be further inhibited.
In a field-effect transistor of the present invention, an area of the inclined surface may be 10% or more of an area of the region separating the source/drain regions in the substrate seen from the normal line of the principal surface. Thus, an inclined surface with higher channel mobility to the principal surface can be adequately ensured, resulting in further increase of an ON-state current.
According to the present invention, there is provided a complementary field-effect transistor comprising an N channel field-effect transistor and a P channel field-effect transistor, wherein the N channel field-effect transistor and the P channel field-effect transistor are any of the field-effect transistors as described above.
In this invention, a P channel type field-effect transistor has an inclined surface, and therefore, channel mobility in the P channel type field-effect transistor can be adequately increased. Since both N channel field-effect transistor and P channel field-effect transistors have an inclined surface, ON-state current properties can be improved while simplifying a manufacturing process.
In a complementary field-effect transistor of the present invention, in the P channel field-effect transistor, an area of the inclined surface can be 10% or more of an area of a region separating the source/drain regions in the substrate seen from the normal line of the principal surface, while in the N channel field-effect transistor, an area of the inclined surface is less than 10% of an area of the region separating the source/drain regions in the substrate seen from the normal line direction of the principal surface. Thus, an ON-state current in the P channel type field-effect transistor can be increased while preventing reduction of an ON-state current in the N channel type field-effect transistor.
A complementary field-effect transistor of the present invention may further comprise a plurality of the P channel field-effect transistors divided by an element isolation region and the single N channel field-effect transistor. Thus, an ON-state current in the P channel type field-effect transistor can be increased while preventing reduction of an ON-state current in the N channel type field-effect transistor.
According to the present invention, there is provided a method of manufacturing a field-effect transistor comprising depositing a mask on a principal surface of a substrate made of single-crystal silicon having a {100} plane as the principal surface; sequentially removing the mask and the substrate to form a concave while forming an element forming region beside the concave; shrinking the sidewall of the mask deposited in the depositing from the concave toward the element forming region to expose a part of the principal surface from the mask; after the exposing the part of the principal surface from the mask, oxidizing the whole surface of the substrate to form an inclined surface oblique to the principal surface in a <010> crystal axis direction or an axis direction substantially equivalent to the <010> crystal axis direction in the substrate exposed from the mask; filling the concave with an insulating film to form an element isolation region; and removing the mask to form a gate electrode extending substantially in the <010> crystal axis direction of the single-crystal silicon or in the axis direction substantially equivalent to the <010> crystal axis direction on the substrate in the element forming region comprising the inclined surface.
In the manufacturing method of the present invention, the mask can be shrunk from the concave toward the element forming region to expose a part of the principal surface from the mask and then the exposed principal surface can be oxidized to form an inclined surface oblique in a <010> crystal axis direction or a direction of an axis substantially equivalent to the <010> crystal axis in the substrate. Thus, a transistor with higher channel mobility and an increased channel width can be reliably manufactured.
Any combination of the above configurations and converted expression of this invention, for example, between a process and an apparatus may be also effective as aspects of this invention.
For example, in the present invention, the field-effect transistor may be a P channel type field-effect transistor to more reliably increase an ON-state current.
In the present invention, the normal line of the inclined surface may be substantially perpendicular to the <010> crystal axis direction of the single-crystal silicon or an axis direction equivalent to the <010> crystal axis direction. Thus, a channel width can be increased and channel mobility can be reliably increased.
In the present invention, the normal line direction of the inclined surface may be an <ab0> axis direction of the single-crystal silicon or an axis direction equivalent to the <ab0> crystal axis direction. Here, “a” and “b” are integers, which may be equal or different. Thus, channel mobility can be further reliably increased. For example, when a principal surface of a substrate is a (100) plane of single-crystal silicon, the normal line of the inclined surface may be in an <ab0> crystal axis direction of the single-crystal silicon.
In the present invention, the gate electrode may protrude in the direction of the principal surface. Thus, an inclined surface may be formed in a region directly below near each of the ends in the gate electrode in its extension direction, resulting in reliable increase of channel mobility.
For example, in the method of manufacturing a semiconductor device according the present invention, the mask may be an SiN film. Thus, an inclined surface can be reliably formed in an element forming region.
In the method of manufacturing a semiconductor device according to the present invention, a shape of the element forming region in a plan view may be substantially a rectangle having a side extending substantially in a direction of a <010> crystal axis of silicon.
In the method of manufacturing a semiconductor device according to the present invention, the sidewall of the mask may be shrunk in a <010> crystal axis direction of the single-crystal silicon or an axis direction equivalent to the <010> crystal axis direction. Thus, an inclined surface with high channel mobility can be reliably formed.
According to the present invention, a technique for improving an ON-state current in a field-effect transistor can be achieved by a configuration that a substrate surface in a region directly below a gate electrode substantially extending in a <010> crystal axis direction of single-crystal silicon comprises a principal surface and an inclined surface oblique to the principal surface along the extension direction of the gate electrode.
Channel mobility of a field-effect transistor (MOSFET) is known to be changed by the crystal plane orientation of Si (for example, T. Sato, Physical Review B, vol. 4, NO. 6, pp. 1950-1960 and 1971). Since the effective mass of a career (an electron or a hole) varies in the crystal plane orientation of Si, the channel mobility of MOSFET changes. The channel mobility of the hole (the career of the P channel field-effect transistor) is the smallest at the {001} plane, and it is increased with the inclination therefrom. Therefore, in the P channel field-effect transistor, according to the change of plane orientation of the inclined plane from <010> crystal axis direction to the <ab0> crystal axis direction (wherein “a” and “b” are independently an integer) or to a direction equivalent to the <ab0> crystal axis, the channel mobility can securely be increased.
On the other hand, the channel mobility of the electron (the career of the N channel field-effect transistor) is the greatest at the {001} plane, and it is reduced with the inclination therefrom. Therefore, in the N channel field-effect transistor, in contrary to the case of P channel field-effect transistor, according to the change of the plane orientation of the inclined plane from <010> crystal axis direction to the <ab0> crystal axis direction (wherein “a” and “b” are independently an integer) or to a direction equivalent to the <ab0> crystal axis, the channel mobility is reduced, while effective channel width is increased by the inclined plane, thus the deterioration of the ON-state current can be suppressed.
Also, independently of the channel mobility, the forming of the inclined plane increases the effective channel width, so the ON-state current property improves both in the P channel field-effect transistor and in the N channel field-effect transistor. FIGS. 12 to 14 show the calculation result about the relation between an inclination angle θ of the inclined plane and the ON-state current.
In the P channel field-effect transistor, as shown in
On the other hand, in the N channel field-effect transistor, as shown in
In other words, the ON-state current in the N channel field-effect transistor and the P channel field-effect shows different behavior varied by two parameters of the inclination angle and the ratio of the length of the inclined plane/flat plane. In the N channel field-effect transistor, the mobility decreasing is more effective, so when the inclination angle is set large, the tendency of the mobility reduction is towards great. Therefore, as for the N channel field-effect transistor, when the selection of the inclination angle is mistaken, ON-state current may be deteriorated. According to the present invention, as for the N channel field-effect transistor the deterioration of ON-state current can also be suppressed.
The above and other objects, advantages and features of the present invention will be more apparent from the following description taken in conjunction with the accompanying drawings, in which:
The invention will be now described herein with reference to illustrative embodiments. Those skilled in the art will recognize that many alternative embodiments can be accomplished using the teachings of the present invention and that the invention is not limited to the embodiments illustrated for explanatory purpose. In all the drawings, equivalent elements have the same symbol, whose description is omitted as appropriate.
This embodiment relates to a P channel type MOSFET.
The MOS field-effect transistor 100 shown in
There is formed an element isolation region 103 surrounding the lateral sides of the MOS field-effect transistor 100. The element isolation region 103 is buried in the single-crystal silicon substrate 101. In a plan view, an element forming region surrounded by the element isolation region 103 is rectangle. Extension directions of two adjacent sides in the rectangle are a <010> axis direction and a <001> axis direction, respectively.
The MOS field-effect transistor 100 comprises the single-crystal silicon substrate 101; a gate electrode 107 on the single-crystal silicon substrate 101 substantially extending in the <010> crystal axis direction of the single-crystal silicon or an axis direction equivalent to the <010> crystal axis direction; and source/drain regions 129 formed on the single-crystal silicon substrate 101 in both sides of the gate electrode 107.
The MOS field-effect transistor 100 further comprises a gate insulating film 105 formed between the gate electrode 107 and the single-crystal silicon substrate 101. The gate insulating film 105 has a substantially constant thickness without a region where a film thickness is deliberately changed. In
The gate electrode 107 extends in the <010> axis direction of the silicon. In a plan view, the gate electrode 107 has a shape of rectangle, whose longer side extends in the <010> axis direction. Furthermore, there is formed a channel region 108 in the single-crystal silicon substrate 101 directly below the gate electrode 107. In this embodiment, the channel region 108 has N conductivity type. In both sides of the gate electrode 107, there are formed source/drain regions 129 with P conductivity type near the surface of the single-crystal silicon substrate 101.
In
As shown in FIGS. 1 to 3, the channel region 108 has a shape of rectangle in a plan view. In the rectangle, extension directions of two adjacent sides are the <010> axis direction and the <001> axis direction of silicon, respectively. As shown in
In a plan view, the upper surface 131 is in the center of the channel region 108 and parallel to the principal surface of the single-crystal silicon substrate 101, and its plane indices are substantially (100). In this and other embodiments, plane indices of substantially (100) may include a plane oblique to the (100) plane of the single-crystal silicon by a given offset angle.
The inclined surface 133 is formed from the end of the element isolation region 103 to the periphery of the single-crystal silicon substrate 101. The inclined surface 133 comprises an inclined surface 133a and an inclined surface 133c which face to each other via the upper surface 131 along the channel width direction. The single-crystal silicon substrate 101 comprises an inclined surface 133b and an inclined surface 133d which face to each other via the upper surface 131 along the channel length direction in the source/drain region 129. Each of the inclined surfaces 133a to 133d is a single plane and has an equal inclination angle θ to the (100) plane.
The inclination angle θ to the principal surface in the single-crystal silicon substrate 101 is, for example, 10° or more.
In
Specifically, the inclined surface 133a is a plane inclined from the (100) plane toward the (10-1) plane along the <010> axis direction of silicon, and is the (30-1) plane in this case. The inclined surface 133b is a plane inclined from the (100) plane toward the (110) plane along the <010> axis direction of silicon, and is the (310) plane in this case. The inclined surface 133c is a plane inclined from the (100) plane toward the (101) plane along the <010> axis direction of silicon, and is the (301) plane in this case. The inclined surface 133d is a plane inclined from the (100) plane toward the (1-10) plane along the <010> axis direction of silicon, and is the (3-10) plane in this case.
In the MOS field-effect transistor 100, an area of the inclined surface 133 is 10% or more, preferably 20% or more of an area of the channel region 108 separating the source/drain regions 129 in the single-crystal silicon substrate 101 seen from the normal line direction of the principal surface. Thus, a length of the channel region 108 can be reliably increase in relation to a width of a region for forming the channel region 108. Therefore, in the case of size reduction of a device, a channel width can be adequately ensured while improving channel mobility.
Next, there will be described a process for manufacturing the MOS field-effect transistor 100 shown in FIGS. 1 to 3.
First, an SiO2 film 109 and an SiN film 111 are sequentially formed on the (100) plane as the principal surface of the single-crystal silicon substrate 101. A thickness of the SiO2 film 109 is, for example, about 10 nm, and a thickness of the SiN film 111 is, for example, about 100 nm. The SiN film 111 is a mask for forming the inclined surface 133 while ensuring a region to be the upper surface 131 during forming the channel region 108. Then, the SiN film 111 and the trench 113 are sequentially etched off to form the trench 113 as a groove concave while forming an element forming region beside the concave (
Next, the whole surface of the single-crystal silicon substrate 101 having the trench 113 is oxidized to deposit an SiO2 film 115 to, for example, 2 nm on the surface of the single-crystal silicon substrate 101 including the inner surface of the trench 113 (
Then, wet etching is conducted to thin the SiN film 111 to, for example, about 85 nm while making the sidewall of the SiN film 111 recede from the trench 113 toward the element forming region to expose a part of the principal surface from the SiN film 111 (
Subsequently, the whole surface of the single-crystal silicon substrate 101 comprising the receding part 117 formed and the single-crystal silicon substrate 101 exposed from the SiN film 111 is oxidized to form an SiO2 film 119 to, for example 20 nm on the surface of the single-crystal silicon substrate 101 (
In the oxidation in the step shown in
Over the whole surface of the single-crystal silicon substrate 101 is deposited by high-density plasma CVD (Chemical Vapor Deposition) an SiO2 film 123 to be an element isolation region 103 while filling the trench 113 with the SiO2 film 123. Then, the substrate is heated at about 800° C. for stabilizing film quality of the SiO2 film 123, so that the SiO2 film 123 is united with the SiO2 films 109, 115 and 119. Then, the SiO2 film 123 formed over the SiN film 111 by CMP is removed by polishing (
Next, the exposed parts of the SiO2 film 123, the SiN film 111 and the SiO2 film 109 are sequentially removed by wet etching (
In
Then, the whole upper surface of the single-crystal silicon substrate 101 is oxidized to form a gate insulating film 105 to, for example, 1.5 nm. Then, a polysilicon gate electrode film is formed to 120 nm as a gate electrode 107 crossing over the channel region 108. The polysilicon gate electrode film is processed into the shape of the gate electrode 107. The gate electrode 107 is formed over the single-crystal silicon substrate 101 in the element forming region including the inclined surface 133 and extends substantially in the <010> crystal axis direction of the single-crystal silicon or an axis direction substantially equivalent to the <010> crystal axis direction (
Next, there will be described the effects of the MOS field-effect transistor 100 shown in FIGS. 1 to 3.
In the MOS field-effect transistor 100 shown in FIGS. 1 to 3, a rectangle-forming pattern in the element isolation region 103, that is, two adjacent sides of the channel region 108, extends in the <010> axis direction and the <001> axis direction, in the principal surface of the single-crystal silicon substrate 101. Furthermore, the gate electrode 107 extend in the <010> axis direction. Therefore, a channel length direction connecting the source/drain regions 129 is the <001> axis direction, and the channel region 108 has the upper surface 131 and the inclined surface 133.
By such a configuration, in the MOS field-effect transistor 100, a surface orientation in the inclined surface 133 of the MOS field-effect transistor 100 can be an <ab0> axis direction of the single-crystal silicon or an axis direction equivalent to the <ab0> crystal axis direction, wherein “a” and “b” are independently an integer and may be the same or different. The inclined surface 133 may be a plane inclined from the {100} plane to the {101} plane and thus a plane with higher channel mobility can be selectively formed in the inclined surface 133. Therefore, channel mobility can be improved in relation to a conventional configuration where the upper surface of the single-crystal silicon substrate directly below the gate electrode is a plane substantially parallel to the principal surface of the substrate. In particular, in this embodiment where the MOS field-effect transistor 100 is of P channel type, ON-state current properties can be significantly improved in comparison with an N channel type transistor.
When a sidewall as described in this embodiment is formed in a channel region of a conventional semiconductor device in which a gate electrode extends in a <011> axis direction, the sidewall is a plane inclined from the {100} plane toward the {111} plane. With such an inclination direction, channel mobility cannot be so significantly increased as in inclination from the {100} plane to the {101} plane. Therefore, in a transistor with a small channel width, an ON-state current cannot be effectively increased by increasing channel mobility.
Additionally, in the MOS field-effect transistor 100 shown in FIGS. 1 to 3, the inclined surface 133 is formed in the side of the end of the element isolation region 103 in the channel region 108. Thus, in comparison with a configuration without the inclined surface 133, a channel width can be increased by 1/cos θ folds. Such an effect is significant when an area of the inclined surface 133 is 10% or more of an area of a region separating the source/drain regions 129 in the single-crystal silicon substrate 101 seen from the normal line of the principal surface.
An ON-state current of a field-effect transistor is dependent on a width and mobility of the channel region 108 as described above. In this embodiment, a length of the channel region 108 is increased and the channel region 108 comprises the inclined surface 133 having a given inclination angle θ, so that channel mobility can be significantly increased in comparison with a conventional configuration. Thus, an ON-state current of the MOS field-effect transistor 100 can be reliably increased. Furthermore, in a P channel type of the MOS field-effect transistor 100, as a width of a region for forming the channel region 108 is reduced, an ON-state current per a unit channel width increases. Thus, an ON-state current of the MOS field-effect transistor 100 can be improved while meeting the requirement for size reduction in gate processing.
In the MOS field-effect transistor 100, all of the inclined surfaces 133a to 133d are formed by a single plane. A particular plane with higher mobility can be, therefore, reliably formed, depending on a design of the MOS field-effect transistor 100. Thus, the MOS field-effect transistor 100 has a configuration which can give a structure as designed exhibiting a desired ON-state current. Furthermore, conversely, in the MOS field-effect transistor 100, an ON-state current can be reliably predicted, depending on a plane-index design of the inclined surface 133. Therefore, the MOS field-effect transistor 100 with a given design can be reliably manufactured with higher reproductivity. Such an effect can be significantly obtained when the inclined surface 133 has the (301) plane of single-crystal silicon or a plane equivalent to the (301) plane, or a plane within 5° to the (301) plane or a plane equivalent to the (301) plane.
Although the MOS field-effect transistor 100 shown in FIGS. 1 to 3 has a configuration where the gate electrode 107 extends in the <010> direction, the gate electrode 107 may extend in an axis direction substantially equivalent to the <010> axis direction. Examples of an axis substantially equivalent to the <010> axis direction include the <001> axis, the <100> axis, the <0-10> axis, the <00-1> axis and the <−100> axis.
This embodiment relates to the MOS field-effect transistor 100 described in Embodiment 1 where the inclined surface 133 is curved.
Since in this configuration, the channel region 108 also has the inclined surface 133 as described in Embodiment 1, a relative area of the inclined surface 133 can be increased to an area of a region separating the source/drain regions 129 in the single-crystal silicon substrate 101 seen from the normal line of the principal surface. The inclined surfaces 133a to 133d are configured such that in the <010> crystal axis direction of the single-crystal silicon or an axis direction equivalent to the <010> crystal axis direction, the surface orientation of the inclined surface 133 varies from the <100> crystal axis direction of the single-crystal silicon to an <ab0> crystal axis direction wherein “a” and “b” are independently an integer, or to a direction equivalent to the <ab0> crystal axis direction. Thus, channel mobility can be increased. Therefore, in the semiconductor device shown in
In the semiconductor device shown in
In this embodiment, the inclined surfaces 133a to 133d may be continuous. Thus, an electric field concentrated point can be eliminated in the channel region, so that stress concentration in the end of the element isolation region 103 can be more reliably alleviated.
This embodiment relates to the MOS field-effect transistor 100 as described in Embodiment 1, where all of the inclined surfaces 133a to 133d are constituted by a plurality of planes.
By this configuration, a plane having a given inclination angle θ can be formed in the inclined surface 133 as is in Embodiment 1, resulting in increase of a ratio of a region for forming the inclined surface 133 to a width of a region for forming the channel region 108 and improvement of channel mobility. Furthermore, since all of the inclined surfaces 133a to 133d are constituted by the plurality of planes, electric field concentration in the end of the element isolation region 103 can be alleviated. Thus, the MOS field-effect transistor 100 having a higher ON-state current can be manufactured with higher reproductivity, and its reliability as a transistor can be improved.
Although the MOS field-effect transistor 100 is described as a P channel type transistor in the above embodiments, the MOS field-effect transistor 100 may be of N channel type.
When the MOS field-effect transistor 100 is of N channel type, the inclined surface 133 can be formed to effectively increase a channel width, resulting in preventing an ON-state current from being reduced. Thus, ON-state current properties can be improved in, for example, the overall CMOS (Complementary Metal Oxide Semiconductor) device described below.
When the MOS field-effect transistor 100 is of N channel type as in this embodiment, an area of the inclined surface 133 may be 20% or less, preferably 10% or less to an area of a region separating the source/drain regions 129 in the single-crystal silicon substrate 101 seen from the normal line of the principal surface. Thus, reduction in an ON-state current can be prevented.
The semiconductor devices described in above embodiments can be applied to a CMOS device.
In the semiconductor device shown in
The semiconductor device shown in
The semiconductor devices shown in
Since the number of the source connecting plugs 125 can be reduced in the semiconductor devices shown in
Although
This effect may be significant when a proportion of the region for forming the inclined surface 133 is 10% or more in relation to a width of the region for forming the channel region 108 in the P channel MOS field-effect transistor 104 while a proportion of the region for forming the inclined surface 133 is less than 10% in relation to a width of the region for forming the channel region 108 in the N channel MOS field-effect transistor 106.
Although the embodiments of this invention have been described with reference to the accompanied drawings, these are only illustrative and various configurations other than the aboves can be employed.
For example, in the above embodiments, the inclined surface 133 in the MOS field-effect transistor 100 may be constituted by a combination of a curved and a flat surfaces.
This example relates to the MOS field-effect transistor 100 described in Embodiment 1 (
WG=2a+b;
and
Channel width=b+2a/cos θ.
FIGS. 12 to 14 show a relationship between WG and Ion when an inclination angle θ is 10°, 20° or 30°. In
The MOS field-effect transistor 100 described in Embodiment 1 (
It is apparent that the present invention is not limited to the above embodiment, that may be modified and changed without departing from the scope and spirit of the invention.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2004-240752 | Aug 2004 | JP | national |
