Patent Application
20230203662
The present application claims the benefit of priority from Japanese Patent Application No. 2021-213031 filed on Dec. 27, 2021. The entire disclosures of the above application are incorporated herein by reference.
The present disclosure relates to a film formation apparatus and a method of using the same.
There is known a film formation apparatus configured to form a film on the surface of a substrate by a mist chemical vapor deposition (CVD) method. The film formation apparatus includes a supply path through which mist generated by a mist generation source is conveyed by a flow of carrier gas and a heater that heats at least a section of the supply path.
In a manufacturing method using such a film formation apparatus, heating of the supply path may suppress the mist from condensing and aggregating in the supply path. Since the condensation and aggregation of the mist are suppressed, the amount of mist supplied to the substrate may be increased, and the speed of forming the film may be improved.
The present disclosure describes a film formation apparatus for forming a film on a surface of a substrate and a method of using the film formation apparatus. The film formation apparatus according to an aspect includes a stage for having the substrate thereon; a mist generation source that generates mist of a solution containing at least water and in which a material for forming the film is dissolved; a supply path that conveys the mist generated by the mist generation source toward the substrate on the stage by a flow of a carrier gas; and a heater that heats at least a part of the supply path. The part of the supply path heated by the heater is provided as a mist heating section in which infrared rays are radiated from an inner surface of the supply path toward the mist. The inner surface of the supply path in the mist heating section is coated with a coating layer containing at least one of an oxide and a hydroxide of an element present in the mist. A method of using the film formation apparatus according to an aspect includes: forming a coating layer on the inner surface of the supply path in the mist heating section by supplying the mist generated by the mist generation source to the mist heating section while operating the heater; and after the forming of the coating layer, forming the film on the surface of the substrate by supplying the mist generated by the mist generation source to the substrate on the stage through the supply path while operating the heater.
Objects, features and advantages of the present disclosure will become more apparent from the following detailed description made with reference to the accompanying drawings, in which like parts are designated by like reference numbers and in which:
In a film formation apparatus for forming a film on the surface of a substrate by a mist chemical vapor deposition (CVD) method, a supply path through which mist generated by a mist generation source conveyed by a flow of carrier gas may be heated at least at a part by a heater. The heating of the supply path may suppress the mist from condensing and aggregating in the supply path. If the condensation and aggregation of the mist are suppressed, the amount of mist supplied to the substrate may be increased, and the speed of forming the film may be improved.
However, even if the supply path is heated, it is difficult to completely suppress the condensation and aggregation of the mist in the supply path. As a result, when the film formation apparatus is used repeatedly, deposits resulting from the condensation and aggregation of the mist adhere to the inner surface of the supply path. Further, it was found that progress of the adhesion of the deposits caused deterioration of the quality of a film (hereinafter, referred to as the film quality) formed on the substrate. The present disclosure provides a technique capable of suppressing such deterioration of the film quality.
When the supply path is heated, the mist conveyed in the supply path is also heated, and the heated mist is supplied to the substrate. However, when the film formation apparatus is repeatedly used and the deposits adhered to the inner surface of the supply path progresses, the amount of heat (particularly, the dose of infrared rays) transmitted from the inner surface of the supply path to the mist decreases. As a result, the rise in temperature of the mist is reduced, and the temperature of the mist supplied to the substrate is lowered unintentionally, resulting in the deterioration of the film quality. Therefore, if the decrease in the amount of heat (particularly, the dose of infrared rays) transmitted from the inner surface of the supply path to the mist is suppressed in the course of repeated use of the film formation apparatus, the deterioration of the film quality can be suppressed. In order to suppress the deterioration of the film quality, it is conceivable to pre-coat the inner surface of the supply path with a material that corresponds to or approximates to the deposits derived from the mist.
According to an aspect of the present disclosure, it is disclosed a film formation apparatus for forming a film on a surface of a substrate. The film formation apparatus according to the aspect includes: a stage for having the substrate thereon, a mist generation source, a supply path, and a heater. The mist generation source is configured to generate mist of a solution containing at least water and in which a material for forming the film is dissolved. The supply path is configured to convey the mist generated by the mist generation source toward the substrate on the stage by means of a flow of a carrier gas. The heater is configured to heat at least a part of the supply path. The part of the supply path heated by the heater serves as a mist heating section in which infrared rays are radiated from an inner surface of the supply path toward the mist. The inner surface of the supply path in the mist heating section is coated with a coating layer, and the coating layer contains at least one of an oxide or a hydroxide of an element present in the mist.
In the film formation apparatus described above, the supply path includes the mist heating section as the part of the supply path heated by the heater. In the mist heating section, the infrared rays are radiated from the inner surface of the supply path toward the mist. The inner surface of the mist heating section is pre-coated with a material that corresponds to or approximates to deposits derived from the mist. As a result, even if deposits derived from the mist further adhere to the inner surface of the supply path in the course of repeated use of the film formation apparatus, the magnitude of decrease in the amount of heat (particularly, the amount of infrared rays) transmitted from the inner surface of the supply path to the mist will be reduced. As a result, the decrease in temperature of the mist supplied to the substrate is also suppressed. Accordingly, the film formation apparatus can continue the formation of films under predetermined optimal conditions over a long period of time.
In an embodiment of the present disclosure, the coating layer may be composed only of the element contained in the mist. According to such a configuration, it is possible to avoid inclusion of impurities in the film formed by the film formation apparatus.
In an embodiment of the present disclosure, the supply path may include a film formation chamber, and the stage may be arranged in the film formation chamber. In such a configuration, the temperature of the substrate when the film is formed is referred to as T1, and the temperature of the inner surface of the film formation chamber facing the surface of the substrate when the film is formed is referred to as T2. The temperature T1 may be higher than the temperature T2 (i.e., T1>T2). That is, it is configured as a so-called cold wall method. In the cold wall method, the mist is not heated in the film formation chamber. Therefore, the temperature rise of the mist in the mist heating section largely affects the final temperature of the mist supplied to the substrate, and thus also largely affects the film quality. In other words, in the cold wall method, the film quality can be effectively stabilized by stabilizing the temperature rise of the mist in the mist heating section. Thus, such a technique can be effectively employed.
In an embodiment of the present disclosure, the coating layer formed in the mist heating section may have an absorptivity of 50% or more of the infrared rays radiated toward the mist from the inner surface of the supply path. According to such a configuration, even when deposits derived from the mist further adhere in the course of repeated use of the film formation apparatus, the magnitude of decrease in the amount of infrared rays radiated to the mist is effectively suppressed.
In an embodiment of the present disclosure, the film formed on the surface of the substrate may be an epitaxial film. As another embodiment, the film formed on the surface of the substrate may not be an epitaxial film, but may be a film having a crystal structure or a film having no crystal structure.
In an embodiment of the present disclosure, the inner surface of the supply path in the mist heating section may be made of quartz. In this case, the quartz may contain a hydroxyl group (OH group). Quartz is a chemically stable substance and has excellent heat resistance. Therefore, the quartz can be used as the material forming the inner surface of the supply path. On the other hand, since quartz has a high transmittance in the infrared region, which is easily absorbed by water, the amount of infrared rays radiated to the mist will change largely when deposits due to the condensation and aggregation of the mist adhere thereto. In order to suppress such a change, it is preferable to form the coating layer on the inner surface of the supply path in advance. In this respect, the effect of the present technique is significantly exhibited.
In an embodiment of the present disclosure, the temperature of the heater is referred to as T3. The temperature T3 of the heater may be 100 degrees Celsius (° C.) or higher (i.e., T3≥100° C.). In order to suppress the mist of the solution containing water from condensing and aggregating, the temperature of the heater may be set to 100° C. or higher. However, if the temperature of the heater is set to 100° C. or higher, deposits tend to adhere to the inner surface of the supply path due to the evaporation of the water contained in the mist, resulting in a change in the amount of infrared rays radiated to the mist. In order to suppress such a change, it is preferable to form the coating layer on the inner surface of the supply path in advance. In this respect, the effect of the present technique is significantly exhibited.
In an embodiment of the present disclosure, the supply path may include a film formation chamber, and the stage may be arranged in the film formation chamber. In this case, the temperature of an inner surface of the film formation chamber is referred to as T2, and the temperature of the heater is referred to as T3. The temperature T2 may be lower than the temperature T3 (i.e., T2<T3). According to such a configuration, the mist will not be heated so much in the film formation chamber. Therefore, the temperature rise of the mist in the mist heating section largely affects the final temperature of the mist supplied to the substrate, and can also largely affect the film quality. In other words, when the temperature relationship T2<T3 described above is satisfied, the film quality can be effectively stabilized by stabilizing the temperature rise of the mist in the mist heating section. Thus, the present technique can be suitably employed.
In an embodiment of the present disclosure, the infrared rays radiated to the mist may have a wavelength λ of 7.8 micrometers or less (i.e., λ≤7.8). In the film formation using the mist of the solution containing water, a film is formed on the surface of the substrate since at least part of the water is removed. For this reason, the heater should normally have the temperature of 100° C. or higher, and such a heater radiates a large amount of infrared rays having the wavelength of 7.8 μm or less based on Wien's displacement law. The wavelength of 7.8 micrometers or less is in a wavelength band that is easily absorbed by water, and largely affects the temperature rise of mist containing water. Therefore, in order to stabilize the film quality, it is particularly effective to suppress changes in the amount of infrared rays radiated to the mist. For this reason, the present technique can be preferably employed.
The present technology is also embodied in a method of using a film formation apparatus. Such a film formation apparatus may include a stage for having a substrate thereon, a stage for heating the substrate on the stage, a mist generation source configured to generate a mist of a solution that contains at least water and in which a material for forming a film on the substrate is dissolved, a supply path configured to convey the mist generated by the mist generation source toward the substrate on the stage by means of a flow of a carrier gas, and a heater configured to heat at least a part of the supply path. In such a film formation apparatus, the part of the supply path heated by the path heater serves as a mist heating section in which infrared rays are radiated from an inner surface of the supply path to the mist.
According to an aspect of the present disclosure, a method of using the film formation apparatus includes a preliminary process and a film forming process performed after the preliminary process. The preliminary process includes forming a coating layer on the inner surface of the supply path in the mist heating section by supplying the mist generated by the mist generation source to the mist heating section, while operating the heater. The film forming process includes forming the film on the surface of the substrate by supplying the mist generated by the mist generation source to the substrate on the stage through the supply path, while operating the heater.
In the method of use described above, the inner surface of the mist heating section can be previously coated with a material that corresponds to or approximates to the deposits derived from the mist by performing the preliminary process. As such, it is possible to effectively suppress a decrease in the amount of heat (particularly, the amount of infrared rays) transmitted from the inner surface of the supply path to the mist in the film forming process performed after the preliminary process. As a result, the temperature of the mist supplied to the substrate does not drop unintentionally, and film formation can be continued over a long period of time under optimum predetermined conditions.
In an embodiment of the present disclosure, the temperature of the inner surface of the mist heating section in the preliminary process is referred to as T4, and the temperature of the heater in the film forming process is referred to as T3. The temperature T3 is lower than the temperature T4 (i.e., T3<T4). According to such a configuration, in the preliminary process, the temperature of the inner surface of the mist heating section is relatively high. Therefore, the formation of the coating layer is effectively promoted.
In an embodiment of the present disclosure, the temperature of the inner surface of the mist heating section in the preliminary process is referred to as T4, and the temperature of the substrate in the film forming process is referred to as T1. The temperature T1 is lower than the temperature T4 (i.e., T1<T4). According to such a configuration, in the preliminary process, the temperature of the inner surface of the mist heating section is relatively high. Therefore, the formation of the coating layer is effectively promoted.
In an embodiment of the present technology, the mist in the preliminary process may be the same as the mist in the film forming process. In this case, although not particularly limited, the preliminary process and the film forming process may be performed continuously. However, as another embodiment, the mist in the preliminary process may be different from the mist in the film forming process.
Hereinafter, specific embodiments of the present disclosure will be described in detail with reference to the drawings.
A film formation apparatus 10 according to a first embodiment of the present disclosure will be described with reference to the drawings. As shown in
The film formation apparatus 10 includes a film formation chamber 12 in which the substrate 2 is arranged, a mist generation source 20 that generates mist 7, and a mist supply path 30 that connects the mist generation source 20 and the film formation chamber 12 to each other. The film formation chamber 12 has a stage 14 on which the substrate 2 is placed and a stage heater 16 that heats the substrate 2 on the stage 14. The temperature of the substrate 2 and the temperature of the inner surface of the film formation chamber 12 facing the surface of the substrate 2 when the film 4 is formed are respectively referred to as T1 and T2. The temperature T1 of the substrate 2 and the temperature T2 of the inner surface of the film formation chamber 12 satisfy a relationship of T1>T2. Note that a specific configuration of the film formation chamber 12 is not particularly limited.
The mist generation source 20 has a raw material solution tank 22, a water tank 24 and an ultrasonic oscillator 26. The raw material solution tank 22 is a container for storing a raw material solution 6. The raw material solution 6 is a solution in which a material for forming the film 4 is dissolved and contains at least water. The raw material solution tank 22 is connected to the film formation chamber 12 via the mist supply path 30. The water tank 24 is a container for storing water. The upper part of the water tank 24 is open, and the raw material solution tank 22 is inserted into the water tank 24 from the opened upper part. The bottom surface of the raw material solution tank 22 is immersed in the water in the water tank 24.
The ultrasonic vibrator 26 is a device that generates ultrasonic waves. The ultrasonic vibrator 26 is arranged at the bottom of the water tank 24 and faces the bottom surface of the raw material solution tank 22. The ultrasonic waves generated by the ultrasonic vibrator 26 is transmitted to the raw material solution 6 in the raw material solution tank 22 through the water in the water tank 24. When the ultrasonic waves are transmitted to the raw material solution 6, the surface of the raw material solution 6 vibrates, so that the mist 7 of the raw material solution 6 is generated in the raw material solution tank 22. Although not particularly limited, the bottom surface of the raw material solution tank 22 is, for example, provided by a membrane made of a flexible material, which facilitates transmission of ultrasonic vibrations to the raw material solution 6.
A carrier gas supply path 28 is connected to the raw material solution tank 22. The carrier gas supply path 28 supplies a carrier gas such as nitrogen gas (N2) into the raw material solution tank 22. Thus, the mist 7 generated in the raw material solution tank 22 flows into the mist supply path 30 by the flow of nitrogen gas (N2) and is supplied into the film formation chamber 12 through the mist supply path 30. A dilution gas supply path 32 is connected to the mist supply path 30. The dilution gas supply path 32 supplies a diluent gas such as nitrogen gas (N2) into the mist supply path 30. The mist 7 is supplied into the film formation chamber 12 at an appropriate density and flow rate by these carrier gas and diluent gas.
The mist supply path 30 is a tubular member that communicates between the raw material solution tank 22 and the film formation chamber 12. Although not particularly limited, the mist supply path 30 of the present embodiment is made of quartz. The quartz may be anhydrous quartz containing substantially no hydroxyl groups (OH groups) or quartz containing a relatively large amount of hydroxyl groups. The mist supply path 30 is provided with a heater 34. The heater 34 is arranged along the mist supply path 30 and heats at least a section HS, which is a part of the mist supply path 30. A specific configuration of the heater 34 is not particularly limited. The heater 34 heats the mist supply path 30 in order to suppress condensation and aggregation of the mist 7 passing through the mist supply path 30. The temperature of the heater 34 is referred to as T3. The temperature T3 may be 100 degrees Celsius (° C.) or higher (i.e., T3≥100), for example.
As shown in
When the film formation apparatus 10 is repeatedly used, deposits resulting from condensation and aggregation of the mist 7 adhere to the inner surface 30a of the mist supply path 30. The deposits adhering to the inner surface 30a absorb the infrared rays R1 and R2 that are radiated to the mist 7 from the inner surface 30a of the mist supply path 30. Therefore, as the adhesion of the deposits progresses, the amount of heat (i.e., the dose of the infrared rays R1 and R2) transmitted to the mist 7 decreases, and the temperature rise generated in the mist 7 also decreases. As a result, the temperature of the mist 7 supplied to the substrate 2 is lowered unintentionally, thereby deteriorating the film quality. In other words, in the course of repeated use of the film formation apparatus 10, if the decrease in the amount of heat (the dose of the infrared rays R1 and R2) transmitted from the inner surface 30a of the mist supply path 30 to the mist 7 is suppressed, the deterioration of the film quality can be suppressed. For that purpose, it is conceivable to previously coat the inner surface 30a of the mist supply path 30 with a material that is equivalent to or similar to the deposits derived from the mist 7.
Based on the above findings, the inner surface 30a of the mist supply path 30 is coated with a coating layer 40 in the mist heating section HS in the present embodiment. The material forming the coating layer 40 contains at least one of oxide and hydroxide of an element present in the mist 7. Since the mist supply path 30 is made of transparent quartz and the coating layer 40 is formed on the inner surface 30a of the mist supply path 30, the mist supply path 30 has an appearance similar to frosted glass. Since the coating layer 40 is formed in advance on the inner surface 30a of the mist supply path 30, that is, the inner surface 30a of the mist supply path 30 has the coating layer 40 as a pre-coating layer, even if the deposits derived from the mist 7 further adhere, the amount of heat (the dose of infrared rays R1 and R2) transmitted from the inner surface 30a of the mist supply path 30 to the mist 7 decreases. As a result, the temperature drop of the mist 7 supplied to the substrate 2 is also suppressed, and the film formation under predetermined optimum conditions can be continued over a long period of time.
A specific configuration of the coating layer 40, such as indices such as thickness and density, is not particularly limited. However, the coating layer 40 may have an absorptivity of 50% or more with respect to the infrared rays R1 and R2 radiated from the inner surface 30a of the mist supply path 30 toward the mist 7. According to such a configuration, even when the deposits derived from the mist 7 further adhere in the course of repeated use of the film formation apparatus 10, the magnitude of decrease in the amount of infrared rays radiated to the mist 7 is effectively suppressed.
In the film formation apparatus 10 of the present embodiment, the temperature T3 of the heater 34 may be 100 degrees Celsius (° C.) or higher (i.e., T3≥100). In this case, the temperature T2 of the inner surface of the film formation chamber 12 and the temperature T3 of the heater 34 may satisfy the relationship of T2<T3. According to such a configuration, the mist 7 is mainly heated in the mist heating section HS, and is not heated so much inside the film formation chamber 12. Therefore, the temperature rise of the mist 7 in the mist heating section HS largely affects the final temperature of the mist 7 supplied to the substrate 2, and can also largely affect the film quality. For this reason, when the relationship of T2<T3 is satisfied, the film quality can be effectively stabilized by stabilizing the temperature rise of the mist 7 in the mist heating section HS. As such, the inner surface 30a of the mist supply path 30 is preferably coated with the coating layer 40 in advance, as the present embodiment described herein.
When the temperature T3 of the heater 34 is 100 degrees Celsius (° C.) or higher (i.e., T3≥100), a large amount of the infrared rays R1, R2 having the wavelength of 7.8 micrometer or less are radiated from the heater 34 based on Wien's displacement law. The wavelength of 7.8 micrometers or less is in a wavelength band that is easily absorbed by water, and largely affects the temperature rise of the mist 7 containing water. Therefore, in order to stabilize the film quality, it is particularly effective to suppress changes in the amount of infrared rays radiated to the mist 7. For this reason, the inner surface 30a of the mist supply path 30 is preferably coated with the coating layer 40 in advance.
Next, a method of using the film formation apparatus 10 will be described with reference to
In the preliminary process, the mist 7 in the mist supply path 30 is preferably exhausted to the outside without being supplied to the film formation chamber 12. Therefore, the mist supply path 30 may be provided with an exhaust path 38 via the branch valve 36. The branch valve 36 is positioned downstream of the mist heating section HS and configured to selectively guide the mist 7 that has passed through the mist heating section HS to either the film formation chamber 12 or the exhaust path 38.
Thereafter, in the film forming process, as shown in
Although not particularly limited, the temperature T4 of the heater 34 in the preliminary process and the temperature T1 of the substrate 2 in the film forming process may satisfy a relationship of T1<T4. According to such a configuration, in the preliminary process, the temperature of the inner surface 30a of the mist heating section HS is relatively high, so that the formation of the coating layer 40 is effectively promoted. In the preliminary process, the temperature of the inner surface 30a of the mist heating section HS is substantially equal to the temperature T4 of the heater 34. Further, it is preferable that the temperature T4 of the heater 34 in the preliminary process and the temperature T3 of the heater 34 in the film forming process satisfy the relationship of T3<T4. Also in this case, the temperature of the inner surface 30a of the mist heating section HS is relatively high in the preliminary process. Therefore, the formation of the coating layer 40 is effectively promoted.
Although not particularly limited, the mist 7 in the preliminary process may be the same as the mist 7 in the film forming process. In this case, although not particularly limited, the preliminary process and the film forming process may be performed continuously. However, as another embodiment, the mist 7 in the preliminary process may be different from the mist 7 in the film forming process. That is, the raw material solution 6 may be different between the preliminary process and the film forming process.
A film formation apparatus 110 of a second embodiment will be described with reference to the drawings. As shown in
In the film formation apparatus 110 of the present embodiment, the film formation chamber 12 has a cylindrical shape, and the heater 34 is provided around the film formation chamber 12. The section HS of the mist supply path 30 is located inside the film formation chamber 12 and surrounded by the heater 34. As such, the heater 34 can heat the substrate 2 on the stage 14 as well as heat the mist supply path 30. As shown in
Also in the present embodiment, the inner surface 30a of the mist supply path 30 in the mist heating section HS is coated with the coating layer 40. The material forming the coating layer 40 contains at least one of oxide and hydroxide of an element present in the mist 7. Since the coating layer 40 is formed in advance on the inner surface 30a of the mist supply path 30, even if the deposits derived from the mist 7 further adhere, the magnitude of decrease in the amount of heat (the dose of the infrared rays R1 and R2) transmitted from the inner surface 30a of the mist supply path 30 to the mist 7 is reduced. As a result, the temperature drop of the mist 7 supplied to the substrate 2 is also suppressed, and the film formation under predetermined optimum conditions can be continued over a long period of time.
Next, a method of using the film formation apparatus 110 will be described with further reference to
Thereafter, in the film forming process, the mist generation source 20 and the mist supply path 30 are attached to the film formation chamber 12, as shown in
A film formation apparatus 210 of the third embodiment will be described with reference to the drawings. As shown in
In the film formation apparatus 210 of the present embodiment, a part of the mist supply path 30 and the film formation chamber 12 are provided by a common cylindrical member, and the heater 34 is disposed around the cylindrical member. That is, the part of the mist supply path 30 and the film formation chamber 12 share the cylindrical member. Therefore, in the film formation apparatus 210 of the present embodiment, the boundary between the mist supply path 30 and the film formation chamber 12 is not particularly defined, and it can be interpreted that the mist supply path 30 includes the film formation chamber 12. As shown in
Also in the present embodiment, the inner surface 30a of the mist supply path 30 in the mist heating section HS is coated with the coating layer 40. The material forming the coating layer 40 contains at least one of oxide and hydroxide of an element present in the mist 7. Since the coating layer 40 is formed in advance on the inner surface 30a of the mist supply path 30, even if the deposits derived from the mist 7 further adhere, the magnitude of decrease in the amount of heat (the dose of the infrared rays R1 and R2) transmitted from the inner surface 30a of the mist supply path 30 to the mist 7 is reduced. As a result, the temperature drop of the mist 7 supplied to the substrate 2 is also suppressed, and the film formation under predetermined optimum conditions can be continued over a long period of time.
Next, a method of using the film formation apparatus 210 will be described with further reference to
Thereafter, as shown in
A film formation apparatus 310 of the fourth embodiment will be described with reference to the drawings. As shown in
In the film formation apparatus 310 of the present embodiment, the stage 14 is a turntable, and a plurality of substrates 2 can be placed on the stage 14. Further, the film formation chamber 12 is provided with a duct 312 connected to the mist supply path 30, so that the mist 7 from the mist supply path 30 is supplied to the substrates 2 on the stage 14 through the duct 312. The mist supply path 30 is provided with an exhaust path 38 via a branch valve 36 as in the first embodiment.
A heater 34 is provided in a section HS of the mist supply path 30. As shown in
Also in this embodiment, the inner surface 30a of the mist supply path 30 in the mist heating section HS is coated with the coating layer 40. The material forming the coating layer 40 contains at least one of oxide and hydroxide of an element present in the mist 7. Since the coating layer 40 is formed in advance on the inner surface 30a of the mist supply path 30, even if the deposits derived from the mist 7 further adhere, the magnitude of decrease in the amount of heat (the dose of the infrared rays R1 and R2) transmitted from the inner surface 30a of the mist supply path 30 to the mist 7 is reduced. As a result, the temperature drop of the mist 7 supplied to the substrates 2 is also suppressed, and the film formation under predetermined optimum conditions can be continued over a long period of time.
Next, a method of using the film formation apparatus 310 will be described with further reference to
Thereafter, in the film forming process, the mist generation source 20 and the mist supply path 30 are attached to the film formation chamber 12, as shown in
Although the embodiments of the present disclosure have been described in detail hereinabove, these are merely examples and do not limit the scope of the present disclosure. The techniques described in the present disclosure include various modifications of the embodiments described hereinabove. The technical elements described in the present disclosure or the drawings exhibit technical usefulness alone or in various combinations, and are not limited to the combinations described in the present disclosure at the time of filing. The techniques illustrated in the present disclosure or drawings can achieve multiple objectives at the same time, and achieving one of the objectives itself has technical usefulness.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2021-213031 | Dec 2021 | JP | national |
