Claims
- 1. A heterolithic voltage controlled oscillator comprising: a doped silicon wafer having a resistivity range of 0.002-0.006 Ohms/cm; the doped silicon wafer having applied thereon a ground via; the doped silicon wafer further being n.sup.+ doped and having applied thereon epitaxially grown silicon of a preferred crystallographic orientation, the epitaxially grown silicon having p-doped regions fabricated of implanted donor and acceptor ions in the epitaxially grown silicon and providing a heterolithic varactor structure and a heterolithic bipolar transistor structure both having p-doped regions fabricated of implanted donor and acceptor ions in the epitaxially grown silicon; said epitaxially grown silicon having been anisotropically etched to provide respective pedestals embodying said varactor structure and said transistor structure and said ground via, a dielectric material disposed between said pedestals; and wherein; an input voltage (V.sub.supply) is applied to a collector of the transistor structure, the transistor structure oscillates at a frequency proportional to said voltage, an L-C resonator circuit formed by metallization on the wafer connects at a base of the transistor structure, the varactor structure connects with an inductor formed by metallization on the wafer to provide a tank circuit, the tank circuit being connected to the resonator circuit, and the varactor structure having a capacitance that varies with voltage, which tunes the frequency of the resonator circuit to provide a voltage of different frequency that is applied as a tuning voltage V.sub.tune to the input voltage, and that shifts the average frequency of the voltage controlled oscillator towards the frequency of the input voltage.
- 2. A voltage controlled oscillator as recited in claim 1, wherein said dielectric material is glass.
- 3. A voltage controlled oscillator as recited in claim 1, wherein said dielectric material is a low loss material at microwave and rf frequencies.
Parent Case Info
This application claims benefit of provisional application Ser. No. 60/022,677, filed Jul. 28, 1996.
US Referenced Citations (15)
Foreign Referenced Citations (1)
Number |
Date |
Country |
0 534 271 A2 |
Mar 1993 |
EPX |