"New Wide Angle, High Transmission Energy Analyzer for Secondary Ion Mass Spectrometry", by M. W. Siegel and M. J. Vasile, Rev. Sci. Instrum. 52(111), Nov. 1981, pp. 1603-1615. |
"Sputter Initiated Resonance Ionization Spectroscopy", by J. E. Parks et al., Thin Solid Films, 1983, North-Holland Publishing Co., pp. 69-78. |
"SARISA--For Those Difficult to Detect Sputtered Atoms", by D. M. Gruen et al., Vacuum Technology, Research & Development, Mar. 1984, pp. 153-160. |
"Trace Surface Analysis With Pico-Coulomb Ion Fluences: Direct Detection of Multiphoton Ionized Iron Atoms From Iron-Doped Silicon Targets", by M. J. Pellin et al., Surface Science 144 (1984), pp. 619-637. |