Berning, Use of Equivalent Films in Design of Infrared Multilayer Antireflection Coatings, Journal of Optical Society of America, vol. 52, p. 431 (1962). |
Budde, Photoelectric Analysis of Polarized Light, Applied Optics, vol. 1, p. 201 (1962). |
Dobrowolski, Completely Automatic Synthesis of Optical Thin Film Systems, Applied Optics, vol. 4, p. 937 (1965). |
Epstein, The Design of Optical Filters, Journal of the Optical Society of America, vol. 42, p. 806 (1952). |
Hauge, et al., Design and Operation of ETA, an Automated Ellipsometer, IBM Journal of Research & Development, p. 472 (Nov. 1973). |
Hottier, et al., In Situ Monitoring by Ellipsometry of Metalorganic Epitaxy of GaAlAs-GaAs Superlattice, J. Applied Physics, vol. 51, p. 1599 (1980). |
Minot, Single-Layer, Gradient Refractive Index Antireflection Films Effective from 0.35 to 2.5.mu., J. of Optical Society of America, V. 66, p. 515 (1976). |
Netterfield, et al., Characterization of Growing Thin Films by in situ Ellipsometry, Spectral Reflectance and Transmittance Measurements, and Ion-Scattering Spectroscopy, Review of Scientific Instruments, vol. 56, p. 1995 (1985). |
Snedaker, New Numerical Thin-Film Synthesis Technique, Journal of the Optical Society of America, vol. 72, p. 1732 (1982). |
Southwell, Quintic Refractive Index Profile Antireflection Coatings, U.S. Pat. No. 4,583,822. |
Southwell, Gradient-Index Antireflection Coatings, Optics Letters, vol. 8, p. 584 (1983). |
Southwell, Coating Design Using Very Thin High- and Low-Index Layers, Applied Optics, vol. 24 (1985). |
Theeten, Ellipsometric Assessment of (Ga,Al) As/GaAs Epitaxial Layers During their Growth in an Organometallic VPE System, Journal of Crystal Growth, vol. 46, p. 245 (1979). |
Yadava, Optical Behavior of Gradient-Index Multilayer Films, Thin Solid Films, vol. 21, p. 297 (1974). |