Magnetic field sensors are ubiquitous, they are found as position, rotation and velocity sensors in vehicles and industrial equipment. They are also used for current sensing in high power applications and the advance in magnetic sensors has enabled the low-cost high-density hard disk industry.
For magnetic sensors to be attractive they need to have a high magnetoresistance (MR>100%), have a linear response in a small magnetic field (%/Oe), and have low resistance (high signal to noise).
Presently, magnetic sensors have high magnetoresistance (MR>100%), for example MgO based magnetic tunnel barriers, but these have a high resistance due to the nature of the tunnel barrier. Hall sensors are cheap and have a linear response but a very low sensitivity (%/Oe). Anisotropic magneto resistance sensors have low resistance and thus high signal to noise but very low magnetoresistance (MR<2-3%).
This disclosure describes and demonstrates a magnetic field sensor based on two anti-ferromagnetically coupled magnetic layers separated by multilayer graphene, prepared in a single sputter chamber without a vacuum break.
This disclosure describes and demonstrates a magnetic field sensor based on two anti-ferromagnetically coupled magnetic layers separated by multilayer graphene, prepared in a single sputter chamber without a vacuum break.
The key advantages include at least the following: 1) the potential for very high magnetoresistance values because of the spin filtering nature of multi-layer graphene; 2) the absence of hysteretic behavior, crucial for sensor application, due to the anti-ferro magnetic coupling induced by the graphene spacer layer; 3) the low resistance of the multilayer, crucial for high signal to ratio; and 4) very high sensitivity, large magnetoresistance response in a small magnetic field range.
In this disclosure is described how the use of multilayer graphene synthesized from a layer of sputtered amorphous carbon induces anti-ferromagnetic coupling between two ferromagnetic layers (ideal for magnetic sensors) and has low resistance and large magnetoresistance response in a small magnetic field.
Electron transport through multi-layer graphene only supports electrons with a momentum K. Graphene in close contact with ferromagnetic surfaces such as Ni(111) and Co(0002) have theoretically been shown only to have minority spin carriers with momentum K. For electrons with momentum different than K (the majority spin), the graphene is effectively an insulator or tunnel barrier. Multilayer graphene acts as a perfect spin filter between two magnetic layers in a similar fashion as MgO is a spin filter in MgO based tunnel barriers with TMR>100%.
The magnetic behavior of two magnetic layers separated by a non-magnetic layer depends on the interlayer exchange coupling. They are either anti-ferromagnetically coupled, ferromagnetically coupled, or free. For magnetic memory applications, it is desired that the coupling be free in order to arbitrarily switch one of the magnetic layers. This is not ideal for magnetic sensors, because this implies hysteretic switching behavior.
For a sensor, it is desired that the layers are anti-ferromagnetically coupled, such that the magnetization of the two layers are anti-parallel when no magnetic field is applied and an external magnetic field will overcome the exchange interaction and align the magnetizations parallel. The magnetoresistance response results from the change in resistance between the anti-parallel and the parallel magnetic orientation. A ferromagnetic coupling would have the two layers always parallel aligned and lead to zero magneto resistance. Multilayer graphene has theoretically been predicted to induce anti-ferromagnetic coupling.
Graphene is typically synthesized on a metal by exposure to high temperature ambient in the presence of a source of carbon. Here, in one example or embodiment, we will use graphene from solid source, such that we can build the whole sensor stack in a single process run in a sputtering chamber.
The full stack was prepared in situ using DC magnetron sputtering in an AJA sputtering chamber with base pressure less than 3×10−8 Torr. The sputtering guns were in a confocal geometry with ˜15 degree of incidence angle and ˜15 cm of distance between substrate and the gun.
The substrate, Silicon wafers with a 27.5 nm of thermal oxide, were ultrasonically cleaned 15 minutes each in acetone then alcohol. After loading, the substrate was back sputtered for three minutes at 10 W, 100V in 20 mTorr of Argon. 2.5 nm of amorphous carbon was grown at a rate of 0.31 nm per minute at 100 W in 3 mTorr of Ar. 25 nm of Ni80Fe20 was grown at 0.05 nm/sec at 100 W in 3 mTorr Ar.
An in situ anneal at 875 C for 10 minutes was performed in a pressure below 2×10−6 Torr. The sample was then allowed to cool down to room temperature at 10 C/min. After the sample was cooled down it was either unloaded for analysis or a layer of 12 nm Co90Fe10 was sputter deposited and capped with 7.5 nm of Pt, see
Atomic force microscopy of the sample after anneal but before the second magnetic layer, see
Magnetic studies by vibrating sample magnetometer shown in
Here, the magnetization is reduced and plateaus around zero applied magnetic field, where the magnetization of the two layers cancel each other.
The resistance is lower at zero field and higher at large field. This is the opposite of conventional giant magneto resistance, which has a negative magneto resistance. This is direct confirmation of the spin filtering of majority carriers in the multilayer graphene spacer. The overall resistance of this sample was 12 Ohm.
There are many major advantages of this new method and device.
Some advantages include but are not limited to: 1) simple in situ processing using standard sputtering techniques; 2) High MR due to spin filtering of graphene; 3) High sensitivity and linear regime due to Anti-ferromagnetic coupling; and 4) Low resistance, thin well controlled multi layer graphene spacer layer.
Some further advantages include but are not limited to: 1) Positive magneto resistance can be combined with conventional negative magneto resistance in balancing circuits for even greater sensitivity; 2) Creates a diffusion barrier to prevent inter-diffusion of the two metal layers at high temperature needed for subsequent processing; 3) Provides control of the film thickness in discrete 0.3 nm steps down to monoatomic 0.3 nm thickness that is unachievable with competing materials; and 4) Removes the dangling bonds inherent in three-dimensional crystalline and amorphous materials thereby preventing formation of unwanted compounds at the interface between films.
This new magnetic field sensor using In Situ solid source graphene and graphene induced anti-ferromagnetic coupling and spin filtering can be used in many applications and are superior to the current state of the art because this new sensor overcomes the issues of the current sensors which either have low MR (AMR) high resistance (GMR, MTJs) or low sensitivity (Hall sensors).
Many modifications and variations of the present invention are possible in light of the above teachings. It is therefore to be understood that the claimed invention may be practiced otherwise than as specifically described. Any reference to claim elements in the singular, e.g., using the articles “a,” “an,” “the,” or “said” is not construed as limiting the element to the singular.
This application claims priority to and the benefits of U.S. Patent Application No. 62/297,550 filed on Feb. 19, 2016, and U.S. patent application Ser. No. 15/425,731 filed on Feb. 6, 2017, issued on Apr. 16, 2019 as U.S. Pat. No. 10,261,139, the entirety of each are herein incorporated by reference.
Number | Name | Date | Kind |
---|---|---|---|
8711600 | Venkataraman | Apr 2014 | B2 |
20090321860 | Klostermann | Dec 2009 | A1 |
20090322319 | Kreupl | Dec 2009 | A1 |
20100007995 | Sasaki | Jan 2010 | A1 |
20100188782 | Yamazaki | Jul 2010 | A1 |
20110149670 | Heo | Jun 2011 | A1 |
20110211272 | Butler | Sep 2011 | A1 |
20130100724 | Venkataraman | Apr 2013 | A1 |
20130170290 | Odagawa | Jul 2013 | A1 |
20140070168 | Seneor | Mar 2014 | A1 |
20140151826 | Keiber | Jun 2014 | A1 |
20140166959 | Bertin | Jun 2014 | A1 |
20140273259 | Friedman | Sep 2014 | A1 |
20150129994 | Bowen | May 2015 | A1 |
20150299850 | Cobas | Oct 2015 | A1 |
20150299852 | Ozkan | Oct 2015 | A1 |
20150303059 | Friedman | Oct 2015 | A1 |
20160111633 | Hsueh | Apr 2016 | A1 |
20160169986 | Li | Jun 2016 | A1 |
20170062435 | Im | Mar 2017 | A1 |
20170194098 | Chang | Jul 2017 | A1 |
20180130897 | Friedman | May 2018 | A1 |
20190320458 | Hosseini | Oct 2019 | A1 |
20200264248 | Xu | Aug 2020 | A1 |
Entry |
---|
Bhaviripudi et al. (Nanoletters, 2010, 10, 4126-4133). (Year: 2010). |
Cobas et al. (Nanoletters, 2012,12,3000-3004) (Year: 2012). |
Iqbal et al. (Nano Res., 2013, 6(5), 373-380) (Year: 2013). |
Number | Date | Country | |
---|---|---|---|
20190265312 A1 | Aug 2019 | US |
Number | Date | Country | |
---|---|---|---|
62297550 | Feb 2016 | US |
Number | Date | Country | |
---|---|---|---|
Parent | 15425731 | Feb 2017 | US |
Child | 16274650 | US |