Quadrature error is one of the primary factors that limit the performance of micromachined sensors such as gyroscopes. Considering the relative magnitudes of the drive and sense oscillations, even an extremely small part of the drive motion coupling into a sense-mode could dominate over the Coriolis response.
Practically, fabrication imperfections may result in less-than-ideal geometries in structures such as gyroscope structures. Less-than-ideal geometries can cause a drive oscillation to partially couple into a sense-mode. Even though several cross-coupling approaches exist, such as elastic, viscous and electrostatic coupling approaches, in certain cases the elastic coupling due to anisoelasticity in the suspension elements increases in magnitude beyond a desired level.
In sensor systems such as gyroscope systems with out-of-plane operational modes, anisoelasticity between the in-plane and out-of-plane directions is the dominating source of Quadrature error. Sidewall tilt or skew in deep reactive-ion etching (“DRIE”) can result in deviation of the cross-section of the flexure bearings from a rectangle to a parallelogram, causing the principle axes of elasticity of the suspension flexure bearings to deviate from parallel and orthogonal to the device surface. In an example, single or multi-axis micromachined sensor structures such as gyroscope structures can suffer from high-quadrature error caused at least in part by DRIE skew.
Additionally, prior resonators rely on simple straight flexure bearings to generate a flexing structure to allow the device to displace in resonance. This creates significant problems when etching creates a skew in the flexure bearing, causing large undesired displacement, often actuating a sense mechanism.
In the drawings, which are not necessarily drawn to scale, like numerals may describe similar components in different views. Like numerals having different letter suffixes may represent different instances of similar components. The drawings illustrate generally, by way of example, but not by way of limitation, various embodiments discussed in the present document.
Unwanted sidewall flex can negatively affect the performance of flexure bearings (“flexures”), such as flexure bearings that support one or more portions of a microelectromechanical systems (“MEMS”) structure such as a die. In an example, if one or more sidewalls have an angle error, an in-plane drive motion can cause out-of-plane motion, such as when the skew axis is along a flexure bearing or beam length. In an example, when skewed pliable or compliant flexure bearings or beams are located on opposite sides during a drive motion, a resulting out-of-plane deflection can cause or contribute to quadrature error. In an example, a low-quadrature suspension system aims at reducing or cancelling undesired out-of-plane motion.
An example includes a fixed portion 118, wherein the anchor 106 is coupled to the fixed portion 118. In an example, a first nonlinear suspension member 108 is coupled to anchor 106 on a side of the anchor. In an example, a second nonlinear suspension member 120 coupled to the anchor on the same side of the anchor, the second nonlinear suspension member having a shape and location mirroring the first nonlinear suspension member about an anchor bisecting plane 122, such as a x-Z-plane. Various examples include a proof-mass 104 that is planar, the proof-mass suspended at least in part by the first nonlinear suspension member 108 and the second nonlinear suspension member 120 such that the proof-mass is rotable about the anchor 106 and is slideable in a plane parallel to the fixed portion, such as in the x-y plane.
In an example, a C-shaped flexure bearing 108 includes a inner portion 110 coupled to the anchor 106 and extending toward the anchor bisecting plane 122, a center portion 114 having a proximal portion and a distal portion, with a proximal portion coupled to the inner portion 110 and a distal portion extending away from the anchor 106 along the anchor bisecting plane 122 and coupled to a outer portion 112 extending away from the anchor bisecting plane 122. In an example, the center portion 114 is perpendicular the inner portion 110 and the outer portion 112. In an examples, the center portion 114 is parallel the anchor bisecting plane 122.
In an examples, the anchor 106, the first nonlinear suspension member 108, the second nonlinear suspension member 120 and the proof-mass 104 are formed of a monolithic material. In an example, the fixed portion 118 comprises a fixed monolithic material other than the monolithic material of the anchor 106, the first nonlinear suspension member 108, the second nonlinear suspension member 120 and the proof-mass 104. In an example, the fixed portion 118 comprises a fixed monolithic material the same as the monolithic material of the anchor 106, the first nonlinear suspension member 108, the second nonlinear suspension member 120 and the proof-mass 104.
In an example, flexure bearings are disposed on each side of the central anchor, such as on opposite sides of the anchor. In an example, out-of-plane motion caused by each C-shaped flexure bearing on a side is cancelled out by its symmetric counterpart. Accordingly, in an example, the quadrature error induced on each flexure bearing is locally reduced or cancelled.
In an example, a central suspension structure 102 is utilized in a sensor, such as a 6 degree of freedom (“DOF”) sensor 100, such as a monolithic 6-DOF sensor, that is comprised of symmetric flexures bearings. In an example, the symmetric flexure bearings include “C-shaped flexure bearings” 108. In an example, each C-shaped flexure bearing includes inner 110 and outer 112 flexure bearings and a high-stiffness connection flexure bearing 114 between two flexure bearings. In an example, the inner flexure bearing 112 is connected to the anchor 106 on one end, and the outer flexure bearing 112 is connected to the proof-mass 104 on another end. In an example, the suspension system 102 is formed by a total of eight C-shaped flexure bearings 108. In an example, two symmetric C-shaped flexure bearings are located on each of the four sides of a central anchor structure.
In an example, a suspension system provides three gyroscope operational modes: torsional in-plane about the Z-axis for the drive motion; torsional out-of-plane about the X-axis for the Y-axis gyroscope sense motion; and torsional out-of-plane about the Y-axis for the X-axis gyroscope sense motion. In an example, the oscillation modes can be switched between each other.
The illustrated example illustrates torsional motion about a Z-Axis, i.e. an axis extending into and out of the page. In an example, during the in-plane torsional motion, the inner 310 and outer 312 flexure bearings in each C-shaped flexure bearing bend in-plane. In an example, the high-stiffness connection bearings 308 do not experience significant bending. For a counterclockwise rotation of the proof-mass about the Z-axis, top part of the proof-mass moves left as shown. In an example, the high-stiffness connection bearings both move left. As a result, the inner and outer flexures on the right C-shaped flexure bearing bend down, while the ones on the left C-shaped flexure bearing bend up. Thus, in an example, the motion results in deflections in opposite directions in the symmetric C-shaped flexure bearing flexures. Since the flexures in symmetric C-shaped flexure bearings deflect in opposite directions, the out-of-plane motion caused by the deflection of the flexure bearings in each C-shaped flexure bearing on a side is cancelled out by its symmetric counterpart. Thus, the quadrature error induced on each flexure bearing is locally cancelled.
In an example, the die is wafer shaped, with each of a first nonlinear suspension member 408 and a second nonlinear suspension member 412 having a substantially rectangular cross-section with the height of the cross-section smaller than the width.
However, in some examples, the inner 910, 910′ and outer 912, 912′ flexure bearings are rotated so that deformation causes one flexure bearing to bend up and one flexure bearing to bend downward during drive mode actuation. In an example, the drive mode is a rotational mode about a central anchor. In an example, for each of the four suspension pairs 404, the drive mode causes one to deform in one direction and the other in the other direction.
Such offsetting is illustrated in
Returning to
A second feature is nonsymmetrical stator finger electrodes, as illustrated specifically in
The illustrated Z-axis rotation sensing electrode structure senses differential motion. The structure provides for differential detection of anti-phase sense motion, with proof-mass fingers that are symmetric about the Y-Z plane 1422, while stator electrodes that are not symmetric about the Y-Z plane. Symmetrical electrode configurations are desirable for vibration rejection. The disclosed electrodes provide proof-mass electrodes that are symmetrical across the Y-Z plane. The symmetrical proof-mass electrodes achieve improved vibration rejection versus nonsymmetrical designs.
The sectional views in
In an example, Z-axis gyro sense motion is sensed via differential proof-mass sensing, while in-phase motion, i.e. motion of the proof-masses in the same direction, is rejected. In various examples, drive motion (1448 in
A third feature includes vertical flexures 1426, illustrated in
For example, a fixed portion or substrate can be coupled to an anchor 1404. A fixed portion includes a package substrate, for examples. A first nonlinear suspension member 1406 can be coupled to anchor 1404 on a side of the anchor 1404. A second nonlinear suspension member 1407 coupled to the anchor 1404 on the same side of the anchor 1404. The second nonlinear suspension member can have a shape and location mirroring the first nonlinear suspension member about an anchor 1404 bisecting plane, although the present subject matter is not so limited. One or both of the first nonlinear suspension member and the second nonlinear suspension member can form part of an inner gimbal 1458 of the microelectromechanical die 1400.
A proof-mass 1408 that is planar can be coupled to the inner gimbal 1458. The proof-mass can be suspended by a first suspension 1460 member disposed on a first side of the anchor 1404. The proof-mass can be suspended by a second suspension member 1462 disposed on a second side of the anchor 1404. The first suspension member 1460 can be coupled opposite the first side of the anchor.
The die 1400 can define a first gap 1464. The gap 1464 can extend along a first side 1466 of the anchor 1404. A second gap 1468 can extend along a second side 1470 of the anchor 1404. The second gap 1468 can be opposite the first side 1466. Each of the first gap 1464 and the second gap 1468 can extend between the inner gimbal 1458 and the proof-mass 1408.
The first gap 1464 can extend from the first suspension member 1460 to the second suspension member 1462. The second gap 1468 can extend from the first suspension member 1460 to the second suspension member 1462. One or both of the first gap and the second gap can be C-shaped. The first C-shape can define a first opening 1472 that opens to a second opening 1474 of the second C-shape of the second gap 1468.
The first C-shape can include a first end portion 1482 and a second end portion 1484, with a center portion 1486 extending between the first end portion and the second end portion. The first end portion and the second end portion can be perpendicular to the center portion. A first canted portion 1488 can extend between the first end portion 1482 and the center portion and a second canted portion 1490 can extend between the second end portion 1484 and the center portion. The first gap can be a mirrored shape of the second gap and the first gap can be mirrored along the anchor bisecting plane.
The first gap can define a first vertical flexure 1476 and a second vertical flexure 1478. The second gap can define a third vertical flexure 1426 and a fourth vertical flexure 1480. Each of the first, second, third and fourth vertical flexures can be elongate, with a length longer than a width. Each respective length can extend away from a respective suspension member. Each respective length can extend away from the anchor bisecting plane 1422.
In an example, a solid proof-mass frame structure, such as the structure illustrated in
The gimbal structure illustrated in
In various examples, drive motion (1448 in
An additional feature of
A microelectromechanical die 1400 can couple with a substrate such as a package to form a packaged integrated circuit. A proof-mass 1408 can be coupled to the substrate at an anchor 1404. The proof-mass can include a first portion 1454 that can be moveable with respect to the anchor 1404. The first portion can include a first proof-mass electrode 1452. A second portion 1456 of the proof-mass 1408, opposite the first portion 1454 with respect to the anchor 1404, can be moveable with respect to the anchor 1404 and the first portion 1454. The second portion 1456 can include a second proof-mass electrode 1452′. The proof-mass 1408 can define a first opening 1492 on a first side of the anchor 1404, such as on the first side of the plane 1423. The first portion 1454 of the proof-mass can be moveably coupled in the opening 1492 to the substrate.
The first proof-mass electrode 1452 can be one of a first plurality of proof-mass electrodes extending into the opening 1492. The plurality can be spaced apart from one another. The proof-mass 1408 can define a second opening 1494 on the second side of the anchor, such as on the first side of the plane 1423. The second portion 1456 can be coupled inside the second opening 1494. The second proof-mass electrode 1452′ can be one of a second plurality of proof-mass electrodes extending into the opening 1494, spaced apart from one another.
A first stator 1430 can be coupled to the substrate, such as via anchor 1428, and can include a first stator electrode 1450. The first stator electrode 1450 can extend alongside the first proof-mass electrode 1452 of the proof-mass to form a first electrode pair. A second stator 1431 can be coupled to the substrate and can include a second stator electrode 1451, opposite the first stator electrode 1450. The second stator electrode 1451 can extend alongside the second proof-mass electrode 1452′ of the second portion 1456 of the proof-mass 1408 to form a second electrode pair. The first electrode pair can form a first capacitor. The second electrode pair can form a second capacitor.
The first proof-mass electrode of the proof-mass can be opposite the second proof-mass electrode of the proof-mass, across the anchor and wherein the first stator electrode can be coupled to the substrate opposite the second anchored electrode, across the anchor.
The first stator electrode 1450 can be one of a first plurality of stator electrodes interdigitated and paired with respective ones of the first plurality of proof-mass electrodes to form the first electrode pair. The second stator can be one of a second plurality of stator electrodes interdigitated and paired with respective ones of the second plurality of stator electrodes to form the second electrode pair
In a first vibratory mode of the die 1400 the first portion 1454 of the proof-mass can be to move away from the second portion 1456 of the proof-mass. The first stator electrode 1450 and second stator electrode 1451 can be arranged such that a distance between electrodes of the first electrode pair can be inversely proportional to a distance between electrodes of the second electrode pair. The first portion 1454 of the proof-mass can be symmetrical, across the anchor 1404, with the second portion 1456 of the proof-mass. The first stator 1430 can be asymmetrical, across the anchor 1404, with respect to the second stator 1431.
In the first vibratory mode the first plurality of stator electrodes can be configured to move away from the first plurality of stator electrodes and away from the anchor while the second plurality of stator electrodes can be configured to move toward the second plurality of stator electrodes and toward the anchor. The proof-mass can be configured to vibrate with respect to the substrate to vary the distances between the first plurality of stator electrodes and the first plurality of stator electrodes and to vary the distances between the second plurality of stator electrodes and the second plurality of stator electrodes.
One of the first plurality of stator electrodes, closest to the anchor, e.g., 1452, being a distance from one of the first plurality of stator electrodes, e.g. 1450, closest to the anchor, when one of the second plurality of stator electrodes, e.g. 1451, closest to the anchor, can be a greater distance from one of the second plurality of stator electrodes, e.g. 1452′, closest to the anchor.
Each of the first proof-mass electrode 1452 and the first stator electrode 1450 can be elongate. A distance D14 between the first proof-mass electrode and the first stator electrode can be substantially constant along the length L14 of each. Each of the second proof-mass electrode 1452′ and the second stator electrode 1451 can be elongate. A distance between the second proof-mass electrode and the second stator electrode being substantially constant along the length of each.
One or more of the first proof-mass electrode, the second proof-mass electrode, the first stator electrode and the second stator electrode can be curved. Each of the electrodes can be curved around an axis around which the proof-mass can be configured to rotate in a second vibratory mode. The axis can be the intersection between the plane 1422 and the plane 1423. The proof-mass can be formed into shape through material removal from a wafer, such as by excising material, such as through etching. Forming can include deep reactive-ion etching.
The die 1400 can be used to sense motion. Vibration of the first portion of a proof-mass and the second portion of a proof-mass can be excited so that the first portion and the second portion move together and apart in synchrony, toward a respective first stator and second stator. Motion of the die along a direction extending between the first portion of the proof-mass and the second portion of the proof-mass can be sensed by measuring a differential in respective capacitance values for the first stator and the second stator. The first proof-mass electrode 1452 can move toward a first stator electrode 1450 of a first stator 1430 while the second portion 1456 can include a second proof-mass electrode 1452′ that moves away from a second stator electrode 1451 of a second stator. Sensing motion can include sensing a differential between a first capacitance of a first electrode pair including the first proof-mass electrode and the first stator electrode and a second electrode pair including the second proof-mass electrode and the second stator electrode. The proof-mass can be rotated in the plane of the proof-mass, e.g. a plane parallel planes 1422 and 1423, without changing the measured differential in respective capacitance values for the first stator and the second stator. Rotation can occur without changing a distance between electrodes of the first electrode pair and without changing a distance between electrodes of the second electrode pair.
Optional methods are possible, including methods in which etching includes deep reactive-ion etching. In some optional methods, the first nonlinear suspension member and the second nonlinear suspension member are part of a first set, comprising etching the material to define a second set of nonlinear suspension members opposite the first set. Some optional methods include etching a third set of nonlinear suspension members for coupling the anchor to the proof-mass and etching a fourth set of nonlinear suspension members for coupling the anchor to the proof-mass, wherein the third set and the fourth set have a similar for factor to the first set and the second set and are bisected by a second anchor bisecting plane perpendicular the first.
The subject matter of the present document can be described using several examples. Example 1 can include a microelectromechanical die for sensing motion, that includes a fixed portion, an anchor coupled to the fixed portion, a first nonlinear suspension member coupled to anchor on a side of the anchor, a second nonlinear suspension member coupled to the anchor on the same side of the anchor, the second nonlinear suspension member having a shape and location mirroring the first nonlinear suspension member about an anchor bisecting plane and a proof-mass that is planar, the proof-mass suspended at least in part by the first nonlinear suspension member and the second nonlinear suspension member such that the proof-mass is rotable about the anchor and is slideable in a plane parallel to the fixed portion.
Example 2 includes the subject matter of example 1, wherein the first nonlinear suspension member has a C-shape.
Example 3 includes the subject matter of example 2, wherein the C-shape includes a inner portion coupled to the anchor and extending toward the anchor bisecting plane, a center portion having a proximal portion and a distal portion, with a proximal portion coupled to the inner portion and a distal portion extending away from the anchor along the anchor bisecting plane and coupled to a outer portion extending away from the anchor bisecting plane.
Example 4 includes the subject matter of example 3, wherein the outer portion of the first nonlinear suspension member has a proximal portion coupled to the center portion of the first nonlinear suspension member, and a distal portion extending away from the anchor bisecting plane, with a fourth portion of the first nonlinear suspension member coupled to the distal portion of the outer portion at a proximal portion of the fourth portion, and extending toward the anchor to a distal portion of the fourth portion that is coupled to a fifth portion of the first nonlinear suspension member that extends toward the anchor bisecting plane.
Example 5 includes the subject matter of any of examples 3-4, wherein the inner portion and the outer portion are linear and parallel.
Example 6 includes the subject matter of example 5, wherein the center portion is perpendicular the inner portion and the outer portion.
Example 7 includes the subject matter of any of examples 3-6, wherein the center portion is parallel the anchor bisecting plane.
Example 8 includes the subject matter of any of examples 1-7, wherein the anchor, the first nonlinear suspension member, the second nonlinear suspension member and the proof-mass are formed of a monolithic material.
Example 9 includes the subject matter of example 8, wherein the fixed portion comprises a fixed monolithic material other than the monolithic material of the anchor, the first nonlinear suspension member, the second nonlinear suspension member and the proof-mass.
Example 10 includes the subject matter of any of examples 1-9, wherein the fixed portion comprises a fixed monolithic material the same as the monolithic material of the anchor, the first nonlinear suspension member, the second nonlinear suspension member and the proof-mass.
Example 11 includes the subject matter of any of examples 1-10, wherein the die is wafer shaped, with each of the first nonlinear suspension member and the second nonlinear suspension member have a substantially rectangular cross-section with the height of the cross-section smaller than the width.
Example 12 includes a that includes etching a material to define an anchor, etching the material to define a first nonlinear suspension member coupled to anchor on a side of the anchor, etching the material to define a second nonlinear suspension member coupled to the anchor on the same side of the anchor, the second nonlinear suspension member having a shape and location mirroring the first nonlinear suspension member about an anchor bisecting plane and etching the material to define a proof-mass that is planar, the proof-mass suspended at least in part by the first nonlinear suspension member and the second nonlinear suspension member such that the proof-mass is rotable about the anchor and is slideable in a plane parallel to the substrate.
Example 13 includes the subject matter of example 12, wherein etching includes deep reactive-ion etching.
Example 14 includes the subject matter of any of examples 12-13, wherein the first nonlinear suspension member and the second nonlinear suspension member are part of a first set, comprising etching the material to define a second set of nonlinear suspension members opposite the first set.
Example 15 includes the subject matter of example 14, comprising etching a third set of nonlinear suspension members for coupling the anchor to the proof-mass and etching a fourth set of nonlinear suspension members for coupling the anchor to the proof-mass, wherein the third set and the fourth set have a similar for factor to the first set and the second set and are bisected by a second anchor bisecting plane perpendicular the first.
Example 16 can include any of the preceding examples, wherein a microelectromechanical die senses motion. The example can include a substrate. The example can include a proof-mass coupled to the substrate at an anchor. The proof-mass can include a first portion moveable with respect to the anchor, the first portion including a first proof-mass electrode. The example can include a second portion of the proof-mass, opposite the first portion with respect to the anchor, the second portion moveable with respect to the anchor and the first portion, the second portion including a second proof-mass electrode. The example can include a first stator coupled to the substrate and including a first stator electrode extending alongside the first proof-mass electrode of the first portion of the proof-mass to form a first electrode pair. The example can include a second stator coupled to the substrate and including a second stator electrode, opposite the first stator electrode, and extending alongside the second proof-mass electrode of the second portion of the proof-mass to form a second electrode pair. According to the examples, in a first vibratory mode, in which the first portion of the proof-mass is to move away from the second portion of the proof-mass, the proof-mass, first stator electrode and second stator electrode are arranged such that a distance between electrodes of the first electrode pair is inversely proportional to a distance between electrodes of the second electrode pair.
Example 17 can include any of the preceding examples wherein the first proof-mass electrode of the proof-mass is opposite the second proof-mass electrode of the proof-mass, across the anchor and wherein the first stator electrode is coupled to the substrate opposite the second anchored electrode, across the anchor.
Example 18 can include any of the preceding examples wherein the first portion of the proof-mass is symmetrical, across the anchor, with the second portion of the proof-mass, and the first stator is asymmetrical, across the anchor, with respect to the second stator.
Example 19 can include any of the preceding examples wherein the first electrode pair comprises a first capacitor, and the second electrode pair comprises a second capacitor.
Example 20 can include any of the preceding examples wherein each of the first proof-mass electrode and the first stator electrode are elongate, with a distance between the first proof-mass electrode and the first stator electrode being substantially constant along the length of each
Example 21 can include any of the preceding examples wherein each of the second proof-mass electrode and the second stator electrode are elongate, with a distance between the second proof-mass electrode and the second stator electrode being substantially constant along the length of each.
Example 22 can include any of the preceding examples wherein the proof-mass defines a first opening on a first side of the anchor, with the first portion of the proof-mass moveably coupled therein, with a first plurality of proof-mass electrodes, including the first proof-mass electrode, extending into the opening, spaced apart from one another. In the example the proof-mass can define a second opening on the second side of the anchor, with the second portion coupled therein, with a second plurality of proof-mass electrodes, including the second proof-mass electrode, extending into the opening, spaced apart from one another.
Example 23 can include any of the preceding examples wherein the first stator electrode is one of a first plurality of stator electrodes interdigitated and paired with respective ones of the first plurality of proof-mass electrodes to form the first electrode pair; and wherein the second stator electrode is one of a second plurality of stator electrodes interdigitated and paired with respective ones of the second plurality of stator electrodes to form the second electrode pair.
Example 24 can include any of the preceding examples wherein, in the first vibratory mode, the first plurality of stator electrodes is configured to move away from the first plurality of stator electrodes and away from the anchor while the second plurality of stator electrodes is configured to move toward the second plurality of stator electrodes and toward the anchor.
Example 25 can include any of the preceding examples wherein the proof-mass is configured to vibrate with respect to the substrate to vary the distances between the first plurality of stator electrodes and the first plurality of stator electrodes and to vary the distances between the second plurality of stator electrodes and the second plurality of stator electrodes, with one of the first plurality of stator electrodes, closest to the anchor, being a distance from one of the first plurality of stator electrodes, closest to the anchor, when one of the second plurality of stator electrodes, closest to the anchor, is a greater distance from one of the second plurality of stator electrodes, closest to the anchor.
Example 26 can include any of the preceding examples wherein the first proof-mass electrode, the second proof-mass electrode, the first stator electrode and the second stator electrode are curved, wherein each of the electrodes curves around an axis around which the proof-mass is configured to rotate in a second vibratory mode.
Example 27 can include any of the preceding examples and can include forming a proof-mass, including forming an anchor for coupling the proof-mass to a substrate. The example can include forming a first portion on a first side of the anchor, the first portion moveable with respect to the anchor and including a first proof-mass electrode. The example can include forming a second portion on a second side of the anchor, opposite the first side, the second portion including a second proof-mass electrode. The example can include forming a first stator for coupling to the substrate, including forming a first stator electrode for extending alongside the first proof-mass electrode of the proof-mass to form a first electrode pair. The example can include forming a second stator for coupling to the substrate, including forming a second stator electrode for extending alongside the second proof-mass electrode of the proof-mass to form a second electrode pair. According to the example, the proof-mass, the first stator and the second stator are formed such that in a first vibratory mode of the proof-mass a distance between electrodes of the first pair is inversely proportional to a distance between electrodes of the second electrode pair.
Example 28 can include any of the preceding examples wherein forming includes deep reactive-ion etching.
Example 29 can include any of the preceding examples wherein forming the first proof-mass electrode, forming the second proof-mass electrode, forming the first stator electrode and forming the second stator electrode includes forming each with a curvature, with each curving around an axis around which the proof-mass rotates in a second vibratory mode.
Example 30 can include any of the preceding examples comprising forming a first capacitor with the first electrode pair and forming a second capacitor with the second electrode pair.
Example 31 can include any of the preceding examples wherein forming the first proof-mass electrode and the first stator electrode includes forming a first distance between them that is substantially constant along a length of the first electrode pair, and forming the second proof-mass electrode and the second stator electrode includes forming a second distance between them that is substantially constant along a length of the second electrode pair.
Example 32 can include any of the preceding examples, including a method for sensing motion with a microelectromechanical die, comprising. The example can include exciting vibration of a first portion of a proof-mass and a second portion of a proof-mass so the first portion and the second portion move together and apart in synchrony, toward a respective first stator and second stator. The example can include sensing motion of the die along a direction extending between the first portion of the proof-mass and the second portion of the proof-mass by measuring a differential in respective capacitance values for the first stator and the second stator.
Example 33 can include any of the preceding examples wherein the first portion includes a first proof-mass electrode that moves toward a first stator electrode of a first stator while the second portion includes a second proof-mass electrode that moves away from a second stator electrode of a second stator.
Example 34 can include any of the preceding examples wherein sensing motion includes sensing a differential between a first capacitance of a first electrode pair including the first proof-mass electrode and the first stator electrode, and a second electrode pair including the second proof-mass electrode and the second stator electrode.
Example 35 can include any of the preceding examples, including rotating the proof-mass, in the plane of the proof-mass, without changing the measured differential in respective capacitance values for the first stator and the second stator.
Example 36 can include any of the preceding examples, including rotating the proof-mass, in the plane of the proof-mass, without changing a distance between electrodes of the first electrode pair and without changing a distance between electrodes of the second electrode pair.
Example 37 can include any of the preceding claims including a microelectromechanical die for sensing motion. The example can include a fixed portion. The example can include an anchor coupled to the fixed portion. The example can include a first nonlinear suspension member coupled to anchor on a first side of the anchor. The example can include a second nonlinear suspension member coupled to the anchor on the first side of the anchor, the second nonlinear suspension member having a shape and location mirroring the first nonlinear suspension member about an anchor bisecting plane. According to the example, the first nonlinear suspension member and the second nonlinear suspension member are part of an inner gimbal of the microelectromechanical die. The example can include a proof-mass that is planar, the proof-mass suspended by a first suspension member disposed on a first side of the anchor and a second suspension member disposed on a second side of the anchor opposite the first side, with the die defining a first gap extending along a first side of the anchor and a second gap extending along a second side of the anchor, opposite the first side, with each of the first gap and the second gap extending between the inner gimbal and the proof-mass, wherein the inner gimbal is supported at least in part by the first nonlinear suspension member and the second nonlinear suspension member such that the proof-mass is rotable about the anchor and is slideable in a plane parallel to the fixed portion.
Example 38 can include any of the preceding claims, wherein the first gap extends from the first suspension member to the second suspension member, and the second gap extends from the first suspension member to the second suspension member.
Example 39 can include any of the preceding claims, wherein the first gap and the second gap are C-shaped, with a first C-shape defining a first opening that opens to a second opening of a second C-shape.
Example 40 can include any of the preceding claims, wherein the first gap defines a first vertical flexure and a second vertical flexure, and the second gap defines a third vertical flexure and a fourth vertical flexure.
Example 41 can include any of the preceding claims, wherein each of the first, second, third and fourth vertical flexures are elongate, with a length longer than a width, with each respective length extending away from a respective suspension member.
Example 42 can include any of the preceding claims, wherein each respective length extends away from the anchor bisecting plane.
Example 43 can include any of the preceding claims, wherein the first C-shape includes a first end portion and a second end portion, with a center portion extending between the first end portion and the second end portion.
Example 44 can include any of the preceding claims, wherein the first end portion and the second end portion are perpendicular to the center portion.
Example 45 can include any of the preceding claims, wherein a first canted portion extends between the first end portion and the center portion and a second canted portion extends between the second end portion and the center portion.
Example 46 can include any of the preceding claims, wherein the first gap is a mirrored shape of the second gap and the first gap is mirrored along the anchor bisecting plane.
Example 47 can include a method including forming a material to define an inner gimbal for coupling with an anchor for anchoring to a substrate. The example can include forming the material to define a first nonlinear suspension member coupled to anchor on a first side of the anchor. The example can include forming the material to define a second nonlinear suspension member coupled to the anchor on the first side of the anchor, the second nonlinear suspension member having a shape and location mirroring the first nonlinear suspension member about an anchor bisecting plane. The example can include forming the material to define a proof-mass that is planar, the proof-mass suspended by a first suspension member disposed on a first side of the anchor and a second suspension member disposed on a second side of the anchor opposite the first side, with a first gap extending along a first side of the anchor and a second gap extending along a second side of the anchor, opposite the first side, with each of the first gap and the second gap extending between the proof-mass and the inner gimbal.
Example 48 can include any of the preceding claims, wherein forming includes deep reactive-ion etching.
Example 49 can include any of the preceding claims, wherein the first nonlinear suspension member and the second nonlinear suspension member are part of a first set, comprising etching the material to define a second set of nonlinear suspension members opposite the first set.
Example 50 can include etching a third set of nonlinear suspension members for coupling the anchor to the proof-mass and etching a fourth set of nonlinear suspension members for coupling the anchor to the proof-mass
Example can include any of the preceding claims, wherein the third set and the fourth set have a similar for factor to the first set and the second set and are bisected by a second anchor bisecting plane perpendicular the first.
Example 51 can include any of the preceding claims, wherein etching the first gap and the second gap includes forming each into a C-shape, with a first C-shape of the first gap opens to a second C-shape of the second gap.
Example 52 can include a method for sensing motion with a microelectromechanical die, comprising. The example can include rotating a proof-mass with respect to an inner gimbal that is coupled to a substrate via an anchor, by. The example can include deforming a first nonlinear suspension member, that couples the proof-mass to a first side of the anchor, out-of-plane of the plane of the proof-mass, above the proof-mass. The example can include deforming a second nonlinear suspension member, that couples the proof-mass to the first side of the anchor, out-of-plane of the plane of the proof-mass on an opposite first side of the plane of the proof-mass, below the proof-mass. The example can include deforming a first suspension member, that supports the proof-mass and that is disposed on a first side of the anchor, and a second suspension member, that is disposed on a second side of the anchor opposite the first side, with the die defining a first gap extending along a first side of the anchor and a second gap extending along a second side of the anchor, opposite the first side, with each of the first gap and the second gap extending between the inner gimbal and the proof-mass.
Example 53 can include any of the preceding claims, wherein deforming a first suspension member, that supports the proof-mass and that is disposed on a first side of the anchor, and a second suspension member, that is disposed on a second side of the anchor opposite the first side includes deforming a first vertical flexure and a second vertical flexure, each defined by the first gap, and a third vertical flexure and a fourth vertical flexure, each defined by the second gap.
Example 54 can include any of the preceding claims, wherein during a first half of a rotation cycle, the first and second vertical flexures are deformed away from the anchor, and the third and fourth vertical flexure are deformed toward the anchor, and during a second half of a rotation cycle, the first and second vertical flexures are deformed toward from the anchor, and the third and fourth vertical flexure are deformed away the anchor.
Example 55 can include any of the preceding claims, wherein deforming of the flexures includes bending.
Example 56 can include any of the preceding claims, wherein an anchor bisecting plane bisects the anchor vertically and passes between the first and second nonlinear suspension members, between the first and second suspension members.
The above detailed description includes references to the accompanying drawings, which form a part of the detailed description. The drawings show, by way of illustration, specific embodiments in which the invention can be practiced. These embodiments are also referred to herein as “examples.” All publications, patents, and patent documents referred to in this document are incorporated by reference herein in their entirety, as though individually incorporated by reference. In the event of inconsistent usages between this document and those documents so incorporated by reference, the usage in the incorporated reference(s) should be considered supplementary to that of this document; for irreconcilable inconsistencies, the usage in this document controls.
In this document, the terms “a” or “an” are used, as is common in patent documents, to include one or more than one, independent of any other instances or usages of “at least one” or “one or more.” In this document, the term “or” is used to refer to a nonexclusive or, such that “A or B” includes “A but not B,” “B but not A,” and “A and B,” unless otherwise indicated. In the appended claims, the terms “including” and “in which” are used as the plain-English equivalents of the respective terms “comprising” and “wherein.” Also, in the following claims, the terms “including” and “comprising” are open-ended, that is, a system, device, article, or process that includes elements in addition to those listed after such a term in a claim are still deemed to fall within the scope of that claim. Moreover, in the following claims, the terms “first,” “second,” and “third,” etc. are used merely as labels, and are not intended to impose numerical requirements on their objects. The above description is intended to be illustrative, and not restrictive. In other examples, the above-described examples (or one or more aspects thereof) may be used in combination with each other. Other embodiments can be used, such as by one of ordinary skill in the art upon reviewing the above description.
The Abstract is provided to comply with 37 C.F.R. §1.72(b), to allow the reader to quickly ascertain the nature of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims. Also, in the above Detailed Description, various features may be grouped together to streamline the disclosure. This should not be interpreted as intending that an unclaimed disclosed feature is essential to any claim. Rather, inventive subject matter may lie in less than all features of a particular disclosed embodiment. Thus, the following claims are hereby incorporated into the Detailed Description, with each claim standing on its own as a separate embodiment. The scope of the invention should be determined with reference to the appended claims, along with the full scope of equivalents to which such claims are entitled.
This application is a continuation-in-part of and claims the benefit of priority under 35 U.S.C. §120 to U.S. patent application Ser. No. 13/813,443, filed on Jan. 31, 2013, which is a U.S. National Stage Filing under 35 U.S.C. 371 from International Patent Application Serial No. PCT/US2011/052006, filed on Sep. 16, 2011, and published on Mar. 22, 2012 as WO 2012/037501 A2, which claims the benefit of priority of U.S. Provisional Patent Application Ser. No. 61/384,247, entitled “LOW-QUADRATURE SUSPENSION SYSTEM FOR MULTI-AXIS GYROSCOPES,” filed Sep. 18, 2010 and U.S. Provisional Patent Application Ser. No. 61/384,512, entitled “IMPROVED QUADRATURE REDUCTION STRUCTURE FOR RESONATING MICROMACHINED DEVICES,” filed Sep. 20, 2010, each of which is incorporated by reference in its entirety. This application also claims the benefit of priority of U.S. Provisional Patent Application Ser. No. 61/593,691, entitled “MEMS MULTI-AXIS GYROSCOPE WITH CENTRAL SUSPENSION AND GIMBAL STRUCTURE,” filed on Feb. 1, 2012, which is incorporated by reference herein in its entirety.
Number | Name | Date | Kind |
---|---|---|---|
3231729 | Stern | Jan 1966 | A |
4896156 | Garverick | Jan 1990 | A |
5481914 | Ward | Jan 1996 | A |
5487305 | Ristic et al. | Jan 1996 | A |
5491604 | Nguyen et al. | Feb 1996 | A |
5600064 | Ward | Feb 1997 | A |
5656778 | Roszhart | Aug 1997 | A |
5703292 | Ward | Dec 1997 | A |
5723790 | Andersson | Mar 1998 | A |
5751154 | Tsugai | May 1998 | A |
5760465 | Alcoe et al. | Jun 1998 | A |
5765046 | Watanabe et al. | Jun 1998 | A |
5894091 | Kubota | Apr 1999 | A |
6131457 | Sato | Oct 2000 | A |
6214644 | Glenn | Apr 2001 | B1 |
6250157 | Touge | Jun 2001 | B1 |
6253612 | Lemkin et al. | Jul 2001 | B1 |
6301965 | Chu et al. | Oct 2001 | B1 |
6351996 | Nasiri et al. | Mar 2002 | B1 |
6366468 | Pan | Apr 2002 | B1 |
6390905 | Korovin et al. | May 2002 | B1 |
6501282 | Dummermuth et al. | Dec 2002 | B1 |
6504385 | Hartwell | Jan 2003 | B2 |
6553835 | Hobbs et al. | Apr 2003 | B1 |
6722206 | Takada | Apr 2004 | B2 |
6725719 | Cardarelli | Apr 2004 | B2 |
6737742 | Sweterlitsch | May 2004 | B2 |
6781231 | Minervini et al. | Aug 2004 | B2 |
6848304 | Geen | Feb 2005 | B2 |
7051590 | Lemkin et al. | May 2006 | B1 |
7054778 | Geiger et al. | May 2006 | B2 |
7093487 | Mochida | Aug 2006 | B2 |
7166910 | Minervini et al. | Jan 2007 | B2 |
7202552 | Zhe et al. | Apr 2007 | B2 |
7210351 | Lo et al. | May 2007 | B2 |
7221767 | Mullenborn et al. | May 2007 | B2 |
7240552 | Acar et al. | Jul 2007 | B2 |
7258011 | Nasiri et al. | Aug 2007 | B2 |
7258012 | Xie | Aug 2007 | B2 |
7266349 | Kappes | Sep 2007 | B2 |
7293460 | Zarabadi et al. | Nov 2007 | B2 |
7301212 | Mian et al. | Nov 2007 | B1 |
7305880 | Caminada et al. | Dec 2007 | B2 |
7358151 | Araki et al. | Apr 2008 | B2 |
7436054 | Zhe | Oct 2008 | B2 |
7449355 | Lutz et al. | Nov 2008 | B2 |
7451647 | Matsuhisa et al. | Nov 2008 | B2 |
7454967 | Skurnik | Nov 2008 | B2 |
7518493 | Bryzek et al. | Apr 2009 | B2 |
7539003 | Ray | May 2009 | B2 |
7544531 | Grosjean | Jun 2009 | B1 |
7595648 | Ungaretti et al. | Sep 2009 | B2 |
7600428 | Robert et al. | Oct 2009 | B2 |
7616078 | Prandi et al. | Nov 2009 | B2 |
7622782 | Chu et al. | Nov 2009 | B2 |
7694563 | Durante et al. | Apr 2010 | B2 |
7706149 | Yang et al. | Apr 2010 | B2 |
7781249 | Laming et al. | Aug 2010 | B2 |
7795078 | Ramakrishna et al. | Sep 2010 | B2 |
7851925 | Theuss et al. | Dec 2010 | B2 |
7859352 | Sutton | Dec 2010 | B2 |
7950281 | Hammerschmidt | May 2011 | B2 |
8004354 | Pu et al. | Aug 2011 | B1 |
8006557 | Yin et al. | Aug 2011 | B2 |
8026771 | Kanai et al. | Sep 2011 | B2 |
8037755 | Nagata et al. | Oct 2011 | B2 |
8113050 | Acar et al. | Feb 2012 | B2 |
8171792 | Sameshima | May 2012 | B2 |
8201449 | Ohuchi et al. | Jun 2012 | B2 |
8250921 | Nasiri et al. | Aug 2012 | B2 |
8256290 | Mao | Sep 2012 | B2 |
8375789 | Prandi et al. | Feb 2013 | B2 |
8378756 | Huang et al. | Feb 2013 | B2 |
8421168 | Allen et al. | Apr 2013 | B2 |
8476970 | Mokhtar et al. | Jul 2013 | B2 |
8508290 | Elsayed et al. | Aug 2013 | B2 |
8643382 | Steele et al. | Feb 2014 | B2 |
8710599 | Marx et al. | Apr 2014 | B2 |
8739626 | Acar | Jun 2014 | B2 |
8742964 | Kleks et al. | Jun 2014 | B2 |
8754694 | Opris et al. | Jun 2014 | B2 |
8763459 | Brand et al. | Jul 2014 | B2 |
8813564 | Acar | Aug 2014 | B2 |
8978475 | Acar | Mar 2015 | B2 |
9003882 | Ayazi et al. | Apr 2015 | B1 |
9006846 | Bryzek et al. | Apr 2015 | B2 |
9062972 | Acar et al. | Jun 2015 | B2 |
9069006 | Opris et al. | Jun 2015 | B2 |
9094027 | Tao et al. | Jul 2015 | B2 |
9095072 | Bryzek et al. | Jul 2015 | B2 |
20020021059 | Knowles et al. | Feb 2002 | A1 |
20020117728 | Brosnihhan et al. | Aug 2002 | A1 |
20020178831 | Takada | Dec 2002 | A1 |
20020189352 | Reeds, III et al. | Dec 2002 | A1 |
20020196445 | McClary et al. | Dec 2002 | A1 |
20030038415 | Anderson et al. | Feb 2003 | A1 |
20030061878 | Pinson | Apr 2003 | A1 |
20030200807 | Hulsing, II | Oct 2003 | A1 |
20030222337 | Stewart | Dec 2003 | A1 |
20040085784 | Salama et al. | May 2004 | A1 |
20040119137 | Leonardi et al. | Jun 2004 | A1 |
20040177689 | Cho | Sep 2004 | A1 |
20040211258 | Geen | Oct 2004 | A1 |
20040219340 | McNeil et al. | Nov 2004 | A1 |
20040231420 | Xie et al. | Nov 2004 | A1 |
20040251793 | Matsuhisa | Dec 2004 | A1 |
20050005698 | McNeil et al. | Jan 2005 | A1 |
20050097957 | Mcneil et al. | May 2005 | A1 |
20050139005 | Geen | Jun 2005 | A1 |
20050189635 | Humpston et al. | Sep 2005 | A1 |
20050274181 | Kutsuna et al. | Dec 2005 | A1 |
20060032308 | Acar et al. | Feb 2006 | A1 |
20060034472 | Bazarjani et al. | Feb 2006 | A1 |
20060043608 | Bernier et al. | Mar 2006 | A1 |
20060097331 | Hattori | May 2006 | A1 |
20060112764 | Higuchi | Jun 2006 | A1 |
20060137457 | Zdeblick | Jun 2006 | A1 |
20060207328 | Zarabadi et al. | Sep 2006 | A1 |
20060213265 | Weber et al. | Sep 2006 | A1 |
20060213266 | French et al. | Sep 2006 | A1 |
20060213268 | Asami et al. | Sep 2006 | A1 |
20060246631 | Lutz et al. | Nov 2006 | A1 |
20060283245 | Konno et al. | Dec 2006 | A1 |
20070013052 | Zhe et al. | Jan 2007 | A1 |
20070034005 | Acar et al. | Feb 2007 | A1 |
20070040231 | Harney et al. | Feb 2007 | A1 |
20070042606 | Wang et al. | Feb 2007 | A1 |
20070047744 | Harney et al. | Mar 2007 | A1 |
20070071268 | Harney et al. | Mar 2007 | A1 |
20070085544 | Viswanathan | Apr 2007 | A1 |
20070099327 | Hartzell et al. | May 2007 | A1 |
20070113653 | Nasiri et al. | May 2007 | A1 |
20070114643 | DCamp et al. | May 2007 | A1 |
20070165888 | Weigold | Jul 2007 | A1 |
20070205492 | Wang | Sep 2007 | A1 |
20070220973 | Acar | Sep 2007 | A1 |
20070222021 | Yao | Sep 2007 | A1 |
20070284682 | Laming et al. | Dec 2007 | A1 |
20080049230 | Chin et al. | Feb 2008 | A1 |
20080079120 | Foster et al. | Apr 2008 | A1 |
20080079444 | Denison | Apr 2008 | A1 |
20080081398 | Lee et al. | Apr 2008 | A1 |
20080083958 | Wei et al. | Apr 2008 | A1 |
20080083960 | Chen et al. | Apr 2008 | A1 |
20080092652 | Acar | Apr 2008 | A1 |
20080122439 | Burdick et al. | May 2008 | A1 |
20080157238 | Hsiao | Jul 2008 | A1 |
20080157301 | Ramakrishna et al. | Jul 2008 | A1 |
20080169811 | Viswanathan | Jul 2008 | A1 |
20080202237 | Hammerschmidt | Aug 2008 | A1 |
20080245148 | Fukumoto | Oct 2008 | A1 |
20080247585 | Leidl et al. | Oct 2008 | A1 |
20080251866 | Belt et al. | Oct 2008 | A1 |
20080290756 | Huang | Nov 2008 | A1 |
20080302559 | Leedy | Dec 2008 | A1 |
20080314147 | Nasiri et al. | Dec 2008 | A1 |
20090007661 | Nasiri et al. | Jan 2009 | A1 |
20090064780 | Coronato et al. | Mar 2009 | A1 |
20090064781 | Ayazi et al. | Mar 2009 | A1 |
20090072663 | Ayazi et al. | Mar 2009 | A1 |
20090114016 | Nasiri et al. | May 2009 | A1 |
20090140606 | Huang | Jun 2009 | A1 |
20090166827 | Foster et al. | Jul 2009 | A1 |
20090175477 | Suzuki et al. | Jul 2009 | A1 |
20090183570 | Acar et al. | Jul 2009 | A1 |
20090194829 | Chung et al. | Aug 2009 | A1 |
20090217757 | Nozawa | Sep 2009 | A1 |
20090263937 | Ramakrishna et al. | Oct 2009 | A1 |
20090266163 | Ohuchi et al. | Oct 2009 | A1 |
20090272189 | Acar et al. | Nov 2009 | A1 |
20100019393 | Hsieh et al. | Jan 2010 | A1 |
20100024548 | Cardarelli | Feb 2010 | A1 |
20100038733 | Minervini | Feb 2010 | A1 |
20100044853 | Dekker et al. | Feb 2010 | A1 |
20100052082 | Lee et al. | Mar 2010 | A1 |
20100058864 | Hsu et al. | Mar 2010 | A1 |
20100072626 | Theuss et al. | Mar 2010 | A1 |
20100089154 | Ballas et al. | Apr 2010 | A1 |
20100122579 | Hsu et al. | May 2010 | A1 |
20100126269 | Coronato et al. | May 2010 | A1 |
20100155863 | Weekamp | Jun 2010 | A1 |
20100206074 | Yoshida et al. | Aug 2010 | A1 |
20100212425 | Hsu et al. | Aug 2010 | A1 |
20100224004 | Suminto et al. | Sep 2010 | A1 |
20100236327 | Mao et al. | Sep 2010 | A1 |
20100294039 | Geen | Nov 2010 | A1 |
20110023605 | Tripoli et al. | Feb 2011 | A1 |
20110030473 | Acar | Feb 2011 | A1 |
20110030474 | Kuang et al. | Feb 2011 | A1 |
20110031565 | Marx et al. | Feb 2011 | A1 |
20110094302 | Schofield et al. | Apr 2011 | A1 |
20110120221 | Yoda | May 2011 | A1 |
20110121413 | Allen et al. | May 2011 | A1 |
20110146403 | Rizzo Piazza Roncoroni et al. | Jun 2011 | A1 |
20110147859 | Tanaka et al. | Jun 2011 | A1 |
20110179868 | Kaino et al. | Jul 2011 | A1 |
20110201197 | Nilsson et al. | Aug 2011 | A1 |
20110265564 | Acar et al. | Nov 2011 | A1 |
20110285445 | Huang et al. | Nov 2011 | A1 |
20110316048 | Ikeda et al. | Dec 2011 | A1 |
20120126349 | Horning et al. | May 2012 | A1 |
20120326248 | Daneman et al. | Dec 2012 | A1 |
20130098153 | Trusov et al. | Apr 2013 | A1 |
20130139591 | Acar | Jun 2013 | A1 |
20130192364 | Acar | Aug 2013 | A1 |
20130192369 | Acar et al. | Aug 2013 | A1 |
20130199263 | Egretzberger et al. | Aug 2013 | A1 |
20130221457 | Conti et al. | Aug 2013 | A1 |
20130247666 | Acar | Sep 2013 | A1 |
20130247668 | Bryzek | Sep 2013 | A1 |
20130250532 | Bryzek et al. | Sep 2013 | A1 |
20130257487 | Opris et al. | Oct 2013 | A1 |
20130263641 | Opris et al. | Oct 2013 | A1 |
20130263665 | Opris et al. | Oct 2013 | A1 |
20130265070 | Kleks et al. | Oct 2013 | A1 |
20130265183 | Kleks et al. | Oct 2013 | A1 |
20130268227 | Opris et al. | Oct 2013 | A1 |
20130268228 | Opris et al. | Oct 2013 | A1 |
20130269413 | Tao et al. | Oct 2013 | A1 |
20130270657 | Acar et al. | Oct 2013 | A1 |
20130270660 | Bryzek et al. | Oct 2013 | A1 |
20130271228 | Tao et al. | Oct 2013 | A1 |
20130277772 | Bryzek et al. | Oct 2013 | A1 |
20130277773 | Bryzek et al. | Oct 2013 | A1 |
20130283911 | Ayazi et al. | Oct 2013 | A1 |
20130298671 | Acar et al. | Nov 2013 | A1 |
20130328139 | Acar | Dec 2013 | A1 |
20130341737 | Bryzek et al. | Dec 2013 | A1 |
20140070339 | Marx | Mar 2014 | A1 |
20140275857 | Toth et al. | Sep 2014 | A1 |
20150059473 | Jia | Mar 2015 | A1 |
20150114112 | Valzasina et al. | Apr 2015 | A1 |
20150185012 | Acar | Jul 2015 | A1 |
Number | Date | Country |
---|---|---|
1068444 | Jan 1993 | CN |
1198587 | Nov 1998 | CN |
1206110 | Jan 1999 | CN |
1221210 | Jun 1999 | CN |
1272622 | Nov 2000 | CN |
1389704 | Jan 2003 | CN |
1532524 | Sep 2004 | CN |
1595062 | Mar 2005 | CN |
1595063 | Mar 2005 | CN |
1603842 | Apr 2005 | CN |
1617334 | May 2005 | CN |
1659810 | Aug 2005 | CN |
1693181 | Nov 2005 | CN |
1813192 | Aug 2006 | CN |
1816747 | Aug 2006 | CN |
1818552 | Aug 2006 | CN |
1886669 | Dec 2006 | CN |
1905167 | Jan 2007 | CN |
1948906 | Apr 2007 | CN |
101038299 | Sep 2007 | CN |
101059530 | Oct 2007 | CN |
101067555 | Nov 2007 | CN |
101069099 | Nov 2007 | CN |
101171665 | Apr 2008 | CN |
101180516 | May 2008 | CN |
101217263 | Jul 2008 | CN |
101239697 | Aug 2008 | CN |
101257000 | Sep 2008 | CN |
101270988 | Sep 2008 | CN |
101316462 | Dec 2008 | CN |
101329446 | Dec 2008 | CN |
101426718 | May 2009 | CN |
101459866 | Jun 2009 | CN |
101519183 | Sep 2009 | CN |
101520327 | Sep 2009 | CN |
101561275 | Oct 2009 | CN |
101634662 | Jan 2010 | CN |
101638211 | Feb 2010 | CN |
101813480 | Aug 2010 | CN |
101839718 | Sep 2010 | CN |
101055180 | Oct 2010 | CN |
101858928 | Oct 2010 | CN |
101916754 | Dec 2010 | CN |
101922934 | Dec 2010 | CN |
201688848 | Dec 2010 | CN |
102109345 | Jun 2011 | CN |
102337541 | Feb 2012 | CN |
102364671 | Feb 2012 | CN |
102597699 | Jul 2012 | CN |
103209922 | Jul 2013 | CN |
103210278 | Jul 2013 | CN |
103221331 | Jul 2013 | CN |
103221332 | Jul 2013 | CN |
103221333 | Jul 2013 | CN |
103221778 | Jul 2013 | CN |
103221779 | Jul 2013 | CN |
103221795 | Jul 2013 | CN |
103238075 | Aug 2013 | CN |
103363969 | Oct 2013 | CN |
103363983 | Oct 2013 | CN |
103364590 | Oct 2013 | CN |
103364593 | Oct 2013 | CN |
103368503 | Oct 2013 | CN |
103368562 | Oct 2013 | CN |
103368577 | Oct 2013 | CN |
103376099 | Oct 2013 | CN |
103376102 | Oct 2013 | CN |
103403495 | Nov 2013 | CN |
203275441 | Nov 2013 | CN |
203275442 | Nov 2013 | CN |
203301454 | Nov 2013 | CN |
203349832 | Dec 2013 | CN |
203349834 | Dec 2013 | CN |
103663344 | Mar 2014 | CN |
203683082 | Jul 2014 | CN |
203719664 | Jul 2014 | CN |
104094084 | Oct 2014 | CN |
104105945 | Oct 2014 | CN |
104220840 | Dec 2014 | CN |
104272062 | Jan 2015 | CN |
112011103124 | Dec 2013 | DE |
102013014881 | Mar 2014 | DE |
1055910 | Nov 2000 | EP |
1460380 | Sep 2004 | EP |
1521086 | Apr 2005 | EP |
1688705 | Aug 2006 | EP |
1832841 | Sep 2007 | EP |
1860402 | Nov 2007 | EP |
2053413 | Apr 2009 | EP |
2259019 | Dec 2010 | EP |
2466257 | Jun 2012 | EP |
0989927 | Apr 1997 | JP |
09089927 | Apr 1997 | JP |
10239347 | Sep 1998 | JP |
1164002 | Mar 1999 | JP |
2000046560 | Feb 2000 | JP |
2005024310 | Jan 2005 | JP |
2005114394 | Apr 2005 | JP |
2005294462 | Oct 2005 | JP |
3882972 | Feb 2007 | JP |
2007024864 | Feb 2007 | JP |
2008294455 | Dec 2008 | JP |
2009075097 | Apr 2009 | JP |
2009186213 | Aug 2009 | JP |
2010025898 | Feb 2010 | JP |
2010506182 | Feb 2010 | JP |
1020110055449 | May 2011 | KR |
1020130052652 | May 2013 | KR |
1020130052653 | May 2013 | KR |
1020130054441 | May 2013 | KR |
1020130055693 | May 2013 | KR |
1020130057485 | May 2013 | KR |
1020130060338 | Jun 2013 | KR |
1020130061181 | Jun 2013 | KR |
101311966 | Sep 2013 | KR |
1020130097209 | Sep 2013 | KR |
101318810 | Oct 2013 | KR |
1020130037462 | Oct 2013 | KR |
1020130112789 | Oct 2013 | KR |
1020130112792 | Oct 2013 | KR |
1020130112804 | Oct 2013 | KR |
1020130113386 | Oct 2013 | KR |
1020130113391 | Oct 2013 | KR |
1020130116189 | Oct 2013 | KR |
1020130116212 | Oct 2013 | KR |
101332701 | Nov 2013 | KR |
1020130139914 | Dec 2013 | KR |
1020130142116 | Dec 2013 | KR |
101352827 | Jan 2014 | KR |
1020140034713 | Mar 2014 | KR |
I255341 | May 2006 | TW |
WO-0107875 | Feb 2001 | WO |
WO-0175455 | Oct 2001 | WO |
WO-2008059757 | May 2008 | WO |
WO-2008087578 | Jul 2008 | WO |
WO-2009050578 | Apr 2009 | WO |
WO-2009156485 | Dec 2009 | WO |
WO-2011016859 | Feb 2011 | WO |
WO-2011016859 | Feb 2011 | WO |
WO-2011107542 | Sep 2011 | WO |
WO-2012037492 | Mar 2012 | WO |
WO-2012037492 | Mar 2012 | WO |
WO-2012037501 | Mar 2012 | WO |
WO-2012037501 | Mar 2012 | WO |
WO-2012037536 | Mar 2012 | WO |
WO-2012037537 | Mar 2012 | WO |
WO-2012037538 | Mar 2012 | WO |
WO-2012037539 | Mar 2012 | WO |
WO-2012037539 | Mar 2012 | WO |
WO-2012037540 | Mar 2012 | WO |
WO-2012040194 | Mar 2012 | WO |
WO-2012040211 | Mar 2012 | WO |
WO-2012040245 | Mar 2012 | WO |
WO-2012040245 | Mar 2012 | WO |
WO-2013115967 | Aug 2013 | WO |
WO-2013116356 | Aug 2013 | WO |
WO-2013116514 | Aug 2013 | WO |
WO-2013116522 | Aug 2013 | WO |
Entry |
---|
“U.S. Appl. No. 12/849,742, Notice of Allowance mailed Nov. 29, 2013”, 7 pgs. |
“U.S. Appl. No. 12/849,742, Supplemental Notice of Allowability mailed Mar. 17, 2014”, 3 pgs. |
“U.S. Appl. No. 12/849,742, Supplemental Notice of Allowability mailed May 5, 2014”, 2 pgs. |
“U.S. Appl. No. 12/849,787, Notice of Allowance mailed Dec. 11, 2013”, 9 pgs. |
“U.S. Appl. No. 12/849,787, Supplemental Notice of Allowability mailed Mar. 21, 2014”, 3 pgs. |
“U.S. Appl. No. 13/362,955, Non Final Office Action mailed Apr. 15, 2014”, 9 pgs. |
“U.S. Appl. No. 13/362,955, Response filed Feb. 17, 2014 to Restriction Requirement mailed Dec. 17, 2013”, 9 pgs. |
“U.S. Appl. No. 13/362,955, Restriction Requirement mailed Dec. 17, 2013”, 6 pgs. |
“U.S. Appl. No. 13/363,537, Non Final Office Action mailed Feb. 6, 2014”, 10 pgs. |
“U.S. Appl. No. 13/363,537, Response filed Jun. 6, 2014 to Non Final Office Action mailed Feb. 6, 2014”, 11 pgs. |
“U.S. Appl. No. 13/742,942, Notice of Allowance mailed Jan. 28, 2014”, 9 pgs. |
“U.S. Appl. No. 13/742,942, Supplemental Notice of Allowability mailed Apr. 10, 2014”, 2 pgs. |
“U.S. Appl. No. 13/746,016, Notice of Allowance mailed Jan. 17, 2014”, 10 pgs. |
“U.S. Appl. No. 13/755,841, Notice of Allowance mailed May 7, 2014”, 8 pgs. |
“U.S. Appl. No. 13/755,841, Preliminary Amendment filed Oct. 10, 2013”, 10 pgs. |
“U.S. Appl. No. 13/755,841, Response filed Apr. 21, 2014 to Restriction Requirement mailed Feb. 21, 2014”, 7 pgs. |
“U.S. Appl. No. 13/755,841, Restriction Requirement mailed Feb. 21, 2014”, 6 pgs. |
“U.S. Appl. No. 13/821,589, Restriction Requirement mailed Apr. 11, 2014”, 10 pgs. |
“Chinese Application Serial No. 2010800423190, Office Action mailed Mar. 26, 2014”, 10 pgs. |
“Chinese Application Serial No. 201180053926.1, Office Action mailed Jan. 13, 2014”, 7 pgs. |
“Chinese Application Serial No. 201180053926.1, Response filed Apr. 29, 2014 to Office Action mailed Jan. 13, 2014”, w/English Claims, 10 pgs. |
“Chinese Application Serial No. 201180054796.3, Office Action mailed Jan. 16, 2014”, 8 pgs. |
“Chinese Application Serial No. 201180055029.4, Office Action mailed Jan. 13, 2014”, 7 pgs. |
“Chinese Application Serial No. 201180055029.4, Response filed May 27, 2014 to Office Action mailed Jan. 13, 2014”, w/English Claims, 29 pgs. |
“Chinese Application Serial No. 201180055309.5, Office Action mailed Mar. 31, 2014”, w/English Claims, 7 pgs. |
“Chinese Application Serial No. 201320172366.8, Office Action mailed Jan. 30, 2014”, w/English Claims, 3 pgs. |
“Chinese Application Serial No. 201320172366.8, Office Action mailed Oct. 25, 2013”, 8 pgs. |
“Chinese Application Serial No. 201320172366.8, Response filed Mar. 18, 2014 to Office Action mailed Jan. 30, 2014”, w/English Claims, 20 pgs. |
“Chinese Application Serial No. 201320172366.8, Response filed Dec. 24, 2013 to Office Action mailed Oct. 25, 2013”, 11 pgs. |
“Chinese Application Serial No. 201320565239.4, Office Action mailed Jan. 16, 2014”, w/English Translation, 3 pgs. |
“Chinese Application Serial No. 201320565239.4, Response filed Mar. 31, 2014 to Office Action mailed Jan. 16, 2014”, w/English Claims, 38 pgs. |
“European Application Serial No. 10806751.3, Extended European Search Report mailed Jan. 7, 2014”, 7 pgs. |
“European Application Serial No. 118260070.2, Office Action mailed Mar. 12, 2014”, 1 pg. |
“European Application Serial No. 11826070.2, Extended European Search Report mailed Feb. 21, 2014”, 5 pgs. |
“European Application Serial No. 11826071.0, Extended European Search Report mailed Feb. 20, 2014”, 6 pgs. |
“European Application Serial No. 11826071.0, Office Action mailed Mar. 12, 2014”, 1 pg. |
“European Application Serial No. 13001692.6, Response filed Apr. 1, 2014 to Extended European Search Report mailed Jul. 24, 2013”, 19 pgs. |
“European Application Serial No. 13001721.3, Response filed Apr. 7, 2014 to Extended European Search Report mailed Jul. 18, 2013”, 25 pgs. |
“Korean Application Serial No. 10-2013-0109990, Amendment filed Dec. 10, 2013”, 4 pgs. |
“Korean Application Serial No. 10-2013-7009775, Office Action mailed Dec. 27, 2013”, 8 pgs. |
“Korean Application Serial No. 10-2013-7009775, Response filed Oct. 29, 2013 to Office Action mailed Sep. 17, 2013”, w/English Claims, 23 pgs. |
“Korean Application Serial No. 10-2013-7009777, Office Action mailed Jan. 27, 2014”, 5 pgs. |
“Korean Application Serial No. 10-2013-7009777, Response filed Apr. 28, 2014”, w/English Claims, 19 pgs. |
“Korean Application Serial No. 10-2013-7009777, Response filed Nov. 5, 2013 to Office Action mailed Sep. 17, 2013”, 11 pgs. |
“Korean Application Serial No. 10-2013-7009788, Office Action mailed Dec. 27, 2013”, w/English Translation, 10 pgs. |
“Korean Application Serial No. 10-2013-7009788, Response filed Oct. 29, 2013 to Office Action mailed Aug. 29, 2013”, w/English Claims, 22 pgs. |
“U.S. Appl. No. 12/849,742, Non Final Office Action mailed Mar. 28, 2013”, 9 pgs. |
“U.S. Appl. No. 12/849,742, Non Final Office Action mailed Aug. 23, 2012”, 9 pgs. |
“U.S. Appl. No. 12/849,742, Response filed Jan. 23, 2012 to Non Final Office Action mailed Aug. 23, 2012”, 10 pgs. |
“U.S. Appl. No. 12/849,787, Non Final Office Action mailed May 28, 2013”, 18 pgs. |
“U.S. Appl. No. 12/849,787, Response filed Feb. 4, 2013 to Restriction Requirement mailed Oct. 4, 2012”, 7 pgs. |
“U.S. Appl. No. 12/849,787, Restriction Requirement mailed Oct. 4, 2012”, 5 pgs. |
“U.S. Appl. No. 12/947,543, Notice of Allowance mailed Dec. 17, 2012”, 11 pgs. |
“U.S. Appl. No. 13/813,443, Preliminary Amendment mailed Jan. 31, 2013”, 3 pgs. |
“U.S. Appl. No. 13/821,586, Preliminary Amendment mailed Mar. 8, 2013”, 6 pgs. |
“U.S. Appl. No. 13/821,589, Preliminary Amendment mailed Mar. 8, 2013”, 6 pgs. |
“U.S. Appl. No. 13/821,598, Preliminary Amendment mailed Mar. 8, 13”, 7 pgs. |
“U.S. Appl. No. 13/821,609, Preliminary Amendment mailed Mar. 8, 2013”, 3 pgs. |
“U.S. Appl. No. 13/821,612, Preliminary Amendment mailed Mar. 8, 2013”, 3 pgs. |
“U.S. Appl. No. 13/821,619, Preliminary Amendment mailed Mar. 8, 2013”, 3 pgs. |
“U.S. Appl. No. 13/821,793, Preliminary Amendment mailed Mar. 8, 2013”, 3 pgs. |
“U.S. Appl. No. 13/821,842, Preliminary Amendment mailed Mar. 8, 2013”, 3 pgs. |
“U.S. Appl. No. 13/821,853, Preliminary Amendment mailed Mar. 8, 2013”, 3 pgs. |
“Application Serial No. PCT/US2011/051994, International Republished Application mailed Jun. 7, 2012”, 1 pg. |
“Application Serial No. PCT/US2011/052006, International Republished Application mailed Jun. 7, 2012”, 1 pg. |
“Application Serial No. PCT/US2011/052417, International Republished Application mailed Jun. 7, 2012”, 1 pg. |
“DigiSiMic™ Digital Silicon Microphone Pulse Part No. TC100E”, TC100E Datasheet version 4.2 DigiSiMic™ Digital Silicon Microphone. (Jan. 2009), 6 pgs. |
“EPCOS MEMS Microphone With TSV”, 1 pg. |
“International Application Serial No. PCT/US2010/002166, International Preliminary Report on Patentability mailed Feb. 16, 2012”, 6 pgs. |
“International Application Serial No. PCT/US2010/002166, International Search Report mailed Feb. 28, 2011”, 3 pgs. |
“International Application Serial No. PCT/US2010/002166, Written Opinion mailed Feb. 28, 2011”, 4 pgs. |
“International Application Serial No. PCT/US2011/051994, International Preliminary Report on Patentability mailed Mar. 28, 2013”, 8 pgs. |
“International Application Serial No. PCT/US2011/051994, International Search Report mailed Apr. 16, 2012”, 3 pgs. |
“International Application Serial No. PCT/US2011/051994, Written Opinion mailed Apr. 16, 2012”, 6 pgs. |
“International Application Serial No. PCT/US2011/052006, International Preliminary Report on Patentability mailed Mar. 28, 2013”, 7 pgs. |
“International Application Serial No. PCT/US2011/052006, Search Report mailed Apr. 16, 2012”, 3 pgs. |
“International Application Serial No. PCT/US2011/052006, Written Opinion mailed Apr. 16, 2012”, 5 pgs. |
“International Application Serial No. PCT/US2011/052059, International Preliminary Report on Patentability mailed Jan. 22, 2013”, 14 pgs. |
“International Application Serial No. PCT/US2011/052059, Search Report mailed Apr. 20, 2012”, 4 pgs. |
“International Application Serial No. PCT/US2011/052059, Written Opinion mailed Apr. 20, 2012”, 7 pgs. |
“International Application Serial No. PCT/US2011/052060, International Preliminary Report on Patentability mailed Jan. 22, 2013”, 12 pgs. |
“International Application Serial No. PCT/US2011/052060, International Search Report Apr. 20, 2012”, 3 pgs. |
“International Application Serial No. PCT/US2011/052060, Written Opinion mailed Apr. 20, 2012”, 7 pgs. |
“International Application Serial No. PCT/US2011/052061, International Preliminary Report on Patentability mailed Mar. 28, 2013”, 6 pgs. |
“International Application Serial No. PCT/US2011/052061, International Search Report mailed Apr. 10, 2012”, 3 pgs. |
“International Application Serial No. PCT/US2011/052061, Written Opinion mailed Apr. 10, 2012”, 4 pgs. |
“International Application Serial No. PCT/US2011/052064, International Preliminary Report on Patentability mailed Mar. 28, 2013”, 5 pgs. |
“International Application Serial No. PCT/US2011/052064, Search Report mailed Feb. 29, 2012”, 3 pgs. |
“International Application Serial No. PCT/US2011/052064, Written Opinion mailed Feb. 29, 2012”, 3 pgs. |
“International Application Serial No. PCT/US2011/052065, International Preliminary Report on Patentability mailed Mar. 28, 2013”, 7 pgs. |
“International Application Serial No. PCT/US2011/052065, International Search Report mailed Apr. 10, 2012”, 3 pgs. |
“International Application Serial No. PCT/US2011/052065, Written Opinion mailed Apr. 10, 2012”, 5 pgs. |
“International Application Serial No. PCT/US2011/052340, International Preliminary Report on Patentability mailed Apr. 4, 2013”, 5 pgs. |
“International Application Serial No. PCT/US2011/052340, Search Report mailed Feb. 29, 2012”, 3 pgs. |
“International Application Serial No. PCT/US2011/052340, Written Opinion mailed Feb. 29, 2012”, 3 pgs. |
“International Application Serial No. PCT/US2011/052369, International Preliminary Report on Patentability mailed Apr. 4, 2013”, 5 pgs. |
“International Application Serial No. PCT/US2011/052369, International Search Report mailed Apr. 24, 2012”, 6 pgs. |
“International Application Serial No. PCT/US2011/052369, Written Opinion mailed Apr. 24, 2012”, 3 pgs. |
“International Application Serial No. PCT/US2011/052417, International Preliminary Report on Patentability mailed Apr. 4, 2013”, 6 pgs. |
“International Application Serial No. PCT/US2011/052417, International Search Report mailed Apr. 23, 2012”, 5 pgs. |
“International Application Serial No. PCT/US2011/052417, Written Opinion mailed Apr. 23, 2012”, 4 pgs. |
“International Application Serial No. PCT/US2013/021411, International Search Report mailed Apr. 30, 2013”, 5 pgs. |
“International Application Serial No. PCT/US2013/021411, Written Opinion mailed Apr. 30, 2013”, 5 pgs. |
“International Application Serial No. PCT/US2013/023877, International Search Report mailed May 14, 2013”, 3 pgs. |
“International Application Serial No. PCT/US2013/023877, Written Opinion mailed May 14, 2013”, 5 pgs. |
“International Application Serial No. PCT/US2013/024149, Written Opinion mailed”, 4 pages. |
“International Application Serial No. PCT/US2013/024149, International Search Report mailed”, 7 pages. |
“T4020 & T4030 MEMS Microphones for Consumer Electronics”, Product Brief 2010, Edition Feb. 2010, (2010), 2 pgs. |
Acar, Cenk, et al., “Chapter 4: Mechanical Design of MEMS Gyroscopes”, MEMS Vibratory Gyroscopes: Structural Approaches to Improve Robustness, Springer, (2009), 73-110. |
Acar, Cenk, et al., “Chapter 6: Linear Multi DOF Architecture—Sections 6.4 and 6.5”, MEMS Vibratory Gyroscopes: Structural Approaches to Improve Robustness, Springer, (2009), 158-178. |
Acar, Cenk, et al., “Chapter 7: Torsional Multi-DOF Architecture”, MEMS Vibratory Gyroscopes: Structural Approaches to Improve Robustness, Springer, (209), 187-206. |
Acar, Cenk, et al., “Chapter 8: Distributed-Mass Architecture”, MEMS Vibratory Gyroscopes: Structural Approaches to Improve Robustness, Springer, (2009), 207-224. |
Acar, Cenk, et al., “Chapter 9: Conclusions and Future Trends”, MEMS Vibratory Gyroscopes: Structural Approaches to Improve Robustness, Springer, (2009), 225-245. |
Beyne, E, et al., “Through-silicon via and die stacking technologies for microsystems-integration”, IEEE International Electron Devices Meeting, 2008. IEDM 2008., (Dec. 2008), 1-4. |
Cabruja, Enric, et al., “Piezoresistive Accelerometers for MCM-Package-Part II”, The Packaging Journal of Microelectromechanical Systems. vol. 14, No. 4, (Aug. 2005), 806-811. |
Ezekwe, Chinwuba David, “Readout Techniques for High-Q Micromachined Vibratory Rate Gyroscopes”, Electrical Engineering and Computer Sciences University of California at Berkeley, Technical Report No. UCB/EECS-2007-176, http://www.eecs.berkeley.edu/Pubs/TechRpts/2007/EECS-2007-176.html, (Dec. 21, 2007), 94 pgs. |
Krishnamurthy, Rajesh, et al., “Drilling and Filling, but not in your Dentist's Chair A look at some recent history of multi-chip and through silicon via (TSV) technology”, Chip Design Magazine, (Oct./Nov. 2008), 7 pgs. |
Rimskog, Magnus, “Through Wafer Via Technology for MEMS and 3D Integration”, 32nd IEEE/CPMT International Electronic Manufacturing Technology Symposium, 2007. IEMT '07., (2007), 286-289. |
“U.S. Appl. No. 13/363,537, Final Office Action mailed Jun. 27, 2014”, 8 pgs. |
“U.S. Appl. No. 13/742,942, Notice of Allowance mailed Jan. 28, 2014”, 8 pgs. |
“U.S. Appl. No. 13/755,841, Supplemental Notice of Allowability Jun. 27, 2014”, 2 pgs. |
“U.S. Appl. No. 13/821,589, Non Final Office Action mailed Jul. 9, 2014”, 10 pgs. |
“U.S. Appl. No. 13/821,589, Response to Restriction Requirement mailed Apr. 11, 2014”, 6 pgs. |
“U.S. Appl. No. 13/821,598, Restriction Requirement mailed Aug. 15, 2014”, 11 pgs. |
“U.S. Appl. No. 13/821,612, Non Final Office Action mailed Jul. 23, 2014”, 8 pgs. |
“U.S. Appl. No. 13/821,853, Non Final Office Action mailed Jul. 30, 2014”, 10 pgs. |
“U.S. Appl. No. 13/860,761, Non Final Office Action mailed Aug. 19, 2014”, 13 pgs. |
“Chinese Application Serial No. 2010800423190, Response filed Aug. 11, 2014 to Office Action mailed Mar. 26, 2014”, w/English Claims, 11 pgs. |
“Chinese Application Serial No. 201180054796.3, Response filed Jun. 30, 2014 to Office Action mailed Jan. 16, 2014”, w/English Claims, 3 pgs. |
“Chinese Application Serial No. 201180055029.4, Office Action mailed Jul. 2, 2014”, w/English Translation, 5 pgs. |
“Chinese Application Serial No. 201180055309.5, Response filed Aug. 13, 2014 to Office Action mailed Mar. 31, 2014”, w/English Claims, 27 pgs. |
“Chinese Application Serial No. 201380007588.7, Notification to Make Rectification mailed Aug. 18, 2014”, 2 pgs. |
“Chinese Application Serial No. 201380007615.0, Notification to Make Rectification mailed Aug. 18, 2014”, 2 pgs. |
“European Application Serial No. 10806751.3, Response filed Jul. 24, 2014 to Office Action mailed Jan. 24, 2014”, 26 pgs. |
“European Application Serial No. 11826068.6, Extended European Search Report mailed Jul. 16, 2014”, 10 pgs. |
“European Application Serial No. 13001719.7, Extended European Search Report mailed Jun. 24, 2014”, 10 pgs. |
“International Application Serial No. PCT/US2013/021411, International Preliminary Report on Patentability mailed Aug. 14, 2014”, 7 pgs. |
“International Application Serial PCT/US2013/023877, International Preliminary Report on Patentability mailed Aug. 14, 2014”, 7 pgs. |
“International Application Serial No. PCT/US2013/024138, International Preliminary Report on Patentability mailed Aug. 14, 2014”, 6 pgs. |
“International Application Serial No. PCT/US2013/024149, International Preliminary Report on Patentability mailed Aug. 14, 2014”, 6 pgs. |
Xia, Guo-Ming, et al., “Phase correction in digital self-oscillation drive circuit for improve silicon MEMS gyroscope bias stability”, Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on, IEEE, (Nov. 1, 2010), 1416-1418. |
“U.S. Appl. No. 13/742,994, Non Final Office Action mailed May 1, 2015”, 20 pgs. |
“U.S. Appl. No. 13/813,443, Restriction Requirement mailed Apr. 29, 2015”, 6 pgs. |
“U.S. Appl. No. 13/821,589, Final Office Action mailed Mar. 12, 2015”, 13 pgs. |
“U.S. Appl. No. 13/821,609, Notice of Allowance mailed Mar. 23, 2015”, 11 pgs. |
“U.S. Appl. No. 13/821,842, Non Final Office Action mailed Mar. 18, 2015”, 20 pgs. |
“U.S. Appl. No. 13/860,761, Advisory Action mailed Mar. 25, 2015”, 3 pgs. |
“U.S. Appl. No. 13/860,761, Notice of Allowance mailed Apr. 28, 2015”, 8 pgs. |
“U.S. Appl. No. 13/860,761, Response filed Mar. 16, 2015 to Final Office Action mailed Jan. 16, 2015”, 12 pgs. |
“U.S. Appl. No. 13/860,761, Response filed Apr. 16, 2015 to Advisory Action mailed Mar. 25, 2015”, 11 pgs. |
“U.S. Appl. No. 14/658,579, Prliminary Amendment filed Mar. 18, 2015”, 8 pgs. |
“Chinese Application Serial No. 201180055823.9, Office Action mailed Mar. 19, 2015”, 8 pgs. |
“Chinese Application Serial No. 201180055845.5, Office Action mailed Mar. 4, 2015”, 8 pgs. |
“U.S. Appl. No. 12/849,742, Response filed Sep. 30, 2013 to Non-Final Office Action mailed Mar. 28, 2013”, 12 pgs. |
“U.S. Appl. No. 12/849,787, Response filed Oct. 28, 2013 to Non Final Office Action mailed May 28, 2013”, 12 pgs. |
“Chinese Application Serial No. 201180053926.1, Amendment filed Aug. 21, 2013”, w/English Translation, 13 pgs. |
“Chinese Application Serial No. 201180055309.5, Voluntary Amendment filed Aug. 23, 2013”, w/English Translation, 13 pgs. |
“Chinese Application Serial No. 201320165465.3, Office Action mailed Jul. 22, 2013”, w/English Translation, 2 pgs. |
“Chinese Application Serial No. 201320165465.3, Response filed Aug. 7, 2013 to Office Action mailed Jul. 22, 2013”, w/English Translation, 39 pgs. |
“Chinese Application Serial No. 201320171504.0, Office Action mailed Jul. 22, 2013”, w/English Translation, 3 pgs. |
“Chinese Application Serial No. 201320171504.0, Response filed Jul. 25, 2013 to Office Action mailed Jul. 22, 2013”, w/English Translation, 33 pgs. |
“Chinese Application Serial No. 201320171616.6, Office Action mailed Jul. 10, 2013”, w/English Translation, 2 pgs. |
“Chinese Application Serial No. 201320171757.8, Office Action mailed Jul. 11, 2013”, w/English Translation, 2 pgs. |
“Chinese Application Serial No. 201320171757.8, Response filed Jul. 25, 2013 to Office Action mailed Jul. 11, 2013”, w/English Translation, 21 pgs. |
“Chinese Application Serial No. 201320171757.8, Response filed Jul. 26, 2013 to Office Action mailed Jul. 10, 2013”, w/English Translation, 40 pgs. |
“Chinese Application Serial No. 201320172128.7, Office Action mailed Jul. 12, 2013”, w/English Translation, 3 pgs. |
“Chinese Application Serial No. 201320172128.7, Response filed Aug. 7, 2013 to Office Action mailed Jul. 12, 2013”, w/English Translation, 39 pgs. |
“Chinese Application Serial No. 201320172366.8, Office Action mailed Jul. 9, 2013”, w/English Translation, 3 pgs. |
“Chinese Application Serial No. 201320172366.8, Response filed Sep. 16, 2013 to Office Action mailed Jul. 9, 2013”, w/English Translation, 24 pgs. |
“Chinese Application Serial No. 201320172367.2, Office Action mailed Jul. 9, 2013”, w/English Translation, 2 pgs. |
“Chinese Application Serial No. 201320172367.2, Response filed Sep. 16, 2013 to Office Action mailed Jul. 9, 2013”, w/English Translation, 24 pgs. |
“Chinese Application Serial No. 201320185461.1, Office Action mailed Jul. 23, 2013”, w/English Translation, 3 pgs. |
“Chinese Application Serial No. 201320185461.1, Response filed Sep. 10, 2013 to Office Action mailed Jul. 23, 2013”, w/English Translation, 25 pgs. |
“Chinese Application Serial No. 201320186292.3, Office Action mailed Jul. 19, 2013”, w/English Translation, 2 pgs. |
“Chinese Application Serial No. 201320186292.3, Response filed Sep. 10, 2013 to Office Action mailed Jul. 19, 2013”, w/English Translation, 23 pgs. |
“European Application Serial No. 13001692.6, European Search Report mailed Jul. 24, 2013”, 5 pgs. |
“European Application Serial No. 13001696.7, Extended European Search Report mailed Aug. 6, 2013”, 4 pgs. |
“European Application Serial No. 13001721.3, European Search Report mailed Jul. 18, 2013”, 9 pgs. |
“International Application Serial No. PCT/US2013/024138, International Search Report mailed May 24, 2013”, 3 pgs. |
“International Application Serial No. PCT/US2013/024138, Written Opinion mailed May 24, 2013”, 4 pgs. |
“Korean Application Serial No. 10-2013-7009775, Office Action mailed Sep. 17, 2013”, w/English Translation, 6 pgs. |
“Korean Application Serial No. 10-2013-7009777, Office Action mailed Sep. 17, 2013”, w/English Translation, 8 pgs. |
“Korean Application Serial No. 10-2013-7009788, Office Action mailed Aug. 29, 2013”, w/English Translation, 6 pgs. |
“Korean Application Serial No. 10-2013-7009790, Office Action mailed Jun. 26, 2013”, W/English Translation, 7 pgs. |
“Korean Application Serial No. 10-2013-7009790, Response filed Aug. 26, 2013 to Office Action mailed Jun. 26, 2013”, w/English Claims, 11 pgs. |
“Korean Application Serial No. 10-2013-7010143, Office Action mailed May 28, 2013”, w/English Translation, 5 pgs. |
“Korean Application Serial No. 10-2013-7010143, Response filed Jul. 24, 2013 to Office Action mailed May 28, 2013”, w/English Claims, 14 pgs. |
Ferreira, Antoine, et al., “A Survey of Modeling and Control Techniques for Micro- and Nanoelectromechanical Systems”, IEEE Transactions on Systems, Man and Cybernetics—Part C: Applications and Reviews vol. 41, No. 3., (May 2011), 350-364. |
Fleischer, Paul E, “Sensitivity Minimization in a Single Amplifier Biquad Circuit”, IEEE Transactions on Circuits and Systems. vol. Cas-23, No. 1, (1976), 45-55. |
Reljin, Branimir D, “Properties of SAB filters with the two-pole single-zero compensated operational amplifier”, Circuit Theory and Applications: Letters to the Editor. vol. 10, (1982), 277-297. |
Sedra, Adel, et al., “Chapter 8.9: Effect of Feedback on the Amplifier Poles”, Microelectronic Circuits, 5th edition, (2004), 836-864. |
Song-Hee, Cindy Paik, “A MEMS-Based Precision Operational Amplifier”, Submitted to the Department of Electrical Engineering and Computer Sciences MIT, [Online]. Retrieved from the Internet: <URL: http://dspace.mit.edu/bitstream/handle/1721.1/16682/57138272.pdf?. . . >, (Jan. 1, 2004), 123 pgs. |
“U.S. Appl. No. 13/362,955, Notice of Allowance mailed Feb. 25, 2015”, 8 pgs. |
“U.S. Appl. No. 13/362,955, Response filed Jan. 16, 2015 to Final Office Action mailed Nov. 19, 2014”, 9 pgs. |
“U.S. Appl. No. 13/363,537, Corrected Notice of Allowance mailed Jan. 28, 2015”, 2 pgs. |
“U.S. Appl. No. 13/821,586, Non Final Office Action mailed Jan. 15, 2015”, 8 pgs. |
“U.S. Appl. No. 13/821,598, Response filed Feb. 20, 2015 to Non Final Office Action mailed Nov. 20, 2014”, 12 pgs. |
“U.S. Appl. No. 13/821,609, Response filed Feb. 13, 2015 to Restriction Requirement mailed Dec. 15, 2014”, 6 pgs. |
“U.S. Appl. No. 13/821,609, Restriction Requirement mailed Dec. 15, 2014”, 7 pgs. |
“U.S. Appl. No. 13/821,612, Notice of Allowance mailed Dec. 10, 2014”, 8 pgs. |
“U.S. Appl. No. 13/821,853, Non Final Office Action mailed Feb. 18, 2015”, 15 pgs. |
“U.S. Appl. No. 13/821,853, Response filed Dec. 1, 2014 to Non Final Office Action mailed Jul. 30, 2014”, 10 pgs. |
“U.S. Appl. No. 13/860,761, Final Office Action mailed Jan. 15, 2015”, 14 pgs. |
“U.S. Appl. No. 13/860,761, Response filed Dec. 19, 2014 to Non Final Office Action mailed Aug. 19, 2014”, 12 pgs. |
“Chinese Application Serial No. 2010800423190, Office Action mailed Dec. 3, 2014”, 3 pgs. |
“Chinese Application Serial No. 2010800423190, Response filed Feb. 15, 2015”, 3 pgs. |
“Chinese Application Serial No. 201180054796.3, Office Action mailed Jan. 30, 2015”, with English translation of claims, 5 pgs. |
“Chinese Application Serial No. 201180054796.3, Response filed Nov. 19, 2014 to Office Action mailed Sep. 4, 2014”, with English translation of claims, 7 pgs. |
“Chinese Application Serial No. 201180055309.5, Office Action mailed Jan. 8, 2015”, with English translation of claims, 5 pgs. |
“Chinese Application Serial No. 201180055309.5, Response filed Jan. 14, 2015 to Office Action mailed Jan. 8, 2015”, 8 pgs. |
“Chinese Application Serial No. 201180055630.3, Office Action mailed Dec. 22, 2014”, with English translation of claims, 10 pgs. |
“Chinese Application Serial No. 201180055792.7, Office Action mailed Dec. 22, 2014”, with English translation of claims, 10 pgs. |
“Chinese Application Serial No. 201180055794.6, Office Action mailed Dec. 17, 2014”, with English translation of claims, 9 pgs. |
“Chinese Application Serial No. 2013101188456, Response filed Jan. 21, 2015”, with English translation of claims, 16 pgs. |
“Chinese Application Serial No. 201310119472.4, Response filed Jan. 21, 2015”, with English translation of claims, 16 pgs. |
“Chinese Application Serial No. 201380007588.7, Response filed Oct. 24, 2014”, with English translation, 3 pgs. |
“Chinese Application Serial No. 201380007615.0, Response filed Oct. 24, 2014”, with English translation, 3 pgs. |
“European Application Serial No. 11826068.6, Response filed Feb. 9, 2015”, 30 pgs. |
“European Application Serial No. 11826071.0, Examination Notification Art. 94(3) mailed Dec. 11, 2014”, 4 pgs. |
“European Application Serial No. 13001695.9, Extended European Search Report mailed Jan. 22, 2015”, 8 pgs. |
“European Application Serial No. 13001719.7, Response filed Jan. 21, 2015”, 29 pgs. |
“U.S. Appl. No. 13/362,955, Final Office Action mailed Nov. 19, 2014”, 5 pgs. |
“U.S. Appl. No. 13/362,955, Response filed Aug. 15, 2014 to Non Final Office Action mailed May 15, 2014”, 13 pgs. |
“U.S. Appl. No. 13/363,537, Examiner Interview Summary mailed Sep. 29, 2014”, 3 pgs. |
“U.S. Appl. No. 13/363,537, Notice of Allowance mailed Nov. 7, 2014”, 5 pgs. |
“U.S. Appl. No. 13/363,537, Response filed Sep. 29, 2014 to Final Office Action mailed Jun. 27, 2014”, 9 pgs. |
“U.S. Appl. No. 13/821,586, Response filed Nov. 24, 2014 to Restriction Requirement mailed Sep. 22, 2014”, 6 pgs. |
“U.S. Appl. No. 13/821,586, Restriction Requirement mailed Sep. 22, 2014”, 4 pgs. |
“U.S. Appl. No. 13/821,589, Response filed Nov. 10, 2014 to Non Final Office Action mailed Jul. 9, 2014”, 15 pgs. |
“U.S. Appl. No. 13/821,598, Non Final Office Action mailed Nov. 20, 2014”, 9 pgs. |
“U.S. Appl. No. 13/821,598, Response filed Oct. 15, 2014 to Restriction Requirement mailed Aug. 15, 2014”, 8 pgs. |
“U.S. Appl. No. 13/821,612, Response filed Oct. 23, 2014 to Non Final Office Action mailed Jul. 23, 2014”, 6 pgs. |
“Chinese Application Serial No. 201180054796.3, Office Action mailed Sep. 4, 2014”, w/English Claims, 11 pgs. |
“Chinese Application Serial No. 201180055029.4, Response filed Nov. 14, 2014 to Office Action mailed Jul. 2, 2014”, w/English Claims, 23 pgs. |
“Chinese Application Serial No. 201310118845.6, Office Action mailed Sep. 9, 2014”, 8 pgs. |
“Chinese Application Serial No. 201310119472.4, Office Action mailed Sep. 9, 2014”, w/English Translation, 11 pgs. |
“European Application Serial No. 11826043.9, Office Action mailed May 6, 2013”, 2 pgs. |
“European Application Serial No. 11826043.9, Response filed Nov. 4, 2013 to Office Action mailed May 6, 2013”, 6 pgs. |
“European Application Serial No. 11826067.8, Extended European Search Report mailed Oct. 6, 2014”, 10 pgs. |
“European Application Serial No. 11826070.2, Response filed Sep. 19, 2014 to Office Action mailed Mar. 12, 2014”, 11 pgs. |
“European Application Serial No. 11826071.0, Response filed Sep. 19, 2014 to Office Action mailed Mar. 12, 2014”, 20 pgs. |
“European Application Serial No. 11827347.3, Office Action mailed May 2, 2013”, 6 pgs. |
“European Application Serial No. 11827347.3, Response filed Oct. 30, 2013 to Office Action mailed May 2, 2013”, 9 pgs. |
“European Application Serial No. 11827384.6, Extended European Search Report mailed Nov. 12, 2014”, 6 pgs. |
“European Application Serial No. 13001695.9, European Search Report mailed Oct. 5, 2014”, 6 pgs. |
Dunn, C, et al., “Efficient linearisation of sigma-delta modulators using single-bit dither”, Electronics Letters 31(12), (Jun. 1995), 941-942. |
Kulah, Haluk, et al., “Noise Analysis and Characterization of a Sigma-Delta Capacitive Silicon Microaccelerometer”, 12th International Conference on Solid State Sensors, Actuators and Microsystems, (2003), 95-98. |
Sherry, Adrian, et al., “AN-609 Application Note: Chopping on Sigma-Delta ADCs”, Analog Devices, [Online]. Retrieved from the Internet: <URL: http://www.analog.com/static/imported-files/application—notes/AN-609.pdf>, (2003), 4 pgs. |
“U.S. Appl. No. 13/742,994, Response filed Jul. 31, 2015 to Non Final Office Action mailed May 1, 2015”, 12 pgs. |
“U.S. Appl. No. 13/765,068, Notice of Allowance mailed May 7, 2015”, 12 pgs. |
“U.S. Appl. No. 13/813,443, Non Final Office Action mailed Jun. 10, 2015”, 10 pgs. |
“U.S. Appl. No. 13/813,443, Response filed May 22, 2015 to Restriction Requirement mailed Apr. 29, 2015”, 7 pgs. |
“U.S. Appl. No. 13/821,586, Notice of Allowance mailed Jun. 5, 2015”, 6 pgs. |
“U.S. Appl. No. 13/821,586, Response filed May 15, 2015 to Non Final Office Action mailed Jan. 15, 2015”, 12 pgs. |
“U.S. Appl. No. 13/821,589, Final Office Action mailed Jul. 17, 2015”, 14 pgs. |
“U.S. Appl. No. 13/821,589, response filed May 12, 2015 to final office action mailed Mar. 12, 2015”, 12 pgs. |
“U.S. Appl. No. 13/821,598, Non Final Office Action mailed Jul. 7, 2015”, 9 pgs. |
“U.S. Appl. No. 13/821,619, Ex Parte Quayle Action mailed Jul. 16, 2015”, 8 pgs. |
“U.S. Appl. No. 13/821,793, Non Final Office Action mailed Jul. 27, 2015”, 14 pgs. |
“U.S. Appl. No. 13/821,842, Response filed Jun. 18, 2015 Non Final Office Action mailed Mar. 18, 2015”, 11 pgs. |
“U.S. Appl. No. 13/821,853, Final Office Action mailed Jun. 18, 2015”, 7 pgs. |
“U.S. Appl. No. 13/821,853, Response filed May 18, 2015 to Non Final Office Action mailed Feb. 18, 2015”, 12 pgs. |
“U.S. Appl. No. 14/023,869, Non Final Office Action mailed Jun. 15, 2015”, 15 pgs. |
“U.S. Appl. No. 14/658,579, Non Final Office Action mailed Jul. 1, 2015”, 9 pgs. |
“Chinese Application Serial No. 201180044919.5, Office Action mailed Jun. 25, 2015”, w/ English Translation, 8 pgs. |
“Chinese Application Serial No. 201180054796.3, Office Action mailed Jun. 4, 2015”, w/ English Translation, 7 pgs. |
“Chinese Application Serial No. 201180054796.3, Response filed Apr. 14, 2015 to Office Action mailed Jan. 30, 2015”, w/ English Claims, 30 pgs. |
“Chinese Application Serial No. 201180055630.3, Office Action mailed Jul. 10, 2015”, w/ English Claims, 8 pgs. |
“Chinese Application Serial No. 201180055630.3, Response filed Apr. 20, 2015 to Office Action mailed Dec. 22, 2014”, w/ English Claims, 10 pgs. |
“Chinese Application Serial No. 201180055792.7, Response filed May 5, 2015 to Office Action mailed Dec. 22, 2014”, w/ English Claims, 15 pgs. |
“Chinese Application Serial No. 201180055794.6, Response filed May 4, 2015 to Office Action mailed Dec. 17, 2014”, w/ English Claims, 15 pgs. |
“Chinese Application Serial No. 201180055845.5, Office Action mailed Aug. 5, 2015”, 5 pgs. |
“Chinese Application Serial No. 201310115550.3, Office Action mailed May 22, 2015”, w/ English Claims, 8 pgs. |
“Chinese Application Serial No. 201310119730.9, Office Action mailed May 4, 2015”, w/ English Claims, 8 pgs. |
“Chinese Application Serial No. 201310119806.8, Office Action mailed Jul. 3, 2015”, w/ English Claims, 12 pgs. |
“Chinese Application Serial No. 201310119986.X, Office Action mailed May 12, 2015”, w/ English Claims, 14 pgs. |
“Chinese Application Serial No. 201310127961.4, Office Action mailed May 6, 2015”, w/ English Claims, 7 pgs. |
“Chinese Application Serial No. 201310128046.7, Office Action mailed Jul. 23, 2015”, 7 pgs. |
“Chinese Application Serial No. 201310415336.X, Office Action mailed Jul. 3, 2015”, w/ English Claims, 9 pgs. |
“Chinese Application Serial No. 201380007588.7, Office Action mailed Jun. 10, 2015”, w/ English Claims, 7 pgs. |
“Chinese Application Serial No. 201380007615.0, Office Action mailed May 6, 2015”, w/ English Claims, 7 pgs. |
“European Application Serial No. 11826067.8, Response filed Apr. 27, 2015 to Extended European Search Report mailed Oct. 6, 2014”, 32 pgs. |
“European Application Serial No. 11826069.4, Extended European Search Report mailed Jul. 23, 2015”, 8 pgs. |
“European Application Serial No. 11826071.0, Response filed Apr. 13, 2015 to Examination Notification Art. 94(3) mailed Dec. 11, 2014”, 5 pgs. |
“European Application Serial No. 11827347.3, Extended European Search Report mailed Jul. 31, 2015”, 6 pgs. |
“Korean Application Serial No. 10-2013-0036907, Amendment filed Jul. 21, 2015”, Not in English, 12 pgs. |
Number | Date | Country | |
---|---|---|---|
20130139592 A1 | Jun 2013 | US |
Number | Date | Country | |
---|---|---|---|
61384247 | Sep 2010 | US | |
61384512 | Sep 2010 | US | |
61593691 | Feb 2012 | US |
Number | Date | Country | |
---|---|---|---|
Parent | 13813443 | US | |
Child | 13755953 | US |