Number | Name | Date | Kind |
---|---|---|---|
4394237 | Donnelly et al. | Jul 1983 | A |
4493745 | Chen et al. | Jan 1985 | A |
4602981 | Chen et al. | Jul 1986 | A |
4859277 | Barna et al. | Aug 1989 | A |
4954212 | Gabriel | Sep 1990 | A |
4995939 | Ferenczi et al. | Feb 1991 | A |
5014217 | Savage | May 1991 | A |
5160402 | Cheng | Nov 1992 | A |
5200023 | Gifford et al. | Apr 1993 | A |
5288367 | Angell et al. | Feb 1994 | A |
5294289 | Heinz et al. | Mar 1994 | A |
5308414 | O'Neill et al. | May 1994 | A |
5338390 | Barbee et al. | Aug 1994 | A |
5347460 | Gifford | Sep 1994 | A |
5348889 | Terashima et al. | Sep 1994 | A |
5362356 | Schoenborn | Nov 1994 | A |
5372673 | Stager et al. | Dec 1994 | A |
5392124 | Barbee et al. | Feb 1995 | A |
5399229 | Stefani et al. | Mar 1995 | A |
5403433 | Morrison et al. | Apr 1995 | A |
5445705 | Barbee et al. | Aug 1995 | A |
5450205 | Sawin et al. | Sep 1995 | A |
5451289 | Barbee et al. | Sep 1995 | A |
5456788 | Barbee et al. | Oct 1995 | A |
5467883 | Frye et al. | Nov 1995 | A |
5472561 | Williams et al. | Dec 1995 | A |
5474648 | Patrick et al. | Dec 1995 | A |
5573624 | Barbee | Nov 1996 | A |
5653894 | Ibbotson | Aug 1997 | A |
5658423 | Angell | Aug 1997 | A |
5664066 | Sun | Sep 1997 | A |
Entry |
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Sherwood et al. “Calculus” UCLA pp. 20-21, 1954.* |
Wahbi et al. “Ratios of first derivative maxima and compensated derivative absorption curve” Analyst, v. 111, pp. 777-780, 1986.* |
Shiga et al. “On line differential converter. . . . ” CA 76:52832, with original article attached, 1971.* |
Sherwood et al. “Calculus” UCLA Pubs. pp. 20-21, 1954.* |
Shiga et al. “Online differential converter for obtaining the first derivative of absorption spectra” CA 76:52832, 1972.* |
Wahbi et al. “Ratios of first derivative maxima and compensted derivative absorption curves” Analyst vo. 111, pp. 777-780, 1986.* |
Webster Dictionary, p. 365, 1976.* |
Splichal et al., “Application of Chemometrics to Optical Emission Spectroscopy for Plasma Monitoring”, SPIE, vol. 1594, Process Module Metrology, Control, and Clustering, pp. 189-203 (1991). |