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5034923 | Kuo et al. | Jul 1991 | A |
5428574 | Kuo et al. | Jun 1995 | A |
6163862 | Adams et al. | Dec 2000 | A |
6182257 | Gillingham | Jan 2001 | B1 |
6249468 | Kan et al. | Jun 2001 | B1 |
6504775 | Ma et al. | Jan 2003 | B1 |
Entry |
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Clinton Kuo et al.; Soft-Defect Detection (SDD) Technique for a High-Reliability CMOS SRAM; IEEE Journal of Solid-State Circuits, vol. 25, No. 1, Feb. 1990; pp. 61-66. |