Claims
- 1. A method for reducing adherence of an adhesive carrier film to a semiconductor die, comprising:placing the adhesive carrier film proximate to a plurality of laterally spaced support members with the semiconductor die on an opposite side of the adhesive carrier film from said support members; and drawing the adhesive carrier film between said support members to reduce adherence of the adhesive carrier film to the semiconductor die.
- 2. The method of claim 1, further comprising pulling a substantial area of the adhesive carrier film away from the semiconductor die.
- 3. The method of claim 1, further comprising removing the semiconductor die from the adhesive carrier film.
- 4. The method of claim 3, wherein said removing is effected by applying a vacuum to a surface of the semiconductor die not in contact with the adhesive carrier film.
- 5. The method of claim 1, further comprising striking a back surface of the semiconductor die through the adhesive carrier film.
- 6. The method of claim 3, further comprising striking a back surface of the semiconductor die through the adhesive carrier film.
- 7. The method of claim 1, wherein said drawing is effected by applying a negative pressure to the adhesive carrier film.
- 8. A method for reducing adherence of an adhesive carrier film to at least one semiconductor die, comprising:disposing the adhesive carrier film, adhered to a back side of the at least one semiconductor die, adjacent to a support including a plurality of laterally spaced support members; and drawing portions of the adhesive carrier film located between said plurality of laterally spaced support members away from the back side of the at least one semiconductor die.
- 9. The method of claim 8, wherein said drawing comprises applying a vacuum to said portions of the adhesive carrier film located between said plurality of laterally spaced support members.
- 10. The method of claim 8, further comprising pulling a substantial area of the adhesive carrier film away from the at least one semiconductor die.
- 11. The method of claim 8, further comprising removing the at least one semiconductor die from the adhesive carrier film.
- 12. The method of claim 11, wherein said removing is effected by applying a vacuum to a surface of the at least one semiconductor die not in contact with the adhesive carrier film.
- 13. The method of claim 8, further comprising applying pressure to the back side of the at least one semiconductor die through the adhesive carrier film.
- 14. The method of claim 13, wherein said applying pressure comprises striking the back side.
CROSS REFERENCE TO RELATED APPLICATIONS
This application is a continuation of application Ser. No. 09/304,566, filed May 4, 1999, now U.S. Pat. No. 6,505,395, issued Jan. 14, 2003, which is a divisional of application Ser. No. 09/140,920, filed Aug. 26, 1998, now U.S. Pat. No. 6,202,292 B1, issued Mar. 20, 2001.
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Continuations (1)
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Number |
Date |
Country |
Parent |
09/304566 |
May 1999 |
US |
Child |
10/198608 |
|
US |