| Number | Date | Country | Kind |
|---|---|---|---|
| 2000-072718 | Mar 2000 | JP |
| Number | Name | Date | Kind |
|---|---|---|---|
| 4657805 | Fukumitsu et al. | Apr 1987 | A |
| 5378514 | Hamada et al. | Jan 1995 | A |
| 5422704 | Sego | Jun 1995 | A |
| 5693382 | Hamada et al. | Dec 1997 | A |
| 5966490 | Minns et al. | Oct 1999 | A |
| Number | Date | Country |
|---|---|---|
| 0 416 517 | Mar 1991 | EP |
| 0 416 528 | Mar 1991 | EP |
| 0416528 | Nov 1991 | EP |
| 2951337 | Jul 1999 | JP |
| 2952962 | Jul 1999 | JP |
| 8804070 | Jun 1988 | WO |
| WO 9807378 | Feb 1998 | WO |
| WO 9846658 | Oct 1998 | WO |
| WO 0137043 | May 2001 | WO |
| WO 0137044 | May 2001 | WO |
| Entry |
|---|
| R. H. French, et al., Proceeding of SPIE—The International Society for Optical Engineering, vol. 4000, pp. 1491-1502, “Fluoropolymers for 157nm Lithography; Optical Properties from VUV Absorbance and Ellipsometry Measurements”, 2000. |