This application claims priority under 35 U.S.C. §119 to Korean Patent Application No. 10-2016-0110093, filed on Aug. 29, 2016, in the Korean Intellectual Property Office, the disclosure of which is incorporated herein in its entirety by reference.
At least some example embodiments relate to pre-charge circuits and/or electronic devices including the same, and more particularly, to pre-charge circuits configured to suppress inrush currents and/or electronic devices including the same.
An electronic device may include a pre-charge circuit, which further includes a resistor element. During a hot plug operation to connect an electronic device to an external power source, for example, the pre-charge circuit may prevent inrush currents from being generated in the electronic device. However, resistor elements of pre-charge circuits may occupy relatively large mounting space on a circuit substrate, and thus, may hinder miniaturization of electronic devices.
One or more example embodiments provide pre-charge circuits configured to more effectively suppress and/or prevent inrush currents, and/or further reduce sizes of electronic devices. One or more example embodiments also provide electronic devices including pre-charge circuits configured to more effectively suppress and/or prevent inrush currents, and/or further reduce sizes of electronic devices.
At least one example embodiment provides an electronic device comprising: a plurality of semiconductor devices; a connector including a pre-charge pin and a power pin; a pre-charge conductive line configured to electrically connect the pre-charge pin to a voltage supply node, the pre-charge conductive line having a first resistance value configured to generate pre-charge current for a pre-charge operation on the plurality of semiconductor devices, the pre-charge current performed to prevent inrush currents due to an external power source; a first conductive line having a second resistance value, the first conductive line configured to electrically connect the power pin to the voltage supply node, and to transmit a power voltage to the voltage supply node from the external power source, the second resistance value less than the first resistance value; and a second conductive line configured to electrically connect the plurality of semiconductor devices to the voltage supply node, and to transmit the power voltage to the plurality of semiconductor devices.
At least one other example embodiment provides a pre-charge circuit, comprising: a first pre-charge pin electrically connected to a first external power source; a second pre-charge pin electrically connected to a second external power source; a first pre-charge conductive line configured to electrically connect the first pre-charge pin to a first voltage supply node, the first pre-charge conductive line having a first resistance value configured to generate first pre-charge current for a first pre-charge operation on at least one first semiconductor device receiving a first power voltage via the first voltage supply node; and a second pre-charge conductive line configured to electrically connect the second pre-charge pin to a second voltage supply node, the second pre-charge conductive line having a second resistance value to generate second pre-charge current for a second pre-charge operation on at least one second semiconductor device receiving a second power voltage via the second voltage supply node.
At least one other example embodiment provides an electronic device comprising: a power connector; a power supply conductive line; and a pre-charge conductive line. The power connector includes a pre-charge pin and a power supply pin. The power supply conductive line has a first resistance, and is configured to electrically connect the power supply pin to a power supply node. The pre-charge conductive line has a second resistance, which is greater than the first resistance, and the pre-charge conductive line is configured to electrically connect the pre-charge pin to the power supply node without an intervening resistor between the pre-charge pin and the power supply node.
At least some example embodiments of inventive concepts will be more clearly understood from the following detailed description taken in conjunction with the accompanying drawings in which:
Hereinafter, example embodiments of inventive concepts will be described in detail by referring to the accompanying drawings. Expressions such as “at least one of,” when preceding a list of elements, modify the entire list of elements and do not modify the individual elements of the list.
Referring to
The host 110 may be configured to control the data storage device 120. The host 110 may include a portable device, such as a smart phone, a personal/portable computer, a personal digital assistant (PDA), a portable media player (PMP), an MP3 player, etc. The host 110 and the data storage device 120 may be connected via a standardized interface, such as universal serial bus (USB), small computer system interface (SCSI), enhanced small device interface (ESDI), serial advanced technology attachment (SATA), single attachment station (SAS), PCI-express, or integrated device electronics (IDE). The interface for connecting the host 110 and the data storage device 120 is not limited to a particular form, and may include various forms.
The data storage device 120 may include a controller 121, a signal connector 122, a power voltage transmitter 125, a power connector 126, and a plurality of non-volatile memories (NVM_1, NVM_2, . . . , NVM_n) 128_1 through 128_n. According to an example embodiment, the signal connector 122 and the power connector 126 may correspond to the interface standards between the data storage device 120 and the host 110. Each of the controller 121 and the non-volatile memories 128_1 through 128_n may include at least one semiconductor device. The non-volatile memories 128_1 through 128_n included in the data storage device 120 may store data received from the host 110. A flash memory (e.g., a NAND flash memory device or vertical NAND (VNAND) flash memory device) may be used to realize the non-volatile memories 128_1 through 128_n. In addition to the flash memory, phase-change random access memory (PRAM), magnetic random access memory (MRAM), resistive random access memory (ReRAM), ferroelectric random access memory (FRAM), etc. may be used to realize the non-volatile memories 128_1 through 128_n. Also, volatile memory, such as dynamic random access memory (DRAM) or static random access memory (SRAM), or hybrid memory including at least two types of memories may be used to realize the non-volatile memories 128_1 through 128_n. The non-volatile memories 128_1 through 128_n may be connected to the controller 121 via a plurality of channels CH1 through CHn. One or more non-volatile memories may be connected to one channel, and the non-volatile memories connected to one channel may be connected to the same data bus.
The data storage device 120 may transmit and receive a plurality of signals Sn to and from the host 110 via the signal connector 122. The signal connector 122 may include a plurality of signal pins so that the signal connector 122 may be directly electrically connected with the host 110. That is, for example, the signal pins of the signal connector 122 are directly electrically connected with the host 110 so that the data storage device 120 may transmit and receive signals Sn to and from the host 110. The signals Sn may include a command signal, an address signal, a data signal, etc. The controller 121 may control a memory operation with respect to the plurality of non-volatile memories 128_1 through 128_n based on the signals Sn including the command signal, the address signal, the data signal, etc.
The data storage device 120 may receive power voltages Vm by being connected to a power source included in the host 110 via the power connector 126. The power connector 126 may include a plurality of power pins so that the power connector 126 may be directly electrically connected to the power source of the host 110. That is, for example, the power pins of the power connector 126 may be directly electrically connected to the power source of the host 110 so that the data storage device 120 may receive the power voltages Vm from the host 110. The power voltage transmitter 125 may transmit power voltages VI1 through VIk necessary for performing a certain operation to the controller 121 and the non-volatile memories 128_1 through 128_n. According to an example embodiment, the power voltage transmitter 125 may include a plurality of conductive lines for transmitting the power voltages VI1 through VIk, to the controller 121 and the non-volatile memories 128_1 through 128_n.
According to an example embodiment, the data storage device 120 may provide a hot plug function with respect to the host 110. The power voltage transmitter 125 may include a plurality of pre-charge conductive lines for suppressing and/or preventing inrush currents, which may be generated (e.g., instantly generated) when the host 110 is electrically connected to the data storage device 120 in an ‘ON’ state via the signal connector 122 and the power connector 126. The power connector 126 may further include a plurality of pre-charge pins that are electrically connected to the host 110 before the power pins, when the power connector 126 is electrically connected to the host 110. The plurality of pre-charge pins may be electrically connected to the plurality of pre-charge conductive lines of the power voltage transmitter 125, respectively, and the pre-charge pins and the pre-charge conductive lines may form a pre-charge circuit. According to an example embodiment, the pre-charge conductive lines may have a greater resistance value than other conductive lines. The pre-charge circuit may pre-charge semiconductor devices of the data storage device 120, before receiving a power voltage from the power source of the host 110. That is, for example, the pre-charge circuit may suppress and/or prevent inrush currents by pre-charging an input capacitor with respect to the semiconductor devices of the data storage device 120 by forming pre-charge current in a target range, which refers to a range of current values, which are less (e.g., quite less) than current values of the inrush currents. For example, the target range when the inrush currents correspond to 10 A may correspond to 1.5 A through 2 A, and the pre-charge current may be generated in the target range via the pre-charge circuit. However, it is only an example, and the target range may be various ranges of current values.
The pre-charge conductive line may have varying resistance values according to a magnitude of target current necessary for charging the input capacitor. For example, the pre-charge conductive line may have a decreased resistance value when the magnitude of the target current decreases. A more detailed description of this aspect will be given later.
The pre-charge circuit of the electronic device 120 receiving a power supply from the outside according to an example embodiment may more effectively suppress and/or prevent inrush currents by pre-charging the input capacitor with respect to the semiconductor devices of the electronic device 120 by using the pre-charge conductive line rather than a pre-charge resistor element, and may reduce the number of necessary components of the electronic device 120 to correspond to allow for further reduction in size and/or miniaturization of the electronic device 120.
Referring to
According to an example embodiment, the pre-charge conductive line 221 may be formed between the pre-charge pin 212 and the voltage supply node 223, and may electrically connect the pre-charge pin 212 to the voltage supply node 223. Also, the pre-charge conductive line 221 may have a first resistance value to generate pre-charge current necessary for a pre-charge operation performed to suppress and/or prevent inrush currents due to the external power source to which the power connector 210 is connected. The first conductive line 222 may be formed between the power pin 214 and the voltage supply node 223, and may electrically connect the power pin 214 to the voltage supply node 223. Also, the first conductive line 222 may transmit a power voltage supplied from the external power source to the voltage supply node 223 via the power pin 214, and may have a second resistance value, which is less than the first resistance value of the pre-charge conductive line 221. The second conductive line 224 may be formed between a plurality of semiconductor devices and the voltage supply node 223, and may electrically connect the plurality of semiconductor devices to the voltage supply node 223. The second conductive line 224 may transmit the power voltage to the plurality of semiconductor devices. For convenience of description, only one second conductive line 224 is illustrated, but example embodiments are not limited thereto. The power voltage transmitter 220 may include a plurality of second conductive lines 224. Further, the power voltage transmitter 220 may include a plurality of pre-charge conductive lines and a plurality of first conductive lines.
According to an example embodiment, the semiconductor devices may be included in the electronic device 120 illustrated in
Hereinafter, example operations of the power connector 210 and the power voltage transmitter 220 will be described in more detail. In this example, the plurality of semiconductor devices are described as a capacitor CIN and a load Load corresponding thereto, for convenience of description. The capacitor CIN may be the input capacitor of the electronic device 120 of
When the power pin 214 is electrically connected to the external power source, the capacitor CIN is pre-charged, and thus, the inrush currents, which may be generated in order to charge the capacitor CIN, may be suppressed and/or prevented in advance, and the power voltage may be more stably {circle around (2)} supplied to the load Load via the first conductive line 222 and the second conductive line 224. According to an example embodiment, when the pre-charge operation on the capacitor CIN is complete and the power voltage is supplied to the load Load, the first resistance value of the pre-charge conductive line 221 is greater than the second resistance value of the first conductive line 222, and thus, current flowing in the pre-charge conductive line 221 may be less than current flowing in the first conductive line 222.
According to an example embodiment, at least one of a length, a width, and a conductivity of the pre-charge conductive line 221 may be different from a length, a width, and a conductivity of the first conductive line 222, so that the pre-charge conductive line 221 and the first conductive line 222 may have different resistance values. A more detailed description of this aspect will be given later.
Referring to
The pre-charge conductive line 321a according to an example embodiment may be formed to be longer than the first conductive line 322a while having the same or substantially the same width and/or the same or substantially the same conductivity as the first conductive line 322a. For example, the pre-charge conductive line 321a and the first conductive line 322a may be formed on an area of a circuit substrate included in the electronic device 120 of
A length of the pre-charge conductive line 321a may be determined by taking into account the target range of the pre-charge current necessary for the pre-charge operation on the capacitor CIN of the electronic device 120 of
In
Referring to
In this example embodiment, a width and a conductivity of the pre-charge conductive line 321b may be the same or substantially the same as a width and/or a conductivity of the first conductive line 322b. Via this structure, a resistance value of the pre-charge conductive line 321b may be greater than a resistance value of the first conductive line 322b. According to an example embodiment, a pattern width PW of the pre-charge conductive line 321b may be determined by taking into account the target range of pre-charge current necessary for a pre-charge operation on the capacitor CIN of the electronic device 120 of
In
Referring to
In this example, a length and/or a conductivity of the pre-charge conductive line 321c may be the same or substantially the same as a length and/or a conductivity of the first conductive line 322c. Via this structure, a resistance value of the pre-charge conductive line 321c may be greater than a resistance value of the first conductive line 322c. According to an example embodiment, the width W1 of the pre-charge conductive line 321c may be determined by taking into account a target range of pre-charge current necessary for a pre-charge operation on the capacitor CIN of the electronic device 120 of
In
Referring to
According to an example embodiment, the pre-charge conductive line 321d may include a first type material, and the first conductive line 322d may include a second type material. The first type material may have a greater conductivity than the second type material. For example, the first type material may include aluminum (Al), zinc (Zn), etc., and the second type material may include gold (Au), silver (Ag), copper (Cu), etc. Also, the first type material and the second type material may include an alloy including two types or more than two types of gold. Via this structure, a resistance value of the pre-charge conductive line 321d may be greater than a resistance value of the first conductive line 322d.
According to an example embodiment, the conductivity of the pre-charge conductive line 321d may be determined by taking into account a target range of pre-charge current necessary for a pre-charge operation on the capacitor CIN of the electronic device 120 of
In
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Via this structure, the pre-charge conductive line of
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The power voltage transmitter 820 may include a first pre-charge conductive line 821, a first conductive line 822, a second conductive line 824, a second pre-charge conductive line 825, a third conductive line 826, and a fourth conductive line 828. The first pre-charge conductive line 821 may be formed between the first pre-charge pin 811 and a first voltage supply node 823, and may electrically connect the first pre-charge pin 811 to the first voltage supply node 823. The first pre-charge conductive line 821 may be formed to have a first resistance value to generate first pre-charge current necessary for a pre-charge operation performed to suppress and/or prevent inrush currents due to the first power source PS1. The first conductive line 822 may transmit the first power voltage V1 supplied from the first power source PS1 to the first voltage supply node 823 via the first power pin 812 and may be formed to have a second resistance value, which is less than the first resistance value of the first pre-charge conductive line 821. The second conductive line 824 may be formed between a plurality of first semiconductor devices and the first voltage supply node 823 and may electrically connect the plurality of first semiconductor devices to the first voltage supply node 823. The second conductive line 824 may transmit the first power voltage V1 to the first semiconductor devices. For convenience of description, the plurality of first semiconductor devices are illustrated as a first capacitor CIN1 and a first load Load1 corresponding thereto.
The second pre-charge conductive line 825 may be formed between the second pre-charge pin 813 and a second voltage supply node 827 and may electrically connect the second pre-charge pin 813 to the second voltage supply node 827. The second pre-charge conductive line 825 may be formed to have a third resistance value to generate second pre-charge current necessary for a pre-charge operation performed to suppress and/or prevent inrush currents due to a second power source PS2. The third conductive line 826 may transmit a second power voltage V2 supplied from the second power source PS2 to the second voltage supply node 827 via the second power pin 814, and may be formed to have a fourth resistance value, which is less than the third resistance value of the second pre-charge conductive line 825. The fourth conductive line 828 may be formed between a plurality of second semiconductor devices and the second voltage supply node 827 and may electrically connect the plurality of second semiconductor devices to the second voltage supply node 827. The fourth conductive line 828 may transmit the second power voltage V2 to the second semiconductor devices. For convenience of description, the plurality of second semiconductor devices are illustrated as a second capacitor CIN2 and a second load Load2.
According to an example embodiment, the first resistance value of the first pre-charge conductive line 821 and the third resistance value of the second pre-charge conductive line 825 may be different from each other. A magnitude of the second power source PS2 may be greater than a magnitude of the first power source PS1. In this case, the first resistance value of the first pre-charge conductive line 821 may be less than the third resistance value of the second pre-charge conductive line 825. Via this, when the pre-charge operation is performed on the first capacitor CIN1 and the second capacitor CIN2, first pre-charge current for pre-charging the first capacitor CIN1 and second pre-charge current for pre-charging the second capacitor CIN2 may be in the same or substantially the same target range. That is, for example, the first resistance value of the first pre-charge conductive line 821 electrically connected to the first power source PS1, which is less than the second power source PS2 may be less than the second resistance value of the second pre-charge conductive line 825 electrically connected to the second power source PS2, so that the first pre-charge current and the second pre-charge current may be in the same or substantially the same target range.
According to an example embodiment, at least one of a length, a width, or a conductivity of the first pre-charge conductive line 821 may be different from at least one of a length, a width, or a conductivity of the second pre-charge conductive line 825, so that the first pre-charge conductive line 821 and the second pre-charge conductive line 825 may have different resistance values. Also, the structure illustrated in
Also, the relationship between the first pre-charge conductive line 821 and the first conductive line 822, and the relationship between the second pre-charge conductive line 825 and the third conductive line 826 are described in detail with reference to
Referring to
The power voltage transmitter 920a may include a first pre-charge conductive line 921a, a first conductive line 922a, a second conductive line 924a, a second pre-charge conductive line 925a, a third conductive line 926a, and a fourth conductive line 928a. The first pre-charge conductive line 921a, the first conductive line 922a, and the second conductive line 924a may meet one another at a first power supply node 923a. The second pre-charge conductive line 925a, the third conductive line 926a, and the fourth conductive line 928a may meet one another at a second power supply node 927a. Hereinafter, it is assumed that a magnitude of the second power source PS2 is greater than a magnitude of the first power source PS1.
The second pre-charge conductive line 925a according to an example embodiment may be formed to be longer on a circuit substrate included in the electronic device than the first pre-charge conductive line 921a, while having the same or substantially the same width and/or the same or substantially the same conductivity as the first pre-charge conductive line 921a. Via this, a resistance value of the second pre-charge conductive line 925a may be greater than a resistance value of the first pre-charge conductive line 921a.
In
Referring to
The power voltage transmitter 920b may include a first pre-charge conductive line 921b, a first conductive line 922b, a second conductive line 924b, a second pre-charge conductive line 925b, a third conductive line 926b, and a fourth conductive line 928b. The first pre-charge conductive line 921b, the first conductive line 922b, and the second conductive line 924b may meet one another at a first power supply node 923b. The second pre-charge conductive line 925b, the third conductive line 926b, and the fourth conductive line 928b may meet one another at a second power supply node 927b.
The second pre-charge conductive line 925b according to an example embodiment may be formed on a circuit substrate to have a greater number of patterns having repeated quadrangular shapes than the first pre-charge conductive line 921b. Via this structure, a resistance value of the second pre-charge conductive line 925b may be greater than a resistance value of the first pre-charge conductive line 921b.
In
Referring to
The power voltage transmitter 920c may include a first pre-charge conductive line 921c, a first conductive line 922c, a second conductive line 924c, a second pre-charge conductive line 925c, a third conductive line 926c, and a fourth conductive line 928c. The first pre-charge conductive line 921c, the first conductive line 922c, and the second conductive line 924c may meet one another at a first power supply node 923c. The second pre-charge conductive line 925c, the third conductive line 926c, and the fourth conductive line 928c may meet one another at a second power supply node 927c.
The second pre-charge conductive line 925c according to an example embodiment may have a narrower pattern width than the first pre-charge conductive line 921c. Via this, a size of an area A2 of a circuit substrate, on which the second pre-charge conductive line 925c is formed, may be the same or substantially the same as a size A1 of an area of the circuit substrate, on which the first pre-charge conductive line 921c is formed. Via this, the first pre-charge conductive line 921c and the second pre-charge conductive line 925c may be formed on the circuit substrate efficiently in terms of space.
In
Referring to
The power voltage transmitter 920d may include a first pre-charge conductive line 921d, a first conductive line 922d, a second conductive line 924d, a second pre-charge conductive line 925d, a third conductive line 926d, and a fourth conductive line 928d. The first pre-charge conductive line 921d, the first conductive line 922d, and the second conductive line 924d may meet one another at a first power supply node 923d. The second pre-charge conductive line 925d, the third conductive line 926d, and the fourth conductive line 928d may meet one another at a second power supply node 927d.
The second pre-charge conductive line 925d according to an example embodiment may have the same or substantially the same length and/or the same or substantially the same conductivity as the first pre-charge conductive line 921d, while having a width w3, which is less than a width w4 of the third conductive line 926d and a width w1 of the first pre-charge conductive line 921d. Via this structure, a resistance value of the second pre-charge conductive line 925d may be greater than a resistance value of the first pre-charge conductive line 921d.
In
Referring to
The power voltage transmitter 920e may include a first pre-charge conductive line 921e, a first conductive line 922e, a second conductive line 924e, a second pre-charge conductive line 925e, a third conductive line 926e, and a fourth conductive line 928e. The first pre-charge conductive line 921e, the first conductive line 922e, and the second conductive line 924e may meet one another at a first power supply node 923e. The second pre-charge conductive line 925e, the third conductive line 926e, and the fourth conductive line 928e may meet one another at a second power supply node 927e.
The second pre-charge conductive line 925e according to an example embodiment may have the same or substantially the same length and/or the same or substantially the same width as the first pre-charge conductive line 921e, while having less conductivity than the first pre-charge conductive line 921e. That is, for example, the second pre-charge conductive line 925e may include a third type material, and the first pre-charge conductive line 921e may include a first type material having greater conductivity than the third type material. Via this structure, a resistance value of the second pre-charge conductive line 925e may be greater than a resistance value of the first pre-charge conductive line 921e.
Referring to
Based on the set parameter of the pre-charge conductive line, the pre-charge conductive line having a greater resistance value than a first conductive line is formed on a circuit substrate, in operation S13. As such, the pre-charge conductive line may be formed in various ways by taking into account the magnitude of the power source electrically connected to the pre-charge conductive line and the target range of the pre-charge current.
Referring to
A flash interface 1140 may interface with the flash memory 120, and the CPU 1110 may perform general control operations for data exchange of the memory controller 1100.
According to at least some example embodiments, memories discussed herein may be embodied to include a three dimensional (3D) memory array. The 3D memory array may be monolithically formed on a substrate (e.g., semiconductor substrate such as silicon, or semiconductor-on-insulator substrate). The 3D memory array may include two or more physical levels of memory cells having an active area disposed above the substrate and circuitry associated with the operation of those memory cells, whether such associated circuitry is above or within such substrate. The layers of each level of the array may be directly deposited on the layers of each underlying level of the array. In example embodiments, the 3D memory array may include VNAND strings that are vertically oriented such that at least one memory cell is located over another memory cell. The at least one memory cell may comprise a charge trap layer.
The following patent documents, which are hereby incorporated by reference in their entirety, describe suitable configurations for three-dimensional memory arrays, in which the three-dimensional memory array is configured as a plurality of levels, which word lines and/or bit lines shared between levels: U.S. Pat. Nos. 7,679,133; 8,553,466; 8,654,587; 8,559,235; and U.S. Patent Application Publication No. 2011/0233648.
As is traditional in the field of inventive concepts, some embodiments (e.g., controllers, source voltage transmission units, hosts, etc.) may be described, and illustrated in the drawings, in terms of functional blocks, units and/or modules. Those skilled in the art will appreciate that these blocks, units and/or modules are physically implemented by electronic (or optical) circuits such as logic circuits, discrete components, microprocessors, hard-wired circuits, memory elements, wiring connections, and the like, which may be formed using semiconductor-based fabrication techniques or other manufacturing technologies. In the case of the blocks, units and/or modules being implemented by microprocessors or similar, they may be programmed using software (e.g., microcode) to perform various functions discussed herein and may optionally be driven by firmware and/or software. Alternatively, each block, unit and/or module may be implemented by dedicated hardware, or as a combination of dedicated hardware to perform some functions and a processor (e.g., one or more programmed microprocessors and associated circuitry) to perform other functions. Also, each block, unit and/or module of the embodiments may be physically separated into two or more interacting and discrete blocks, units and/or modules without departing from the scope of inventive concepts. Further, the blocks, units and/or modules of the embodiments may be physically combined into more complex blocks, units and/or modules without departing from the scope of inventive concepts.
While inventive concepts have been particularly shown and described with reference to example embodiments thereof, it will be understood that various changes in form and details may be made therein without departing from the spirit and scope of the following claims.
Number | Date | Country | Kind |
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10-2016-0110093 | Aug 2016 | KR | national |