Patent Application
20250206941
This disclosure relates to the field of packaging technologies, and in particular, to a resin composition and a preparation method and an disclosure thereof.
An electronic device gradually becomes thinner and smaller, and a display component of the electronic device gradually moves toward a narrower bezel and becomes thinner. Based on this, a COF (Chip on Film) packaging technology emerges. The COF packaging technology is currently one of mainstream packaging manners of a driver chip of a display, allowing a chip to be directly packaged on a flexible substrate and to be moved, through folding, to a position below a display connected to the package. Therefore, the COF packaging technology provides advantages such as high assembly density, high flexibility, a small size, and a light weight, and may enable an electronic device to have a relatively narrow bezel.
An underfill filled in a gap between the bottom of the chip and the flexible substrate is one of key materials in the COF packaging technology. Currently, a commonly used COF underfill is an epoxy resin composition, but the epoxy resin composition usually includes a filler of a large particle size. This is not conducive to filling of a relatively narrow gap, is likely to result in an air hole, and reduces flexibility of a system. In addition, an epoxy resin composition that does not include a filler is usually used with another additive, and large particles also exist in the system. This is not conducive to filling of a relatively narrow gap either.
Therefore, there is a need to provide a COF underfill with few particles and high reliability in filling, for practical use in filling a narrow gap of a COF chip.
In view of this, embodiments of this disclosure provide a resin composition, to resolve a problem that an existing COF underfill is not applicable to narrow-gap filling because particles in the COF underfill are not strictly controlled.
A first aspect of embodiments of this disclosure provides a resin composition, where the resin composition includes epoxy resin, a curing agent, a curing accelerator, and an auxiliary agent, the auxiliary agent includes a colorant and a toughening agent, and a total mass fraction of particles with particle sizes greater than 300 nm in the resin composition is less than or equal to 0.1 wt %.
In the resin composition provided in this disclosure, content of particles with particle sizes greater than 1 μm is relatively low. This helps the composition smoothly fill a relatively narrow gap between a COF chip and a flexible substrate, and can ensure that there are few air holes and particles, to match development of a current highly integrated chip.
In one embodiment, a viscosity of the resin composition at a room temperature ranges from 0.3 Pa·s to 1 Pa·s. The resin composition has a relatively low viscosity at a room temperature. This helps ensure that the resin composition has good fluidity, and can smoothly fill all bottom gaps, thereby improving bonding firmness of the chip on the flexible substrate, and ensuring reliability in a transportation and long-term use process of a packaged chip.
In one embodiment, a total mass fraction of particles with particle sizes between 100 nm and 300 nm in the resin composition is within a range of 0.2%-4%. The existence of an appropriate amount of these small particles helps improve flexibility of a cured product of the resin composition, and improve packaging reliability.
In one embodiment, the resin composition does not include an inorganic filler. This helps the resin composition keep a relatively low viscosity, facilitating narrow-gap filling. In addition, the resin composition is not prone to aggregation of a filler and the like.
In one embodiment, a viscosity increase rate of the resin composition left to stand at the room temperature and a humidity of 45% for 24 hours is less than 200%. This helps ensure that the resin composition has a relatively long operation process time window; and no obvious viscosity increase occurs in an disclosure process of the resin composition.
In one embodiment, a mass percentage of the epoxy resin in the resin composition ranges from 30% to 50%. An appropriate amount of the epoxy resin helps the resin composition have a relatively low viscosity and a wider process window, and ensures that a cured product of the resin composition has an appropriate mechanical strength.
In one embodiment, a mass percentage of the curing agent in the resin composition ranges from 40% to 65%. An appropriate amount of the curing agent helps ensure that the epoxy resin is fully cured and has a suitable curing rate and the like.
In one embodiment, a mass percentage of the curing accelerator in the resin composition ranges from 0.2% to 10%. The existence of an appropriate amount of the curing accelerator may increase a curing rate of the resin composition, and make the resin composition have an appropriate quantity of small particles with particle sizes between 100 nm and 300 nm.
In one embodiment, a mass percentage of the colorant in the resin composition does not exceed 1%, and a mass percentage of the toughening agent in the resin composition does not exceed 15%.
In one embodiment, the colorant includes one or more of carbon black, carbon microspheres, graphene, or an organic dye. These colorants help confirm a dispensing effect of the resin composition.
In one embodiment, the resin composition further includes an ion trapping agent whose mass percentage does not exceed 2%.
A second aspect of embodiments of this disclosure provides a preparation method of a resin composition, including the following operations:
The preparation method of the resin composition is simple and easy to operate, content of a particulate matter of a large particle size in the obtained resin composition is low, a viscosity of the composition is relatively low, and the resin composition is more suitable for narrow-gap filling.
A third aspect of embodiments of this disclosure provides an disclosure of the foregoing resin composition in sealed packaging of an electronic component.
A fourth aspect of embodiments of this disclosure provides a packaging material, used for sealed packaging of an electronic component. The packaging material includes the resin composition according to the first aspect of embodiments of this disclosure and/or a cured product of the resin composition.
A fifth aspect of embodiments of this disclosure provides a cured product. The cured product includes a cured product of the resin composition according to the first aspect of embodiments of this disclosure, or the cured product is obtained by curing a resin composition prepared by using the preparation method according to the second aspect of embodiments of this disclosure. The cured product of the resin composition has a good narrow-gap filling effect, and has few air holes and particle impurities.
A sixth aspect of embodiments of this disclosure provides a package, where the package includes the cured product according to the fifth aspect of embodiments of this disclosure. The package prepared by using the foregoing cured product has relatively high service reliability.
A seventh aspect of embodiments of this disclosure provides a package, where the package includes a substrate and a chip disposed on the substrate, a plurality of solder bumps are provided on a surface that is of the chip and that faces a side of the substrate, an underfill layer is disposed between the solder bumps, and the underfill layer includes the cured product according to the fifth aspect of embodiments of this disclosure. In this case, the package may be a COF packaged chip, and may be applied to a small-sized, light, and thin terminal device, and enable the terminal device to have a narrow bezel.
An eighth aspect of embodiments of this disclosure provides a display, where the display includes a display panel and the package according to the seventh aspect of embodiments of this disclosure connected to the display panel. Using the foregoing package helps to make a bezel of the display relatively narrow and improve quality reliability.
A ninth aspect of embodiments of this disclosure provides a terminal device, where the terminal device includes the package according to the sixth aspect of embodiments of this disclosure or the display according to the eighth aspect of embodiments of this disclosure. By using the foregoing package or display, performance of the terminal device can be improved, and market competitiveness can be improved.
The following describes technical solutions in this disclosure with reference to accompanying drawings in embodiments of this disclosure.
When the electronic component 20 is a chip and the substrate 10 is a flexible printed circuit board (FPC), the package 100 may also be referred to as a “COF packaged chip”, that is, a chip on a flexible substrate. In this case, the chip 20 is directly packaged on the FPC, and is placed in a flat cable of the FPC. When the COF packaged chip is connected to a display panel 201 driven by the COF packaged chip (as shown in
With an increase of chip integration, a height of the solder bump 30 between the chip 20 and the substrate 10 becomes smaller, and the gap filled by the underfill layer 40 becomes narrower accordingly. This requires that a COF underfill should have a relatively low viscosity, a relatively small quantity of particles, and the like, to meet high fluidity and a sufficient process operation time window to ensure that the gap is fully filled. However, because an existing COF underfill usually cannot meet these requirements, it is difficult to actually use the COF underfill to seal a narrow gap whose height is less than 15 μm. In view of this, an embodiment of this disclosure provides a resin composition. The resin composition may be used to form the underfill layer 40 with good quality through coating and curing the resin composition, to fully fill a narrow gap whose height is less than 15 μm.
In an embodiment, the resin composition provided in this embodiment of this disclosure includes epoxy resin, a curing agent, a curing accelerator, and an auxiliary agent. The auxiliary agent includes a colorant and a toughening agent. A total mass fraction of particles with particle sizes greater than 300 nm in the resin composition is less than or equal to 0.1 wt %.
In the resin composition provided in this disclosure, the “particle” comes from a particle component in the resin composition, for example, may come from the auxiliary agent or a combination of the auxiliary agent and the curing accelerator. Content of particles with particle sizes greater than 0.3 μm in the resin composition is controlled to be relatively low. This helps the composition to smoothly fill a relatively narrow gap between the COF chip and the flexible substrate, and can ensure that there are relatively few air holes and particle impurities, to match development of a current highly integrated chip, and fill a narrow gap whose height is less than 15 μm. In addition, the existence of the toughening agent can improve flexibility of a cured product of the resin composition, and ensure high reliability; and the existence of the colorant can deepen a color of the resin composition, improve disclosure convenience of the resin composition, and facilitate observation of an disclosure effect.
In one embodiment, a viscosity of the resin composition at a room temperature ranges from 0.3 Pa·s to 1 Pa·s. The resin composition has a relatively low viscosity at a room temperature. This helps ensure that the resin composition has good fluidity and high filling performance, and facilitates smooth flow to allow the resin composition to enter a relatively narrow gap and fully fill all bottom gaps, thereby improving bonding firmness of the chip on the flexible substrate, and ensuring reliability in a transportation and long-term use process of a packaged chip. In this disclosure, the term “room temperature” may be any temperature of 20° C.-30° C., for example, 20° C., 22° C., 25° C., 28° C., or 30° C., and 25° C. is relatively common.
In this disclosure, the total mass fraction of the particles with the particle sizes greater than 300 nm in the resin composition may be less than or equal to 0.05 wt %, or less than or equal to 0.01 wt %, or even 0 (in this case, the resin composition does not include particles with particle sizes greater than 300 nm). When content of the particles with particle sizes greater than 300 nm is 0, a filling capability of the resin composition is better.
In some implementations of this disclosure, a total mass fraction of particles with particle sizes greater than 0.1 μm in the resin composition is less than or equal to 0.1 wt %. In this case, the total mass fraction of the particles with the particle sizes greater than 0.1 μm in the resin composition may be less than or equal to 0.05 wt %, or less than or equal to 0.02 wt %, or even 0. In this case, the resin composition has a better filling capability, and can seal a narrower gap in the chip, for example, a gap whose height is less than 10 μm or less than 5 μm.
In one embodiment, a total mass fraction of particles with particle sizes between 100 nm and 300 nm in the resin composition is within a range of 0.2%-4%. These small particles come from at least the auxiliary agent that includes the colorant and the toughening agent. The existence of an appropriate amount of these small particles can better improve flexibility of a cured product of the resin composition, and improve packaging reliability.
In this disclosure, the viscosity of the resin composition at the room temperature may be 0.3 Pa·s, 0.4 Pa·s, 0.45 Pa·s, 0.5 Pa·s, 0.6 Pa·s, 0.65 Pa·s, 0.7 Pa·s, 0.8 Pa·s, 0.85 Pa·s, 0.9 Pa·s, or the like. In some implementations, the viscosity of the resin composition at the room temperature ranges from 0.45 Pa·s to 1 Pa·s. In this case, the resin composition has relatively good fluidity, and also helps ensure good adhesion of a cured product of the resin composition on the substrate.
In one embodiment, the resin composition does not include an inorganic filler. The inorganic filler includes silicon dioxide, aluminum oxide, titanium dioxide, boron nitride, aluminum titanide, silicon titanide, aluminum nitride, silicon nitride, and the like, and silicon dioxide is the most common. In a common resin composition, content of an inorganic filler is usually greater than 10%. By contrast, in this disclosure, the resin composition that does not include an inorganic filler has a relatively low viscosity. This is more conducive to narrow-gap filling of the resin composition, the resin composition is not prone to particle aggregation; and the like. In addition, the foregoing resin composition is usually used for a COF underfill, a gap filled by the resin composition is relatively narrow (a height usually does not exceed 15 μm), and a formed underfill layer is usually relatively thin. Even if no inorganic filler is included, the underfill layer is not prone to warping.
In addition, because the resin composition does not include an inorganic filler, in one embodiment, the resin composition may not include a coupling agent. The coupling agent may be a silane coupling agent, a titanate coupling agent, aluminate coupling agent, or the like.
Because the resin composition does not include an inorganic filler, in one embodiment, content of a silicon (Si) element, content of an aluminum (Al) element, content of a titanium (Ti) element, and content of a boron (B) element in the resin composition are relatively low, for example, are all less than 0.05 wt %. In some cases, content of each of these elements may be 0. Content of these elements is extremely low. This helps reduce total ion content in the system, and helps improve packaging reliability of the resin composition.
In one embodiment, the resin composition does not include an organic solvent. In this way, an aftertreatment difficulty caused by addition of a solvent and a problem that bubbles are generated due to solvent volatilization in a curing process of the resin composition can be avoided.
In one embodiment, a viscosity increase rate of the resin composition left to stand at the room temperature and a humidity of 45% for 24 hours is less than 200%. A relatively small viscosity increase rate helps ensure that the resin composition has a relatively long operation process time window, and can keep a relatively low viscosity and high fluidity before all bottom gaps are fully filled, thereby improving bonding firmness of the chip on the flexible substrate. 24 h viscosity increase rate Δη=(viscosity obtained after the resin composition is left to stand for 24 h initial viscosity)/initial viscosity×100%. In some implementations of this disclosure, the viscosity increase rate of the resin composition is less than 100%, for example, less than 90%. It should be noted that, during representation of the viscosity increase rate of the resin composition, a mentioned humidity value may be allowed to fluctuate to a specific extent. For example, a humidity of 45%+5% may also be considered as a humidity of 45%. “Room temperature” may be any temperature of 20° C.-30° C., for example, 22° C., 25° C., or 28° C.
The resin composition in this embodiment of this disclosure is cured when being heated. To be specific, a chemical reaction between the epoxy resin and the curing agent may occur to form a three-dimensional network polymer. The curing accelerator can promote/increase a curing reaction speed of the resin composition at a specific temperature. The resin composition is transformed into a cured product in a specific shape after being cured. In one embodiment, a mass percentage of the epoxy resin in the resin composition ranges from 30% to 50%. In one embodiment, a mass percentage of the curing agent in the resin composition ranges from 40% to 65%. An appropriate amount of the epoxy resin helps the resin composition have a relatively low viscosity and a wider process window, and ensures that a cured product of the resin composition has an appropriate mechanical strength. An appropriate amount of the curing agent helps ensure that the epoxy resin is fully cured and has a suitable curing rate and the like.
In an embodiment, the mass percentage of the epoxy resin in the resin composition may be 32%, 35%, 40%, 43%, 45%, 48%, 50%, or the like. The mass percentage of the curing agent in the resin composition may be 42%, 45%, 50%, 55%, 58%, 59%, 60%, 62%, 63%, 65%, or the like. In some implementations, the mass percentage of the epoxy resin in the resin composition ranges from 40% to 50%, and may further range from 42% to 50%. The mass percentage of the curing agent in the resin composition ranges from 54% to 65%, and may further range from 54% to 57% or from 59% to 65%.
In this disclosure, the epoxy resin may include one or more of bisphenol-type epoxy resin (for example, bisphenol-A epoxy resin or bisphenol-F epoxy resin), aliphatic epoxy resin, silicon-containing epoxy resin, aromatic epoxy resin (for example, naphthalene epoxy resin, aminophenol epoxy resin, or biphenyl epoxy resin), and the like. The naphthalene epoxy resin and the aminophenol epoxy resin help make the cured product of the resin composition have a relatively high glass transition temperature, to reduce a risk of softening the cured product at a high temperature; and the aliphatic epoxy resin helps make the resin composition have a relatively low viscosity.
These types of epoxy resin may be in a liquid state or a solid state at a room temperature, but the epoxy resin in the resin composition includes at least one type of epoxy resin that is in a liquid state at a room temperature (for example, 25° C.), to make the resin composition have a relatively low viscosity at the room temperature. If the epoxy resin includes epoxy resin that is in a liquid state at the room temperature and epoxy resin that is in a solid state at the room temperature, during preparation of the resin composition, the epoxy resin in a solid state needs to be dissolved in liquid resin first, and then mixed with another component. The existence of the epoxy resin that is in a solid state at the room temperature is conducive to increasing a glass transition temperature of the cured product of the resin composition.
In some implementations of this disclosure, the curing agent is an anhydride curing agent. This type of curing agent is easier to make the resin composition have a relatively low viscosity and a relatively short curing time, and is more suitable for a COF underfill system. The resin composition in this case includes epoxy resin, an anhydride curing agent, and an auxiliary agent. In one embodiment, the anhydride curing agent may include one or more of methylhexahydrophthalic anhydride, methyltetrahydrophthalic anhydride, methyl nadic anhydride, hydrogenated methyl nadic anhydride, dodecenyl succinic anhydride, and terpenic anhydride, and the like, but no limitation is set thereto. Methylhexahydrophthalic anhydride helps make the resin composition have a low viscosity and high curing reaction performance; methyl nadic anhydride enables the cured product of the resin composition to have a relatively high glass transition temperature; and dodecenyl succinic anhydride and terpenic anhydride help make the cured product of the resin composition have good flexibility.
In this disclosure, the curing accelerator is also referred to as a curing catalyst, and can increase a curing reaction speed of the resin composition at a specific temperature. In some implementations of this disclosure, the curing accelerator includes an imidazole accelerator. The imidazole accelerator may be selected from one or more of imidazole, dimethylimidazole, 4,5-dihydroxymethyl-2-phenylimidazole, 2-ethyl-4-methylimidazole, 2,4-diamino-6-[2-(2-methyl-1-imidazolyl)ethyl]-1,3,5-triazine, 2-undecylimidazole, 1-cyanoethyl-2-ethyl-4-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 1-benzyl-2-methylimidazole, 1-phenyl dimethylimidazole, and the like. The imidazole curing accelerator may be powder or liquid at a room temperature.
In one embodiment, a mass percentage of the curing accelerator in the resin composition does not exceed 10%, to avoid a case in which film flatness of the underfill layer is affected because a curing rate of the resin composition is excessively high due to excessively high content of the curing accelerator. In some implementations, the mass percentage of the curing accelerator in the resin composition ranges from 0.2% to 10%. For example, the mass percentage is 0.3%, 0.5%, 1%, 2%, 5%, or 8%. In some other implementations, the mass percentage of the curing accelerator in the resin composition ranges from 0.2% to 2.5%.
In some implementations of this disclosure, the resin composition includes components of the following mass percentages: the epoxy resin 42%-50%, the curing agent 55%-65%, the curing accelerator 0.2%-2.5%, and an auxiliary agent. In this case, the viscosity of the resin composition at the room temperature may be within a range from 0.45 Pa·s to 1 Pa·s, and the resin composition has relatively good fluidity and narrow-gap filling performance. In addition, a cured product of the resin composition has relatively good adhesion.
In this disclosure, the auxiliary agent includes a colorant and a toughening agent, and in some cases, the auxiliary agent further includes an ion trapping agent. It may be understood that a type of the auxiliary agent may not be limited thereto.
The colorant is mainly used to give a specific color to the resin composition, for example, to deepen the color of the composition, so that during dispensing of the resin composition, it can be determined, based on a color difference, whether a glue shape and a dispensing amount meet requirements. For example, the colorant may include one or more of carbon black, carbon microspheres, graphene, an organic dye, and the like. In one embodiment, a mass percentage of the colorant in the resin composition does not exceed 1%, for example, 0.01%, 0.05%, 0.1%, 0.2%, 0.5%, 0.8%, or 1%. In some implementations, the mass percentage of the colorant in the resin composition ranges from 0.1% to 2%.
The toughening agent may be used to improve flexibility of a cured product of the resin composition, so that the cured product does not break when the packaged chip is bent, thereby ensuring high reliability. In one embodiment, the toughening agent may include rubber, an aliphatic compound, and the like. The toughening agent may exist in a granular shape or in a long strip shape. For example, in some implementations, the toughening agent may include rubber particles, long-chain aliphatic compound particles, and the like. In one embodiment, a mass percentage of the toughening agent in the resin composition does not exceed 15%, for example, 0.1%, 0.5%, 1%, 2%, 5%, 8%, 10%, 12%, or 15%. In some implementations, the mass percentage of the toughening agent in the resin composition is 1%-5%.
The ion trapping agent may be used to trap ions in the resin composition, for example, halogen ions, to prevent metal migration caused because the solder bump 30 of the chip 20 is corroded by the halogen ions, and ensure high reliability in a case of a narrow gap. The ion trapping agent may include an organic ion trapping agent and/or an inorganic ion trapping agent. Generally, the inorganic ion trapping agent has a better ion trapping capability. For example, the inorganic ion trapping agent may include one or more of zirconium hydrophosphate, magnesium aluminum salt hydrate, and the like. In one embodiment, a mass percentage of the ion trapping agent in the resin composition does not exceed 2%, for example, is 0, 0.1%, 0.2%, 0.5%, 0.8%, 1%, 1.5%, or 2%. In some implementations, the mass percentage of the ion trapping agent in the resin composition ranges from 0.2% to 2%.
In this disclosure, an appropriate ratio of the epoxy resin, the curing agent, the curing accelerator, the auxiliary agent, and the like helps ensure that the resin composition has a relatively low viscosity. It should be noted that, because the resin composition includes the auxiliary agent, total content of all auxiliaries should not be 0. In some cases, content of the ion trapping agent may be 0.
In one embodiment, the resin composition is black. The black resin composition is more conducive to visually distinguishing the resin composition from the substrate 10, the solder bump 30, and the like, and is more convenient to determine, during dispensing, whether a glue shape and a dispensing amount of the resin composition meet requirements. The color of the resin composition may be brought by an additive contained therein, especially the colorant.
An embodiment of this disclosure further provides a preparation method of a resin composition, including the following operations:
In the foregoing preparation method of the resin composition, the auxiliary agent and the curing accelerator that may include a particulate matter are first dispersed in the epoxy resin, where the epoxy resin may be used as a dispersion medium to implement uniform dispersion and particle size reduction of the auxiliary agent in the epoxy resin; and then the epoxy resin is mixed with another component (such as the curing agent) that does not include a particulate matter. In this way, it can be ensured that content of particles of a large particle size in the obtained resin composition is extremely low, and the resin composition is more suitable for narrow-gap filling. Dispersion treatment may be performed at a room temperature or at an appropriate high-temperature (for example, not higher than 120° C.). In one embodiment, dispersion treatment of the auxiliary agent and the curing accelerator in the epoxy resin may be performed in a ball mill, a grinding machine (for example, a three-roll grinding machine), a sand mill, a mechanical fusion machine, a mechanical mixing apparatus, a shearing device, and the like. In other words, dispersion treatment includes but is not limited to ball milling, grinding, sand milling, mechanical fusion, mechanical mixing, shearing, and the like.
In some implementations of this disclosure, a total mass fraction of particles with particle sizes greater than 0.3 μm in the resin composition is 0. In this case, the resin composition has a better packaging effect on a narrow-gap chip. Further, a total mass fraction of particles with particle sizes greater than 0.1 μm in the resin composition is less than or equal to 0.1 wt %, or even 0.
The preparation method of the resin composition is simple and easy to operate, content of a particulate matter of a large particle size in the obtained resin composition is low, a viscosity of the composition is relatively low, and the resin composition is more suitable for narrow-gap filling.
An embodiment of this disclosure further provides a cured product. The cured product is obtained by curing the resin composition described above in this disclosure, or is obtained by curing a resin composition prepared by using the preparation method described above in this disclosure. In other words, the cured product includes a cured product of the foregoing resin composition. The cured product is well distributed in a narrow gap, and has a relatively small quantity of air holes and few particle impurities.
An embodiment of this disclosure further provides an disclosure of the foregoing resin composition in sealed packaging of an electronic component.
In an embodiment, an embodiment of this disclosure provides a packaging material, where the packaging material includes the resin composition in embodiments of this disclosure and/or a cured product of the resin composition. The packaging material may be used for sealed packaging of an electronic component.
An embodiment of this disclosure further provides a package, where the package includes the cured product in embodiments of this disclosure. The package is packaged by using the resin composition provided in embodiments of this disclosure, and has high reliability.
In an embodiment, refer to
The substrate 10 is usually an FPC, and the FPC generally includes a base film 101, a metal foil 102, and an ink layer 103 that are disposed in a laminated manner. In a typical FPC, a base film 101 may be a polyimide (PI) film, and a metal foil 102 may be a copper foil. Generally, an ink layer 103 does not completely cover the metal foil 102, and generally, the ink layer 103 is not covered on a part that is of the FPC and that is to be connected to the chip 20. The solder bump 30 of the chip 20 may be bonded with an inner pin on the FPC through thermal compression bonding, to obtain the package.
When the substrate 10 of the package is a flexible FPC, the package also correspondingly has specific flexibility. The package may also be referred to as a “COF packaged chip”, and it helps enable an electronic device to have a narrow bezel and a good display effect.
An embodiment of this disclosure further provides a display. As shown in
When the display panel 201 and the package 100 are assembled into a display, the package 100 may be bent (for example, folded along a dashed line in
The chip 20 in the package 100 may drive the display panel 201 to be “lighted up”. The display panel 201 may be a liquid crystal display (LCD), an organic light-emitting diode (OLED) display, a light-emitting diode (LED) display, or another type of displayable component, including but not limited to a notch screen, a water drop screen, a bezel-less screen, a curved surface screen, or the like. In addition, the display 200 may further include a cover (not shown in the figure) covering the display panel 201.
An embodiment of this disclosure further provides an electronic device, where the electronic device includes the package or the display in embodiments of this disclosure.
In some implementations, the electronic device may be a terminal product such as a mobile phone, a tablet computer, a notebook computer, a television, a DVD player, a video recorder, a wearable device (for example, a smartwatch or a smart band), a portable computer, a microphone, or an in-vehicle device. In some embodiments, the electronic device may further include a housing to accommodate the package 100 or the display 200. In some other implementations, the electronic device may alternatively be various wired or wireless communications devices such as a lightning arrester, an antenna, a gateway, a remote control, a radar, an intercom, a switch, and a router, or a communications base station.
In this disclosure, “and/or” describes an association relationship between associated objects, and indicates that three relationships may exist. For example, A and/or B may indicate that: only A exists, both A and B exist, and only B exists, where A and B may be singular or plural. In this disclosure, “at least one” means one or more, and “a plurality of” means two or more. When content of a substance mentioned in this disclosure does not exceed a value, for example, does not exceed 10%, it means “less than or equal to 10%”.
The following further describes the technical solutions in embodiments of this disclosure by using a plurality of embodiments.
Preparation of a resin composition: Each raw material is weighed according to a formula in Table 1. In an embodiment, 40 weight parts of epoxy resin (including 15 weight parts of aminophenol epoxy resin, 10 weight parts of naphthalene epoxy resin, and 15 weight parts of bisphenol-F epoxy resin) and 0.5 weight part of curing accelerator (which is modified imidazole that is in a liquid state at a normal temperature, and is abbreviated as a substance a), 0.5 weight part of ion trapping agent (which is zirconium hydrophosphate), 0.5 weight part of toughening agent (which is rubber particles), and 0.1 weight part of colorant (which is carbon black) are first mixed and then dispersed in a sand mill for 5 hours, then 59 weight parts of curing agent (including 29 weight parts of methylhexahydrophthalic anhydride, 10 weight parts of terpenic anhydride, 10 weight parts of dodecenyl succinic anhydride, and 10 weight parts of methyl nadic anhydride) are added and mixed evenly to obtain the resin composition. A color of the resin composition in Embodiment 1 is black.
Specific components and content of resin compositions in Embodiment 2 to Embodiment 9, a comparative example 1, and a comparative example 2 are listed in Table 1. For a preparation process thereof, refer to Embodiment 1. In Table 1, a substance b represents an imidazole curing accelerator that is solid powder at a room temperature.
A difference between the resin composition and preparation thereof in the comparative example 1 and the resin composition and preparation thereof in Embodiment 5 lies in that: The epoxy resin, the curing agent, the curing accelerator, the ion trapping agent, the colorant, and the toughening agent are directly mixed, and grinding treatment is not first performed on the epoxy resin and an auxiliary agent such as the curing accelerator and the ion trapping agent.
The resin composition in the comparative example 2 includes only the epoxy resin, the curing agent, and the curing accelerator, and the curing accelerator is the substance a that is in a liquid state at a normal temperature, and the resin composition does not include an auxiliary agent such as the toughening agent, the colorant, or the ion trapping agent. During preparation of the resin composition in the comparative example 2, the epoxy resin, the curing agent, and the curing accelerator are directly mixed.
Evaluation of the resin compositions in embodiments and the comparative examples is as follows:
(1) A viscosity of each resin composition is measured by using a rheometer at a room temperature (25° C.), at a shear rate of 5 reciprocal seconds.
(2) Viscosity measurement is performed on each resin composition after the resin composition is left to stand at the room temperature (25° C.) and a humidity of 45% for 24 hours, to obtain a 24 h viscosity increase rate. 24 h viscosity increase rate=(viscosity after 24 h−initial viscosity)/initial viscosity×100%.
(3) Content of particles with particle sizes greater than 300 nm: Each resin composition is filtered by using a nylon filter membrane with a pore size of 300 nm. Then the filter membrane is rinsed with a solvent, a filtered product is dried, and a mass of a dry substance remaining on a surface of the filter membrane is weighed. A proportion of the mass of the dry substance to a mass of the resin composition measured before filtering is used as a mass percentage of particles with particle sizes greater than 300 nm.
In addition, content of particles with particle sizes between 100 nm and 300 nm: After each resin composition is filtered by using the nylon filter membrane with the pore size of 300 nm, secondary filtration is performed on obtained filtrate by using a nylon filter membrane with a pore size of 100 nm, a substance remaining on the filter membrane with a pore size of 100 nm is rinsed with propane, and a dried remaining substance is weighed. A proportion of a mass of the dried substance to the mass of the resin composition measured before filtering is used as a mass percentage of particles with particle sizes between 100 nm and 300 nm.
(4) Verification of a narrow-gap filling performance: Three types of driver chips (with 45 chips per type) with a size of 15 mm×1 mm are customized, and solder bump heights of the driver chips are 15 μm, 10 μm, and 5 μm. Each resin composition is applied to gaps between bumps through dispensing by using a dispenser. A dispensing amount for each chip is 4 mg of each resin composition. After dispensing is completed, the resin compositions are cured at 130° C. for 2 h. Then, cured products are observed for air holes by using a 200× microscope, and the cured products are observed for particle impurities by using a 500× microscope. In a single chip, if a quantity of particle impurities or a quantity of air holes is less than 1, narrow-gap filling performance is excellent; if a quantity of particle impurities or a quantity of air holes is within 1 to 3, narrow-gap filling performance is qualified; or if a quantity of particle impurities or a quantity of air holes is greater than 3, narrow-gap filling performance is poor.
(5) Verification of a peeling force test: A 90-degree peeling force test is performed on a chip in (4) on which dispensing and curing have been performed and whose solder bump height is 15 μm by using a pulling force tester. If a peeling force is less than 300 gf, a test result is poor; if a peeling force is within 300 gf to 400 gf, a test result is qualified; or if a peeling force is greater than 400 gf, a test result is excellent.
(6) High-pressure accelerated aging test: 45 chips in (4) on which dispensing has been performed and whose bump heights are 15 μm are placed at a temperature of 130° C., a humidity of 85%, and a pressure of 2 atmospheres for 96 hours. Then, a test on circuit continuity is performed for the chips. If no chip has poor circuit continuity, a test result is marked as qualified; or if one or more chips have poor circuit continuity, a test result is marked as unqualified.
(7) Temperature and humidity test: The 45 chips in (4) on which dispensing has been performed and whose bump heights are 15 μm are placed at a temperature of 85° C. and a humidity of 85% for 1000 hours. Then, a test on circuit continuity is performed for the chips. If no chip has poor circuit continuity, a test result is marked as qualified; or if one or more chips have poor circuit continuity, a test result is marked as unqualified.
Table 2 below summarizes evaluation results of the resin compositions in embodiments and the comparative examples.
By comparing Embodiment 5 and the comparative example 1 in which a same epoxy resin system, a same curing agent system, and a same auxiliary agent system are used, it can be learned from Table 2 that, content of particles with particle sizes greater than 300 nm in the resin composition in Embodiment 5 of this disclosure is lower than that in the comparative example 1. The resin composition shows an obvious advantage in performance of filling a narrow gap in a chip, especially in filling a narrower gap with a height of 10 μm or 5 μm; and the resin composition in Embodiment 5 shows a better narrow-gap filling capability, and has no air hole or visible particle impurity. In addition, by comparing the comparative example 2 and Embodiment 1 to Embodiment 6 in this disclosure in which a same epoxy resin system is used but no auxiliary agent is used, although content of particles with particle sizes greater than 300 nm in the resin composition in the comparative example 2 is also relatively low, the resin composition does not include an auxiliary agent or a particle-like curing accelerator raw material, and content of particles of a small particle size in the system is almost considered as 0. In this case, in reliability test methods such as a peeling force test and a high-pressure accelerated aging test, test results of a cured product of the resin composition in the comparative example 2 are obviously inferior to those in Embodiment 1 to Embodiment 6 in this disclosure.
In addition, it can be learned by comparing Embodiment 7 to Embodiment 9 with Embodiment 6 that, when composition of the epoxy resin changes, the resin composition in embodiments of this disclosure may also show a relatively low viscosity and relatively low content of particles of a large particle size, thereby showing a relatively good narrow-gap filling capability, and a cured product shows a strong peeling force and good quality reliability.
| Number | Date | Country | Kind |
|---|---|---|---|
| 202211120011.4 | Sep 2022 | CN | national |
This application is a continuation of International Application No. PCT/CN2023/118146, filed on Sep. 12, 2023, which claims priority to Chinese Patent Application No. 202211120011.4, filed on Sep. 15, 2022. The disclosures of the aforementioned applications are hereby incorporated by reference in their entireties.
| Number | Date | Country | |
|---|---|---|---|
| Parent | PCT/CN2023/118146 | Sep 2023 | WO |
| Child | 19079256 | US |
