1. Technical Field of the Invention
The present invention relates to the field of the integrated circuit, more particularly to mask-programmed read-only memory (mask-ROM).
2. Prior Arts
With the advent of three-dimensional mask-programmed read-only memory (3D-MPROM), the storage capacity of the mask-ROM greatly improves. U.S. Pat. No. 5,835,396 discloses a 3D-MPROM. It is a monolithic semiconductor memory. As illustrated in
3D-MPROM is a diode-based cross-point memory. Each memory cell (e.g. 5aa) typically comprises a diode 3d. The diode can be broadly interpreted as any device whose electrical resistance at the read voltage is lower than that when the applied voltage has a magnitude smaller than or polarity opposite to that of the read voltage. The memory level 10A further comprises a data-coding layer 6A, i.e. a blocking dielectric 3b. It blocks the current flow between the upper and lower address lines. Absence or existence of a data-opening 6ca in the blocking dielectric 3b indicates the state of a memory cell. Besides the blocking dielectric 3b, the data-coding layer 6A could also comprise a resistive layer (referring to U.S. patent application Ser. No. 12/785,621) or an extra-dopant layer (referring to U.S. Pat. No. 7,821,080).
Inevitably, a manufactured mask-ROM contains faulty memory cells. In prior arts, a mask-ROM is factory-repaired, i.e. the data in the mask-ROM (i.e. the mask-ROM data) are checked and repaired in the factory. As illustrated in
Factory-repair requires reading out all data in a mask-ROM. In the past, this is not difficult for the conventional mask-ROM, which stores a limited amount of data. However, this is very difficult for a large-capacity mask-ROM, more particularly for a 3D-MPROM. By way of example, it takes almost half a week to read out all data from a 3D-MPROM, which could store ˜1 TByte data but has a slow read speed of ˜3 MByte/s. In other words, its testing time will be almost half a week. Such a long testing time makes the factory-repair expensive for the large-capacity mask-ROM, more particularly for the 3D-MPROM.
It is a principle object of the present invention to provide a large-capacity mask-ROM, more particularly a 3D-MPROM, with a lower testing cost.
It is a further object of the present invention to provide a method to reduce the testing time and testing cost for a large-capacity mask-ROM, more particularly a 3D-MPROM.
In accordance with these and other objects of the present invention, self-repair system and method are disclosed.
The present invention discloses self-repair system and method for a large-capacity mask-ROM, more particularly for a 3D-MPROM. The self-repair system comprises a playback device (e.g. cellular phone, internet TV, or computer) and a memory card containing 3D-MPROM (i.e. a 3D-MPROM card). Most of the 3D-MPROM data are not checked in the factory, but checked and repaired in the field, i.e. during the use of the playback device. A feature that distinguishes the present invention from prior arts is that the 3D-MPROM data are checked and repaired by a playback device, not by a tester. The playback device, which is a consumer device, is not on a par in price and complexity with a tester, which is an industrial equipment.
Self-repair takes advantage of an RWM (e.g. flash memory) that is part of the playback device and whose data can be erased and re-written. It also takes advantage of hybrid content-distribution. Hybrid content-distribution uses two types of memory to distribute contents: RWM and 3D-MPROM. During a publication period, new contents are transferred from a remote server to the playback device and saved into the RWM. At the end of the publication period, a user receives a 3D-MPROM card, which stores a collection of the transferred contents. An error-detecting means checks the data as they are read out from the 3D-MPROM. At this step, the RWM data are used as the correct version of the 3D-MPROM data. When bad data are detected, the good data to replace the bad data are fetched from the RWM and saved into a redundancy ROM. Self-repair can significantly reduce the testing time and lower the testing cost.
It should be noted that all the drawings are schematic and not drawn to scale. Relative dimensions and proportions of parts of the device structures in the figures have been shown exaggerated or reduced in size for the sake of clarity and convenience in the drawings. The same reference symbols are generally used to refer to corresponding or similar features in the different embodiments.
Those of ordinary skills in the art will realize that the following description of the present invention is illustrative only and is not intended to be in any way limiting. Other embodiments of the invention will readily suggest themselves to such skilled persons from an examination of the within disclosure.
The present invention uses 3D-MPROM as an example to explain the concept of self-repair. The preferred embodiments disclosed herein can be extended to any large-capacity mask-ROM. A large-capacity mask-ROM has a storage capacity on the order of GB, even on the order of TB. In the present invention, the primary data-recording means for a mask-ROM includes photo-lithography and imprint-lithography. The “mask” in the mask-ROM includes data-mask used in photo-lithography, as well as nano-imprint mold or nano-imprint template used in imprint-lithography.
Referring now to
The playback device 30, more generally, a consumer processing apparatus, can read and process data from the memory card 20, e.g. playing a movie or video game, reading a map, listening to music, reading books, or running software. The playback device 30 communicates with a remote server 100 through a communication channel 50. The remote server 100 stores a mass-content library. The communication channel 50 includes internet, WiFi and cellular (e.g. 3G, 4G) signals.
At the end of PERIOD 1, a first set of contents S1 (=C1+C2+ . . . +Cn) is accumulated in the RWM 48. At time T1, a user receives a first memory card M1 (step 76), which permanently stores the first set of contents S1. Note that, in order to reduce the testing cost, most of the 3D-MPROM data are not checked in the factory! Then a self-repair step is carried out to check and repair the 3D-MPROM data (step 80). The details of this self-repair step will be disclosed in
In the above description, the self-repair step 80 is carried out in the field where the playback device 30 is used. After the memory card 20 is inserted into the playback device 30, the 3D-MPROM data are checked and repaired in one of the following situations: 1) when the playback device 30 is idle (i.e. idle repair); 2) when the memory card 20 is in use, more particularly during its 1st use (i.e. 1st-use repair). Generally speaking, after it is repaired, the memory card 20 no longer needs to be repaired again. It can be directly used in other playback devices, e.g. the one that does not have internet access.
The 3D-MPROM 10 stores the content data. The 3D-MPROM data should use a coding scheme that facilitates error-detection. In the present invention, this coding scheme is referred to as error-detection code. Preferably, this error-detection code can be used to correct errors. Overall, the error-detection code should be stronger in error detection than error correction. Its examples include Reed-Solomon code, Golay code, BCH code, multi-dimensional parity code, Hamming code, and convolutional code.
The ROM 28 functions as a redundancy memory for the 3D-MPROM 10. It stores the addresses of the bad data from the 3D-MPROM 10 and the associated good data. The ROM 28 could be a non-volatile memory that can be programmed at least once, e.g. a one-time-programmable memory (OTP), an EPROM memory, an EEPROM memory, or a flash memory. The redundancy ROM 28 is preferably located in a same memory card 20 as the 3D-MPROM 10. This way, the repaired memory card 20 can be used by other playback devices (including those without internet access). To read a repaired memory card 20, address 41 is first compared with those stored in the redundancy ROM 28. If there is a match, the data 49 from the ROM 28, instead of the data 43 from the 3D-MPROM 10, are read out. This is indicated by the dash lines of
The error-detecting means 32 detects errors in the data 43 from the 3D-MPROM 10. Preferably it can also correct error(s). This error-detecting means 32 should use an error-detecting algorithm suitable for the coding scheme used by the 3D-MPROM data. The error-detecting means 32 can be located either in the memory card 20 or in the playback device 30.
The RWM 48 is part of the playback device 30 and it stores the contents transferred from the remote server 100 during each publication period. To make room for the contents to be released in the next publication period, the contents common to the 3D-MPROM 10 and the RWM 48 are deleted from the RWM 48 after each publication period. The RWM 48 is a non-volatile re-writable memory, e.g. a flash memory.
The communicating means 36 is part of the playback device 30. During a publication period, it incrementally transfers new contents from the remote server 100 to the RWM 48. The communicating means 36 includes internet, WiFi and cellular communication means.
The memory card 20 could comprise a memory package or a memory module.
While illustrative embodiments have been shown and described, it would be apparent to those skilled in the art that may more modifications than that have been mentioned above are possible without departing from the inventive concepts set forth therein. Besides 3D-MPROM, the self-repair system and method can be applied to other mask-ROM. The invention, therefore, is not to be limited except in the spirit of the appended claims.
This application relates to a provisional application, “Self-Repair System and Method for Three-Dimensional Printed Memory”, Application Ser. No. 61/529,926, filed Sep. 1, 2011.
Number | Date | Country | |
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61529926 | Sep 2011 | US |