for read only memories

Industry

CPC
G11C29/822

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/822for read only memories

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Testing read-only memory using memory built-in self-test controller
- Patent number 11,521,698
- Issue date Dec 6, 2022
- Texas Instruments Incorporated
- Prakash Narayanan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing read-only memory using memory built-in self-test controller
- Patent number 10,818,374
- Issue date Oct 27, 2020
- Texas Instruments Incorporated
- Prakash Narayanan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
E-fuse circuit
- Patent number 10,366,773
- Issue date Jul 30, 2019
- SK hynix Inc.
- Hyeong Soo Jeong
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for detecting time dependent dielectric breakdow...
- Patent number 10,163,526
- Issue date Dec 25, 2018
- GLOBALFOUNDRIES Inc.
- John A. Fifield
- G11 - INFORMATION STORAGE
Information Patent Grant
Read only memory (ROM) with redundancy
- Patent number 9,460,811
- Issue date Oct 4, 2016
- GLOBALFOUNDRIES Inc.
- George M. Braceras
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for rebalancing data stored in flash memory devices
- Patent number 9,442,670
- Issue date Sep 13, 2016
- SanDisk Technologies LLC
- Warren Fritz Kruger
- G11 - INFORMATION STORAGE
Information Patent Grant
Flash memory apparatus, memory controller and method for controllin...
- Patent number 9,348,692
- Issue date May 24, 2016
- Asolid Technology Co., Ltd.
- Chia-Ching Chu
- G11 - INFORMATION STORAGE
Information Patent Grant
Solving MLC NAND paired page program using reduced spatial redundancy
- Patent number 9,305,655
- Issue date Apr 5, 2016
- Virtium Technology, Inc.
- Lan Dinh Phan
- G11 - INFORMATION STORAGE
Information Patent Grant
Fault masking method for non-volatile memories
- Patent number 8,929,166
- Issue date Jan 6, 2015
- National Taiwan University of Science and Technology
- Shyue-Kung Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Read only memory (ROM) with redundancy
- Patent number 8,839,054
- Issue date Sep 16, 2014
- International Business Machines Corporation
- George M. Braceras
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus, embedded memory, address decoder, method of reading out...
- Patent number 7,672,150
- Issue date Mar 2, 2010
- Infineon Technologies AG
- David A. Sellar
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for patching for program ROM
- Patent number 7,644,223
- Issue date Jan 5, 2010
- VIA Telecom Co., Ltd.
- Alon Saado
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
ROM redundancy in ROM embedded DRAM
- Patent number 7,366,946
- Issue date Apr 29, 2008
- Micron Technology, Inc.
- Scott Derner
- G11 - INFORMATION STORAGE
Information Patent Grant
Three-dimensional-memory-based self-test integrated circuits and me...
- Patent number 7,304,355
- Issue date Dec 4, 2007
- Guobiao Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
ROM redundancy in ROM embedded DRAM
- Patent number 7,174,477
- Issue date Feb 6, 2007
- Micron Technology, Inc.
- Scott Derner
- G11 - INFORMATION STORAGE
Information Patent Grant
Self-testing printed circuit board comprising electrically programm...
- Patent number 7,126,196
- Issue date Oct 24, 2006
- Guobiao Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Mask programmable read-only memory based on nF-opening mask
- Patent number 6,903,427
- Issue date Jun 7, 2005
- Guobiao Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
ROM memory device having repair function for defective cell and met...
- Patent number 6,882,585
- Issue date Apr 19, 2005
- Samsung Electronics Co., Ltd.
- Kwang-Lae Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for managing data stored primarily in a read-only memory
- Patent number 6,874,073
- Issue date Mar 29, 2005
- Infineon Technologies AG
- Peter Mahrla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrically programmable three-dimensional memory-based self test
- Patent number 6,812,488
- Issue date Nov 2, 2004
- Guobiao Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Three-dimensional memory
- Patent number 6,717,222
- Issue date Apr 6, 2004
- Guobiao Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable semiconductor memory device
- Patent number 6,262,924
- Issue date Jul 17, 2001
- Fujitsu Limited
- Yutaka Fukutani
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory redundancy circuit using single polysilicon floating gate tr...
- Patent number 6,031,771
- Issue date Feb 29, 2000
- Macronix International Co., Ltd.
- Tom D. Yiu
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable semiconductor memory device
- Patent number 6,026,052
- Issue date Feb 15, 2000
- Fujitsu Limited
- Yutaka Fukutani
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 5,963,488
- Issue date Oct 5, 1999
- Sharp Kabushiki Kaisha
- Koji Inoue
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable semiconductor memory device
- Patent number 5,831,933
- Issue date Nov 3, 1998
- Fujitsu Limited
- Yutaka Fukutani
- G11 - INFORMATION STORAGE
Information Patent Grant
Replacement semiconductor read-only memory
- Patent number 5,764,575
- Issue date Jun 9, 1998
- Sharp Kabushiki Kaisha
- Tomoyuki Kawai
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable semiconductor memory device
- Patent number 5,661,694
- Issue date Aug 26, 1997
- Fujitsu Limited
- Yutaka Fukutani
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor read only memory
- Patent number 5,452,258
- Issue date Sep 19, 1995
- Sharp Kabushiki Kaisha
- Yasuhiro Hotta
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit for repairing defective read only memories with redundant N...
- Patent number 5,434,814
- Issue date Jul 18, 1995
- Samsung Electronics Co., Ltd.
- Sung-Hee Cho
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TESTING READ-ONLY MEMORY USING MEMORY BUILT-IN SELF-TEST CONTROLLER
- Publication number 20200388346
- Publication date Dec 10, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Prakash NARAYANAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Field-Repair System and Method for Large-Capacity Mask-Programmed R...
- Publication number 20150269034
- Publication date Sep 24, 2015
- Guobiao ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIP TESTER AND TEST METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20140369144
- Publication date Dec 18, 2014
- SK HYNIX INC.
- Kyoung Beom KIM
- G11 - INFORMATION STORAGE
Information Patent Application
EMBEDDED MEMORY DEVICE AND MEMORY CONTROLLER INCLUDING THE SAME
- Publication number 20140369137
- Publication date Dec 18, 2014
- Samsung Electronics Co., Ltd.
- Younggeun LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Field-Repair System and Method
- Publication number 20140359401
- Publication date Dec 4, 2014
- HANGZHOU HAICUN INFORMATION TECHNOLOGY CO. LTD.
- Guobiao ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
READ ONLY MEMORY (ROM) WITH REDUNDANCY
- Publication number 20140351662
- Publication date Nov 27, 2014
- George M. BRACERAS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Fault Masking Method for Non-Volatile Memories
- Publication number 20140198592
- Publication date Jul 17, 2014
- SHYUE-KUNG LU
- G11 - INFORMATION STORAGE
Information Patent Application
READ ONLY MEMORY (ROM) WITH REDUNDANCY
- Publication number 20130275821
- Publication date Oct 17, 2013
- International Business Machines Corporation
- George M. BRACERAS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BURNING SYSTEM AND METHOD
- Publication number 20130238835
- Publication date Sep 12, 2013
- HON HAI Precision Industry CO., LTD.
- HUA-LIN LIU
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY ACCESS CONTROL DEVICE AND MANUFACTURING METHOD
- Publication number 20130121093
- Publication date May 16, 2013
- Takashi Morimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Field-Repair System and Method
- Publication number 20130061100
- Publication date Mar 7, 2013
- CHENGDU HAICUN IP TECHNOLOGY LLC
- Guobiao ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Self-Repair System and Method
- Publication number 20130061108
- Publication date Mar 7, 2013
- CHENGDU HAICUN IP TECHNOLOGY LLC
- Guobiao ZHANG
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS, EMBEDDED MEMORY, ADDRESS DECODER, METHOD OF READING OUT...
- Publication number 20090086526
- Publication date Apr 2, 2009
- INFINEON TECHNOLOGIES AG
- David A. Sellar
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit and method for patching for program ROM
- Publication number 20080112205
- Publication date May 15, 2008
- VIA TELECOM CO., LTD.
- Alon Saado
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY SYSTEM
- Publication number 20080013375
- Publication date Jan 17, 2008
- Keiichiro ENDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ROM redundancy in ROM embedded DRAM
- Publication number 20070168783
- Publication date Jul 19, 2007
- Micron Technology, Inc.
- Scott Derner
- G11 - INFORMATION STORAGE
Information Patent Application
Self-testing printed circuit board comprising electrically programm...
- Publication number 20040262731
- Publication date Dec 30, 2004
- Guobiao Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
Three-dimensional-memory-based self-test integrated circuits and me...
- Publication number 20040155301
- Publication date Aug 12, 2004
- Guobiao Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
Three-dimensional memory cells and peripheral circuits
- Publication number 20040155302
- Publication date Aug 12, 2004
- Guobiao Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
ROM redundancy in ROM embedded DRAM
- Publication number 20040153725
- Publication date Aug 5, 2004
- Micron Technology, Inc.
- Scott Derner
- G11 - INFORMATION STORAGE
Information Patent Application
ROM memory device having repair function for defective cell and met...
- Publication number 20040037122
- Publication date Feb 26, 2004
- Kwang-Lae Cho
- G11 - INFORMATION STORAGE
Information Patent Application
Electrically programmable three-dimensional memory-based self-test
- Publication number 20040007746
- Publication date Jan 15, 2004
- Guobiao Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
Method for managing data stored primarily in a read-only memory
- Publication number 20030196051
- Publication date Oct 16, 2003
- Peter Mahrla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Three-dimensional memory
- Publication number 20030067043
- Publication date Apr 10, 2003
- Guobiao Zhang
- H01 - BASIC ELECTRIC ELEMENTS

for read only memories

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Testing read-only memory using memory built-in self-test controller

Testing read-only memory using memory built-in self-test controller

E-fuse circuit

Circuit and method for detecting time dependent dielectric breakdow...

Read only memory (ROM) with redundancy

Method and system for rebalancing data stored in flash memory devices

Flash memory apparatus, memory controller and method for controllin...

Solving MLC NAND paired page program using reduced spatial redundancy

Fault masking method for non-volatile memories

Read only memory (ROM) with redundancy

Apparatus, embedded memory, address decoder, method of reading out...

Circuit and method for patching for program ROM

ROM redundancy in ROM embedded DRAM

Three-dimensional-memory-based self-test integrated circuits and me...

ROM redundancy in ROM embedded DRAM

Self-testing printed circuit board comprising electrically programm...

Mask programmable read-only memory based on nF-opening mask

ROM memory device having repair function for defective cell and met...

Method for managing data stored primarily in a read-only memory

Electrically programmable three-dimensional memory-based self test

Three-dimensional memory

Programmable semiconductor memory device

Memory redundancy circuit using single polysilicon floating gate tr...

Programmable semiconductor memory device

Semiconductor memory device

Programmable semiconductor memory device

Replacement semiconductor read-only memory

Programmable semiconductor memory device

Semiconductor read only memory

Circuit for repairing defective read only memories with redundant N...

Patents Applicationslast 30 patents

TESTING READ-ONLY MEMORY USING MEMORY BUILT-IN SELF-TEST CONTROLLER

Field-Repair System and Method for Large-Capacity Mask-Programmed R...

CHIP TESTER AND TEST METHOD OF SEMICONDUCTOR DEVICE

EMBEDDED MEMORY DEVICE AND MEMORY CONTROLLER INCLUDING THE SAME

Field-Repair System and Method

READ ONLY MEMORY (ROM) WITH REDUNDANCY

Fault Masking Method for Non-Volatile Memories

READ ONLY MEMORY (ROM) WITH REDUNDANCY

BURNING SYSTEM AND METHOD

MEMORY ACCESS CONTROL DEVICE AND MANUFACTURING METHOD

Field-Repair System and Method

Self-Repair System and Method

APPARATUS, EMBEDDED MEMORY, ADDRESS DECODER, METHOD OF READING OUT...

Circuit and method for patching for program ROM

MEMORY SYSTEM

ROM redundancy in ROM embedded DRAM

Self-testing printed circuit board comprising electrically programm...

Three-dimensional-memory-based self-test integrated circuits and me...

Three-dimensional memory cells and peripheral circuits

ROM redundancy in ROM embedded DRAM

ROM memory device having repair function for defective cell and met...

Electrically programmable three-dimensional memory-based self-test

Method for managing data stored primarily in a read-only memory

Three-dimensional memory