Number | Date | Country | Kind |
---|---|---|---|
5-163719 | Jul 1993 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
4970727 | Miyawaki | Nov 1990 | |
5142495 | Canepa | Aug 1992 |
Entry |
---|
A. Tanabe et al., "A 30-ns 64-Mb DRAM with Built-in Self-Test and Self-Repair Function", IEEE Journal of Solid-State Circuits, vol. 27, No. 11, Nov. 1992, pp. 1525-1533. |