Stacking system and method

Abstract
A system and method for selectively stacking and interconnecting individual integrated circuit devices to create a high density integrated circuit module. Connections between stack elements are made through carrier structures that provide inter-element connections that substantially follow an axis that is substantially perpendicular to the vertical axis of the stack. The carrier structure provides connection between elements through conductive paths disposed to provide connection between the foot of an upper IC element and the upper shoulder of the lower IC element. This leaves open to air flow most of the vertical transit section of the lower lead for cooling while creating an air gap between elements that encourages cooling airflow between the elements of the stack. A method for creating stacked integrated circuit modules according to the invention is provided.
Description




TECHNICAL FIELD




The present invention relates to aggregating integrated circuits and, in particular, to stacking integrated circuits.




BACKGROUND OF THE INVENTION




A variety of techniques are used to stack integrated circuits. Some require that the circuits be encapsulated in special packages, while others use circuits in conventional packages. In some cases, the leads alone of packaged circuits have been used to create the stack and interconnect its constituent elements. In other techniques, structural elements such as rails are used to create the stack and interconnect the constituent elements.




Circuit boards in vertical orientations have been used to provide interconnection between stack elements. For example, in U.S. Pat. No. 5,514,907 to Moshayedi, a technique is described for creating a multi-chip module from surface-mount packaged memory chips. The devices are interconnected on their lead emergent edges through printed circuit boards oriented vertically to a carrier or motherboard that is contacted by connective sites along the bottom of the edge-placed PCBs. Japanese Patent Laid-open Publication No. Hei 6-77644 discloses vertical PCBs used as side boards to interconnect packaged circuit members of the stack.




Others have stacked integrated circuits without casings or carrier plates. Electrical conductors are provided at the edges of the semiconductor bodies and extended perpendicularly to the planes of the circuit bodies. Such a system is shown in U.S. Pat. No. 3,746,934 to Stein.




Still others have stacked packaged circuits using interconnection packages similar to the packages within which the integrated circuits of the stack are contained to route functionally similar terminal leads in non-corresponding lead positions. An example is found in U.S. Pat. No. 4,398,235 to Lutz et al. Simple piggyback stacking of DIPs has been shown in U.S. Pat. No. 4,521,828 to Fanning.




Some more recent methods have employed rail-like structures used to provide interconnection and structural integrity to the aggregated stack. The rails are either discrete elements that are added to the structure or are crafted from specific orientations of the leads of the constituent circuit packages. For example, in U.S. Pat. No. 5,266,834 to Nishi et al., one depicted embodiment illustrates a stack created by selective orientation of the leads of particularly configured stack elements, while in U.S. Pat. No. 5,343,075 to Nishino, a stack of semiconductor devices is created with contact plates having connective lines on inner surfaces to connect the elements of the stack.




More recently, sophisticated techniques have been developed for stacking integrated circuits. The assignee of the present invention has developed a variety of such techniques for stacking integrated circuits. In one such method, multiple conventional ICs are stacked and external leads are interconnected with one another by means of a rail assembly. The rails are made of flat strips of metal and the rails define apertures that receive the leads of the discrete IC packages. An example of this system is shown in U.S. Pat. No. 5,778,522 assigned to the assignee of the present invention.




An even more recent technique developed by the assignee of the present invention interconnects conventionally packaged ICs with flexible circuits disposed between stack elements. The flexible circuits include an array of flexible conductors supported by insulating sheets. Terminal portions of the flexible conductors are bent and positioned to interconnect appropriate leads of respective upper and lower IC packages.




Some of the previously described systems have required encapsulation of the constituent ICs in special packages. Still others have added rails that must be custom-fabricated for the application. Many have relied upon connections that substantially coincide with the vertical orientation of the stack and thus require more materials while often adding excessive height to the stack. Others that use PCBs have inhibited heat dissipation of the stack. Most have deficiencies that add expense or complexity or thermal inefficiency to stacked integrated circuits. What is needed therefore, is a technique and system for stacking integrated circuits that provides a thermally efficient, robust structure while not adding excessive height to the stack yet allowing production at reasonable cost with easily understood and managed materials.




SUMMARY OF THE INVENTION




The present invention provides a system and method for selectively stacking and interconnecting individual integrated circuit devices to create a high density integrated circuit module. It is principally designed for use with memory circuits, but can be employed to advantage with any integrated circuits where size conservation and use of duplicative circuitry are present considerations.




In a preferred embodiment, conventional TSOP memory circuits are vertically stacked one above the other. The stack consists of two packaged integrated circuits, but alternatives may employ greater numbers of ICs.




Connections between stack elements are made through carrier structures that provide inter-element connections that transit from one IC to another IC to conserve material and create a stack having improved air flow and consequent heat transference. This is accomplished by having the interelement connections substantially follow an axis that is substantially perpendicular to the vertical axis of the stack. The carrier structure and inter-element connections cooperate to adapt the inherent structural features of the leads of the constituent elements into a stack framework having appropriate integrity.




In a preferred embodiment, electronic connections between stack elements are supported by printed circuit board or other support material. The connection between elements is made by conductive paths disposed to provide connection between the feet of leads of an upper IC element and the upper shoulder of leads of a lower IC element. This leaves open to air flow, most of the transit section of the lower lead for cooling, while creating an air gap between elements that encourages cooling airflow between the elements of the stack and minimizes fabrication complexity.




A method for creating stacked integrated circuit modules is provided that provides reasonable cost, mass production techniques to produce modules.











BRIEF DESCRIPTION OF THE DRAWINGS





FIG. 1

depicts a circuit module composed of a stack of two packaged integrated circuits devised in accordance with the present invention.





FIG. 2

is a view of a connection between two stack elements in the embodiment depicted in FIG.


1


.





FIG. 3

shows an alternative embodiment of a circuit module devised in accordance with the present invention.





FIG. 4

depicts the connection of the foot of one exemplar lead of an upper IC to an embodiment of the carrier structure of the present invention.





FIG. 5

depicts an upper plan view of a printed circuit board structure used in a method of the present invention.





FIG. 6

is a lower plan view of the PCB shown in FIG.


5


.





FIG. 7

shows an enlarged detail from FIG.


6


.





FIG. 8

depicts a sectional view of the connection structure along line C—C of FIG.


7


.





FIG. 9

depicts a sectional view of the connection structure along line B-C of FIG.


7


.





FIG. 10

depicts a sectional view of the connection structure along line A—A of FIG.


7


.











DETAILED DESCRIPTION OF EMBODIMENTS





FIG. 1

depicts a high density memory module


10


devised in accordance with the present invention. The present invention is adaptable to a variety of IC circuits and, in its preferred implementation, memory Circuits of a variety of capacities. Module


10


in created with upper IC


12


and lower IC


14


. Each of ICs


12


and


14


are, in the depicted preferred embodiment, plastic encapsulated memory circuits disposed in thin small outline packages known as TSOPs. Other package types may be used with the present invention as well as packaged circuits other than memories, but, as described here as preferred examples, the invention is advantageously implemented with memories in TSOP packaging. As shown in

FIG. 1

as to lower IC


14


, but present in both IC


12


and


14


of module


10


, each IC has a lower surface


16


, upper surface


18


and periphery


20


. In this embodiment, there is an air gap


21


between IC


12


and IC


14


although a heat transference material may reside between the ICs.




As depicted in

FIG. 2

, emergent from package peripheral wall


20


, leads such as illustrated lead


22


, provide a connective pathway for the electronics of the circuitry chip


24


embedded within plastic casing


26


of exemplar IC


12


. Lead


22


of upper IC


12


is shown as having foot


26


and shoulder


28


and transit section


30


but similar features may be identified in lead


22


of lower IC


14


. Shoulder


28


can extend from and include the planar part of lead


22


emergent from peripheral wall


20


(i.e., the “head” of the shoulder identified by reference


31


) to the end of the curvature into transit section


30


. As leads


22


emerge from the package periphery, a supportive shelf or plane is created or defined (respectively) by the heads of the plurality of leads on a side. These features of lead


22


are present in conventional TSOP packaged memory circuits available from most major suppliers of memories such as Samsung and Micron Technology, for example. Foot


26


is provided to allow the mounting of the TSOP IC on the surface of a printed circuit or other carrier and signal transit board. Shoulder


28


arises from providing foot


26


for surface mount connection of the IC, while transit section


30


of lead


22


connects shoulder


28


with foot


26


. In practice, lead


22


and, in particular, transit section


30


are surfaces from which heat from internal chip


24


is dissipated by local air convection. Transit section


30


is often a substantially straight path but may exhibit curvature.




Carrier structure


40


is shown in

FIG. 2

as being interposed between shoulder


28


of lead


22


of lower IC


14


and foot


26


of lead


22


of upper IC


12


. Carrier structure


40


, in a preferred embodiment, has upper and lower substantially planar surfaces


45


and


47


, respectively. Upper surface


45


bears a row of upper connective elements


44


and lower surface


47


bears a row of lower connective elements


46


. These elements


44


and


46


may rest on surfaces


45


and


47


or be embedded into those surfaces. In the module, upper connective elements


44


are disposed beneath the feet of the leads of IC


12


and the lower surface


47


is placed along the plane of heads


31


of selected leads of lower IC


14


as shown in

FIGS. 2 and 3

. While being beneath the feet of the leads, it should be understood that carrier structure


40


and/or upper connective element


44


may have an extent greater or lesser as well as coincident with the feet of the leads of IC


12


. Carrier structure


40


is, in a preferred embodiment, printed circuit board material or other carrier material disposed between corresponding leads of constituent elements of module


10


. Other structures that provide connective elements in an insulative bed or carrier may be employed as carrier structure


40


. So called flex circuit, known to those of skill in the art is an example of an alternative material for carrier structure


40


. Carrier structure


40


retains upper IC


12


in orientation with lower IC


14


. Carrier structure


40


provides a horizontal structure to support electrical connection between appropriate leads of upper and lower ICs


12


and


14


. Although it provides horizontal carriage of the electrical connection, parts of the conductive path may be coincident in orientation to the main axis of module


10


. The principal orientation of the connective paths provided by carrier structure


40


is, however, perpendicular to the main vertical axis of the created module. Thus, the connective path principally follows a horizontal path. The provision of the horizontal carrier provides structural and fabrication advantages not found in simple structures used in previous stacks. For example, such a method and structure exploits the existing lead assemblage of the constituent ICs to craft a module defining cage or framework. Although the leads are provided by the TSOP manufacturer to enable surface mounting (SMT) of the TSOP, the horizontal carrier structure


40


provides advantages to the lead assemblage, namely, a low capacitance carrier for a conductive pathway that allows inter-element spacing, efficient cooling, and simple stack construction and interconnectivity with structural integrity and appropriate height.




Two carrier structures


40


are generally used in a two element module


10


. One structure


40


is disposed along one periphery of module


10


, while another carrier structure


40


is disposed in conjunction with an opposite periphery of the module.




Carrier structure


40


is preferably devised from printed circuit board. As discussed, other materials may be used as carrier structure


40


. The readily understood technology of PCBs provides, however, and allows, as will be explained below, an efficient and cost-effective method for the fabrication of modules that reflect the invention disclosed here.




Carrier structure


40


is soldered into place as shown by solder


42


that improves the connection of foot


26


of upper IC


12


with upper connective element


44


(in this case, a trace) of carrier structure


40


. In the embodiment shown in

FIG. 2

, connective elements


44


and


46


are etched traces, but other means of providing the connection are known in the art and within the scope of the invention. Solder


42


is also shown providing certain connection between lead


22


of lower IC


14


and lower connective element


46


(in this case, also a trace) of carrier structure


40


.




Upper and lower connective elements


44


and


46


are connected to each other in the embodiment shown in

FIG. 2 through a

plated through hole or via


48


that is drilled in the PCB during stack fabrication. The use of vias to connect conductive planes or traces in PCB technology is well known to those of skill in the art. When a multi-layer PCB board is used as carrier structure


40


, a “blind” via may be used in the path of connection between upper and lower connective elements


44


and


46


. In a preferred embodiment, via


48


is cut through length-wise to create a castellation-like structure. This can be done when the greater part of carrier structure


40


is, in a preferred technique for fabrication of module


10


, routed in a larger PCB board used to construct module


10


. It will be noted, however, that via


48


is shown disposed on the interior of module


10


. This provides protection against environmental hazards. Via


48


may also be disposed on the exterior of module


10


. Placement within module


10


is not essential to the invention either for via


48


or other connective structures used in the present invention to connect upper with lower connective elements


44


and


46


. Further, via


48


need not be bisected. Inside placement will, however, provide sufficient room for connective traces to be provided for efficient differential element enablement. Other connectives besides vias may be used to conduct signals between upper and lower connectives


44


and


46


. For example, a connective element may be used through the body of carrier structure


40


. Traces on the exterior vertical sides of carrier


40


may be used. Alternatively, multi-layer boards may be used to provide the connection.





FIG. 3

is a sectional view of a module


10


implemented according to the present invention in which a trace


50


is used to connect upper trace


44


with lower trace


46


of carrier structure


40


.

FIG. 4

is a view showing lone lead of upper IC


12


emergent from periphery


20


, the lead having shoulder


28


, transit section


30


and foot


26


. Foot


26


is shown as attached to carrier structure


40


. In this embodiment, carrier structure


40


has been implemented with upper connective elements


44


and specialized upper connective element pad


52


. The use of a discrete pad such as


52


for connection to the foot of the lead is not required, but may be advantageous in embodiments where the pitch between leads allows. It will be noted that in this depiction, connection between upper connective


44


to lower connective element


46


(not shown) is on the inside edge of carrier structure


40


as disposed in place in module


10


.





FIG. 5

depicts an upper plan view of a part of a PCB routed and etched to provide a construction structure


59


for the creation of a circuit module of stacked integrated circuits according to an embodiment of the present invention.

FIG. 6

is a lower plan view of the PCB shown in FIG.


5


.

FIG. 7

shows an enlarged detail from

FIG. 6

showing the trace used to provide selective enablement of the constituent elements of module


10


.




In

FIGS. 5 and 6

, orifices


54


are routed openings through a PCB


60


having upper and lower conductive surfaces. The upper and lower conductive surfaces of PCB


60


are etched to create the appropriate pattern for the upper and lower connective elements


44


and


46


, respectively. Central opening


56


provides a space through which the body of lower IC


14


is disposed to allow the shoulders of leads of lower IC


14


to contact lower connective elements (traces)


46


of each of the two carrier structures


40


which are, at this stage of fabrication, still connected to the body of PCB


60


through bridges


57


. Bridges


57


are cut after upper and lower ICs


12


and


14


are soldered into place.




In practice, lower IC


14


is disposed upside down (“dead bug”). coincident with central opening


56


as seen in the view of FIG.


6


. Lower IC


14


is preferably placed in position with a pick and place machine or similar precision placement mechanism to accurately dispose the IC relative to the lower connective elements (traces)


46


of the two carrier structures


40


. It will be understood that multiple iterations of construction structure


59


shown in

FIGS. 5 and 6

are preferably created in one larger PCB and that the body of lower IC


14


may or may not be emergent into opening


56


depending upon the construction of ICs


12


and


14


. Once construction structure


59


is populated with lower ICs


14


, solder paste and reflow solder techniques known in the art are used to adhere lower IC


14


to the still attached to PCB


60


carrier structures


40


. In a preferred embodiment, once soldered into place, the now populated with lower ICs


14


assembly of multiple stacks in progress is positioned to allow placement of the upper ICs


12


to contact the upper conductive elements


44


shown in FIG.


5


. Again, the assembly is soldered and, after cooling, the carrier structures


40


are cut away from the PCB matrix


60


thus leaving created module(s)


10


.





FIG. 7

is an enlargement of area


62


shown in FIG.


6


. The particular one of lower conductive elements


46


shown identified by reference


64


makes contact with an unused no-connect lead of lower IC


14


. To enable upper IC


12


, a signal may be applied to a no connect lead of lower IC


14


that contacts connective element


64


of carrier structure


40


. That signal is conveyed from connective element


64


to the enablement trace


65


that extends from termini


66


to


68


. That connection may be by way of the corresponding upper connective element


44


. From terminus


68


of enablement trace


65


, the signal is brought by way of the appropriate upper connective element


44


to the upper IC


12


lead that receives enable signals. Enablement trace


65


is created to allow a signal applied to a no-connect lead of lower IC


14


to enable upper IC


12


by conveying that enablement signal from the unused lead of lower IC


14


to an enabling active lead of upper IC


12


. Thus, the constituent elements of module


10


may be selectively. enabled in the context of the disclosed invention. Other similar techniques for differential enablement using similar methods may be used. The placement requirements of enablement trace


65


may cause the disposition of the upper to lower connective


53


or via


48


or other connective to be on the interior of the carrier structure relative to the module.





FIG. 8

depicts a sectional view of the connection structure along line C—C of FIG.


7


. As shown in

FIG. 8

, enablement trace terminus


68


is connected through upper connective


44


of carrier structure


40


to the foot


26


of a depicted enable lead of upper IC


12


of module


10


. As shown in

FIG. 8

, although carrier structure


40


is disposed so as to place its lower surface


47


along the plane of heads


31


of leads


22


of lower IC


14


, there is no connection to shown lead


22


of lower IC


14


and, at this site, lower surface


47


does not touch the lead


22


of the lower IC


14


. Lower surface


47


may touch the lead


22


of lower IC


14


, however, as long as, for this particular site depicting a preferred differential enablement strategy, connection


68


does not contact this particular lead


22


of lower IC


14


. When created, module


10


will, as shown in

FIG. 1

, have spaced upper IC


12


from lower IC


14


. The space between upper and lower ICs may be left open to air flow or may be filled with a thermally conductive element


72


positioned with thermally conductive adhesive shown at reference


70


. The signal on enablement trace terminus


68


shown in

FIG. 8

was conveyed through the body of enablement trace


65


shown in

FIG. 9

which depicts

FIG. 7

along line A—A. As shown, there is no connection between enablement trace


65


and either the upper or lower connective elements at this point in its transit from terminus


66


to terminus


68


.

FIG. 10

is a sectional view along the line B—B of FIG.


7


and shows enablement trace terminus


66


is connected through upper connective element


44


and upper to lower connective


53


and lower connective element


46


to shoulder


28


of lower IC


14


to receive an enable signal for upper IC


12


at a no-connect lead of lower IC


14


.




Although the present invention has been described in detail, it will be apparent that those skilled in the art that the invention may be embodied in a variety of specific forms and that various changes, substitutions and alterations can be made without departing from the spirit and scope of the invention. The described embodiments are only illustrative and not restrictive and the scope of the invention is, therefore, indicated by the following claims.



Claims
  • 1. A circuit module comprised of:a first packaged integrated circuit and a second packaged integrated circuit, each of the first and second packaged integrated circuits having an upper surface, a lower surface and a peripheral wall, emergent from first and second sides of said peripheral wall are leads that each have a shoulder and foot, the shoulders each having a head; a first carrier structure having pairs of corresponding and electrically communicative upper and lower connective elements, the upper and lower connective elements being respectively disposed along first and second substantially planar surfaces of the first carrier structure, the upper connective elements being disposed beneath feet of selected leads emergent from the first side of the peripheral wall of the first packaged integrated circuit and the second substantially planar surface of the first carrier structure being disposed along the plane of the heads of selected leads emergent from the first side of the peripheral wall of the second packaged integrated circuit; and a second carrier structure having pairs of corresponding and electrically communicative upper and lower connective elements, the upper and lower connective elements being disposed along first and second substantially planar surfaces respectively of the second carrier structure, the upper connective elements being disposed beneath feet of selected leads emergent from the second side of the peripheral wall of the first packaged integrated circuit and the second substantially planar surface of the first carrier structure being disposed along the plane of the heads of selected leads emergent from the second side of the peripheral wall of the second packaged integrated circuit.
  • 2. The circuit module of claim 1 in which the corresponding upper and lower connective elements electrically communicate through vias.
  • 3. The circuit module of claim 2 in which the vias are disposed perpendicularly to the first and second substantially planar surfaces of the first and second carrier structures.
  • 4. The circuit module of claim 3 in which the vias are on a surface of the first and second carrier structures.
  • 5. The circuit module of claim 1 in which the corresponding upper and lower connective elements electrically communicate through a trace.
  • 6. The circuit module of claim 1 in which the first and second carrier structures are comprised of printed circuit board.
  • 7. The circuit module of claim 6 in which the printed circuit board has multiple layers.
  • 8. The circuit module of claim 6 in which the printed circuit board is patterned to include an electrically communicative pathway between a no-connect lead of the second packaged integrated circuit and an active lead of the first packaged integrated circuit.
  • 9. The circuit module of claim 1 in which the first and second carrier structures distance the first packaged integrated circuit from the second packaged integrated circuit and between the first and second carrier structures there resides a thermally conductive material.
  • 10. The circuit module of claim 1 in which the first and second carrier structures distance the first packaged integrated circuit from the second packaged integrated circuit and the created gap there between is narrower than the distance from the upper and lower surfaces of the first packaged integrated circuit.
  • 11. The circuit module of claim 1 in which the first and second packaged integrated circuits are TSOPs.
  • 12. A circuit module having four peripheral sides, the module being comprised of:an upper integrated circuit and a lower integrated circuit, each integrated circuit having an upper surface, a lower surface, and a periphery emergent from which are a plurality of leads each having a shoulder and a foot; two carrier structures, each disposed on a peripheral side of the module between selected feet of the upper integrated circuit and selected shoulders of the lower integrated circuit to distance the upper integrated circuit above the lower integrated circuit, the carrier structures each having a set of electrical pathways, certain ones of said set of electrical pathways providing electrical communication between certain ones of the selected feet of the upper integrated circuit and certain corresponding ones of the selected shoulders of the lower integrated circuit.
  • 13. The module of claim 12 in which the integrated circuits are TSOP packaged memory circuits.
  • 14. The module of claim 12 in which the carrier structures are comprised of printed circuit board material.
  • 15. The module of claim 12 in which thermally conductive material resides in the space between the upper and lower integrated circuits.
  • 16. The module of claim 12 in which the space between the upper and lower integrated circuits is an air gap.
  • 17. A circuit module in which more than two integrated circuits are stacked with carrier structures according to claim 12.
  • 18. The module of claim 12 in which the two carrier structures are etched printed circuit board patterned to connect a no-connect one of the leads of the lower IC with an active lead of the upper IC.
  • 19. The module of claim 12 in which the electrical pathways comprise a trace disposed on a surface of the carrier structures.
  • 20. A method of creating a stack of integrated circuits selectively connected to provide increased memory density in an application;providing a printed circuit board having upper and lower connective surfaces; etching said printed circuit board to provide two rows each having a plurality of upper and a coincident plurality of lower connective elements; disposing connective vias between corresponding upper and lower connective elements for each row; creating openings on each side of each row of upper and coincident lower connective elements, a central opening being large enough to dispose therein an integrated circuit body; placing a first integrated circuit in a position to contact at a plurality of its shoulders, the lower connective elements of the printed circuit board rows; soldering the first integrated circuit into connection with the lower connective elements of the rows of the printed circuit board; placing a second integrated circuit into a position to contact at a plurality of its feet, the upper connective elements of the printed circuit board rows; soldering the second integrated circuit to maintain the contact between the feet and upper connective elements; separating the two rows from the printed circuit board.
  • 21. The method of claim 20 in which the first integrated circuit is placed in position to contact the lower connective elements with a pick and place machine.
  • 22. The method of claim 20 in which the printed circuit board is a multi-layer board.
  • 23. The circuit module of claim 1 fabricated according to the method of claim 20.
  • 24. An integrated circuit module fabricated according to the method of claim 20.
US Referenced Citations (205)
Number Name Date Kind
3246386 Ende Apr 1966 A
3287606 Schwartz Nov 1966 A
3290559 Kirby et al. Dec 1966 A
3313986 Kilby Apr 1967 A
3377516 Ellett et al. Apr 1968 A
3403300 Horowitz et al. Sep 1968 A
3436604 Hyltin et al. Apr 1969 A
3515949 Michaels et al. Jun 1970 A
3535595 Moore Oct 1970 A
3614541 Farrand Oct 1971 A
3614546 Avins Oct 1971 A
3671812 Peluso et al. Jun 1972 A
3713893 Hasty Jan 1973 A
3727064 Bottini Apr 1973 A
3746934 Stein Jul 1973 A
3925801 Haitz et al. Dec 1975 A
3949274 Anacker Apr 1976 A
3959579 Johnson May 1976 A
4017963 Beyerlein Apr 1977 A
4103318 Schwede Jul 1978 A
4116518 Pleskac Sep 1978 A
4116519 Grabbe et al. Sep 1978 A
4139726 Penrod et al. Feb 1979 A
4158745 Keller Jun 1979 A
4241493 Andrulitis et al. Dec 1980 A
4288808 Hantusch Sep 1981 A
4288841 Gogal Sep 1981 A
4321418 Dran et al. Mar 1982 A
4331258 Geschwind May 1982 A
4364620 Mulholland et al. Dec 1982 A
4371912 Guzik Feb 1983 A
4379259 Varadi et al. Apr 1983 A
4394712 Anthony Jul 1983 A
4398235 Lutz et al. Aug 1983 A
4406508 Sadigh-Behzadi Sep 1983 A
4437235 McIver Mar 1984 A
4451973 Tateno et al. Jun 1984 A
4521828 Fanning Jun 1985 A
4525921 Carson et al. Jul 1985 A
4571663 McPherson Feb 1986 A
4574331 Smolley Mar 1986 A
4630172 Stenerson et al. Dec 1986 A
4631573 Sutrina Dec 1986 A
4633573 Scherer Jan 1987 A
4638348 Brown et al. Jan 1987 A
4638406 Samson Jan 1987 A
4642735 Hodsdon et al. Feb 1987 A
4680617 Ross Jul 1987 A
4684975 Takiar et al. Aug 1987 A
4688864 Sorel Aug 1987 A
4696525 Coller Sep 1987 A
4698663 Sugimoto et al. Oct 1987 A
4706166 Go Nov 1987 A
4712129 Orcutt Dec 1987 A
4722060 Quinn et al. Jan 1988 A
4733461 Nakano Mar 1988 A
4761681 Reid Aug 1988 A
4763188 Johnson Aug 1988 A
4764846 Go Aug 1988 A
4770640 Walter Sep 1988 A
4796078 Phelps, Jr. et al. Jan 1989 A
4821007 Fields et al. Apr 1989 A
4821148 Kobayashi et al. Apr 1989 A
4823234 Konishi et al. Apr 1989 A
4829403 Harding May 1989 A
4833568 Berhold May 1989 A
4839717 Phy et al. Jun 1989 A
4841355 Parks Jun 1989 A
4855868 Harding Aug 1989 A
4862245 Pashby et al. Aug 1989 A
4862249 Carlson Aug 1989 A
4868712 Woodman Sep 1989 A
4878106 Sachs Oct 1989 A
4884237 Mueller et al. Nov 1989 A
4891789 Quanttrini et al. Jan 1990 A
4924352 Septfons May 1990 A
4948645 Holzinger et al. Aug 1990 A
4953005 Carlson et al. Aug 1990 A
4953060 Lauffer et al. Aug 1990 A
4956694 Eide Sep 1990 A
4983533 Go Jan 1991 A
4994411 Naito et al. Feb 1991 A
4996583 Hatada Feb 1991 A
4996587 Hinrichsmeyer et al. Feb 1991 A
4997517 Parthasarathi Mar 1991 A
5001545 Kalfus et al. Mar 1991 A
5012323 Farnworth Apr 1991 A
5014113 Casto May 1991 A
5016138 Woodman May 1991 A
5025307 Ueda et al. Jun 1991 A
5031072 Malhi et al. Jul 1991 A
5034350 Marchisi Jul 1991 A
5041015 Travis Aug 1991 A
5041395 Steffen Aug 1991 A
5043794 Tai et al. Aug 1991 A
5049527 Merrick et al. Sep 1991 A
5057903 Olla Oct 1991 A
5057906 Ishigami Oct 1991 A
5058265 Goldfarb Oct 1991 A
5065277 Davidson Nov 1991 A
5068708 Newman Nov 1991 A
5086018 Conru et al. Feb 1992 A
5099393 Bentlage et al. Mar 1992 A
5101324 Sato Mar 1992 A
5104820 Go et al. Apr 1992 A
5107328 Kinsman Apr 1992 A
5108553 Foster et al. Apr 1992 A
5128831 Fox, III et al. Jul 1992 A
5138430 Gow, III et al. Aug 1992 A
5138434 Wood et al. Aug 1992 A
5140745 McKenzie, Jr. Aug 1992 A
5155068 Tada Oct 1992 A
5159434 Kohno et al. Oct 1992 A
5168926 Watson et al. Dec 1992 A
5198888 Sugano et al. Mar 1993 A
5200362 Lin et al. Apr 1993 A
5214307 Davis May 1993 A
5221642 Burns Jun 1993 A
5222014 Lin Jun 1993 A
5223739 Katsumata et al. Jun 1993 A
5214845 King et al. Jul 1993 A
5231304 Solomon Jul 1993 A
5236117 Roane et al. Aug 1993 A
5239447 Cotues et al. Aug 1993 A
5241454 Ameen et al. Aug 1993 A
5243133 Engle et al. Sep 1993 A
5247423 Lin et al. Sep 1993 A
5262927 Chia et al. Nov 1993 A
5266834 Nishi et al. Nov 1993 A
5273940 Sanders Dec 1993 A
5279029 Burns Jan 1994 A
5279991 Minahan et al. Jan 1994 A
5281852 Normington Jan 1994 A
5307929 Seidler May 1994 A
5311060 Rostoker et al. May 1994 A
5311401 Gates, Jr. et al. May 1994 A
5313096 Eide May 1994 A
5313097 Haj-Ali-Ahmadi et al. May 1994 A
5334875 Sugano et al. Aug 1994 A
5343075 Nishino Aug 1994 A
5343366 Cipolla et al. Aug 1994 A
5347428 Carson et al. Sep 1994 A
5347429 Kohno et al. Sep 1994 A
5367766 Burns et al. Nov 1994 A
5369056 Burns et al. Nov 1994 A
5369058 Burns et al. Nov 1994 A
5371866 Cady Dec 1994 A
5373189 Massit et al. Dec 1994 A
5377077 Burns Dec 1994 A
5384689 Shen Jan 1995 A
5394010 Tazawa et al. Feb 1995 A
5397916 Normington Mar 1995 A
5420751 Burns et al. May 1995 A
5426566 Beilstein, Jr. et al. Jun 1995 A
5446313 Masuda et al. Aug 1995 A
5446620 Burns et al. Aug 1995 A
5471369 Honda et al. Nov 1995 A
5475920 Burns et al. Dec 1995 A
5479318 Burns Dec 1995 A
5481133 Hsu Jan 1996 A
5484959 Burns Jan 1996 A
5493476 Burns Feb 1996 A
5499160 Burns Mar 1996 A
5514907 Moshayedi May 1996 A
5523619 McAllister et al. Jun 1996 A
5543664 Burns Aug 1996 A
5550711 Burns et al. Aug 1996 A
5552963 Burns Sep 1996 A
5561591 Burns Oct 1996 A
5566051 Burns Oct 1996 A
5586009 Burns Dec 1996 A
5588205 Roane Dec 1996 A
5592364 Roane Jan 1997 A
5605592 Burns Feb 1997 A
5612570 Eide et al. Mar 1997 A
5615475 Burns Apr 1997 A
5631193 Burns May 1997 A
5644161 Burns Jul 1997 A
5654877 Burns Aug 1997 A
5656856 Kweon Aug 1997 A
5657537 Saia et al. Aug 1997 A
5723903 Masuda et al. Mar 1998 A
5778522 Burns Jul 1998 A
5783464 Burns Jul 1998 A
5801437 Burns Sep 1998 A
5804870 Burns Sep 1998 A
5814881 Alagratnam et al. Sep 1998 A
5828125 Burns Oct 1998 A
5835988 Ishii Nov 1998 A
5843807 Burns Dec 1998 A
5864175 Burns Jan 1999 A
5895232 Burns Apr 1999 A
5960539 Burns Oct 1999 A
5978227 Burns Nov 1999 A
6025642 Burns Feb 2000 A
6028352 Eide Feb 2000 A
6049123 Burns Apr 2000 A
6040983 Baudouin et al. May 2000 A
RE36916 Moshayedi Oct 2000 E
6168970 Burns Jan 2001 B1
6194247 Burns et al. Feb 2001 B1
6205654 Burns Mar 2001 B1
6288907 Burns Sep 2001 B1
6310392 Burns Oct 2001 B1
6316825 Park et al. Nov 2001 B1
Foreign Referenced Citations (28)
Number Date Country
122-687 Oct 1984 EP
122-687 Oct 1984 EP
0 298 211 Jan 1989 EP
57-31166 Feb 1982 JP
57-31166 Feb 1982 JP
58-112348 Apr 1983 JP
58-96756 Jun 1983 JP
58-112348 Jul 1983 JP
58-96756 Aug 1983 JP
58-219757 Dec 1983 JP
60-160641 Aug 1985 JP
60-254762 Dec 1985 JP
61-63048 Apr 1986 JP
61-75558 Apr 1986 JP
61-163652 Jul 1986 JP
61-219143 Sep 1986 JP
62-230027 Aug 1987 JP
62-230027 Oct 1987 JP
63-117451 May 1988 JP
63-123849 Jun 1988 JP
63-153849 Jun 1988 JP
2-260448 Oct 1990 JP
3-96266 Apr 1991 JP
3-167868 Jul 1991 JP
4-209562 Jul 1992 JP
6-77644 Aug 1992 JP
SU 834-957 May 1981 RU
834-957 May 1981 SU
Non-Patent Literature Citations (26)
Entry
Dense-Pac MicroSystems, Inc., “Short Form Catalog,” 1990, 12 pages.
“Electronic Packaging & Production” article, A cahners Publication, Jan. 1992, 2 pages.
IBM Technical Disclosure Bulletin, Edge-Mounted MLC Packaging Scheme, vol. 23, No. 12, May 1981.
IBM Technical Disclosure Bulletin, Process for Producing Lateral Chip Connectors, vol. 32, No. 3B, Aug. 1989.
IBM Technical Disclosure Bulletin, Vertical Chip Packaging, vol. 20, No. 11A, Apr. 1978.
International Electron Device Meeting, IEDM Technical Digest, Washington, D.C., Dec. 6-7, 1987.
“Introducing a Revolutionary 3 Dimensional Package Type-THE SLCC,” John Forthun, Advancement in Technology.
“New levels of hybrid IC density are provided by Three-Dimensional Packaging”article, 2 pages.
Patent Abstract of Japan, Publication No. 05029534, Published May 2, 1993 Inventor: Nakamura Shigemi, entitled “Memory Module”, European Patent Office.
Research Disclosure, Organic Card Device Carrier, 31318, May 1990, No. 313.
Tuckerman, D.B. et al., “Laminated Memory: A New 3-Dimensional Packaging Technology for MCMs” article, nCHIP, Inc., IEEE, 1994.
1992 Proceedings, 42nd Electronic Components & Technology Conference, May 18-20, 1992.
“Declaration of Mark Moshayedi in Support of Plaintiff/CounterDefendant's Motion for Summary Judgment of Non-Infringement of U.S. Patent No. 4,956,694,” Civil Action No. SACV 98-822, Simple Technology, Inc. v. Dense-Pac Microsystems, Inc., 20 total pages (9 pages. of the Declaration and 11 pages. of attachments to Declaration).
“Alternative assembly for memory ICs,” XP-002093051, Electronic Engineering, Jan. 1987, p.22.
3-D Integrated Packaging and Interconnect Technology, Wescon/90 Conference Record, held Nov. 13-15, 1990, Anaheim, CA.
Dense-Pac Microsystems, “3-D Technology,” 1993, 15 pages.
Dense-Pac Microsystems, 16-Megabit High Speed CMOS SRAM.
Dense-Pac Microsystems, 128-Megabyte SDRAM SODIMM.
Dense-Pac Microsystems, 256-Megabyte CMOS DRAM.
Dense-Pac Microsystems, “While others are still defining it . . . Our customers are cashing in!” flyer.
Dense-Pac Microsystems, Inc., “Memory Products-Short Form-04,” 1994, 5 pages.
Dense-Pac MicroSystems, Inc., “Short Form Catalog,” 1991, 20 pages.
Dean Frew, “High Density Memory Packaging Technology/High Speed Imaging Applications,” SPIE vol. 1346 Ultrahigh- and High-Speed Photography, Videography, Photonics, and Velocimetry '90 , pp. 200-209.
Alvin Weinberg and W. Kinzy Jones, “Vertically-Integrated Package, ” IEEE , pp. 436-443.
“Alterable Interposer Block for Personalizing Stacked Module Interconnections,” IBM Technical Disclosure Bulletin , vol. 30, No. 8, Jan. 8, 1988, pp. 373-374.
Catalog of Dense-Pac Microsystems, Inc. describing two products: DPS512X16A3Ceramic 512K X 16 CMOS SRAM Module and DPS512X16AA3 High Speed Ceramic 512K X 16 CMOS SRAM Module, pp. 8-65—8-70.