The present disclosure relates to a storage device unit having a substrate on which a storage device is disposed.
When an electronic device on which a storage device such as a solid state drive (SSD), a hard disk drive (HDD), or a memory is mounted is used in a cold district, there is a case when the electronic device is operated at a temperature lower than the operation guarantee temperature of the storage device because the outdoor temperature is low. PTL 1 discloses a memory card including a printed circuit board on which a semiconductor memory is mounted, a frame that supports the printed circuit board, and a heater disposed on an inner surface of the frame. When the temperature of the memory card falls below the operation guarantee temperature range, the memory card is heated by the heater, and the memory can be operated within the operation guarantee temperature range.
In addition, a method of heating the storage device is also known in which a flexible printed circuit board (FPC) having a heater function is separately prepared and is disposed around the storage device. The temperature of the storage device is measured by a temperature sensor, and when the temperature is lower than the operation guarantee temperature of the storage device, the storage device can be operated within the operation guarantee temperature range by being heated with the heater.
In the case of the method using the memory card described in PTL 1 or the FPC having the heater function, there is still room for improvement in terms of reduction in manufacturing cost.
A storage device unit according to the present disclosure includes:
According to the present disclosure, the manufacturing cost can be reduced.
An electronic device such as a laptop personal computer (PC) is sometimes used outdoors. For example, when the outdoor temperature is below zero in a cold district, the temperature falls below the operation guarantee temperature of the storage device such as an SSD, an HDD, or a memory mounted in the electronic device. When the electronic device is activated in such an environment, there is a problem that the storage device does not operate normally or an access speed to the storage device becomes slower. In order to prevent this, a method of preparing an FPC on which a heater circuit is formed and disposing the FPC around the storage device is also known. For example, there is a method in which the periphery of an HDD is surrounded by the FPC in which the heater circuit is formed, and the storage device is heated when the temperature of the storage device is low at the time of activation. There is also a method in which the FPC in which the heater circuit is formed is disposed between an SSD and a substrate on which the SSD is mounted, and the SSD is heated by a heater.
In the method of heating the storage device by the FPC having the heater circuit, there is a problem that the manufacturing cost is difficult to be reduced because the costly FPC is separately prepared. In addition, there is also a problem that a work process of incorporating the storage device into an electronic device or the like is additionally required.
Therefore, the inventors of the present discloser have studied an electronic device for solving these problems and devised the following configuration.
A storage device unit according to one aspect of the present disclosure includes:
According to this configuration, the manufacturing cost can be reduced. In addition, workability at the time of manufacturing can be improved, and man-hours can be reduced.
In a view from a direction perpendicular to the main surface,
According to this configuration, the storage device can be efficiently heated.
The storage device may be a solid state drive.
According to this configuration, in the electronic device including the SSD, the SSD can be operated within the operation guarantee temperature range by heating the SSD when the outdoor temperature is low at the time of activation.
The plurality of wiring layers may include a ground layer on which a ground pattern is formed on a side of the main surface with respect to the heat-generating layer.
According to this configuration, the heat generated from the heat-generating circuit can be efficiently transmitted to the outside of the substrate.
In the following, the present exemplary embodiment preferable to practice the present disclosure is described in detail with reference to the drawings.
[Overall Configuration]
As illustrated in
As illustrated in
As illustrated in
<Storage Service Unit>
<Substrate>
As illustrated in
As illustrated in
With storage device unit 20 having such a structure, storage device unit 20 can be stored in housing 12c of main body 12 in the thickness direction (Z-axis direction) of main body 12. As a result, connector 22 of main body 12 and connector 30 of storage device unit 20 can be detachably connected in the thickness direction.
As illustrated in
Heat-generating circuits 36 and 38 of heat-generating layers 26b and 26c are heaters for heating storage device 28 when, for example, the outdoor temperature is low. When information processing device 10 is activated, thermistor 50 measures the temperature of storage device 28. When the temperature of storage device 28 is lower than a predetermined temperature determined from, for example, the operation guarantee temperature of storage device 28, the current flows through heat-generating circuits 36 and 38 to generate heat to heat storage device 28. Here, the predetermined temperature is, for example, a lower limit temperature (0° C.) of the operation guarantee temperature. When the temperature of storage device 28 rises to a predetermined operable temperature (for example, 2° C.) determined from the operation guarantee temperature of storage device 28 or more, the current to heat-generating circuits 36 and 38 is cut off, and the heating is terminated. Note that the control of heat-generating circuits 36 and 38 based on the temperature of storage device 28 is executed by the CPU or the like of information processing device 10. Further, the control of heat-generating circuits 36 and 38 may be executed by, for example, a microcontroller or the like mounted on substrate 26 or storage device 28. Note that the temperatures of 0° C. and 2° C. described above are examples for describing the present disclosure, and other temperatures may be used, and the present disclosure is not limited thereto.
As illustrated in
<Storage Device>
In the present exemplary embodiment, an SSD is mounted on substrate 26 as storage device 28. As illustrated in
In a view from the direction (Z-axis direction) perpendicular to main surface 26a of substrate 26, heat-generating circuits 36 and 38 are preferably formed in substantially the same shape as storage device 28 and disposed so as to overlap storage device 28. That is, the shapes of heat-generating circuits 36 and 38 may be substantially the same as the shape of storage device 28 in the view from the direction (Z-axis direction) perpendicular to main surface 26a of substrate 26. By disposing heat-generating circuits 36 and 38 so as to overlap storage device 28, storage device 28 can be efficiently heated.
The SSD adopted as storage device 28 of the present exemplary embodiment generally has the operation guarantee temperature of about 0° C. to 40° C. When the outdoor temperature falls below zero in such as a cold district, there is a case where the temperatures of information processing device 10 and storage device 28 mounted on information processing device 10 also fall below 0° C. In this case, storage device 28 can be used within the operation guarantee temperature range of storage device 28 by heating storage device 28 by heat-generating circuits 36 and 38.
[Operation]
An operation of information processing device 10 having the above configuration is described.
(1) When information processing device 10 is activated, thermistor 50 measures the temperature of storage device 28.
(2) If the temperature of storage device 28 is, for example, lower than 0° C., current flows through heat-generating circuits 36 and 38 of heat-generating layers 26b and 26c, and storage device 28 is started to be heated. At this time, storage device 28 is not energized, and storage device 28 cannot be used. The current through heat-generating circuits 36 and 38 and the energization of storage device 28 are controlled by, for example, the CPU or the like.
(3) When the temperature of storage device 28 becomes, for example, 2° C. or higher, the current to heat-generating circuits 36 and 38 is cut off, and the heating of storage device 28 is terminated.
(4) When the heating of storage device 28 is terminated, the energization of storage device 28 is started, and storage device 28 becomes usable.
[Effects]
According to the present exemplary embodiment, storage device 28 can be heated by providing heat-generating circuits 36 and 38 on substrate 26 on which storage device 28 is mounted, without preparing an FPC having a heater circuit. Therefore, the manufacturing cost can be reduced as compared with the case of using the FPC having the heater circuit. In addition, because the process of incorporating the FPC having the heater circuit into storage device unit 20 is not necessary, the manufacturing man-hours can be reduced and the productivity can be improved.
The present disclosure has been described by taking the above exemplary embodiment as an example, but the present disclosure is not limited to the above exemplary embodiment.
For example, in the present exemplary embodiment, heat-generating circuits 36 and 38 are formed in two wiring layers among the six wiring layers of substrate 26, but the heat-generating circuits may be formed in one or three or more wiring layers among the wiring layers of substrate 26 by adjusting the thickness and length of the wiring. The thickness and length of the wiring of heat-generating circuit may be determined by the amount of heat generation required to heat storage device 28.
In the present exemplary embodiment, among the six wiring layers of substrate 26, the third layer and the fourth layer are heat-generating layers 26b and 26c, and heat-generating circuits 36 and 38 are formed in heat-generating layers 26b and 26c, respectively. However, the heat-generating layer can be any wiring layer among the plurality of wiring layers of substrate 26. Preferably, the heat-generating circuit is formed using the wiring layer located in the inner layer as the heat-generating layer. By using the wiring layer located in the inner layer as the heat-generating layer, a short circuit can be prevented.
Further, in the present exemplary embodiment, substrate 26 is formed by stacking six wiring layers, but a number of wiring layers is not limited thereto. Further, in the present exemplary embodiment, storage device 28 is disposed on main surface 26a of substrate 26, but the storage device may also be mounted on a surface of substrate 26 opposite to main surface 26a. In this case, it is preferably that the ground layer be formed on the wiring layer located on the side of main surface 26a of substrate 26 of the heat-generating layer and be also formed on the wiring layer located on the opposite side of main surface 26a of substrate 26 of the heat-generating layer.
Further, in the present exemplary embodiment, substrate 26 and storage device 28 are disposed so as not to be in contact with each other (shown schematically in
In the present exemplary embodiment, the SSD is adopted as storage device 28, but storage device 28 may be an HDD, a memory, or the like.
The present disclosure is applicable to a storage device unit in which a storage device is disposed on a substrate and to an information processing device including the storage device unit.
Number | Date | Country | Kind |
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2019-125413 | Jul 2019 | JP | national |
Number | Name | Date | Kind |
---|---|---|---|
6114674 | Baugh | Sep 2000 | A |
20040052046 | Regimbal | Mar 2004 | A1 |
20040228023 | Keller | Nov 2004 | A1 |
20040240174 | Ooka | Dec 2004 | A1 |
20060065431 | Trucco | Mar 2006 | A1 |
20070177308 | Kimura | Aug 2007 | A1 |
20090163079 | Nguyen | Jun 2009 | A1 |
20090268417 | Kagawa | Oct 2009 | A1 |
20110122030 | Suzuki | May 2011 | A1 |
20130081568 | Happoya | Apr 2013 | A1 |
20130094148 | Sloane | Apr 2013 | A1 |
20130180973 | White | Jul 2013 | A1 |
20140016261 | Lin | Jan 2014 | A1 |
20140177097 | Wu | Jun 2014 | A1 |
20140306335 | Mataya | Oct 2014 | A1 |
20150138735 | Oh | May 2015 | A1 |
20150261265 | Dean | Sep 2015 | A1 |
20170277234 | Chou | Sep 2017 | A1 |
20180026022 | Lee | Jan 2018 | A1 |
20180174940 | Ferguson | Jun 2018 | A1 |
20190305265 | Wynn | Oct 2019 | A1 |
Number | Date | Country |
---|---|---|
H01-174989 | Dec 1989 | JP |
H02-231200 | Sep 1990 | JP |
2009054046 | Apr 2009 | WO |
Entry |
---|
International Search Report for related Application No. PCT/JP2020/025836, mailed Oct. 6, 2020. |
Number | Date | Country | |
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20220124907 A1 | Apr 2022 | US |
Number | Date | Country | |
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Parent | PCT/JP2020/025836 | Jul 2020 | WO |
Child | 17563159 | US |