D. Pramanik, S. R. Nariani and G. Spadini, "Field Inversion In CMOS Double Metal Circuits Due to Carbon Based SOG's", VMIC Conference, Jun. 12-13, 1989, pp. 454-462. |
"Suppression of Hot-Carrier Effects in submicrometer CMOS Technology", by Chen, Min-Liang et al, IEEE Transactions on Electron Devices, vol. 35, No. 12, Dec. 1988, pp. 2210-2220, cited in specification p. 2. |
"Mobile Charge in a Novel Spin-On Oxide (SOX) Detection of Hydrogen in Dielectrics", by N. Lifshitz et al, Journal Electrochem. Soc., vol. 136, No. 5, May 1989, pp. 1440-1446, cited on specification p. 3. |
"Hot-Carrier Aging of the MOS Transistor in the Presence of Spin-on Glass as the Interlevel Dielectric", by N. Lifshitz et al, IEEE Electron Device Letters, vol. 12, No. 3, Mar. 1991, pp. 140-142, cited on specification p. 3. |
"Charge Loss in EPROM Due to Ion Generation and Transport in Interlevel Dielectric", by G. Crisenza et al, Proceedings of IEEE IEDM, 1990, pp. 107-110, cited on specification p. 3. |
"Electroluminescence Studies in Silicon Dioxide Films Containing Tiny Silicon Islands", by D. J. DiMaria et al, Journal of Appl. Phys., vol. 56, Jul. 1984, pp. 401-416, cited on specification p. 1. |
"Improvement Of Endurance to Hot Carrier Degradation", Yoshida et al., IEEE, 1988, pp. 22-25. |