The field of the present disclosure relates to semiconductor processing and showerhead reactors, particularly to showerheads for chemical vapor deposition reactors.
Various deposition and etching processes and tools are used in semiconductor wafer processing such as for integrated circuits, solar photovoltaic cells and micro-machining. Two predominant types of reactors used in semiconductor processing are the tube-type reactor and the showerhead-type reactor, which are discussed in “Principles of Chemical Vapor Deposition” by Daniel M. Dobkin and Michael K. Zuraw, 2003, Kluwer Academic Publishers.
Typically, a chemical vapor deposition (CVD) showerhead reactor operates on a single wafer per chamber and thus has much lower wafer throughput than a CVD tube reactor, which handles many wafers in parallel in a single load. In a showerhead reactor, gases are distributed to a wafer from a showerhead (alternately, shower head). In a tube reactor, gases are distributed to a parallel-spaced set of wafers in a boat, with the gases traveling from an inlet at one end of the tube to an exhaust at the other end of the tube. Showerhead reactors are often run at a higher deposition rate in order to improve throughput for commercial viability.
Tube reactors and showerhead reactors are often known as hot-wall and cold-wall reactor designs respectively, with the tube reactor normally operated as nearly isothermal and the showerhead reactor having large temperature gradients from one part of the reactor to another. Generally, for plasma generation, showerhead reactors are preferred as compared to tube reactors, as tube-type plasma reactors have difficulties in mechanical design, particle control, electrical design and wafer handling. Tube reactors are suitable for processes requiring good temperature uniformity and high temperatures, such as polysilicon deposition. Showerhead reactors are suitable for lower temperature plasma-based processes including deposition of various materials and etching.
Plasma reactors often use a metallic showerhead as one plasma electrode, and a wafer in electrical connection with a chuck as the other plasma electrode. Walls of the chamber in which the showerhead and the wafer are mounted are generally held at ground potential for safety reasons. Electrons in the plasma lose energy to the chamber walls upon collision with the walls. Plasma enhanced chemical vapor deposition (PECVD) is often preferred in semiconductor processing as compared to physical vapor deposition (PVD), as films deposited by PECVD conformally cover processed wafer topographies, filling trenches or holes, and have superior electrical properties and lower defect densities.
Plenum dimensions and diameter, angle, and placement of holes in the showerhead affect flow of process gases. Generally, the showerhead has a diameter that is approximately the same as or is slightly larger than the silicon wafer or substrate being processed, as does the chuck supporting the wafer or substrate. Multiple gas plenums may be arranged in circumferential rings in or above the showerhead, for dispensing multiple gases without mixing in the plenum.
US Patent Application Publication No. 2010/0233879 A1 discloses a single-wafer, multiple-showerhead, multiple-chuck reactor. A wafer is moved to four or five different chucks for deposition of a portion of a film at each chuck. Each showerhead introduces its own random nonuniformities. Using several chucks averages out the random nonuniformities.
Improvements in showerhead reactors are sought. It is a goal of the present invention to improve processing throughput in showerhead reactors.
A goal of improving processing throughput in showerhead reactors is met with a tiled showerhead for a semiconductor-processing showerhead reactor. A showerhead “tile” is a showerhead with an array of gas outflow aperatures. A showerhead tile can be about the same size as, or larger than or smaller than a standard showerhead. A tiled showerhead can be built up to a size that is larger than a standard showerhead. Some tiles can include exhaust ports and/or fluid temperature control, while other tiles rely on surrounding infrastructure for exhaust and/or fluid temperature control. Showerhead tiles enable a tiled showerhead to be scaled upwards or downwards by adding or subtracting repeated copies of a showerhead tile in a modular manner.
A tiled showerhead has an array of showerhead tiles that fit together in a defined area. Each of the showerhead tiles has a plurality of process gas apertures. Each tile can be dimensioned for processing a respective substrate or the entire array can be dimensioned for processing an areawise substrate. The tiled showerhead can be used for simultaneous processing of semiconductor wafers or similar substrates.
In one embodiment, each showerhead tile has fluid passageways adjacent to the central area of the tile. The fluid passageways may include cooling plenums, or exhaust gas passageways connected to gas curtain apertures. Sometimes an exhaust region, with an exhaust aperture, surrounds the central area of the showerhead tile.
In a further embodiment, each showerhead tile has at least one fluid passageway adjacent to the central area of the tile. The fluid passageway may include cooling plenums, or gas passageways connected to gas curtain apertures for reactive gas deposition on a substrate of corresponding size.
With reference to
A tiled showerhead can process multiple substrates in a variety of showerhead reactors. A single fixture having a tiled showerhead can be used in a single-chamber showerhead reactor, to process multiple substrates in one or a series of processing actions in the chamber. Multiple tiled showerheads can be used in a long, linear showerhead reactor having multiple reaction chambers, each chamber having a respective tiled showerhead, to process multiple substrates in parallel in each chamber and in series in successive chambers. A modular showerhead reactor, using modular reactors each having one or more chambers with respective tiled showerheads, can be assembled to process multiple substrates in parallel in each chamber and in series in successive chambers. Respective chambers have physical walls, gas isolation walls and/or exhaust zones in various combinations surrounding the chamber and/or separating the chamber from an adjacent chamber.
The showerhead tiles 100, 300 and 500 shown in
With reference to
The fluid passageways 8 and 10 are used for two differing purposes in embodiments of the showerhead tile 100, namely cooling in first and third embodiments and provision of a gas curtain in second and third embodiments. In a first embodiment, the two fluid passageways 8 and 10 are connectable to circulate a cooling fluid, which cools the showerhead tile 100.
In a second embodiment, the two fluid passageways 8 and 10 are connectable to a gas supply and provide an isolation gas curtain through gas curtain apertures 20 of the showerhead tile 100. The gas curtain apertures 20 are fluidly connected to the two fluid passageways 8 and 10. Hydrogen is suitable as a gas for the gas curtain. In a further example, nitrogen is suitable as a gas for the gas curtain. Further gases suitable for the gas curtain can be devised.
In a third embodiment, each of the two fluid passageways 8 and 10 acts as a cooling plenum and is open on the surface of the showerhead tile 100 facing a wafer being processed. Hydrogen or other gas passing through the fluid passageways 8 and 10 cools the showerhead tile 100 through heat transfer from the showerhead tile 100 to the gas in the cooling plenum. The hydrogen or other gas proceeds outward from the cooling plenum to form a gas curtain. Each of the two fluid passageways 8 and 10 thus provides a gas curtain and a cooling to the showerhead tile 100.
With reference to
With reference to
In
A three by three array of wafers being processed using the tiled showerhead 400 can be more compact than a three by three array of wafers being processed using the tiled showerhead 200. A showerhead reactor using the tiled showerhead 400 can be more compact than a showerhead reactor using the tiled showerhead 200.
With reference to
In
With reference to
Variations of the showerhead assembly 902 are dimensioned and equipped according to the number and arrangement of showerhead tiles in the array of tiles. The plenum or plenums should be large enough for an even distribution of gases. A larger showerhead for a larger array of showerhead tiles should have a taller plenum, more plenums and/or more diffuser plates. Conversely, a smaller showerhead for a lesser number of showerhead tiles in a smaller array of showerhead tiles may have a shorter plenum, fewer plenums and/or fewer diffuser plates.
With reference to
Each of the showerhead tiles 100, 300 or 500 in a tiled showerhead 200, 400, 700 or 800 or variation thereof distributes process gas to a respective wafer in the showerhead reactor 1000. In variations, a gas curtain is provided by the second or the third variation of the showerhead tile 100 as in the tiled showerhead 200, or by the tiled showerhead 400 or examples of the tiled showerhead 700 or 800. Exhaust is provided by each of the showerhead tiles 100 in the tiled showerhead 200 or by the tiled showerhead 400, 700 or 800.
With reference to
In a modular showerhead reactor, the first showerhead reactor 1102 is a showerhead reactor module and the second showerhead reactor 1104 is a further showerhead reactor module, which can be the of the same or of differing construction and characteristics. In one embodiment of a modular showerhead reactor, the first and second showerhead reactors 1102, 1104 are modules and are moved in directions 1110, 1112 toward each other. The exit face 1114 of the first showerhead reactor 1102 is fastened to the entrance face 1116 of the second showerhead reactor 1104 with appropriate hardware and sealing. A substrate can pass directly from the first showerhead reactor 1102 to the second showerhead reactor 1104.
With reference to
In
In
With reference to
Referring again to
In a long, linear reactor, whether designed as a single reactor or a modular reactor having multiple modules, a series of showerheads is placed along the length of the reactor in one or more chambers. Each chamber is widened to process wafers side-by-side, as is any passageway from one chamber to another. Each tiled showerhead directs processing gas to the respective substrates. Exhaust channels or ports direct exhaust gas flows from substrates. Gas isolation curtains can be provided by gas flows emanating from tiled showerheads so equipped with gas isolation apertures. A lid of the reactor can be integrated with gas conduits, can be integrated with showerhead fixtures, or can be separate from such.
A standard, single-wafer showerhead reactor is usually of a cold-wall or hot-wall type. A cold-wall reactor has walls that are not expressly heated, and can experience a condensation of particles on the cold walls from reactions of the various process gases. A hot-wall reactor has walls that are expressly heated, and can experience reactions on the heated walls.
In contrast, a “zero” or no wall reactor has a chamber with no physical walls, and has instead walls that are created by gas flows such as gas isolation curtains. The “zero” wall reactor has many or all of the benefits of cold-wall and hot-wall reactors with fewer or none of the drawbacks of either. Physical walls outside of the isolation zones prevent contamination from the atmosphere, i.e. gases arriving from outside of a deposition zone, and allow overall pressure control. Thus, the “zero” wall reactor does have physical walls, but the reaction or deposition chamber within the reactor is defined by isolation zones having gas isolation curtains or other gas flows. Exhaust zones pull gases away from substrates, so that contaminants such as arsenic or other processing leftovers or byproducts are not passed along to other wafers outside of a processing zone. Pressure balancing is applied among process gas flows, exhaust gas flows and gas isolation curtain flows. Examples of tiled showerheads having provision for an exhaust gas flow and/or a gas isolation curtain flow can be used in a “zero” wall showerhead reactor.
Isolation zones with gas curtain “walls” allow a mechanically simpler apparatus that does not have mechanical doors opening and closing when a substrate is moved from one processing zone to another processing zone, although mechanical doors or the like could be used. As an example, a deposition e.g. an epitaxial deposition can be applied in a first zone, with a further deposition applied in a second zone, followed by cleaning in the second or in a third zone, and further followed by etching in a fourth or subsequent zone, with processing zones separated by isolation zones. A “train” of substrate carriers can proceed one after the other, with substrates being processed in parallel in each processing zone, and substrates being processed in series in subsequent processing zones and subsequent modules.
By combining parallel processing of a group or an array of substrates under a tiled showerhead and serial processing through subsequent processing zones or modules having one or more further tiled showerheads, throughput of substrates is greatly increased as compared to a single-substrate showerhead reactor or as compared to a series processing single-substrate-wide showerhead reactor. Multiple examples of a long, linear showerhead reactor or of a modular showerhead reactor including multiple modules, each of which uses one or more tiled showerheads, can be arrayed horizontally or vertically or both for further improvements in substrate processing throughput.
One of the advantages of a modular showerhead is that very large substrates may be processed at a single time. For example, large area P-N junctions can be formed, then diced into smaller pieces, or used as a large panel. A modular showerhead formed by groups of array of tiles would be appropriate to processing large substrates.
Number | Name | Date | Kind |
---|---|---|---|
4993358 | Mahawili | Feb 1991 | A |
5059770 | Mahawili | Oct 1991 | A |
5122391 | Mayer | Jun 1992 | A |
5304247 | Kondo et al. | Apr 1994 | A |
5304398 | Krusell et al. | Apr 1994 | A |
5532190 | Goodyear et al. | Jul 1996 | A |
5792272 | Van Os et al. | Aug 1998 | A |
6001267 | Os et al. | Dec 1999 | A |
6113700 | Choi | Sep 2000 | A |
6821910 | Adomaitis et al. | Nov 2004 | B2 |
6852167 | Ahn | Feb 2005 | B2 |
7104476 | Kim | Sep 2006 | B2 |
7410668 | Ahn | Aug 2008 | B2 |
7429410 | Keller et al. | Sep 2008 | B2 |
7484473 | Keller et al. | Feb 2009 | B2 |
7537662 | Soininen et al. | May 2009 | B2 |
7601223 | Lindfors et al. | Oct 2009 | B2 |
7718030 | Funk et al. | May 2010 | B2 |
7789961 | Nelson et al. | Sep 2010 | B2 |
7794546 | Li | Sep 2010 | B2 |
8008174 | He et al. | Aug 2011 | B2 |
8038834 | Funk et al. | Oct 2011 | B2 |
8075690 | Keller et al. | Dec 2011 | B2 |
8143074 | Day et al. | Mar 2012 | B2 |
8236106 | Iizuka et al. | Aug 2012 | B2 |
8277888 | Dedontney | Oct 2012 | B2 |
8293013 | DeDontney | Oct 2012 | B2 |
8298338 | Kim et al. | Oct 2012 | B2 |
8334015 | Chiang et al. | Dec 2012 | B2 |
8366828 | Iizuka | Feb 2013 | B2 |
8398770 | Levy et al. | Mar 2013 | B2 |
8402845 | Dedontney | Mar 2013 | B2 |
8409354 | Chiang et al. | Apr 2013 | B2 |
8440259 | Chiang et al. | May 2013 | B2 |
8551890 | Goodlin et al. | Oct 2013 | B2 |
8726838 | Shanker et al. | May 2014 | B2 |
20020122885 | Ahn | Sep 2002 | A1 |
20030207032 | Ahn et al. | Nov 2003 | A1 |
20050087134 | Ahn | Apr 2005 | A1 |
20050092248 | Lee et al. | May 2005 | A1 |
20050255257 | Choi et al. | Nov 2005 | A1 |
20060005771 | White et al. | Jan 2006 | A1 |
20060060138 | Keller et al. | Mar 2006 | A1 |
20060234514 | Gianoulakis et al. | Oct 2006 | A1 |
20070068625 | Funk et al. | Mar 2007 | A1 |
20070092732 | Rose et al. | Apr 2007 | A1 |
20070107661 | Ahn | May 2007 | A1 |
20070131169 | Ahn | Jun 2007 | A1 |
20080000497 | Verhaverbeke | Jan 2008 | A1 |
20080124463 | Bour et al. | May 2008 | A1 |
20080196666 | Toshima | Aug 2008 | A1 |
20090061083 | Chiang et al. | Mar 2009 | A1 |
20090061644 | Chiang et al. | Mar 2009 | A1 |
20090061646 | Chiang et al. | Mar 2009 | A1 |
20090229754 | Iizuka et al. | Sep 2009 | A1 |
20090236041 | Iizuka | Sep 2009 | A1 |
20090236447 | Panagopoulos et al. | Sep 2009 | A1 |
20090324379 | He et al. | Dec 2009 | A1 |
20090325367 | He et al. | Dec 2009 | A1 |
20100092668 | Hegedus | Apr 2010 | A1 |
20100147370 | He et al. | Jun 2010 | A1 |
20100193471 | Funk et al. | Aug 2010 | A1 |
20100219509 | He et al. | Sep 2010 | A1 |
20100233879 | Ryan | Sep 2010 | A1 |
20100300359 | Armour et al. | Dec 2010 | A1 |
20110132542 | Iizuka | Jun 2011 | A1 |
20110214812 | Song et al. | Sep 2011 | A1 |
20110214814 | Iizuka et al. | Sep 2011 | A1 |
Entry |
---|
Book: D.M. Dobkin et al., Principles of Chemical Vapor Deposition, 2003 Kluwer Academic Publishers, Chapter 3, 3 pages. |