1. Field of the Invention
The present invention relates to a transmitting device for use in radio communications, such as local area network (LAN) communications and metropolitan area network (MAN) communications, and to an electronic apparatus using the transmitting device.
2. Background Art
A description is provided of a conventional transmitting device, with reference to
In conventional transmitting device 1 as described above, spacer substrate 5 is not disposed under amplifier 3 or only a part of spacer substrate 5 is disposed under amplifier 3. Such disposition makes a space between amplifier 3 and the motherboard (not shown). This space hinders amplifier 3 from sufficiently dissipating heat to the motherboard (not shown). Thus, the heat generated from amplifier 3 can increase the capacity of amplifier 3, thus decreasing the gain of amplifier 3.
For example, Patent Document 1 is known as information about conventional arts related to this invention.
A transmitting device includes the following elements: a substrate; an amplifier mounted on the top face or the internal layer of the substrate; a semiconductor integrated circuit (IC) mounted on the bottom face of the substrate and connected to the amplifier; and a spacer substrate disposed on the bottom face of the substrate. The height of the spacer substrate is larger than the height of the semiconductor IC. The spacer substrate is disposed at least under the amplifier.
In the above structure, the heat generated from the amplifier can efficiently be dissipated through the spacer substrate disposed on the bottom face of the substrate. This efficient heat dissipation can inhibit deterioration of the characteristics of the amplifier.
Hereinafter, a description is provided of the first exemplary embodiment of the present invention, with reference to
Transmitting device 11 includes the following elements: substrate 12; amplifier 13 mounted on the top face or the internal layer of main substrate 12; semiconductor integrated circuit (IC) 14 mounted on the bottom face of main substrate 12 and connected to amplifier 13; and spacer substrate 15 disposed on the bottom face of main substrate 12.
Main substrate 12 has a rectangular shape, and is a multilayer substrate having a thickness equal to or smaller than 0.5 mm and made of a resin, such as glass epoxy. Amplifier 13 is made of an integrated circuit, and amplifies a transmission signal supplied from semiconductor IC 14 to a desired output level.
The outside shape of spacer substrate 15 is like a rectangular frame having the same size as main substrate 12. The height (thickness) of spacer 15 is larger than the height (thickness) of semiconductor IC 14. The bottom face of spacer substrate 15 is mounted on the motherboard (not shown) of an electronic apparatus, such as a personal computer and a portable telephone.
Spacer substrate 15 allows transmitting device 11 to be a chip-type component that is surface-mountable on a motherboard (not shown), although the transmitting device is a double-sided mounting device having elements mounted on the top face and bottom face of main substrate 12 thereof.
In the four sides of the rectangular frame of spacer substrate 15, at least one side is wider than the other sides. This wider portion is disposed directly under amplifier 13. In the above structure, the heat generated from amplifier 13 can efficiently be dissipated through spacer substrate 15 disposed on the bottom face of main substrate 12. This efficient heat dissipation can inhibit deterioration of the characteristics of amplifier 13 caused by the heat.
In the wider side of spacer substrate 15, first ground pattern 16 is disposed under amplifier 13. Further, in order to provide electrical continuity between amplifier 13 and first ground pattern 16 through first through-hole 17, second ground pattern 18 is disposed on the top face of spacer substrate 15.
Main substrate 12 includes third ground pattern 19 disposed on the bottom face of main substrate 12 under amplifier 13. Third ground pattern 19 is electrically connected with second ground pattern 18 disposed on the top face of spacer substrate 15 by soldering spacer substrate 15 and main substrate 12 together. Further, main substrate 12 includes fourth ground pattern 20 that is disposed on the top face of main substrate 12 under amplifier 13 disposed on the top face of main substrate 12. Third ground pattern 19 and fourth ground pattern 20 are in electrical continuity with each other through primary through-hole 21.
In the above structure, spacer substrate 15 is disposed on the bottom face of main substrate 12, particularly under amplifier 13. Thus, a large area of third ground pattern 19 disposed on the bottom face of main substrate 12 can be secured without being hindered by the wiring of semiconductor IC 14.
The heat generated from amplifier 13 is transferred from fourth ground pattern 20 disposed on the top face of main substrate 12 to third ground pattern 19 disposed on the bottom face of main substrate 12 through primary through-hole 21. Further, third ground pattern 19 and second ground pattern 18 are electrically connected with each other by soldering, and this metal-to-metal contact improves heat conductivity. Then, this heat is transferred from second ground pattern 18 disposed on the top face of spacer substrate 15 to first ground pattern 16 through first through-hole 17. By this heat transfer, the heat generated from amplifier 13 can efficiently be dissipated from main substrate 12 through spacer substrate 15. This heat dissipation can inhibit deterioration of the characteristics of amplifier 13 caused by the heat. Further, spacer substrate 15 is mounted on a motherboard (not shown) closely contacted therewith. This contact allows the heat to escape from first ground pattern 16 to the motherboard, thus further improving heat dissipation.
Semiconductor IC 14 may be structured as two chips by separating the RF part from the base-band part, like RF semiconductor circuit 22 disposed on the top face of main substrate 12 as shown in
Further, preferably, the diameter of first through-hole 17 is designed to be larger than the diameter of primary through-hole 21. The size of primary through-hole 21 is restricted by the shape and size of the terminal part of amplifier 13 and thus is difficult to be enlarged in many cases. However, first through-hole 17 have fewer restrictions imposed on the shape thereof, and can be enlarged. A larger through-hole can provide the larger heat conduction. This structure can improve the heat conduction efficiency of first through-hole 17, thus further inhibiting deterioration of the characteristics of amplifier 13 caused by the heat. The communication device of this exemplary embodiment has an extremely advantageous structure in attaining such a structure. Because main substrate 12 and spacer substrate 15 are formed of separate pieces as shown in
At least one of first ground pattern 16 and second ground pattern 18 may be designed to have an area larger than the area of fourth ground pattern 20. This structure can improve the heat dissipation effect of first ground pattern 16 and second ground pattern 18. Thus, the heat generated in amplifier 13 can be dissipated efficiently. For the same reason as described above, the communication device of this exemplary embodiment has an extremely advantageous structure in attaining such a structure.
Further, spacer substrate 15 may be implemented by a large number of divided pieces of substrate 15. In such a structure, a substrate material having high heat dissipation efficiency may be used only for some of the pieces of substrate 15 disposed under amplifier 13. Thus, the substrate material that has high heat dissipation efficiency but relatively high cost and poor workability can be used in the necessary part only. As a result, an inexpensive and easily produced transmitting device having high heat dissipation efficiency can be provided.
Hereinafter, a description is provided of the second exemplary embodiment of the present invention, with reference to
The upper left portion of
Main substrate 12 has seventh ground pattern 28 disposed on the bottom face of main substrate 12 under semiconductor switch 24. Seventh ground pattern 28 is electrically connected with sixth ground pattern 27 disposed on the top face of spacer substrate 15 by soldering spacer substrate 15 and main substrate 12 together.
Further, main substrate 12 has eighth ground pattern 29 that is disposed on the top face of main substrate 12, under semiconductor switch 24 disposed on the top face of main substrate 12. Seventh ground pattern 28 and eighth ground pattern 29 is in electrical continuity with each other through secondary through-hole 21a.
In the above structure, spacer substrate 15 is disposed on the bottom face of main substrate 12 under semiconductor switch 24. Thus, a large area of seventh ground pattern 28 disposed on the bottom face of main substrate 12 can be secured without being hindered by the wiring of semiconductor IC 14.
The loss made when a transmission signal passes through semiconductor switch 24 (passage loss) causes generation of heat from semiconductor switch 24. This heat is transferred from eighth ground pattern 29 disposed on the top face of main substrate 12 to seventh ground pattern 28 disposed on the bottom face of main substrate 12 through secondary through-hole 21a. Further, seventh ground pattern 28 and sixth ground pattern 27 are electrically connected with each other by soldering, and this metal-to-metal contact improves heat conductivity. Then, this heat is transferred from sixth ground pattern 27 disposed on the top face of main substrate 15 to fifth ground pattern 25 through second through-hole 26. By this heat transfer, the heat generated from semiconductor switch 24 can efficiently be dissipated from main substrate 12 through spacer substrate 15. Further, spacer substrate 15 is mounted on a motherboard (not shown) closely contacted therewith. This contact allows the heat to escape from fifth ground pattern 25 to the motherboard, thus further improving heat dissipation.
First ground pattern 16 and fifth ground pattern 25 are electrically insulated from each other on spacer substrate 15. Thus, the influence of the heat generated from amplifier 13 on semiconductor switch 24 can be reduced. Such structures can inhibit deterioration of the characteristics of semiconductor switch 24 caused by the heat.
Further, preferably, the diameter of second through-hole 26 is designed to be larger than the diameter of secondary through-hole 21a. The size of secondary through-hole 21a is restricted by the shape and size of the terminal part of semiconductor switch 24 and thus is difficult to be enlarged in many cases. However, second through-hole 26 have fewer restrictions imposed on the shape thereof, and can be enlarged. A larger through-hole can provide the larger heat conduction. This structure can improve the heat conduction efficiency of second through-hole 26, thus inhibiting deterioration of the characteristics of semiconductor switch 24 caused by the heat. The communication device of this exemplary embodiment has an extremely advantageous structure in attaining such a structure.
Because main substrate 12 and spacer substrate 15 are formed of separate pieces as shown in
At least one of fifth ground pattern 25 and sixth ground pattern 27 may be designed to have an area larger than the area of eighth ground pattern 29. This structure can improve the heat dissipation effect of fifth ground pattern 25 and sixth ground pattern 27. Thus, the heat generated in semiconductor switch 24 can be dissipated efficiently. For the same reason as described above, the communication device of this exemplary embodiment has an extremely advantageous structure in attaining such a structure.
Hereinafter, a description is provided of the third exemplary embodiment of the present invention, with reference to
With reference to
In this manner, amplifier 13 for outputting signals at a large amplitude level and oscillating circuit 23 are spaced from each other so that RF semiconductor circuit 22 is sandwiched therebetween. This disposition can inhibit electromagnetic coupling and interference between amplifier 13 and oscillating circuit 23, thus preventing deterioration of the characteristics of amplifier 13 and oscillating circuit 23. Amplifier 13 and oscillating circuit 23 may be disposed on the opposite faces, i.e. on the top face and bottom face, of main substrate 12 as long as a long distance is secured therebetween.
Hereinafter, a description is provided of the fourth exemplary embodiment of the present invention, with reference to
Transmitting device 11 of
Hereinafter, a description is provided of the fifth exemplary embodiment of the present invention, with reference to
With reference to
Several exemplary embodiments of the present invention have been described with reference to the accompanying drawings. However, the present invention is not limited to these embodiments. It is apparent to those skilled in the art that various changes can be made within the scope of the claims.
In the above description, the respective ground patterns are disposed only on the top face or the bottom face. However, in a multilayer substrate, the ground patterns disposed on an internal layer thereof can offer the same advantages of the present invention. When first ground pattern 16 and fifth ground pattern 25 are disposed on the internal layer, the same advantage of heat dissipation as the above embodiments can be offered.
Amplifier 13 and semiconductor switch 24 may include passive elements provided on an internal layer or a surface layer of main substrate 12, as partial elements thereof. Generally in a multilayer substrate, an inductor component and resistor component can be provided on an internal layer or a surface layer thereof. These passive elements can be used as partial elements of amplifier 13 and semiconductor switch 24. The object of the present invention can be attained, when the invention provides a structure for dissipating heat from positive elements more susceptible to heat than the passive elements using the respective ground patterns and through-holes.
In other words, the present invention includes the following elements: double-sided mounting substrate 12 having an exothermic circuit element (amplifier 13) mounted on the top face thereof; spacer substrate 15 that has a height larger than the maximum height (height of semiconductor IC 14) of circuit elements to be mounted on the bottom face of double-sided mounting substrate 12; and a motherboard closely contacted with spacer substrate 15. Spacer substrate 15 is closely contacted with the bottom face of double-sided mounting substrate 12. Spacer substrate 15 includes an opening space so as not to obstruct the circuit elements to be mounted on the bottom face of double-sided mounting substrate 12, in a position corresponding to the circuit elements. The portion corresponding to the bottom face of the exothermic circuit element is closely contacted with spacer substrate 15. Thus, the exothermic circuit element dissipates heat in the air and also to the spacer substrate closely contacted with the mounting substrate and to a motherboard under the spacer substrate. In order to allow the heat to escape, greater use of metals in through-holes or the like increases heat dissipation efficiency.
In a transmitting device of the present invention, deterioration of the characteristics of an amplifier caused by heat can be inhibited. Thus, the present invention has an advantage of improving the transmission characteristics of the transmitting device and is useful to a portable terminal or an on-vehicle electronic apparatus.
Number | Date | Country | Kind |
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2007-107938 | Apr 2007 | JP | national |