Number | Name | Date | Kind |
---|---|---|---|
4532970 | Tullis et al. | Aug 1985 | |
4534389 | Tullis | Aug 1985 | |
4674936 | Bonora | Jun 1987 | |
4674939 | Maney et al. | Jun 1987 | |
4676709 | Bonora et al. | Jun 1987 | |
4724874 | Parikh et al. | Feb 1988 | |
4739882 | Parikh et al. | Apr 1988 | |
4802809 | Bonora et al. | Feb 1989 | |
4815912 | Maney et al. | Mar 1989 | |
4859137 | Bonora et al. | Aug 1989 | |
4974166 | Maney et al. | Nov 1990 | |
4995430 | Bonara et al. | Feb 1991 | |
5097421 | Maney et al. | Mar 1992 | |
5112277 | Cruz et al. | May 1992 | |
5166884 | Maney et al. | Nov 1992 | |
5169272 | Bonora et al. | Dec 1992 | |
5431600 | Murata et al. | Jul 1995 | |
5527390 | Ono et al. | Jun 1996 | |
5586585 | Bonora et al. | Dec 1996 | |
5607276 | Muka et al. | Mar 1997 |
Number | Date | Country |
---|---|---|
0 340 345 | Jan 1993 | EPX |
0117004 | Sep 1993 | DEX |
8600870 | Feb 1986 | WOX |
9014273 | Nov 1990 | WOX |
9318543 | Sep 1993 | WOX |
Entry |
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"Wafer Confinement for Control of Contamination in Microelectronics", Solid State Technology, Aug. 1990, pp. S1-S5. |
ACR ERGOSMIF MAN Brochure, 15 pages, undated. |