Annette L. Martin

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wafer assemblies comprising photoresist over silicon...
- Patent number 7,057,263
- Issue date Jun 6, 2006
- Micron Technology, Inc.
- John T. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer assemblies comprising photoresist over silicon...
- Patent number 6,693,345
- Issue date Feb 17, 2004
- Micron Technology, Inc.
- John T. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor processing method of promoting photoresist adhesion t...
- Patent number 6,451,504
- Issue date Sep 17, 2002
- Micron Technology, Inc.
- J. Brett Rolfson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer assemblies comprising photoresist over silicon...
- Patent number 6,417,559
- Issue date Jul 9, 2002
- Micron Technology, Inc.
- John T. Moore
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor processing methods of forming photoresist over silico...
- Patent number 6,323,139
- Issue date Nov 27, 2001
- Micron Technology, Inc.
- John T. Moore
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor processing method of promoting photoresist adhesion t...
- Patent number 6,297,171
- Issue date Oct 2, 2001
- Micron Technology Inc.
- J. Brett Rolfson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor processing method of promoting photoresist adhesion t...
- Patent number 5,926,739
- Issue date Jul 20, 1999
- Micron Technology, Inc.
- J. Brett Rolfson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling semiconductor structural warpage in rapid thermal proce...
- Patent number 5,926,742
- Issue date Jul 20, 1999
- Micron Technology, Inc.
- Randhir P. S. Thakur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for repeatable temperature measurement using surface reflect...
- Patent number RE36050
- Issue date Jan 19, 1999
- Micron Technology, Inc.
- Randhir P. S. Thakur
- 374 - Thermal measuring and testing
Information Patent Grant
Controlling semiconductor structural warpage in rapid thermal proce...
- Patent number 5,851,929
- Issue date Dec 22, 1998
- Micron Technology, Inc.
- Randhir P. S. Thakur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming high-integrity ultrathin oxides
- Patent number 5,738,909
- Issue date Apr 14, 1998
- Micron Technology, Inc.
- Randhir P. S. Thakur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method DRAM polycide rowline formation
- Patent number 5,425,392
- Issue date Jun 20, 1995
- Micron Semiconductor, Inc.
- Randhir P. S. Thakur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for chemical vapor depositing a titanium nitride layer on a...
- Patent number 5,416,045
- Issue date May 16, 1995
- Micron Technology, Inc.
- Ralph E. Kauffman
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for reducing the effects of semiconductor substrate deformities
- Patent number 5,382,551
- Issue date Jan 17, 1995
- Micron Semiconductor, Inc.
- Randhir P. S. Thakur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for repeatable temperature measurement using surface reflect...
- Patent number 5,364,187
- Issue date Nov 15, 1994
- Micron Semiconductor, Inc.
- Randhir P. S. Thakur
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating hybrid oxides for thinner gate devices
- Patent number 5,360,769
- Issue date Nov 1, 1994
- Micron Semiconductor, Inc.
- Randhir P. S. Thakur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for repeatable temperature measurement using surface reflect...
- Patent number 5,350,236
- Issue date Sep 27, 1994
- Micron Semiconductor, Inc.
- Randhir P. S. Thakur
- G01 - MEASURING TESTING
Information Patent Grant
Method for enhancing nitridation and oxidation growth by introducin...
- Patent number 5,264,396
- Issue date Nov 23, 1993
- Micron Semiconductor, Inc.
- Randhir P. S. Thakur
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor wafer assemblies comprising photoresist over silicon...
- Publication number 20040124441
- Publication date Jul 1, 2004
- John T. Moore
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor wafer assemblies comprising photoresist over silicon...
- Publication number 20020047202
- Publication date Apr 25, 2002
- John T. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PROCESSING METHODS OF FORMING PHOTORESIST OVER SILICO...
- Publication number 20010044218
- Publication date Nov 22, 2001
- JOHN T. MOORE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor processing method of promoting photoresist adhesion t...
- Publication number 20010023051
- Publication date Sep 20, 2001
- J. Brett Rolfson
- H01 - BASIC ELECTRIC ELEMENTS

Annette L. Martin

Person

Patents Grantslast 30 patents

Semiconductor wafer assemblies comprising photoresist over silicon...

Semiconductor wafer assemblies comprising photoresist over silicon...

Semiconductor processing method of promoting photoresist adhesion t...

Semiconductor wafer assemblies comprising photoresist over silicon...

Semiconductor processing methods of forming photoresist over silico...

Semiconductor processing method of promoting photoresist adhesion t...

Semiconductor processing method of promoting photoresist adhesion t...

Controlling semiconductor structural warpage in rapid thermal proce...

Method for repeatable temperature measurement using surface reflect...

Controlling semiconductor structural warpage in rapid thermal proce...

Method of forming high-integrity ultrathin oxides

Method DRAM polycide rowline formation

Method for chemical vapor depositing a titanium nitride layer on a...

Method for reducing the effects of semiconductor substrate deformities

System for repeatable temperature measurement using surface reflect...

Method for fabricating hybrid oxides for thinner gate devices

Method for repeatable temperature measurement using surface reflect...

Method for enhancing nitridation and oxidation growth by introducin...

Patents Applicationslast 30 patents

Semiconductor wafer assemblies comprising photoresist over silicon...

Semiconductor wafer assemblies comprising photoresist over silicon...

SEMICONDUCTOR PROCESSING METHODS OF FORMING PHOTORESIST OVER SILICO...

Semiconductor processing method of promoting photoresist adhesion t...