Benjamin Donald Stripe

Person

Walnut Creek, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray sequential array wavelength dispersive spectrometer
- Patent number 11,885,755
- Issue date Jan 30, 2024
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
System and method using x-rays for depth-resolving metrology and an...
- Patent number 11,549,895
- Issue date Jan 10, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
System and method for computed laminography x-ray fluorescence imaging
- Patent number 11,143,605
- Issue date Oct 12, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength dispersive x-ray spectrometer
- Patent number 10,989,822
- Issue date Apr 27, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
System and method for x-ray fluorescence with filtering
- Patent number 10,962,491
- Issue date Mar 30, 2021
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Energy-resolving x-ray detection system
- Patent number 10,845,491
- Issue date Nov 24, 2020
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing X-ray spectroscopy and X-ray absorption spectr...
- Patent number 10,416,099
- Issue date Sep 17, 2019
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Detector for X-rays with high spatial and high spectral resolution
- Patent number 10,295,486
- Issue date May 21, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER
- Publication number 20230349842
- Publication date Nov 2, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SYSTEM AND X-RAY SOURCE WITH ELECTRICALLY INSULA...
- Publication number 20230280291
- Publication date Sep 7, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD USING X-RAYS FOR DEPTH-RESOLVING METROLOGY AND AN...
- Publication number 20220082515
- Publication date Mar 17, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR COMPUTED LAMINOGRAPHY X-RAY FLUORESCENCE IMAGING
- Publication number 20210080408
- Publication date Mar 18, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY FLUORESCENCE WITH FILTERING
- Publication number 20200072770
- Publication date Mar 5, 2020
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
ENERGY-RESOLVING X-RAY DETECTION SYSTEM
- Publication number 20190369272
- Publication date Dec 5, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH DISPERSIVE X-RAY SPECTROMETER
- Publication number 20190369271
- Publication date Dec 5, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PERFORMING X-RAY SPECTROSCOPY AND X-RAY ABSORPTION SPECTR...
- Publication number 20190011379
- Publication date Jan 10, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR FOR X-RAYS WITH HIGH SPATIAL AND HIGH SPECTRAL RESOLUTION
- Publication number 20170052128
- Publication date Feb 23, 2017
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING

Benjamin Donald Stripe

Person

Patents Grantslast 30 patents

X-ray sequential array wavelength dispersive spectrometer

System and method using x-rays for depth-resolving metrology and an...

System and method for computed laminography x-ray fluorescence imaging

Wavelength dispersive x-ray spectrometer

System and method for x-ray fluorescence with filtering

Energy-resolving x-ray detection system

Method of performing X-ray spectroscopy and X-ray absorption spectr...

Detector for X-rays with high spatial and high spectral resolution

Patents Applicationslast 30 patents

X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER

X-RAY FLUORESCENCE SYSTEM AND X-RAY SOURCE WITH ELECTRICALLY INSULA...

SYSTEM AND METHOD USING X-RAYS FOR DEPTH-RESOLVING METROLOGY AND AN...

SYSTEM AND METHOD FOR COMPUTED LAMINOGRAPHY X-RAY FLUORESCENCE IMAGING

SYSTEM AND METHOD FOR X-RAY FLUORESCENCE WITH FILTERING

ENERGY-RESOLVING X-RAY DETECTION SYSTEM

WAVELENGTH DISPERSIVE X-RAY SPECTROMETER

METHOD OF PERFORMING X-RAY SPECTROSCOPY AND X-RAY ABSORPTION SPECTR...

DETECTOR FOR X-RAYS WITH HIGH SPATIAL AND HIGH SPECTRAL RESOLUTION