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Chi W. Yau
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Holland, PA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Boundary-scan-compliant multi-chip module
Patent number
5,673,276
Issue date
Sep 30, 1997
Lucent Technologies Inc.
Najmi Taher Jarwala
G01 - MEASURING TESTING
Information
Patent Grant
Built-in self-test control network
Patent number
5,570,374
Issue date
Oct 29, 1996
Lucent Technologies Inc.
Chi W. Yau
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Boundary-scan-based system and method for test and diagnosis
Patent number
5,444,716
Issue date
Aug 22, 1995
AT&T Corp.
Najmi T. Jarwala
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for testing edge connector inputs and outputs...
Patent number
5,331,274
Issue date
Jul 19, 1994
AT&T Bell Laboratories
Najmi T. Jarwala
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for data transfer to and from devices through...
Patent number
5,155,732
Issue date
Oct 13, 1992
AT&T Bell Laboratories
Najmi T. Jarwala
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for generating control signals
Patent number
5,048,021
Issue date
Sep 10, 1991
AT&T Bell Laboratories
Najmi T. Jarwala
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing circuit boards
Patent number
5,029,166
Issue date
Jul 2, 1991
AT&T Bell Laboratories
Najmi T. Jarwala
G01 - MEASURING TESTING
Information
Patent Grant
Method for testing interconnections
Patent number
5,027,353
Issue date
Jun 25, 1991
AT&T Bell Laboratories
Najmi T. Jarwala
G01 - MEASURING TESTING