Douglas John Cutter

Person

Fort Collins, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for preventing processor errors
- Patent number 8,423,832
- Issue date Apr 16, 2013
- Hewlett-Packard Development Company, L.P.
- Reid J. Riedlinger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for adjusting operating points of a processor bas...
- Patent number 8,020,038
- Issue date Sep 13, 2011
- Hewlett-Packard Development Company, L.P.
- Reid J. Riedlinger
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
System and method for testing a processor
- Patent number 7,590,509
- Issue date Sep 15, 2009
- Hewlett-Packard Development Company, L.P.
- Reid J. Riedlinger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for testing a sense amp
- Patent number 7,054,208
- Issue date May 30, 2006
- Micron Technology, Inc.
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for checking the resistance of programmable el...
- Patent number 6,983,404
- Issue date Jan 3, 2006
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for voltage regulation in a semiconductor device
- Patent number 6,778,452
- Issue date Aug 17, 2004
- Micron Technology, Inc.
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Grant
Cancellation of redundant elements with a cancel bank
- Patent number 6,690,611
- Issue date Feb 10, 2004
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Distributed MUX scheme for bi-endian rotator circuit
- Patent number 6,687,262
- Issue date Feb 3, 2004
- Hewlett-Packard Development Company, L.P.
- Daming Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low current redundancy anti-fuse method and apparatus
- Patent number 6,686,790
- Issue date Feb 3, 2004
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Cancellation of redundant elements with a cancel bank
- Patent number 6,633,507
- Issue date Oct 14, 2003
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Electrically programmable photolithography mask
- Patent number 6,537,710
- Issue date Mar 25, 2003
- Micron Technology, Inc.
- Douglas J. Cutter
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electrically programmable photolithography mask
- Patent number 6,528,217
- Issue date Mar 4, 2003
- Micron Technology, Inc.
- Douglas J. Cutter
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Junctionless antifuses and systems containing junctionless antifuses
- Patent number 6,525,399
- Issue date Feb 25, 2003
- Micron Technology, Inc.
- Douglas J. Cutter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for finding a first element
- Patent number 6,487,550
- Issue date Nov 26, 2002
- Hewlett-Packard Company
- Douglas J Cutter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for detecting snoop hits on victim lines issue...
- Patent number 6,484,238
- Issue date Nov 19, 2002
- Hewlett-Packard Company
- Douglas J Cutter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low current redundancy anti-fuse apparatus
- Patent number 6,462,608
- Issue date Oct 8, 2002
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Low current redundancy anti-fuse method and apparatus
- Patent number 6,456,149
- Issue date Sep 24, 2002
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Driver circuit for a voltage-pulling device
- Patent number 6,452,846
- Issue date Sep 17, 2002
- Micron Technology, Inc.
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of stressing a memory device
- Patent number 6,445,629
- Issue date Sep 3, 2002
- Micron Technology, Inc.
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Grant
Virtual address bypassing using local page mask
- Patent number 6,446,187
- Issue date Sep 3, 2002
- Hewlett-Packard Company
- Reid James Riedlinger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of forming and programming junctionless antifuses
- Patent number 6,444,558
- Issue date Sep 3, 2002
- Micron Technology, Inc.
- Douglas J. Cutter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrically programmable photolithography mask
- Patent number 6,379,847
- Issue date Apr 30, 2002
- Micron Technology, Inc.
- Douglas J. Cutter
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for storage of test results within an integrat...
- Patent number 6,365,421
- Issue date Apr 2, 2002
- Micron Technology, Inc.
- Brett Debenham
- G11 - INFORMATION STORAGE
Information Patent Grant
Low current redundancy anti-fuse method and apparatus
- Patent number 6,351,140
- Issue date Feb 26, 2002
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Cancellation of redundant elements with a cancel bank
- Patent number 6,351,424
- Issue date Feb 26, 2002
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Margin-range apparatus for a sense amp's voltage-pulling tr...
- Patent number 6,335,888
- Issue date Jan 1, 2002
- Micron Technology, Inc.
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for forming a junctionless antifuse
- Patent number 6,323,536
- Issue date Nov 27, 2001
- Micron Technology, Inc.
- Douglas J. Cutter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Current saturation test device
- Patent number 6,262,927
- Issue date Jul 17, 2001
- Micron Technology, Inc.
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Grant
Low current redundancy anti-fuse method and apparatus
- Patent number 6,255,894
- Issue date Jul 3, 2001
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Test device
- Patent number 6,198,676
- Issue date Mar 6, 2001
- Micron Technology, Inc.
- Kurt D. Beigel
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
System and method for adjusting operating points of a processor bas...
- Publication number 20080155321
- Publication date Jun 26, 2008
- Reid J. Riedlinger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for preventing processor errors
- Publication number 20080126826
- Publication date May 29, 2008
- Reid J. Riedlinger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for testing a processor
- Publication number 20060290365
- Publication date Dec 28, 2006
- Reid J. Riedlinger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory apparatus and method
- Publication number 20060268651
- Publication date Nov 30, 2006
- Douglas John Cutter
- G11 - INFORMATION STORAGE
Information Patent Application
Method and device for testing a sense amp
- Publication number 20050152195
- Publication date Jul 14, 2005
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for checking the resistance of programmable el...
- Publication number 20050005208
- Publication date Jan 6, 2005
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Application
System and method for generating a graphical representation of faul...
- Publication number 20040098644
- Publication date May 20, 2004
- John Wuu
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit and method for voltage regulation in a semiconductor device
- Publication number 20040095822
- Publication date May 20, 2004
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Application
Systems and methods to improve silicon debug of speed failures in m...
- Publication number 20040083410
- Publication date Apr 29, 2004
- Douglas J. Cutter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Cancellation of redundant elements with a cancel bank
- Publication number 20030035330
- Publication date Feb 20, 2003
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Application
Electrically programmable photolithography mask
- Publication number 20020102479
- Publication date Aug 1, 2002
- Micron Technology, Inc.
- Douglas J. Cutter
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Electrically programmable photolithography mask
- Publication number 20020098424
- Publication date Jul 25, 2002
- Micron Technology, Inc.
- Douglas J. Cutter
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Junctionless antifuses and systems containing junctionless antifuses
- Publication number 20020050625
- Publication date May 2, 2002
- Micron Technology, Inc.
- Douglas J. Cutter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cancellation of redundant elements with a cancel bank
- Publication number 20020027815
- Publication date Mar 7, 2002
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for storage of test results within an integrat...
- Publication number 20020006676
- Publication date Jan 17, 2002
- Brett Debenham
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY PROGRAMMABLE PHOTOLITHOGRAPHY MASK
- Publication number 20010049063
- Publication date Dec 6, 2001
- DOUGLAS J. CUTTER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR FORMING A JUNCTIONLESS ANTIFUSE
- Publication number 20010040269
- Publication date Nov 15, 2001
- DOUGLAS J. CUTTER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW CURRENT REDUNDANCY ANTI -FUSE APPARATUS
- Publication number 20010013805
- Publication date Aug 16, 2001
- DOUGLAS J. CUTTER
- G11 - INFORMATION STORAGE
Information Patent Application
Margin-range apparatus for a sense amp's voltage-pulling transistor
- Publication number 20010009522
- Publication date Jul 26, 2001
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Application
Low current redundancy anti-fuse method and apparatus
- Publication number 20010008382
- Publication date Jul 19, 2001
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Application
Low current redundancy anti-fuse method and apparatus
- Publication number 20010007431
- Publication date Jul 12, 2001
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Application
Low current redundancy anti-fuse method and apparatus
- Publication number 20010006351
- Publication date Jul 5, 2001
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE

Douglas John Cutter

Person

Patents Grantslast 30 patents

System and method for preventing processor errors

System and method for adjusting operating points of a processor bas...

System and method for testing a processor

Method and device for testing a sense amp

Method and apparatus for checking the resistance of programmable el...

Circuit and method for voltage regulation in a semiconductor device

Cancellation of redundant elements with a cancel bank

Distributed MUX scheme for bi-endian rotator circuit

Low current redundancy anti-fuse method and apparatus

Cancellation of redundant elements with a cancel bank

Electrically programmable photolithography mask

Electrically programmable photolithography mask

Junctionless antifuses and systems containing junctionless antifuses

Method and apparatus for finding a first element

Apparatus and method for detecting snoop hits on victim lines issue...

Low current redundancy anti-fuse apparatus

Low current redundancy anti-fuse method and apparatus

Driver circuit for a voltage-pulling device

Method of stressing a memory device

Virtual address bypassing using local page mask

Methods of forming and programming junctionless antifuses

Electrically programmable photolithography mask

Method and apparatus for storage of test results within an integrat...

Low current redundancy anti-fuse method and apparatus

Cancellation of redundant elements with a cancel bank

Margin-range apparatus for a sense amp&#x00027;s voltage-pulling tr...

Method and apparatus for forming a junctionless antifuse

Current saturation test device

Low current redundancy anti-fuse method and apparatus

Test device

Patents Applicationslast 30 patents

System and method for adjusting operating points of a processor bas...

System and method for preventing processor errors

System and method for testing a processor

Memory apparatus and method

Method and device for testing a sense amp

Method and apparatus for checking the resistance of programmable el...

System and method for generating a graphical representation of faul...

Circuit and method for voltage regulation in a semiconductor device

Systems and methods to improve silicon debug of speed failures in m...

Cancellation of redundant elements with a cancel bank

Electrically programmable photolithography mask

Electrically programmable photolithography mask

Junctionless antifuses and systems containing junctionless antifuses

Cancellation of redundant elements with a cancel bank

Method and apparatus for storage of test results within an integrat...

ELECTRICALLY PROGRAMMABLE PHOTOLITHOGRAPHY MASK

METHOD AND APPARATUS FOR FORMING A JUNCTIONLESS ANTIFUSE

LOW CURRENT REDUNDANCY ANTI -FUSE APPARATUS

Margin-range apparatus for a sense amp's voltage-pulling transistor

Low current redundancy anti-fuse method and apparatus

Low current redundancy anti-fuse method and apparatus

Low current redundancy anti-fuse method and apparatus

Margin-range apparatus for a sense amp's voltage-pulling tr...