Howard Lee Tigelaar

Person

Allen, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor interconnect
- Patent number 8,860,147
- Issue date Oct 14, 2014
- Texas Instruments Incorporated
- Amitava Chatterjee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI MuGFETs having single gate electrode level
- Patent number 8,581,317
- Issue date Nov 12, 2013
- Texas Instruments Incorporated
- Howard Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device with memory cell including MuGFET and FIN capacitor
- Patent number 8,067,792
- Issue date Nov 29, 2011
- Texas Instruments Incorporated
- Weize Xiong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having improved gate electrode placement and d...
- Patent number 7,968,950
- Issue date Jun 28, 2011
- Texas Instruments Incorporated
- Howard Lee Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for increasing the extent of built-in self-testin...
- Patent number 7,793,186
- Issue date Sep 7, 2010
- Texas Instruments Incorporated
- Cloves R. Cleavelin
- G11 - INFORMATION STORAGE
Information Patent Grant
Feedback structure for an SRAM cell
- Patent number 7,768,820
- Issue date Aug 3, 2010
- Texas Instruments Incorporated
- Theodore W. Houston
- G11 - INFORMATION STORAGE
Information Patent Grant
Dummy active area implementation
- Patent number 7,759,182
- Issue date Jul 20, 2010
- Texas Instruments Incorporated
- Robert G. Fleck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for increasing the extent of built-in self-testin...
- Patent number 7,752,518
- Issue date Jul 6, 2010
- Texas Instruments Incorporated
- Cloves R. Cleavelin
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with memory cell including MuGFET and fin capacitor
- Patent number 7,683,417
- Issue date Mar 23, 2010
- Texas Instruments Incorporated
- Weize Xiong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device with capacitor and diode
- Patent number 7,539,044
- Issue date May 26, 2009
- Texas Instruments Incorporated
- Howard Lee Tigelaar
- G11 - INFORMATION STORAGE
Information Patent Grant
Building fully-depleted and partially-depleted transistors on same...
- Patent number 7,410,841
- Issue date Aug 12, 2008
- Texas Instruments Incorporated
- Howard Lee Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Building fully-depleted and bulk transistors on same chip
- Patent number 7,410,840
- Issue date Aug 12, 2008
- Texas Instruments Incorporated
- Howard Lee Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a combined fully-depleted silicon-on-insulato...
- Patent number 7,198,993
- Issue date Apr 3, 2007
- Texas Instruments Incorporated
- Howard L. Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensitive test structure for assessing pattern anomalies
- Patent number 6,967,110
- Issue date Nov 22, 2005
- Texas Instruments Incorporated
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit MOS transistor with reduced drain and source res...
- Patent number 6,919,605
- Issue date Jul 19, 2005
- Texas Instruments Incorporated
- Howard Lee Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimized metal fuse process
- Patent number 6,687,973
- Issue date Feb 10, 2004
- Texas Instruments Incorporated
- Melissa M. Hewson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for patterning dense and isolated features on semiconductor...
- Patent number 6,677,240
- Issue date Jan 13, 2004
- Texas Instruments Incorporated
- Howard L. Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving wafer sleuth capability by adding wafer rotati...
- Patent number 6,180,424
- Issue date Jan 30, 2001
- Texas Instruments Incorporated
- Howard L. Tigelaar
- G01 - MEASURING TESTING
Information Patent Grant
Non-volatile memory cell structure and process for forming same
- Patent number 5,821,581
- Issue date Oct 13, 1998
- Texas Instruments Incorporated
- Cetin Kaya
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory cell structure and process for forming same
- Patent number 5,750,427
- Issue date May 12, 1998
- Texas Instruments Incorporated
- Cetin Kaya
- G11 - INFORMATION STORAGE
Information Patent Grant
Process for thickening selective gate oxide regions
- Patent number 5,595,922
- Issue date Jan 21, 1997
- Texas Instruments
- Howard L. Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile memory cell structure and process for forming same
- Patent number 5,557,565
- Issue date Sep 17, 1996
- Texas Instruments Incorporated
- Cetin Kaya
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of making high speed EPROM containing graded source/drain pr...
- Patent number 5,455,184
- Issue date Oct 3, 1995
- Texas Instruments Incorporated
- Howard L. Tigelaar
- G11 - INFORMATION STORAGE
Information Patent Grant
Metal-to-metal antifuse structure
- Patent number 5,451,810
- Issue date Sep 19, 1995
- Texas Instruments Incorporated
- Howard L. Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making contract-free floating-gate memory array with sili...
- Patent number 5,420,060
- Issue date May 30, 1995
- Texas Instruments Incorporated
- Manzur Gill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for and method of rapid testing of semiconductor componen...
- Patent number 5,410,162
- Issue date Apr 25, 1995
- Texas Instruments Incorporated
- Howard L. Tigelaar
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming air gap dielectric spaces between semiconductor l...
- Patent number 5,407,860
- Issue date Apr 18, 1995
- Texas Instruments Incorporated
- Richard A. Stoltz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal-to-metal antifuse structure
- Patent number 5,300,456
- Issue date Apr 5, 1994
- Texas Instruments Incorporated
- Howard L. Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory cell circuit and array
- Patent number 5,287,304
- Issue date Feb 15, 1994
- Texas Instruments Incorporated
- Mark G. Harward
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of making flash EEPROM or merged FAMOS cell without alignmen...
- Patent number 5,273,926
- Issue date Dec 28, 1993
- Texas Instruments Incorporated
- Howard L. Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Methods and Apparatus for an Automated Fluid Pumping System
- Publication number 20180291910
- Publication date Oct 11, 2018
- Tigmill Technologies, LLC
- Jerry Mack Mills
- E21 - EARTH DRILLING MINING
Information Patent Application
System and Method for Increasing the Extent of Built-In Self-Testin...
- Publication number 20100229056
- Publication date Sep 9, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Cloves R. Cleavelin
- G11 - INFORMATION STORAGE
Information Patent Application
SOI MUGFETS HAVING SINGLE GATE ELECTRODE LEVEL
- Publication number 20100052025
- Publication date Mar 4, 2010
- Texas Instruments Inc.
- Howard Lee Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory Device with Memory Cell Including MuGFET and FIN Capacitor
- Publication number 20100002494
- Publication date Jan 7, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Weize Xiong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Increasing the Extent of Built-In Self-Testin...
- Publication number 20090204861
- Publication date Aug 13, 2009
- Cloves R. Cleavelin
- G11 - INFORMATION STORAGE
Information Patent Application
FEEDBACK STRUCTURE FOR AN SRAM CELL
- Publication number 20090175062
- Publication date Jul 9, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Theodore W. Houston
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTERCONNECT
- Publication number 20090134471
- Publication date May 28, 2009
- Amitava Chatterjee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE WITH MEMORY CELL INCLUDING MUGFET AND FIN CAPACITOR
- Publication number 20090108316
- Publication date Apr 30, 2009
- Weize Xiong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device Having Improved Gate Electrode Placement and D...
- Publication number 20090001566
- Publication date Jan 1, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Howard Lee Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BUILDING FULLY-DEPLETED AND PARTIALLY-DEPLETED TRANSISTORS ON SAME...
- Publication number 20080265325
- Publication date Oct 30, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Howard Lee Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BUILDING FULLY-DEPLETED AND BULK TRANSISTORS ON SAME CHIP
- Publication number 20080265362
- Publication date Oct 30, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Howard Lee Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dummy active area implementation
- Publication number 20080122009
- Publication date May 29, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Robert G. Fleck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPOSABLE SEMICONDUCTOR DEVICE SPACER WITH HIGH SELECTIVITY TO OXIDE
- Publication number 20080096337
- Publication date Apr 24, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Howard Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE WITH MULTIPLE DIELEC...
- Publication number 20080096383
- Publication date Apr 24, 2008
- Interuniversitair Microelektronica Centrum (IMEC) VZW
- Howard Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Building fully-depleted and partially-depleted transistors on same...
- Publication number 20060216898
- Publication date Sep 28, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Howard Lee Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Building fully-depleted and bulk transistors on same chip
- Publication number 20060216903
- Publication date Sep 28, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Howard Lee Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Combined fully-depleted silicon-on-insulator (FD-SOI) and partially...
- Publication number 20060128074
- Publication date Jun 15, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Howard L. Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for reduced circuit area and improved gate length control
- Publication number 20060113604
- Publication date Jun 1, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Howard Lee Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sensitive test structure for assessing pattern anomalies
- Publication number 20060033503
- Publication date Feb 16, 2006
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Low resistance integrated circuit MOS transistor
- Publication number 20050045924
- Publication date Mar 3, 2005
- Howard Lee Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sensitive test structure for assessing pattern anomalies
- Publication number 20040229388
- Publication date Nov 18, 2004
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PATTERNING DENSE AND ISOLATED FEATURES ON SEMICONDUCTOR...
- Publication number 20040002218
- Publication date Jan 1, 2004
- TEXAS INSTRUMENTS INCORPORATED
- Howard L. Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optimized metal fuse process
- Publication number 20020062549
- Publication date May 30, 2002
- Melissa M. Hewson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cost effective split-gate process that can independently optimize t...
- Publication number 20020052083
- Publication date May 2, 2002
- Xin Zhang
- H01 - BASIC ELECTRIC ELEMENTS

Howard Lee Tigelaar

Person

Patents Grantslast 30 patents

Semiconductor interconnect

SOI MuGFETs having single gate electrode level

Memory device with memory cell including MuGFET and FIN capacitor

Semiconductor device having improved gate electrode placement and d...

System and method for increasing the extent of built-in self-testin...

Feedback structure for an SRAM cell

Dummy active area implementation

System and method for increasing the extent of built-in self-testin...

Memory device with memory cell including MuGFET and fin capacitor

Memory device with capacitor and diode

Building fully-depleted and partially-depleted transistors on same...

Building fully-depleted and bulk transistors on same chip

Method of fabricating a combined fully-depleted silicon-on-insulato...

Sensitive test structure for assessing pattern anomalies

Integrated circuit MOS transistor with reduced drain and source res...

Optimized metal fuse process

Method for patterning dense and isolated features on semiconductor...

Method for improving wafer sleuth capability by adding wafer rotati...

Non-volatile memory cell structure and process for forming same

Non-volatile memory cell structure and process for forming same

Process for thickening selective gate oxide regions

Non-volatile memory cell structure and process for forming same

Method of making high speed EPROM containing graded source/drain pr...

Metal-to-metal antifuse structure

Method of making contract-free floating-gate memory array with sili...

Apparatus for and method of rapid testing of semiconductor componen...

Method of forming air gap dielectric spaces between semiconductor l...

Metal-to-metal antifuse structure

Memory cell circuit and array

Method of making flash EEPROM or merged FAMOS cell without alignmen...

Patents Applicationslast 30 patents

Methods and Apparatus for an Automated Fluid Pumping System

System and Method for Increasing the Extent of Built-In Self-Testin...

SOI MUGFETS HAVING SINGLE GATE ELECTRODE LEVEL

Memory Device with Memory Cell Including MuGFET and FIN Capacitor

System and Method for Increasing the Extent of Built-In Self-Testin...

FEEDBACK STRUCTURE FOR AN SRAM CELL

SEMICONDUCTOR INTERCONNECT

MEMORY DEVICE WITH MEMORY CELL INCLUDING MUGFET AND FIN CAPACITOR

Semiconductor Device Having Improved Gate Electrode Placement and D...

BUILDING FULLY-DEPLETED AND PARTIALLY-DEPLETED TRANSISTORS ON SAME...

BUILDING FULLY-DEPLETED AND BULK TRANSISTORS ON SAME CHIP

Dummy active area implementation

DISPOSABLE SEMICONDUCTOR DEVICE SPACER WITH HIGH SELECTIVITY TO OXIDE

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE WITH MULTIPLE DIELEC...

Building fully-depleted and partially-depleted transistors on same...

Building fully-depleted and bulk transistors on same chip

Combined fully-depleted silicon-on-insulator (FD-SOI) and partially...

Methods for reduced circuit area and improved gate length control

Sensitive test structure for assessing pattern anomalies

Low resistance integrated circuit MOS transistor

Sensitive test structure for assessing pattern anomalies

METHOD FOR PATTERNING DENSE AND ISOLATED FEATURES ON SEMICONDUCTOR...

Optimized metal fuse process

Cost effective split-gate process that can independently optimize t...