Jason Graalum

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Circuit for programming antifuse bits
- Patent number 6,903,991
- Issue date Jun 7, 2005
- Micron Technology, Inc.
- Patrick J. Mullarkey
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit for programming antifuse bits
- Patent number 6,826,071
- Issue date Nov 30, 2004
- Micron Technology, Inc.
- Patrick J. Mullarkey
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit for programming antifuse bits
- Patent number 6,661,693
- Issue date Dec 9, 2003
- Micron Technology
- Patrick J. Mullarkey
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for disabling and re-enabling access to IC test functions
- Patent number 6,646,459
- Issue date Nov 11, 2003
- Micron Technology, Inc.
- Daryl L. Habersetzer
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for disabling and re-enabling access to IC test functions
- Patent number 6,590,407
- Issue date Jul 8, 2003
- Micron Technology, Inc.
- Daryl L. Habersetzer
- G01 - MEASURING TESTING
Information Patent Grant
Method for disabling and re-enabling access to IC test functions
- Patent number 6,570,400
- Issue date May 27, 2003
- Micron Technology, Inc.
- Daryl L. Habersetzer
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for programming antifuse bits
- Patent number 6,445,605
- Issue date Sep 3, 2002
- Micron Technology, Inc.
- Patrick J. Mullarkey
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for disabling and re-enabling access to IC tes...
- Patent number 6,255,838
- Issue date Jul 3, 2001
- Micron Technology, Inc.
- Daryl L. Habersetzer
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method disabling and re-enabling access to IC test fu...
- Patent number 6,255,837
- Issue date Jul 3, 2001
- Micron Technology, Inc.
- Daryl L. Habersetzer
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for disabling and re-enabling access to IC tes...
- Patent number 6,160,413
- Issue date Dec 12, 2000
- Micron Technology, Inc.
- Daryl L. Habersetzer
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for programming antifuse bits
- Patent number 6,130,834
- Issue date Oct 10, 2000
- Micron Technology, Inc.
- Patrick J. Mullarkey
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit for programming antifuse bits
- Patent number 6,055,173
- Issue date Apr 25, 2000
- Micron Technology, Inc.
- Patrick J. Mullarkey
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit for programming antifuse bits
- Patent number 5,689,455
- Issue date Nov 18, 1997
- Micron Technology, Inc.
- Patrick J. Mullarkey
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for disabling and re-enabling access to IC test functions
- Patent number 5,627,478
- Issue date May 6, 1997
- Micron Technology, Inc.
- Daryl L. Habersetzer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Circuit for programming antifuse bits
- Publication number 20050201135
- Publication date Sep 15, 2005
- Patrick J. Mullarkey
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUIT FOR PROGRAMMING ANTIFUSE BITS
- Publication number 20040223397
- Publication date Nov 11, 2004
- Micron Technology, Inc.
- Patick J. Mullarkey
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit for programming antifuse bits
- Publication number 20030185080
- Publication date Oct 2, 2003
- Micron Technology, Inc.
- Patick J. Mullarkey
- G11 - INFORMATION STORAGE
Information Patent Application
Apparatus and method for disabling and re-enabling access to IC tes...
- Publication number 20030020508
- Publication date Jan 30, 2003
- Daryl L. Habersetzer
- G01 - MEASURING TESTING
Information Patent Application
Circuit for programming antifuse bits
- Publication number 20020167831
- Publication date Nov 14, 2002
- Micron Technology, Inc.
- Patrick J. Mullarkey
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit for programming antifuse bits
- Publication number 20020163827
- Publication date Nov 7, 2002
- Micron Technology, Inc.
- Patrick J. Mullarkey
- G11 - INFORMATION STORAGE
Information Patent Application
Apparatus and method for disabling and re-enabling access to IC tes...
- Publication number 20020140449
- Publication date Oct 3, 2002
- Daryl L. Habersetzer
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for disabling and re-enabling access to IC tes...
- Publication number 20010015654
- Publication date Aug 23, 2001
- Daryl L. Habersetzer
- G01 - MEASURING TESTING

Jason Graalum

Person

Patents Grantslast 30 patents

Circuit for programming antifuse bits

Circuit for programming antifuse bits

Circuit for programming antifuse bits

Method for disabling and re-enabling access to IC test functions

Apparatus for disabling and re-enabling access to IC test functions

Method for disabling and re-enabling access to IC test functions

Circuit for programming antifuse bits

Apparatus and method for disabling and re-enabling access to IC tes...

Apparatus and method disabling and re-enabling access to IC test fu...

Apparatus and method for disabling and re-enabling access to IC tes...

Circuit for programming antifuse bits

Circuit for programming antifuse bits

Circuit for programming antifuse bits

Apparatus for disabling and re-enabling access to IC test functions

Patents Applicationslast 30 patents

Circuit for programming antifuse bits

CIRCUIT FOR PROGRAMMING ANTIFUSE BITS

Circuit for programming antifuse bits

Apparatus and method for disabling and re-enabling access to IC tes...

Circuit for programming antifuse bits

Circuit for programming antifuse bits

Apparatus and method for disabling and re-enabling access to IC tes...

Apparatus and method for disabling and re-enabling access to IC tes...