Mark A. Jaso

Person

Fairfax Station, VA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus, method and system for monitoring chamber parameters asso...
- Patent number 6,974,524
- Issue date Dec 13, 2005
- Micron Technology, Inc.
- Mark A. Jaso
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Device for measuring the profile of a metal film sputter deposition...
- Patent number 6,811,657
- Issue date Nov 2, 2004
- Micron Technology, Inc.
- Mark A. Jaso
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Chemical-mechanical planarization of metallurgy
- Patent number 6,632,377
- Issue date Oct 14, 2003
- International Business Machines Corporation
- Vlasta Brusic
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Dummy patterns for aluminum chemical polishing (CMP)
- Patent number 6,344,409
- Issue date Feb 5, 2002
- International Business Machines Corporation
- Mark A. Jaso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low temperature via fill using liquid phase transport
- Patent number 6,177,348
- Issue date Jan 23, 2001
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit having a via and a capacitor
- Patent number 6,166,423
- Issue date Dec 26, 2000
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of controllably forming a LOCOS oxide layer over a portion o...
- Patent number 6,153,474
- Issue date Nov 28, 2000
- International Business Machines Corporation
- Herbert Lei Ho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication of interconnects with two different thicknesses
- Patent number 6,136,686
- Issue date Oct 24, 2000
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process to reduce localized polish stop erosion
- Patent number 6,114,248
- Issue date Sep 5, 2000
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI/bulk hybrid substrate and method of forming the same
- Patent number 6,107,125
- Issue date Aug 22, 2000
- International Business Machines Corporation
- Mark A. Jaso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dummy patterns for aluminum chemical polishing (CMP)
- Patent number 6,093,631
- Issue date Jul 25, 2000
- International Business Machines Corporation
- Mark A. Jaso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a capacitor and a capacitor formed using the method
- Patent number 6,025,226
- Issue date Feb 15, 2000
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI/bulk hybrid substrate and method of forming the same
- Patent number 5,894,152
- Issue date Apr 13, 1999
- International Business Machines Corporation
- Mark A. Jaso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of chemically mechanically polishing an electronic component...
- Patent number 5,885,899
- Issue date Mar 23, 1999
- International Business Machines Corporation
- Michael David Armacost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making an aluminum contact
- Patent number 5,854,140
- Issue date Dec 29, 1998
- Siemens Aktiengesellschaft
- Mark A. Jaso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of chemically mechanically polishing an electronic component
- Patent number 5,795,826
- Issue date Aug 18, 1998
- International Business Machines Corporation
- Jeffrey Peter Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of chemically mechanically polishing an electronic component...
- Patent number 5,726,099
- Issue date Mar 10, 1998
- International Business Machines Corporation
- Mark Anthony Jaso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Storage node process for deep trench-based DRAM
- Patent number 5,656,535
- Issue date Aug 12, 1997
- Siemens Aktiengesellschaft
- Herbert Ho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of chemically mechanically polishing an electronic component
- Patent number 5,573,633
- Issue date Nov 12, 1996
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming uniformly thin, isolated silicon mesas on an insu...
- Patent number 5,264,387
- Issue date Nov 23, 1993
- International Business Machines Corporation
- Klaus D. Beyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CVD diamond or diamond-like carbon for chemical-mechanical polish e...
- Patent number 5,246,884
- Issue date Sep 21, 1993
- International Business Machines Corporation
- Mark A. Jaso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Planarization of Josephson integrated circuit
- Patent number 5,055,158
- Issue date Oct 8, 1991
- International Business Machines Corporation
- William J. Gallagher
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Apparatus, method and system for monitoring chamber parameters asso...
- Publication number 20060054497
- Publication date Mar 16, 2006
- Mark A. Jaso
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Device for measuring the profile of a metal film sputter deposition...
- Publication number 20050023132
- Publication date Feb 3, 2005
- Mark A. Jaso
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
DEVICE FOR MEASURING THE PROFILE OF A METAL FILM SPUTTER DEPOSITION...
- Publication number 20040144638
- Publication date Jul 29, 2004
- Mark A. Jaso
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Mark A. Jaso

Person

Patents Grantslast 30 patents

Apparatus, method and system for monitoring chamber parameters asso...

Device for measuring the profile of a metal film sputter deposition...

Chemical-mechanical planarization of metallurgy

Dummy patterns for aluminum chemical polishing (CMP)

Low temperature via fill using liquid phase transport

Integrated circuit having a via and a capacitor

Method of controllably forming a LOCOS oxide layer over a portion o...

Fabrication of interconnects with two different thicknesses

Process to reduce localized polish stop erosion

SOI/bulk hybrid substrate and method of forming the same

Dummy patterns for aluminum chemical polishing (CMP)

Method of forming a capacitor and a capacitor formed using the method

SOI/bulk hybrid substrate and method of forming the same

Method of chemically mechanically polishing an electronic component...

Method of making an aluminum contact

Method of chemically mechanically polishing an electronic component

Method of chemically mechanically polishing an electronic component...

Storage node process for deep trench-based DRAM

Method of chemically mechanically polishing an electronic component

Method of forming uniformly thin, isolated silicon mesas on an insu...

CVD diamond or diamond-like carbon for chemical-mechanical polish e...

Planarization of Josephson integrated circuit

Patents Applicationslast 30 patents

Apparatus, method and system for monitoring chamber parameters asso...

Device for measuring the profile of a metal film sputter deposition...

DEVICE FOR MEASURING THE PROFILE OF A METAL FILM SPUTTER DEPOSITION...