Najmi T. Jarwala

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Plainsboro, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Boundary-scan-compliant multi-chip module
- Patent number 5,673,276
- Issue date Sep 30, 1997
- Lucent Technologies Inc.
- Najmi Taher Jarwala
- G01 - MEASURING TESTING
Information Patent Grant
Boundary-scan-based system and method for test and diagnosis
- Patent number 5,444,716
- Issue date Aug 22, 1995
- AT&T Corp.
- Najmi T. Jarwala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for testing edge connector inputs and outputs...
- Patent number 5,331,274
- Issue date Jul 19, 1994
- AT&T Bell Laboratories
- Najmi T. Jarwala
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for data transfer to and from devices through...
- Patent number 5,155,732
- Issue date Oct 13, 1992
- AT&T Bell Laboratories
- Najmi T. Jarwala
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for generating control signals
- Patent number 5,048,021
- Issue date Sep 10, 1991
- AT&T Bell Laboratories
- Najmi T. Jarwala
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing circuit boards
- Patent number 5,029,166
- Issue date Jul 2, 1991
- AT&T Bell Laboratories
- Najmi T. Jarwala
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing interconnections
- Patent number 5,027,353
- Issue date Jun 25, 1991
- AT&T Bell Laboratories
- Najmi T. Jarwala
- G01 - MEASURING TESTING