Neil Richardson

Person

Stamford, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
High resolution charged particle projection lens array using magnet...
- Patent number 7,569,834
- Issue date Aug 4, 2009
- KLA-Tencor Technologies Corporation
- Neil Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structures and methods for inspection of semiconductor integra...
- Patent number 6,921,672
- Issue date Jul 26, 2005
- KLA-Tencor Technologies Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Dual probe test structures for semiconductor integrated circuits
- Patent number 6,636,064
- Issue date Oct 21, 2003
- KLA Tencor
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Stepper type test structures and methods for inspection of semicond...
- Patent number 6,633,174
- Issue date Oct 14, 2003
- KLA Tencor
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous flooding and inspection for charge control in an elect...
- Patent number 6,627,884
- Issue date Sep 30, 2003
- KLA-Tencor Technologies Corporation
- Mark A. McCord
- G01 - MEASURING TESTING
Information Patent Grant
Inspectable buried test structures and methods for inspecting the same
- Patent number 6,576,923
- Issue date Jun 10, 2003
- KLA-Tencor Corporation
- Akella V. S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structures and methods for inspection of semiconductor integra...
- Patent number 6,528,818
- Issue date Mar 4, 2003
- KLA Tencor
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Continuous movement scans of test structures on semiconductor integ...
- Patent number 6,524,873
- Issue date Feb 25, 2003
- KLA Tencor
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Inspectable buried test structures and methods for inspecting the same
- Patent number 6,509,197
- Issue date Jan 21, 2003
- KLA-Tencor Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for generating spatially resolved voltage con...
- Patent number 6,445,199
- Issue date Sep 3, 2002
- KLA-Tencor Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam dose control for scanning electron microscopy and cri...
- Patent number 6,211,518
- Issue date Apr 3, 2001
- KLA-Tencor Corporation
- Neil Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam dose control for scanning electron microscopy and cri...
- Patent number 5,869,833
- Issue date Feb 9, 1999
- KLA-Tencor Corporation
- Neil Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulsed laser photoemission electron-beam probe
- Patent number 5,270,643
- Issue date Dec 14, 1993
- Schlumberger Technologies
- Neil Richardson
- G01 - MEASURING TESTING
Information Patent Grant
Double-gated integrating scheme for electron beam tester
- Patent number 5,210,487
- Issue date May 11, 1993
- Schlumberger Technologies Inc.
- Hitoshi Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for acquiring data from intermittently failin...
- Patent number 5,144,225
- Issue date Sep 1, 1992
- Schlumberger Technologies, Inc.
- Christopher G. Talbot
- G01 - MEASURING TESTING
Information Patent Grant
IC modification with focused ion beam system
- Patent number 5,140,164
- Issue date Aug 18, 1992
- Schlumberger Technologies, Inc.
- Christopher G. Talbot
- B24 - GRINDING POLISHING
Information Patent Grant
Magnetic lens and electron beam deflection system
- Patent number 4,912,405
- Issue date Mar 27, 1990
- Schlumberger Technology Corporation
- Neil Richardson
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam test probe for integrated circuit testing
- Patent number 4,864,228
- Issue date Sep 5, 1989
- Fairchild Camera and Instrument Corporation
- Neil Richardson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for pulsing electron beams
- Patent number 4,721,909
- Issue date Jan 26, 1988
- Schlumberger Technology Corporation
- Neil Richardson
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam test probe system for analyzing integrated circuits
- Patent number 4,706,019
- Issue date Nov 10, 1987
- Fairchild Camera and Instrument Corporation
- Neil Richardson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Systems and Methods for Determining One or More Characteristics of...
- Publication number 20120281275
- Publication date Nov 8, 2012
- KLA-Tencor Corporation
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETERMINING ONE OR MORE CHARACTERISTICS OF...
- Publication number 20100235114
- Publication date Sep 16, 2010
- KLA-Tencor Corporation
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURES AND METHODS FOR INSPECTION OF SEMICONDUCTOR INTEGRA...
- Publication number 20080246030
- Publication date Oct 9, 2008
- KLA-TENCOR
- Akella V.S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope apparatus using CRT-type optics
- Publication number 20070145266
- Publication date Jun 28, 2007
- Avi Cohen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test structures and methods for inspection of semiconductor integra...
- Publication number 20030096436
- Publication date May 22, 2003
- KLA-Tencor Technologies Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Application
Inspectable buried test structures and methods for inspecting the same
- Publication number 20020187582
- Publication date Dec 12, 2002
- KLA-Tencor Corporation
- Akella V. S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Simultaneous flooding and inspection for charge control in an elect...
- Publication number 20020130260
- Publication date Sep 19, 2002
- KLA-Tencor Technologies Corporation
- Mark A. McCord
- G01 - MEASURING TESTING

Neil Richardson

Person

Patents Grantslast 30 patents

High resolution charged particle projection lens array using magnet...

Test structures and methods for inspection of semiconductor integra...

Dual probe test structures for semiconductor integrated circuits

Stepper type test structures and methods for inspection of semicond...

Simultaneous flooding and inspection for charge control in an elect...

Inspectable buried test structures and methods for inspecting the same

Test structures and methods for inspection of semiconductor integra...

Continuous movement scans of test structures on semiconductor integ...

Inspectable buried test structures and methods for inspecting the same

Methods and apparatus for generating spatially resolved voltage con...

Electron beam dose control for scanning electron microscopy and cri...

Electron beam dose control for scanning electron microscopy and cri...

Pulsed laser photoemission electron-beam probe

Double-gated integrating scheme for electron beam tester

Methods and apparatus for acquiring data from intermittently failin...

IC modification with focused ion beam system

Magnetic lens and electron beam deflection system

Electron beam test probe for integrated circuit testing

Apparatus for pulsing electron beams

Electron beam test probe system for analyzing integrated circuits

Patents Applicationslast 30 patents

Systems and Methods for Determining One or More Characteristics of...

SYSTEMS AND METHODS FOR DETERMINING ONE OR MORE CHARACTERISTICS OF...

TEST STRUCTURES AND METHODS FOR INSPECTION OF SEMICONDUCTOR INTEGRA...

Electron microscope apparatus using CRT-type optics

Test structures and methods for inspection of semiconductor integra...

Inspectable buried test structures and methods for inspecting the same

Simultaneous flooding and inspection for charge control in an elect...