Nicole A. Saulnier

Person

Albany, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Self aligned pattern formation post spacer etchback in tight pitch...
- Patent number 12,106,963
- Issue date Oct 1, 2024
- TESSERA LLC
- Sean D. Burns
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Confined bridge cell phase change memory
- Patent number 11,980,111
- Issue date May 7, 2024
- International Business Machines Corporation
- Injo Ok
Information Patent Grant
BEOL fat wire level ground rule compatible embedded artificial inte...
- Patent number 11,956,975
- Issue date Apr 9, 2024
- International Business Machines Corporation
- Soon-Cheon Seo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase change memory cell spacer
- Patent number 11,930,724
- Issue date Mar 12, 2024
- International Business Machines Corporation
- Injo Ok
Information Patent Grant
Multi-layer phase change memory device
- Patent number 11,889,773
- Issue date Jan 30, 2024
- International Business Machines Corporation
- Kevin W. Brew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Phase change memory cell galvanic corrosion prevention
- Patent number 11,800,817
- Issue date Oct 24, 2023
- International Business Machines Corporation
- Injo Ok
Information Patent Grant
Self aligned pattern formation post spacer etchback in tight pitch...
- Patent number 11,670,510
- Issue date Jun 6, 2023
- TESSERA LLC
- Sean D. Burns
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned pattern formation for a semiconductor device
- Patent number 11,646,221
- Issue date May 9, 2023
- International Business Machines Corporation
- Sean D. Burns
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-layer phase change memory device
- Patent number 11,621,394
- Issue date Apr 4, 2023
- International Business Machines Corporation
- Kevin W. Brew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Phase change memory cell with a projection liner
- Patent number 11,476,418
- Issue date Oct 18, 2022
- International Business Machines Corporation
- Injo Ok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated phase change memory cell projection liner and etch stop...
- Patent number 11,456,417
- Issue date Sep 27, 2022
- International Business Machines Corporation
- Kevin W. Brew
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase change memory cell with a wrap around and ring type of electr...
- Patent number 11,456,415
- Issue date Sep 27, 2022
- International Business Machines Corporation
- Injo Ok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Projected phase change memory devices
- Patent number 11,283,015
- Issue date Mar 22, 2022
- International Business Machines Corporation
- Timothy Mathew Philip
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase change memory device
- Patent number 11,264,569
- Issue date Mar 1, 2022
- International Business Machines Corporation
- Injo Ok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned pattern formation for a semiconductor device
- Patent number 11,227,793
- Issue date Jan 18, 2022
- International Business Machines Corporation
- Sean D. Burns
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atomic layer deposition and physical vapor deposition bilayer for a...
- Patent number 11,158,788
- Issue date Oct 26, 2021
- International Business Machines Corporation
- Kevin W. Brew
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for equal substrate to channel height between...
- Patent number 11,043,494
- Issue date Jun 22, 2021
- International Business Machines Corporation
- Lawrence A. Clevenger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET gate cut after dummy gate removal
- Patent number 11,024,715
- Issue date Jun 1, 2021
- Tessera, Inc.
- John R. Sporre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoresist bridging defect removal by reverse tone weak developer
- Patent number 11,022,890
- Issue date Jun 1, 2021
- International Business Machines Corporation
- Zhenxing Bi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Photoresist bridging defect removal by reverse tone weak developer
- Patent number 11,022,891
- Issue date Jun 1, 2021
- International Business Machines Corporation
- Zhenxing Bi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Self aligned pattern formation post spacer etchback in tight pitch...
- Patent number 11,018,007
- Issue date May 25, 2021
- Tessera, Inc.
- Sean D. Burns
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned quadruple patterning (SAQP) for routing layouts includ...
- Patent number 10,957,583
- Issue date Mar 23, 2021
- International Business Machines Corporation
- Sean D. Burns
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method to form bi-layer composite phase-change-memory...
- Patent number 10,937,961
- Issue date Mar 2, 2021
- International Business Machines Corporation
- Injo Ok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low resistance electrode for high aspect ratio confined PCM cell in...
- Patent number 10,903,418
- Issue date Jan 26, 2021
- International Business Machines Corporation
- Ruqiang Bao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method to form phase change memory cell with self- al...
- Patent number 10,833,267
- Issue date Nov 10, 2020
- International Business Machines Corporation
- Injo Ok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques to improve critical dimension width and depth uniformity...
- Patent number 10,832,945
- Issue date Nov 10, 2020
- International Business Machines Corporation
- Nicole Saulnier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned high density and size adjustable phase change memory
- Patent number 10,803,933
- Issue date Oct 13, 2020
- International Business Machines Corporation
- Injo Ok
- G11 - INFORMATION STORAGE
Information Patent Grant
Phase change memory with a patterning scheme for tantalum nitride a...
- Patent number 10,741,756
- Issue date Aug 11, 2020
- International Business Machines Corporation
- Injo Ok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask process aware calibration using mask pattern fidelity inspections
- Patent number 10,725,454
- Issue date Jul 28, 2020
- International Business Machines Corporation
- Ravi K. Bonam
- G05 - CONTROLLING REGULATING
Information Patent Grant
Dielectric gap fill evaluation for integrated circuits
- Patent number 10,622,250
- Issue date Apr 14, 2020
- International Business Machines Corporation
- Isabel Cristina Chu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SELF ALIGNED PATTERN FORMATION POST SPACER ETCHBACK IN TIGHT PITCH...
- Publication number 20250062126
- Publication date Feb 20, 2025
- TESSERA LLC
- Sean D. Burns
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF ALIGNED PATTERN FORMATION POST SPACER ETCHBACK IN TIGHT PITCH...
- Publication number 20240096627
- Publication date Mar 21, 2024
- TESSERA LLC
- Sean D. Burns
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE ENCAPSULATION OF MEMRISTIVE ELEMENT
- Publication number 20230200265
- Publication date Jun 22, 2023
- International Business Machines Corporation
- Kevin W. Brew
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-LAYER PHASE CHANGE MEMORY DEVICE
- Publication number 20230200267
- Publication date Jun 22, 2023
- International Business Machines Corporation
- Kevin W. Brew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UNIFORMLY PATTERNED TWO-TERMINAL DEVICES
- Publication number 20230180485
- Publication date Jun 8, 2023
- International Business Machines Corporation
- Kevin W. Brew
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARTIFICIAL INTELLIGENCE DEVICE CELL WITH IMPROVED PHASE CHANGE MATE...
- Publication number 20230099419
- Publication date Mar 30, 2023
- International Business Machines Corporation
- Injo OK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICALLY INSULATED PROJECTION LINER FOR AI DEVICE
- Publication number 20230085288
- Publication date Mar 16, 2023
- International Business Machines Corporation
- Injo Ok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEOL FAT WIRE LEVEL GROUND RULE COMPATIBLE EMBEDDED ARTIFICIAL INTE...
- Publication number 20230079392
- Publication date Mar 16, 2023
- International Business Machines Corporation
- Soon-Cheon Seo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONFINED BRIDGE CELL PHASE CHANGE MEMORY
- Publication number 20230075622
- Publication date Mar 9, 2023
- International Business Machines Corporation
- Injo Ok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE CHANGE MEMORY CELL SPACER
- Publication number 20230058218
- Publication date Feb 23, 2023
- International Business Machines Corporation
- Injo Ok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE CHANGE MEMORY CELL GALVANIC CORROSION PREVENTION
- Publication number 20220407005
- Publication date Dec 22, 2022
- International Business Machines Corporation
- Injo Ok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-LAYER PHASE CHANGE MEMORY DEVICE
- Publication number 20220209105
- Publication date Jun 30, 2022
- International Business Machines Corporation
- Kevin W. Brew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHASE CHANGE MEMORY CELL WITH A PROJECTION LINER
- Publication number 20220181547
- Publication date Jun 9, 2022
- International Business Machines Corporation
- Injo OK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE CHANGE MEMORY CELL WITH A WRAP AROUND AND RING TYPE OF ELECTR...
- Publication number 20220181546
- Publication date Jun 9, 2022
- International Business Machines Corporation
- Injo Ok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED PHASE CHANGE MEMORY CELL PROJECTION LINER AND ETCH STOP...
- Publication number 20220165949
- Publication date May 26, 2022
- International Business Machines Corporation
- Kevin W. Brew
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROJECTED PHASE CHANGE MEMORY DEVICES
- Publication number 20210305503
- Publication date Sep 30, 2021
- International Business Machines Corporation
- Timothy Mathew Philip
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF ALIGNED PATTERN FORMATION POST SPACER ETCHBACK IN TIGHT PITCH...
- Publication number 20210280422
- Publication date Sep 9, 2021
- Tessera, Inc.
- Sean D. Burns
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE CHANGE MEMORY DEVICE
- Publication number 20210135104
- Publication date May 6, 2021
- International Business Machines Corporation
- Injo Ok
- G11 - INFORMATION STORAGE
Information Patent Application
Techniques to Improve Critical Dimension Width and Depth Uniformity...
- Publication number 20200266100
- Publication date Aug 20, 2020
- International Business Machines Corporation
- Nicole Saulnier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FINFET GATE CUT AFTER DUMMY GATE REMOVAL
- Publication number 20200243648
- Publication date Jul 30, 2020
- Tessera, Inc.
- John R. Sporre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW RESISTANCE ELECTRODE FOR HIGH ASPECT RATIO CONFINED PCM CELL IN...
- Publication number 20200161543
- Publication date May 21, 2020
- International Business Machines Corporation
- Ruqiang Bao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASK PROCESS AWARE CALIBRATION USING MASK PATTERN FIDELITY INSPECTIONS
- Publication number 20200150629
- Publication date May 14, 2020
- International Business Machines Corporation
- Ravi K. Bonam
- G05 - CONTROLLING REGULATING
Information Patent Application
STRUCTURE AND METHOD TO FORM BI-LAYER COMPOSITE PHASE-CHANGE-MEMORY...
- Publication number 20200144501
- Publication date May 7, 2020
- International Business Machines Corporation
- Injo OK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure and Method to Form Phase Change Memory Cell with Self-Ali...
- Publication number 20200136043
- Publication date Apr 30, 2020
- International Business Machines Corporation
- Injo OK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATOMIC LAYER DEPOSITION AND PHYSICAL VAPOR DEPOSITION BILAYER FOR A...
- Publication number 20200135807
- Publication date Apr 30, 2020
- International Business Machines Corporation
- Kevin W. Brew
- G11 - INFORMATION STORAGE
Information Patent Application
SELF-ALIGNED PATTERN FORMATION FOR A SEMICONDUCTOR DEVICE
- Publication number 20200090985
- Publication date Mar 19, 2020
- International Business Machines Corporation
- Sean D. Burns
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF ALIGNED PATTERN FORMATION POST SPACER ETCHBACK IN TIGHT PITCH...
- Publication number 20200075336
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Sean D. Burns
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE CHANGE MEMORY WITH A DIELECTRIC BI-LAYER
- Publication number 20200066977
- Publication date Feb 27, 2020
- International Business Machines Corporation
- Iqbal Rashid Saraf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Self-Aligned High Density and Size Adjustable Phase Change Memory
- Publication number 20200066337
- Publication date Feb 27, 2020
- International Business Machines Corporation
- Injo OK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-ALIGNED QUADRUPLE PATTERNING (SAQP) FOR ROUTING LAYOUTS INCLUD...
- Publication number 20190393082
- Publication date Dec 26, 2019
- International Business Machines Corporation
- Sean D. Burns
- H01 - BASIC ELECTRIC ELEMENTS

Nicole A. Saulnier

Person

Patents Grantslast 30 patents

Self aligned pattern formation post spacer etchback in tight pitch...

Confined bridge cell phase change memory

BEOL fat wire level ground rule compatible embedded artificial inte...

Phase change memory cell spacer

Multi-layer phase change memory device

Phase change memory cell galvanic corrosion prevention

Self aligned pattern formation post spacer etchback in tight pitch...

Self-aligned pattern formation for a semiconductor device

Multi-layer phase change memory device

Phase change memory cell with a projection liner

Integrated phase change memory cell projection liner and etch stop...

Phase change memory cell with a wrap around and ring type of electr...

Projected phase change memory devices

Phase change memory device

Self-aligned pattern formation for a semiconductor device

Atomic layer deposition and physical vapor deposition bilayer for a...

Structure and method for equal substrate to channel height between...

FinFET gate cut after dummy gate removal

Photoresist bridging defect removal by reverse tone weak developer

Photoresist bridging defect removal by reverse tone weak developer

Self aligned pattern formation post spacer etchback in tight pitch...

Self-aligned quadruple patterning (SAQP) for routing layouts includ...

Structure and method to form bi-layer composite phase-change-memory...

Low resistance electrode for high aspect ratio confined PCM cell in...

Structure and method to form phase change memory cell with self- al...

Techniques to improve critical dimension width and depth uniformity...

Self-aligned high density and size adjustable phase change memory

Phase change memory with a patterning scheme for tantalum nitride a...

Mask process aware calibration using mask pattern fidelity inspections

Dielectric gap fill evaluation for integrated circuits

Patents Applicationslast 30 patents

SELF ALIGNED PATTERN FORMATION POST SPACER ETCHBACK IN TIGHT PITCH...

SELF ALIGNED PATTERN FORMATION POST SPACER ETCHBACK IN TIGHT PITCH...

SELECTIVE ENCAPSULATION OF MEMRISTIVE ELEMENT

MULTI-LAYER PHASE CHANGE MEMORY DEVICE

UNIFORMLY PATTERNED TWO-TERMINAL DEVICES

ARTIFICIAL INTELLIGENCE DEVICE CELL WITH IMPROVED PHASE CHANGE MATE...

ELECTRICALLY INSULATED PROJECTION LINER FOR AI DEVICE

BEOL FAT WIRE LEVEL GROUND RULE COMPATIBLE EMBEDDED ARTIFICIAL INTE...

CONFINED BRIDGE CELL PHASE CHANGE MEMORY

PHASE CHANGE MEMORY CELL SPACER

PHASE CHANGE MEMORY CELL GALVANIC CORROSION PREVENTION

MULTI-LAYER PHASE CHANGE MEMORY DEVICE

PHASE CHANGE MEMORY CELL WITH A PROJECTION LINER

PHASE CHANGE MEMORY CELL WITH A WRAP AROUND AND RING TYPE OF ELECTR...

INTEGRATED PHASE CHANGE MEMORY CELL PROJECTION LINER AND ETCH STOP...

PROJECTED PHASE CHANGE MEMORY DEVICES

SELF ALIGNED PATTERN FORMATION POST SPACER ETCHBACK IN TIGHT PITCH...

PHASE CHANGE MEMORY DEVICE

Techniques to Improve Critical Dimension Width and Depth Uniformity...

FINFET GATE CUT AFTER DUMMY GATE REMOVAL

LOW RESISTANCE ELECTRODE FOR HIGH ASPECT RATIO CONFINED PCM CELL IN...

MASK PROCESS AWARE CALIBRATION USING MASK PATTERN FIDELITY INSPECTIONS

STRUCTURE AND METHOD TO FORM BI-LAYER COMPOSITE PHASE-CHANGE-MEMORY...

Structure and Method to Form Phase Change Memory Cell with Self-Ali...

ATOMIC LAYER DEPOSITION AND PHYSICAL VAPOR DEPOSITION BILAYER FOR A...

SELF-ALIGNED PATTERN FORMATION FOR A SEMICONDUCTOR DEVICE

SELF ALIGNED PATTERN FORMATION POST SPACER ETCHBACK IN TIGHT PITCH...

PHASE CHANGE MEMORY WITH A DIELECTRIC BI-LAYER

Self-Aligned High Density and Size Adjustable Phase Change Memory

SELF-ALIGNED QUADRUPLE PATTERNING (SAQP) FOR ROUTING LAYOUTS INCLUD...