Richard L. Campbell

Person

Chassell, MI, US

People

Patents Grantslast 30 patents

Information Patent Grant
High frequency interconnect structures, electronic assemblies that...
- Patent number 9,372,214
- Issue date Jun 21, 2016
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Grant
Differential waveguide probe
- Patent number 7,876,114
- Issue date Jan 25, 2011
- Cascade Microtech, Inc.
- Richard L. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Differential signal probing system
- Patent number 7,764,072
- Issue date Jul 27, 2010
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Grant
Test structure and probe for differential signals
- Patent number 7,750,652
- Issue date Jul 6, 2010
- Cascade Microtech, Inc.
- Richard Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Calibration structures for differential signal probing
- Patent number 7,723,999
- Issue date May 25, 2010
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Grant
Wideband active-passive differential signal probe
- Patent number 7,619,419
- Issue date Nov 17, 2009
- Cascade Microtech, Inc.
- Richard Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Differential signal probe with integral balun
- Patent number 7,609,077
- Issue date Oct 27, 2009
- Cascade Microtech, Inc.
- Richard Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Probe for high frequency signals
- Patent number 7,449,899
- Issue date Nov 11, 2008
- Cascade Microtech, Inc.
- Richard L. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
On-wafer test structures for differential signals
- Patent number 7,443,186
- Issue date Oct 28, 2008
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Grant
Test structure and probe for differential signals
- Patent number 7,403,028
- Issue date Jul 22, 2008
- Cascade Microtech, Inc.
- Richard Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Transponder-based microwave telemetry apparatus
- Patent number 6,999,000
- Issue date Feb 14, 2006
- The Board of Control of Michigan Technological University
- Richard Lynn Campbell
- G08 - SIGNALLING
Information Patent Grant
Three-level semiconductor balun and method for creating the same
- Patent number 6,437,658
- Issue date Aug 20, 2002
- TriQuint Semiconductor, Inc.
- Thomas R. Apel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated broadside coupled transmission line element
- Patent number 6,407,647
- Issue date Jun 18, 2002
- TriQuint Semiconductor, Inc.
- Thomas R. Apel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microwave telemetry for sensing conditions in enclosed rotating and...
- Patent number 5,555,457
- Issue date Sep 10, 1996
- Board of Control of Michigan Technological University
- Richard L. Campbell
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH FREQUENCY INTERCONNECT STRUCTURES, ELECTRONIC ASSEMBLIES THAT...
- Publication number 20120306587
- Publication date Dec 6, 2012
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL SIGNAL PROBING SYSTEM
- Publication number 20100264948
- Publication date Oct 21, 2010
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE AND PROBE FOR DIFFERENTIAL SIGNALS
- Publication number 20100244874
- Publication date Sep 30, 2010
- Cascade Microtech, Inc.
- Richard Campbell
- G01 - MEASURING TESTING
Information Patent Application
Differential waveguide probe
- Publication number 20090189623
- Publication date Jul 30, 2009
- Richard L. Campbell
- G01 - MEASURING TESTING
Information Patent Application
High frequency probe
- Publication number 20090079451
- Publication date Mar 26, 2009
- Cascade Microtech, Inc.
- Richard L. Campbell
- G01 - MEASURING TESTING
Information Patent Application
On-wafer test structures
- Publication number 20090021273
- Publication date Jan 22, 2009
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
Test structure and probe for differential signals
- Publication number 20080246498
- Publication date Oct 9, 2008
- Cascade Microtech, Inc.
- Richard Campbell
- G01 - MEASURING TESTING
Information Patent Application
System for detecting molecular structure and events
- Publication number 20080012578
- Publication date Jan 17, 2008
- Cascade Microtech, Inc.
- Richard Campbell
- G01 - MEASURING TESTING
Information Patent Application
Differential signal probe with integral balun
- Publication number 20080012591
- Publication date Jan 17, 2008
- Richard Campbell
- G01 - MEASURING TESTING
Information Patent Application
Unilateralized amplifier
- Publication number 20080012640
- Publication date Jan 17, 2008
- Cascade Microtech, Inc.
- Richard Campbell
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
On-wafer test structures
- Publication number 20070285112
- Publication date Dec 13, 2007
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
Differential signal probing system
- Publication number 20070285085
- Publication date Dec 13, 2007
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
Calibration structures for differential signal probing
- Publication number 20070285107
- Publication date Dec 13, 2007
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
Test structure and probe for differential signals
- Publication number 20070285111
- Publication date Dec 13, 2007
- Cascade Microtech, Inc.
- Richard Campbell
- G01 - MEASURING TESTING
Information Patent Application
Wideband active-passive differential signal probe
- Publication number 20060290357
- Publication date Dec 28, 2006
- Richard Campbell
- G01 - MEASURING TESTING
Information Patent Application
High frequency probe
- Publication number 20060279299
- Publication date Dec 14, 2006
- Cascade Microtech Inc.
- Richard L. Campbell
- G01 - MEASURING TESTING
Information Patent Application
Transponder-based microwave telemetry apparatus
- Publication number 20040017299
- Publication date Jan 29, 2004
- Richard Lynn Campbell
- G08 - SIGNALLING

Richard L. Campbell

Person

Patents Grantslast 30 patents

High frequency interconnect structures, electronic assemblies that...

Differential waveguide probe

Differential signal probing system

Test structure and probe for differential signals

Calibration structures for differential signal probing

Wideband active-passive differential signal probe

Differential signal probe with integral balun

Probe for high frequency signals

On-wafer test structures for differential signals

Test structure and probe for differential signals

Transponder-based microwave telemetry apparatus

Three-level semiconductor balun and method for creating the same

Integrated broadside coupled transmission line element

Microwave telemetry for sensing conditions in enclosed rotating and...

Patents Applicationslast 30 patents

HIGH FREQUENCY INTERCONNECT STRUCTURES, ELECTRONIC ASSEMBLIES THAT...

DIFFERENTIAL SIGNAL PROBING SYSTEM

TEST STRUCTURE AND PROBE FOR DIFFERENTIAL SIGNALS

Differential waveguide probe

High frequency probe

On-wafer test structures

Test structure and probe for differential signals

System for detecting molecular structure and events

Differential signal probe with integral balun

Unilateralized amplifier

On-wafer test structures

Differential signal probing system

Calibration structures for differential signal probing

Test structure and probe for differential signals

Wideband active-passive differential signal probe

High frequency probe

Transponder-based microwave telemetry apparatus