Robert Folaron

Person

Plano, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multifunctional composite projectiles and methods of manufacturing...
- Patent number 11,821,714
- Issue date Nov 21, 2023
- SMART NANOS, LLC.
- Robert Folaron
- F42 - AMMUNITION BLASTING
Information Patent Grant
Long range large caliber frangible round for defending against UAV'S
- Patent number 11,047,657
- Issue date Jun 29, 2021
- Ascendance International, LLC
- Joseph Garst
- F42 - AMMUNITION BLASTING
Information Patent Grant
Multifunctional composite projectiles and methods of manufacturing...
- Patent number 10,760,885
- Issue date Sep 1, 2020
- SMART NANOS, LLC.
- Robert Folaron
- F42 - AMMUNITION BLASTING
Information Patent Grant
Long range large caliber frangible round for defending against UAVS
- Patent number 10,753,715
- Issue date Aug 25, 2020
- ASCENDANCE INTERNATIONAL, LLC
- Joseph Garst
- F42 - AMMUNITION BLASTING
Information Patent Grant
Long range large caliber frangible round for defending against UAV'S
- Patent number 10,466,023
- Issue date Nov 5, 2019
- ASCENDANCE INTERNATIONAL, LLC
- Joseph Garst
- F42 - AMMUNITION BLASTING
Information Patent Grant
Firearm suppression device
- Patent number 10,429,146
- Issue date Oct 1, 2019
- ASCENDANCE INTERNATIONAL, LLC
- Joseph Garst
- F41 - WEAPONS
Information Patent Grant
Firearm suppression device
- Patent number 10,107,581
- Issue date Oct 23, 2018
- Ascendance International LLC
- Joseph Garst
- F41 - WEAPONS
Information Patent Grant
Patterned atomic layer epitaxy
- Patent number 7,799,132
- Issue date Sep 21, 2010
- Zyvex Labs, LLC
- John N. Randall
- C30 - CRYSTAL GROWTH
Information Patent Grant
Charged particle beam device probe operation
- Patent number 7,675,300
- Issue date Mar 9, 2010
- Zyvex Instruments, LLC
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Patterned atomic layer epitaxy
- Patent number 7,326,293
- Issue date Feb 5, 2008
- Zyvex Labs, LLC
- John N. Randall
- C30 - CRYSTAL GROWTH
Information Patent Grant
Charged particle beam device probe operation
- Patent number 7,319,336
- Issue date Jan 15, 2008
- Zyvex Instruments, LLC
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Method, system and device for microscopic examination employing fib...
- Patent number 7,227,140
- Issue date Jun 5, 2007
- Zyvex Instruments, LLC
- George Skidmore
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for automatically positioning electronic dice within comp...
- Patent number 6,900,459
- Issue date May 31, 2005
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method for automatically positioning electronic die within componen...
- Patent number 6,492,187
- Issue date Dec 10, 2002
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method for positioning a semiconductor die within a temporary package
- Patent number 6,353,312
- Issue date Mar 5, 2002
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for automatically positioning electronic dice...
- Patent number 6,210,984
- Issue date Apr 3, 2001
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for automatically positioning electronic dice...
- Patent number 6,150,828
- Issue date Nov 21, 2000
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for automatically positioning electronic dice...
- Patent number 6,064,194
- Issue date May 16, 2000
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for automatically positioning electronic dice...
- Patent number 5,955,877
- Issue date Sep 21, 1999
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for automatically positioning electronic dice...
- Patent number 5,894,218
- Issue date Apr 13, 1999
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTIFUNCTIONAL COMPOSITE PROJECTILES AND METHODS OF MANUFACTURING...
- Publication number 20240068788
- Publication date Feb 29, 2024
- Smart Nanos, LLC
- Robert Folaron
- F42 - AMMUNITION BLASTING
Information Patent Application
MULTIFUNCTIONAL COMPOSITE PROJECTILES AND METHODS OF MANUFACTURING...
- Publication number 20210108903
- Publication date Apr 15, 2021
- Smart Nanos, LLC
- Robert Folaron
- F42 - AMMUNITION BLASTING
Information Patent Application
LONG RANGE LARGE CALIBER FRANGIBLE ROUND FOR DEFENDING AGAINST UAVS
- Publication number 20200348115
- Publication date Nov 5, 2020
- Ascendance International, LLC
- Joseph Garst
- F42 - AMMUNITION BLASTING
Information Patent Application
LONG RANGE LARGE CALIBER FRANGIBLE ROUND FOR DEFENDING AGAINST UAVS
- Publication number 20200033104
- Publication date Jan 30, 2020
- Ascendance International, LLC
- Joseph Garst
- F42 - AMMUNITION BLASTING
Information Patent Application
LONG RANGE LARGE CALIBER FRANGIBLE ROUND FOR DEFENDING AGAINST UAVS
- Publication number 20190301844
- Publication date Oct 3, 2019
- Ascendance International, LLC
- Joseph Garst
- F42 - AMMUNITION BLASTING
Information Patent Application
MULTIFUNCTIONAL COMPOSITE PROJECTILES AND METHODS OF MANUFACTURING...
- Publication number 20190113320
- Publication date Apr 18, 2019
- Smart Nanos, LLC
- Robert Folaron
- F42 - AMMUNITION BLASTING
Information Patent Application
FIREARM SUPPRESSION DEVICE
- Publication number 20190072352
- Publication date Mar 7, 2019
- Ascendance International, LLC
- Joseph Garst
- F41 - WEAPONS
Information Patent Application
MODULAR HANDGUARD DEVICE FOR A FIREARM
- Publication number 20180010881
- Publication date Jan 11, 2018
- Ascendance International, LLC
- Joseph Garst
- F41 - WEAPONS
Information Patent Application
FIREARM SUPPRESSION DEVICE
- Publication number 20170205175
- Publication date Jul 20, 2017
- Joseph Garst
- F41 - WEAPONS
Information Patent Application
NANO-ENHANCED SMART PANEL
- Publication number 20090047453
- Publication date Feb 19, 2009
- SMART NANOMATERIALS, LLC
- Robert Folaron
- B61 - RAILWAYS
Information Patent Application
NANO-ENHANCED MODULARLY CONSTRUCTED COMPOSITE PANEL
- Publication number 20090047502
- Publication date Feb 19, 2009
- SMART NANOMATERIALS, LLC
- Robert Folaron
- B32 - LAYERED PRODUCTS
Information Patent Application
NANO-ENHANCED MODULARLY CONSTRUCTED CONTAINER
- Publication number 20090045195
- Publication date Feb 19, 2009
- SMART NANOMATERIALS, LLC
- Tobin Djerf
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
CHARGED PARTICLE BEAM DEVICE PROBE OPERATION
- Publication number 20080150557
- Publication date Jun 26, 2008
- ZYVEX INSTRUMENTS, LLC
- Christof BAUR
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED ATOMIC LAYER EPITAXY
- Publication number 20080092803
- Publication date Apr 24, 2008
- ZYVEX LABS, LLC
- John N. Randall
- C30 - CRYSTAL GROWTH
Information Patent Application
Method, System and Device for Microscopic Examination Employing Fib...
- Publication number 20070187623
- Publication date Aug 16, 2007
- ZYVEX INSTRUMENTS, LLC
- George SKIDMORE
- G02 - OPTICS
Information Patent Application
Charged particle beam device probe operation
- Publication number 20060192116
- Publication date Aug 31, 2006
- Zyvex Corporation
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
Patterned atomic layer epitaxy
- Publication number 20050223968
- Publication date Oct 13, 2005
- Zyvex Corporation
- John N. Randall
- C30 - CRYSTAL GROWTH
Information Patent Application
Method, system and device for microscopic examination employing fib...
- Publication number 20050178980
- Publication date Aug 18, 2005
- Zyvex Corporation
- George Skidmore
- G02 - OPTICS
Information Patent Application
Method and apparatus for automatically positioning electronic dice...
- Publication number 20030088973
- Publication date May 15, 2003
- Warren M. Farnworth
- G01 - MEASURING TESTING

Robert Folaron

Person

Patents Grantslast 30 patents

Multifunctional composite projectiles and methods of manufacturing...

Long range large caliber frangible round for defending against UAV'S

Multifunctional composite projectiles and methods of manufacturing...

Long range large caliber frangible round for defending against UAVS

Long range large caliber frangible round for defending against UAV'S

Firearm suppression device

Firearm suppression device

Patterned atomic layer epitaxy

Charged particle beam device probe operation

Patterned atomic layer epitaxy

Charged particle beam device probe operation

Method, system and device for microscopic examination employing fib...

Apparatus for automatically positioning electronic dice within comp...

Method for automatically positioning electronic die within componen...

Method for positioning a semiconductor die within a temporary package

Method and apparatus for automatically positioning electronic dice...

Method and apparatus for automatically positioning electronic dice...

Method and apparatus for automatically positioning electronic dice...

Method and apparatus for automatically positioning electronic dice...

Method and apparatus for automatically positioning electronic dice...

Patents Applicationslast 30 patents

MULTIFUNCTIONAL COMPOSITE PROJECTILES AND METHODS OF MANUFACTURING...

MULTIFUNCTIONAL COMPOSITE PROJECTILES AND METHODS OF MANUFACTURING...

LONG RANGE LARGE CALIBER FRANGIBLE ROUND FOR DEFENDING AGAINST UAVS

LONG RANGE LARGE CALIBER FRANGIBLE ROUND FOR DEFENDING AGAINST UAVS

LONG RANGE LARGE CALIBER FRANGIBLE ROUND FOR DEFENDING AGAINST UAVS

MULTIFUNCTIONAL COMPOSITE PROJECTILES AND METHODS OF MANUFACTURING...

FIREARM SUPPRESSION DEVICE

MODULAR HANDGUARD DEVICE FOR A FIREARM

FIREARM SUPPRESSION DEVICE

NANO-ENHANCED SMART PANEL

NANO-ENHANCED MODULARLY CONSTRUCTED COMPOSITE PANEL

NANO-ENHANCED MODULARLY CONSTRUCTED CONTAINER

CHARGED PARTICLE BEAM DEVICE PROBE OPERATION

PATTERNED ATOMIC LAYER EPITAXY

Method, System and Device for Microscopic Examination Employing Fib...

Charged particle beam device probe operation

Patterned atomic layer epitaxy

Method, system and device for microscopic examination employing fib...

Method and apparatus for automatically positioning electronic dice...