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Theodore A. Khoury
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Evanston, IL, US
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Patents Grants
last 30 patents
Information
Patent Grant
Packaging and interconnection of contact structure
Patent number
7,276,920
Issue date
Oct 2, 2007
Advantest Corp.
Mark R. Jones
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure production method
Patent number
6,750,136
Issue date
Jun 15, 2004
Advantest Corp.
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure production method
Patent number
6,736,665
Issue date
May 18, 2004
Advantest Corp.
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure and production method thereof and probe contact a...
Patent number
6,676,438
Issue date
Jan 13, 2004
Advantest Corp.
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure production method
Patent number
6,677,245
Issue date
Jan 13, 2004
Advantest Corp.
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure and production method thereof and probe contact a...
Patent number
6,641,430
Issue date
Nov 4, 2003
Advantest Corp.
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure and production method thereof
Patent number
6,612,861
Issue date
Sep 2, 2003
Advantest Corp.
Theodore A. Khoury
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure and production method thereof and probe contact a...
Patent number
6,608,385
Issue date
Aug 19, 2003
Advantest Corp.
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Probe contract system having planarity adjustment mechanism
Patent number
6,586,956
Issue date
Jul 1, 2003
Advantest, Corp.
Robert Edward Aldaz
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure and production method thereof and probe contact a...
Patent number
6,579,804
Issue date
Jun 17, 2003
Advantest, Corp.
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure and production method thereof and probe contact a...
Patent number
6,576,485
Issue date
Jun 10, 2003
Advantest Corp.
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Method of producing contact structure
Patent number
6,576,301
Issue date
Jun 10, 2003
Advantest, Corp.
Theodore A. Khoury
G01 - MEASURING TESTING
Information
Patent Grant
Packaging and interconnection of contact structure
Patent number
6,548,756
Issue date
Apr 15, 2003
Advantest Corp.
Mark R. Jones
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure and production method thereof
Patent number
6,540,524
Issue date
Apr 1, 2003
Advantest Corp.
Theodore A. Khoury
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure having silicon finger contactor
Patent number
6,535,003
Issue date
Mar 18, 2003
Advantest, Corp.
Robert Edward Aldaz
G01 - MEASURING TESTING
Information
Patent Grant
Packaging and interconnection of contact structure
Patent number
6,534,710
Issue date
Mar 18, 2003
Advantest Corp.
Mark R. Jones
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure and production method thereof and probe contact a...
Patent number
6,504,223
Issue date
Jan 7, 2003
Advantest Corp.
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Probe contact system having planarity adjustment mechanism
Patent number
6,476,626
Issue date
Nov 5, 2002
Advantest, Corp.
Robert Edward Aldaz
G01 - MEASURING TESTING
Information
Patent Grant
Method for producing a contact structure
Patent number
6,472,890
Issue date
Oct 29, 2002
Advantest, Corp.
Theodore A. Khoury
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure and production method thereof and probe contact a...
Patent number
6,471,538
Issue date
Oct 29, 2002
Advantest Corp.
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure for electrical communication with contact targets
Patent number
6,466,043
Issue date
Oct 15, 2002
Advantest Corp.
Theodore A. Khoury
G01 - MEASURING TESTING
Information
Patent Grant
Probe contactor and production method thereof
Patent number
6,452,407
Issue date
Sep 17, 2002
Advantest Corp.
Theodore A. Khoury
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for edge connection between elements of an int...
Patent number
6,440,775
Issue date
Aug 27, 2002
Advantest Corporation
Theodore A. Khoury
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe contact system having planarity adjustment mechanism
Patent number
6,441,629
Issue date
Aug 27, 2002
Advantest Corp.
Theodore A. Khoury
G01 - MEASURING TESTING
Information
Patent Grant
Method of producing contact structure
Patent number
6,436,802
Issue date
Aug 20, 2002
Adoamtest Corp.
Theodore A. Khoury
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure formed by photolithography process
Patent number
6,420,884
Issue date
Jul 16, 2002
Advantest Corp.
Theodore A. Khoury
G01 - MEASURING TESTING
Information
Patent Grant
Contact structure formed over a groove
Patent number
6,399,900
Issue date
Jun 4, 2002
Advantest Corp.
Theodore A. Khoury
G01 - MEASURING TESTING
Information
Patent Grant
Packaging and interconnection of contact structure
Patent number
6,384,616
Issue date
May 7, 2002
Advantest Corp.
Mark R. Jones
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for edge connection between elements of an int...
Patent number
6,369,445
Issue date
Apr 9, 2002
Advantest Corporation
Theodore A. Khoury
G01 - MEASURING TESTING
Information
Patent Grant
Pick and place mechanism for contactor
Patent number
6,359,454
Issue date
Mar 19, 2002
Advantest Corp.
Theodore A. Khoury
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Contact structure with flexible cable and probe contact assembly us...
Publication number
20040051541
Publication date
Mar 18, 2004
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Application
Contact structure and production method thereof and probe contact a...
Publication number
20030173661
Publication date
Sep 18, 2003
Advantest Corp.
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Application
Contact structure and production method thereof and probe contact a...
Publication number
20030027423
Publication date
Feb 6, 2003
Advantest Corp.
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Application
Contact structure production method
Publication number
20030003740
Publication date
Jan 2, 2003
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Application
Contact structure production method
Publication number
20020179904
Publication date
Dec 5, 2002
Advantest Corp.
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Application
Contact structure and production method thereof and probe contact a...
Publication number
20020155735
Publication date
Oct 24, 2002
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Application
Contact structure and production method thereof and probe contact a...
Publication number
20020123252
Publication date
Sep 5, 2002
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Application
Contact structure for electrical communication with contact targets
Publication number
20020089343
Publication date
Jul 11, 2002
Advantest Corp.
Theodore A. Khoury
G01 - MEASURING TESTING
Information
Patent Application
Method for producing a contact structure
Publication number
20020089342
Publication date
Jul 11, 2002
Advantest Corp.
Theodore A. Khoury
G01 - MEASURING TESTING
Information
Patent Application
Contact structure and production method thereof
Publication number
20020076971
Publication date
Jun 20, 2002
Advantest Corp.
Theodore A. Khoury
G01 - MEASURING TESTING
Information
Patent Application
Contact structure having silicon finger contactor
Publication number
20020075021
Publication date
Jun 20, 2002
Robert Edward Aldaz
G01 - MEASURING TESTING
Information
Patent Application
Probe contract system having planarity adjustment mechanism
Publication number
20020057098
Publication date
May 16, 2002
Robert Edward Aldaz
G01 - MEASURING TESTING
Information
Patent Application
Probe contact system having planarity adjustment mechanism
Publication number
20020050832
Publication date
May 2, 2002
Robert Edward Aldaz
G01 - MEASURING TESTING
Information
Patent Application
Contact structure and production method thereof and probe contact a...
Publication number
20020048954
Publication date
Apr 25, 2002
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Application
Contact structure and production method thereof and probe contact a...
Publication number
20020048973
Publication date
Apr 25, 2002
Yu Zhou
G01 - MEASURING TESTING
Information
Patent Application
Packaging and interconnection of contact structure
Publication number
20020027444
Publication date
Mar 7, 2002
Advantest Corp.
Mark R. Jones
G01 - MEASURING TESTING
Information
Patent Application
Packaging and interconnection of contact structure
Publication number
20020024348
Publication date
Feb 28, 2002
Advantest Corp.
Mark R. Jones
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for edge connection between elements of an int...
Publication number
20010053565
Publication date
Dec 20, 2001
Theodore A. Khoury
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Probe contactor and production method thereof
Publication number
20010026166
Publication date
Oct 4, 2001
Theodore A. Khoury
G01 - MEASURING TESTING
Information
Patent Application
Packaging and interconnection of contact structure
Publication number
20010023770
Publication date
Sep 27, 2001
Advantest Corp.
Mark R. Jones
G01 - MEASURING TESTING
Information
Patent Application
Packaging and interconnection of contact structure
Publication number
20010014556
Publication date
Aug 16, 2001
Mark R. Jones
G01 - MEASURING TESTING
Information
Patent Application
Contact structure and production method thereof and probe contact a...
Publication number
20010004556
Publication date
Jun 21, 2001
Yu Zhou
G01 - MEASURING TESTING