Thomas Scheiter

Person

Strasslach, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Passivation layer structure
- Patent number 7,054,469
- Issue date May 30, 2006
- Infineon Technologies AG
- Siegfried Röhl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic component and utilization of a guard structure contained...
- Patent number 6,714,392
- Issue date Mar 30, 2004
- Infineon Technologies AG
- Heinz Opolka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for producing a reference image for pattern recognition tasks
- Patent number 6,668,072
- Issue date Dec 23, 2003
- Siemens Aktiengesellschaft
- Gerd Hribernig
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor component having double passivating layers formed of...
- Patent number 6,664,612
- Issue date Dec 16, 2003
- Infineon Technologies AG
- Josef Willer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Micromechanical component protected from environmental influences
- Patent number 6,401,544
- Issue date Jun 11, 2002
- Infineon Technologies AG
- Robert Aigner
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for capacitive image acquisition
- Patent number 6,365,888
- Issue date Apr 2, 2002
- Infineon Technologies AG
- Paul-Werner Von Basse
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface micromachined ultrasonic transducer
- Patent number 6,320,239
- Issue date Nov 20, 2001
- Siemens Aktiengesellschaft
- Peter-Christian Eccardt
- G01 - MEASURING TESTING
Information Patent Grant
Process for producing micromechanical sensors
- Patent number 6,159,762
- Issue date Dec 12, 2000
- Thomas Scheiter
- G01 - MEASURING TESTING
Information Patent Grant
Micromechanical sensor
- Patent number 6,140,689
- Issue date Oct 31, 2000
- Siemens Aktiengesellschaft
- Thomas Scheiter
- G01 - MEASURING TESTING
Information Patent Grant
Rotation rate sensor
- Patent number 6,094,985
- Issue date Aug 1, 2000
- Siemens Aktiengesellschaft
- Hergen Kapels
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor chip
- Patent number 6,020,050
- Issue date Feb 1, 2000
- Siemens Aktiengesellschaft
- Ulrich Naher
- G01 - MEASURING TESTING
Information Patent Grant
Capacitively measuring sensor and readout circuit
- Patent number 5,974,895
- Issue date Nov 2, 1999
- Siemens Aktiengesellschaft
- Max Steger
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a combination of a pressure sensor and an...
- Patent number 5,918,110
- Issue date Jun 29, 1999
- Siemens Aktiengesellschaft
- Klaus Abraham-Fuchs
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor
- Patent number 5,883,779
- Issue date Mar 16, 1999
- Siemens Aktiengesellschaft
- Ralf Catanescu
- G01 - MEASURING TESTING
Information Patent Grant
Micromechanical semiconductor components and manufacturing method t...
- Patent number 5,834,332
- Issue date Nov 10, 1998
- Siemens Aktiengesellschaft
- Christofer Hierold
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Micromechanical semiconductor component and manufacturing method th...
- Patent number 5,760,455
- Issue date Jun 2, 1998
- Siemens Aktiengesellschaft
- Christofer Hierold
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for manufacturing an acceleration sensor
- Patent number 5,700,702
- Issue date Dec 23, 1997
- Siemens Aktiengesellschaft
- Helmut Klose
- G01 - MEASURING TESTING
Information Patent Grant
Method for the selective removal of silicon dioxide
- Patent number 5,662,772
- Issue date Sep 2, 1997
- Siemens Aktiengesellschaft
- Thomas Scheiter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitive semiconductor pressure sensor
- Patent number 5,631,428
- Issue date May 20, 1997
- Siemens Aktiengesellschaft
- Ralf Catanescu
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor
- Patent number 5,450,754
- Issue date Sep 19, 1995
- Siemens Aktiengesellschaft
- Markus Biebl
- G01 - MEASURING TESTING
Information Patent Grant
Acceleration sensor and method for manufacturing same
- Patent number 5,447,067
- Issue date Sep 5, 1995
- Siemens Aktiengesellschaft
- Markus Biebl
- G01 - MEASURING TESTING
Information Patent Grant
Tunnel effect acceleration sensor
- Patent number 5,431,051
- Issue date Jul 11, 1995
- Siemens Aktiengesellschaft
- Markus Biebl
- G01 - MEASURING TESTING
Information Patent Grant
Sensor for sensing fingerpaints and method for producing the sensor
- Patent number 5,373,181
- Issue date Dec 13, 1994
- Siemens Aktiengesellschaft
- Thomas Scheiter
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Passivation layer structure
- Publication number 20020109209
- Publication date Aug 15, 2002
- Siegfried Rohl
- G01 - MEASURING TESTING
Information Patent Application
Electronic component and utilization of a guard structure contained...
- Publication number 20020066942
- Publication date Jun 6, 2002
- Heinz Opolka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Micromechanical component protected from environmental influences
- Publication number 20010054315
- Publication date Dec 27, 2001
- Robert Aigner
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Method for capacitive image acquisition
- Publication number 20010022337
- Publication date Sep 20, 2001
- Paul-Werner Von Basse
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor component with passivation
- Publication number 20010019168
- Publication date Sep 6, 2001
- Josef Willer
- G06 - COMPUTING CALCULATING COUNTING

Thomas Scheiter

Person

Patents Grantslast 30 patents

Passivation layer structure

Electronic component and utilization of a guard structure contained...

Method for producing a reference image for pattern recognition tasks

Semiconductor component having double passivating layers formed of...

Micromechanical component protected from environmental influences

Method for capacitive image acquisition

Surface micromachined ultrasonic transducer

Process for producing micromechanical sensors

Micromechanical sensor

Rotation rate sensor

Semiconductor chip

Capacitively measuring sensor and readout circuit

Method for manufacturing a combination of a pressure sensor and an...

Pressure sensor

Micromechanical semiconductor components and manufacturing method t...

Micromechanical semiconductor component and manufacturing method th...

Method for manufacturing an acceleration sensor

Method for the selective removal of silicon dioxide

Capacitive semiconductor pressure sensor

Pressure sensor

Acceleration sensor and method for manufacturing same

Tunnel effect acceleration sensor

Sensor for sensing fingerpaints and method for producing the sensor

Patents Applicationslast 30 patents

Passivation layer structure

Electronic component and utilization of a guard structure contained...

Micromechanical component protected from environmental influences

Method for capacitive image acquisition

Semiconductor component with passivation